CN112018101B - 半导体封装 - Google Patents
半导体封装 Download PDFInfo
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- CN112018101B CN112018101B CN202010463794.0A CN202010463794A CN112018101B CN 112018101 B CN112018101 B CN 112018101B CN 202010463794 A CN202010463794 A CN 202010463794A CN 112018101 B CN112018101 B CN 112018101B
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Abstract
本发明提供了一种半导体封装,该半导体封装包括底部芯片封装和顶部天线封装。底部芯片封装具有第一侧以及与该第一侧相对的第二侧,该底部芯片封装包括在第二侧上并排布置的第一半导体芯片和第二半导体芯片。顶部天线封装安装在该底部芯片封装的该第一侧上,其中,该顶部天线封装包括辐射天线组件。本发明提供的半导体封装可以满足底部芯片封装和顶部天线封装之间不同的功能和要求,实现了较低的封装成本、较短的前置时间和较好的设计灵活性。
Description
技术领域
本公开总体上涉及半导体封装领域,更具体地,涉及一种包括分立天线(discreteantenna)装置的半导体封装
背景技术
如本领域已知的,芯片(chip)和天线之间较短的互连(interconnect)在毫米波(millimeter-wave,mmW)应用中越来越关键。为了实现芯片和天线之间更短的互连以及实现半导体封装更小的体积和更高的集成度,在半导体芯片封装领域中已经开发出了在封装内包含有集成电路(integrated circuit,IC)芯片和天线的封装内天线(AiP,Antenna inPackage)。
遗憾的是,天线和布线之间对基板层的设计要求是非常不同。通常地,需要在基板层中使用薄的堆积层(build-up layer),以便实现薄的通孔和密集互连。然而,这种要求与天线设计的要求相矛盾,天线设计通常需要厚的、几乎均匀间隔的基板层。
发明内容
有鉴于此,本发明提供一种改进的半导体封装,以克服现有技术的不足和缺陷。
根据本发明的一个方面,公开一种半导体封装,该半导体封装包括底部芯片封装和顶部天线封装。底部芯片封装具有第一侧以及与该第一侧相对的第二侧,该底部芯片封装包括在第二侧上并排布置的第一半导体芯片和第二半导体芯片。顶部天线封装安装在该底部芯片封装的该第一侧上,其中,该顶部天线封装包括辐射天线组件。
根据本发明的一个方面,该半导体封装还包括连接器,连接器设置在底部芯片封装的第二侧上,或者连接器设置在该顶部天线封装的底表面上。
根据本发明的一个方面,公开一种半导体封装,该半导体封装包括芯片封装、多个天线封装。芯片封装具有第一侧和与该第一侧相对的第二侧,该芯片封装包括在该第二侧上并排布置的第一半导体芯片和第二半导体芯片。多个天线封装安装在该芯片封装的第一侧上,其中,该多个天线封装中的每一个均包括辐射天线组件。
本发明提供的半导体封装可以满足底部芯片封装和顶部天线封装之间不同的功能和要求,实现了较低的封装成本、较短的前置时间和较好的设计灵活性。
在阅读了以下在各个附图和附图中示出的优选实施例的详细说明之后,本发明的这些和其他目的对于本领域普通技术人员无疑将变得显而易见。
附图说明
附图被包括进来以提供对本发明的进一步理解,附图被结合在本说明书中并构成本说明书的一部分。附图示出了本发明的实施例,并且与说明书一起用于解释本发明的原理。在附图中:
图1示出了根据本发明一个实施例的示例性半导体封装1a的示意性横截面图,该半导体封装1a包括安装在底部芯片封装上的分立天线装置。
图2至图9示出了根据本发明各种实施例的如图1所示的半导体封装的一些示例性变型。
图10至图13示出了根据本发明的其他实施例的示例性顶部天线封装的示意性截面图。
图14示出了顶部天线封装的示例性扇出型芯片封装。
图15示出了根据本发明的另一实施例的示例性半导体封装3a的示意性截面图,该半导体封装3a包括安装在底部芯片封装上的分立天线装置。
图16示出了根据本发明另一实施例的示例性半导体封装3b的示意性截面图,该半导体封装3b包括安装在底部芯片封装件上的分立天线装置。
图17示出了根据本发明另一实施例的示例性半导体封装3c的示意性截面图,该半导体封装3c包括安装在底部芯片封装上的分立天线装置。
图18示出了根据本发明另一实施例的示例性半导体封装3d的示意性截面图,该半导体封装3d包括安装在底部芯片封装上的分立天线装置。
具体实施方式
在下面对本发明的实施例的详细描述中,参考了附图,这些附图构成本发明的一部分,并且在附图中通过图示的方式示出了可以实践本公开内容的特定的优选实施例。对这些实施例进行了详细的描述以使本领域普通技术人员能够实践这些实施例。也可以利用其他实施例,并且可以在不脱离本发明的精神和范围的情况下进行结构上的、逻辑的、电气的的改变。
