CN112020767B - 用于转移半导体器件的可变节距多针头 - Google Patents
用于转移半导体器件的可变节距多针头 Download PDFInfo
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- CN112020767B CN112020767B CN201980027553.7A CN201980027553A CN112020767B CN 112020767 B CN112020767 B CN 112020767B CN 201980027553 A CN201980027553 A CN 201980027553A CN 112020767 B CN112020767 B CN 112020767B
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0446—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3402—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W99/00—Subject matter not provided for in other groups of this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7408—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including alignment aids
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
- H10P72/7414—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support the auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7432—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used in a transfer process involving transfer directly from an origin substrate to a target substrate without use of an intermediate handle substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07173—Means for moving chips, wafers or other parts, e.g. conveyor belts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07178—Means for aligning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07183—Means for monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W80/00—Direct bonding of chips, wafers or substrates
- H10W80/161—Aligning
- H10W80/163—Aligning using active alignment, e.g. detecting marks and correcting position
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W80/00—Direct bonding of chips, wafers or substrates
- H10W80/211—Direct bonding of chips, wafers or substrates using auxiliary members, e.g. aids for protecting the bonding area
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/791—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads
- H10W90/794—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between a chip and a stacked insulating package substrate, interposer or RDL
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Engineering & Computer Science (AREA)
- Robotics (AREA)
- Die Bonding (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/147,055 US11232968B2 (en) | 2018-09-28 | 2018-09-28 | Variable pitch multi-needle head for transfer of semiconductor devices |
| US16/147,055 | 2018-09-28 | ||
| PCT/US2019/053199 WO2020069159A1 (en) | 2018-09-28 | 2019-09-26 | Variable pitch multi-needle head for transfer of semiconductor devices |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112020767A CN112020767A (zh) | 2020-12-01 |
| CN112020767B true CN112020767B (zh) | 2022-05-06 |
Family
ID=69946573
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980027553.7A Active CN112020767B (zh) | 2018-09-28 | 2019-09-26 | 用于转移半导体器件的可变节距多针头 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11232968B2 (https=) |
| EP (1) | EP3857594A4 (https=) |
| JP (1) | JP7254170B2 (https=) |
| KR (1) | KR102551661B1 (https=) |
| CN (1) | CN112020767B (https=) |
| TW (1) | TWI731423B (https=) |
| WO (1) | WO2020069159A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11001078B2 (en) | 2018-09-28 | 2021-05-11 | Rohinni, LLC | Interchangeable guide head for transfer mechanism |
| US11217471B2 (en) | 2019-03-06 | 2022-01-04 | Rohinni, LLC | Multi-axis movement for transfer of semiconductor devices |
| US10923378B2 (en) * | 2019-05-13 | 2021-02-16 | Seagate Technology Llc | Micro-component batch transfer systems, methods, and devices |
| DE102020001439B3 (de) * | 2020-02-21 | 2021-06-10 | Mühlbauer Gmbh & Co. Kg | Vorrichtung und Verfahren zum Übertragen elektronischer Bauteile von einem ersten zu einem zweiten Träger |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6551048B1 (en) * | 2000-07-12 | 2003-04-22 | National Semiconductor Corporation | Off-load system for semiconductor devices |
| KR20130077311A (ko) * | 2011-12-29 | 2013-07-09 | 한미반도체 주식회사 | 픽업유닛 및 픽업장치 |
| JP2017076762A (ja) * | 2015-10-16 | 2017-04-20 | 東レエンジニアリング株式会社 | ボンディングヘッドおよび実装装置 |
| CN107431024A (zh) * | 2015-03-20 | 2017-12-01 | 罗茵尼公司 | 用于半导体装置转印的方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2071144C1 (ru) | 1991-12-03 | 1996-12-27 | Анатолий Александрович Варламов | Способ съема полупроводниковых кристаллов с эластичной пленки-носителя и устройство для съема полупроводниковых кристаллов с эластичной пленки-носителя |