术语“晶粒(die)”、“芯片(chip)”、“半导体芯片”和“半导体晶粒”在整个说明书中可互换使用,以表示集成电路芯片或晶粒。本文使用的术语“水平的”可以定义为平行于平面或表面(例如基板的表面)的方向,而不管它的朝向如何。如本文所使用的术语“垂直的”可以指与刚刚描述的水平方向正交的方向。而例如“在…上”、“在…上方”、“在…下”、“底部”、“顶部”、“侧”(例如“侧壁”)、“较高”、“较低”、“之上”和“之下”的术语,均可以相对于水平面。
本公开涉及一种半导体封装,其包括安装在底部半导体芯片封装(或底部芯片封装)上的至少一个分立(discrete)天线装置(或顶部天线封装),由此形成天线叠层封装(package-on-package)结构。根据本发明一些实施例,本文中各种实施例中公开的示例性半导体封装与常规的封装内天线相比,提供的优点包括但不限于:具有更低的封装成本、更短的前置时间(lead-time)和/或更好的设计灵活性。
具体来说,现有技术中,包含有集成电路芯片和天线的封装体为了兼容这两种结构,封装体中会留出多个较薄的薄基板层,为集成电路芯片设置更多的布线;同时封装体较厚也可以为天线留出较厚的厚基板层,以承载天线的设计。因此现有技术中的封装体会制造的较厚、体积较大,从而容纳数量较多的薄基板层以及较厚的厚基板层,例如封装体可能需要12层基板层,以满足包括集成电路芯片和天线的封装体的需求。
而本发明中将顶部天线封装与底部芯片封装分离开,就可以将这两个结构分开制造成型后再组装在一起。这样可以根据顶部天线封装与底部芯片封装各自不同的功能和要求进行设计和制造,而无需将封装体做的较厚去兼容其他的结构,所以顶部天线封装与底部芯片封装中每一个都可以做的较薄,例如现有的封装体需要12层基板层,而本发明中封装相同的芯片和天线只需要6层基板层(例如底部芯片封装)和2层基板层(例如顶部天线封装)即可,因此本发明中需要的材质相比现有技术更少,需要的制程也更少,从而大大降低了生产、封装成本。此外,顶部天线封装与底部芯片封装可分开制造成型,这样就可以同时生产顶部天线封装与底部芯片封装之后,再组装得到半导体封装,而现有技术中一整个封装体仅能按照流程在一条流水线生产,因此本发明中顶部天线封装与底部芯片封装分离可以加快生产效率,具有更短的前置时间。并且本发明中顶部天线封装与底部芯片封装分离,用户或设计人员可根据需要对封装进行组合,以满足不同的需求。例如可以将复数个底部芯片封装连接在一起使用,或根据需求选择多个底部芯片封装和顶部天线封装组合在一起使用,适应不同的应用场景和用户需求,因此本发明的方案增加了设计弹性,具有更好的设计灵活性,可以满足更广泛的使用需求。
图1是示出根据本发明一个实施例的示例性半导体封装1a的示意性横截面图,该半导体封装1a包括安装在底部芯片封装(bottom chip package)上的分立天线装置。根据一个实施例,半导体封装可以是无线模块,分立天线装置可以是天线封装。如图1所示,半导体封装1a包括底部芯片封装10和安装在底部芯片封装10上的顶部(top)天线封装20。底部芯片封装10具有第一侧(side)10a和与第一侧10a相对的第二侧10b。顶部天线封装20可以安装在第一侧10a上。底部芯片封装10可以包括安装在第二侧10b上的半导体芯片(或半导体晶粒)30。例如,半导体芯片30可以是RFIC(Radio Frequency Integrated Circuit,射频集成电路)芯片、基带(base-band)IC芯片、系统单芯片(System-in-Chip,SOC)晶粒,但不限于此。
根据一个实施例,底部芯片封装10可以包括封装基板100,封装基板100具有带有一个或多个电镀通孔112的芯部(core)110以及具有一个或多个堆积层(build-up layer)120。堆积层120可以具有一个或多个形成在堆积层中的通孔122和/或导电迹线114,以在整个底部芯片封装10中布设信号、接地和/或电源。在底部堆积层120的底表面上的导电迹线124可以采用一个或多个焊盘的形式,半导体芯片30可以利用导电组件312连接在该焊盘上。例如,导电组件312可以包括焊球、焊料凸块、铜凸块、金凸块或其他任何适合的导电装置。
例如,芯部110可以包括任何适合的材质,包括玻璃纤维片(fiberglass sheet)、预浸材质(prepreg)、FR-4材质、FR-5材质或它们的组合的环氧层压板(epoxy laminate)。导电迹线114和124、电镀通孔112和通孔122可以包括任何适合的导电材质,包括铜、银、金、镍或它们的组合。堆积层120可以包括任何适合的介电材质,包括聚酰亚胺(polyimide)、预浸材质、聚合物(polymer)等。
根据一个实施例,底部芯片封装10可以进一步包括在第一侧10a和第二侧10b上的阻焊层(solder mask layer)130。为了互连的目的,阻焊层130可以包括用于暴露导电迹线124中相应焊盘的开口。根据一个实施例,导电组件140的阵列可以设置在底部芯片封装10的第二侧10b上,以便进一步与印刷电路板或主板的互连。