| JPH08266980A (ja) | 1995-04-03 | 1996-10-15 | Shibuya Kogyo Co Ltd | フラックス転写装置 |
| US6283693B1 (en) * | 1999-11-12 | 2001-09-04 | General Semiconductor, Inc. | Method and apparatus for semiconductor chip handling |
| US6975016B2 (en) | 2002-02-06 | 2005-12-13 | Intel Corporation | Wafer bonding using a flexible bladder press and thinned wafers for three-dimensional (3D) wafer-to-wafer vertical stack integration, and application thereof |
| JP2003289084A (ja) * | 2002-03-28 | 2003-10-10 | Sanken Electric Co Ltd | 半導体素子ピックアップ装置 |
| KR20050009034A (ko) * | 2003-07-15 | 2005-01-24 | 삼성전자주식회사 | 칩 분리 장치 |
| JP4624813B2 (ja) * | 2005-01-21 | 2011-02-02 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法および半導体製造装置 |
| US7560303B2 (en) | 2006-11-07 | 2009-07-14 | Avery Dennison Corporation | Method and apparatus for linear die transfer |
| JP4693805B2 (ja) * | 2007-03-16 | 2011-06-01 | 株式会社東芝 | 半導体装置の製造装置及び製造方法 |
| JP5174432B2 (ja) * | 2007-11-12 | 2013-04-03 | Juki株式会社 | 部品供給装置 |
| WO2012142177A2 (en) | 2011-04-11 | 2012-10-18 | Ndsu Research Foundation | Selective laser-assisted transfer of discrete components |
| DE102011104225B4 (de) | 2011-06-15 | 2017-08-24 | Mühlbauer Gmbh & Co. Kg | Vorrichtung und Verfahren zum Positionieren eines elektronischen Bauteils und / oder eines Trägers relativ zu einer Ausstoßeinrichtung |
| RU2498449C1 (ru) | 2012-05-12 | 2013-11-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Московский государственный технический университет имени Н.Э. Баумана" (МГТУ им. Н.Э. Баумана) | Контактирующее устройство |
| DE102012013370B4 (de) * | 2012-07-04 | 2017-11-23 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Montagevorrichtung und Verfahren zum Fixieren einer Nadel in einem Nadelhalter einer Ausstoßvorrichtung zum Abheben eines Chips von einem Trägermaterial |
| US9659837B2 (en) | 2015-01-30 | 2017-05-23 | Semiconductor Components Industries, Llc | Direct bonded copper semiconductor packages and related methods |
| SG11201900112TA (en) | 2016-07-05 | 2019-02-27 | Canon Machinery Inc | Defect detection device, defect detection method, wafer, semiconductor chip, semiconductor device, die bonder, bonding method, semiconductor manufacturing method, and semiconductor device manufacturing method |
| JP6637397B2 (ja) * | 2016-09-12 | 2020-01-29 | ファスフォードテクノロジ株式会社 | 半導体製造装置および半導体装置の製造方法 |
| US10297478B2 (en) * | 2016-11-23 | 2019-05-21 | Rohinni, LLC | Method and apparatus for embedding semiconductor devices |
| US10504767B2 (en) | 2016-11-23 | 2019-12-10 | Rohinni, LLC | Direct transfer apparatus for a pattern array of semiconductor device die |
| JP6885456B2 (ja) | 2017-02-22 | 2021-06-16 | 新東工業株式会社 | テストシステム |
| TWM557658U (zh) | 2017-12-01 | 2018-04-01 | 浮雕精密有限公司 | 戳針機 |
| US10573543B2 (en) | 2018-04-30 | 2020-02-25 | Cree, Inc. | Apparatus and methods for mass transfer of electronic die |
| US11001078B2 (en) | 2018-09-28 | 2021-05-11 | Rohinni, LLC | Interchangeable guide head for transfer mechanism |
| US11217471B2 (en) | 2019-03-06 | 2022-01-04 | Rohinni, LLC | Multi-axis movement for transfer of semiconductor devices |
-
2018
- 2018-09-28 US US16/147,055 patent/US11232968B2/en active Active
-
2019
- 2019-09-26 CN CN201980027553.7A patent/CN112020767B/zh active Active
- 2019-09-26 WO PCT/US2019/053199 patent/WO2020069159A1/en not_active Ceased
- 2019-09-26 EP EP19866179.5A patent/EP3857594A4/en active Pending
- 2019-09-26 KR KR1020217011411A patent/KR102551661B1/ko active Active
- 2019-09-26 JP JP2021517283A patent/JP7254170B2/ja active Active
- 2019-09-27 TW TW108135266A patent/TWI731423B/zh active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6551048B1 (en) * | 2000-07-12 | 2003-04-22 | National Semiconductor Corporation | Off-load system for semiconductor devices |
| KR20130077311A (ko) * | 2011-12-29 | 2013-07-09 | 한미반도체 주식회사 | 픽업유닛 및 픽업장치 |
| CN107431024A (zh) * | 2015-03-20 | 2017-12-01 | 罗茵尼公司 | 用于半导体装置转印的方法 |
| JP2017076762A (ja) * | 2015-10-16 | 2017-04-20 | 東レエンジニアリング株式会社 | ボンディングヘッドおよび実装装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20200105570A1 (en) | 2020-04-02 |
| JP2022500881A (ja) | 2022-01-04 |
| EP3857594A1 (en) | 2021-08-04 |
| TW202030818A (zh) | 2020-08-16 |
| TWI731423B (zh) | 2021-06-21 |
| CN112020767A (zh) | 2020-12-01 |
| KR102551661B1 (ko) | 2023-07-05 |
| EP3857594A4 (en) | 2022-06-22 |
| JP7254170B2 (ja) | 2023-04-07 |
| WO2020069159A1 (en) | 2020-04-02 |
| KR20210058941A (ko) | 2021-05-24 |
| US11232968B2 (en) | 2022-01-25 |
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