顶部天线封装20通过导电组件240电耦接到底部芯片封装10,导电组件240以一个或多个焊盘的形式耦接到顶部堆积层120的上表面上的导电迹线124,并且导电组件240以一个或多个焊盘的形式耦接到基板210的底面上的导电迹线214。例如,导电组件240可以包括焊球、焊料凸块、铜凸块、金凸块或其他任何适合的导电装置。顶部天线封装20可以包括基板210。基板210可以包括一个或多个电镀通孔212以将信号从基板210的一侧路由到基板210的另一侧。
例如,基板210可以是陶瓷(ceramic)基板、半导体基板、电介质(dielectric)基板、玻璃基板,但不限于此。根据本发明的实施例,顶部天线封装20可以是低温共烧陶瓷(low temperature co-fired ceramic,LTCC)、倒装芯片尺寸封装(flip-chip chip-scale-package,FCCSP)或扇出型芯片封装(fan-out type chip package)、叠层式封装、或者引线接合(wire-bond)型封装等,但不限于此。
根据一个实施例,顶部天线封装20不包括半导体芯片或晶粒。顶部天线封装20还可以包括设置在基板210的表面上的导电迹线214中的辐射天线(radiative antenna)组件220。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。尽管在该图中没有示出,但应该理解的是,根据设计要求,辐射天线组件220可以设置在基板210的底面处。例如,辐射天线组件220可以是任何适合的类型,例如贴片(patch)天线、缝隙耦合(slot-coupled)天线、叠层贴片(stacked patch)、偶极天线(dipole)、单极天线(monopole)等,并且可以具有不同的取向(orientation)和/或极化(polarization)。在一些实施例中,辐射天线组件220可以通过设置于基板210内的一个或多个电镀通孔212或其他导电迹线将信号从基板210的一侧路由到基板210的另一侧。
此外,辐射天线组件220可以包括多个天线模块,例如双频带(dual-band)天线组件和单频带(single-band)天线组件,并不限于此。
图2至图9示出了根据本发明各种实施例的如图1所示的半导体封装的一些示例性变型,其中相同的标号表示相同的层、区域或组件。应该理解的是,除非另外特别指出,否则以下描述的各种示例性实施例的特征可以彼此组合。
如图2所示,半导体封装1b和半导体封装1a之间的差别在于,半导体封装1b的半导体芯片30设置在与顶部天线封装20相同的一侧上。例如,半导体芯片30和顶部天线封装20都安装在底部芯片封装10的第一侧10a上。同样,半导体芯片30可以通过导电组件312与导电迹线124中相应的焊盘连接。虽然未在附图中示出,应该理解的是,可以在半导体芯片30和底部芯片封装10的第一侧10a之间设置底部填充层。在非限制性示例中,半导体芯片30可以直接安装在顶部天线封装20之下。将半导体芯片30和顶部天线封装20安装在同一侧,半导体芯片与顶部天线封装之间的信号传输距离更短,可以提高信号的处理效率。
如图3所示,并简要地参照图2,半导体封装1c与半导体封装1b之间的区别在于,半导体封装1c还包括位于顶部天线封装20与底部芯片封装10之间的模塑料410。根据一个实施例,模塑料410可以包含环氧树脂或聚合物,但不限于此。模塑料410可以覆盖并封装半导体芯片30。根据一个实施例,模塑料410可以填充到半导体芯片30和底部芯片封装10的第一侧10a之间的间隙中。根据一个实施例,模塑料410可以包括贯穿模塑通孔410a。导电组件240可以设置在相应的贯穿模塑通孔410a内。使用模塑料可以进一步保护半导体芯片,并且使得半导体封装整体的机械强度更高,以及提高半导体封装的结构稳定性和耐用性。
如图4所示,并简要地参照图2,半导体封装1d和半导体封装1b之间的区别在于,半导体封装1d的半导体芯片30嵌入到封装基板100的芯部110中。应该理解的是,半导体芯片30也可以直接嵌入在堆积层120中。例如,半导体芯片30可以安装在封装基板100的芯部110上并且嵌入在电介质层(或介电层)的层内。在另一个实施例中,可以在封装基板100中形成空腔(图未示),并且将半导体芯片30放置在该空腔内。半导体芯片30可以通过传统的接合(bonding)技术接合。将半导体芯片嵌入在封装基板内可以为半导体芯片提供更可靠的保护,并且可以节省空间,减小整体半导体封装的体积,有助于半导体封装的小型化。
如图5所示,半导体封装1e包括多个半导体芯片,例如分别设置在底部芯片封装10的第一侧10a和第二侧10b上的半导体芯片30a和半导体芯片30b。半导体芯片30a可以通过导电组件312a电连接到封装件基板100。半导体芯片30b可以通过导电组件312b电连接到封装件基板100。此外,还可以继续在封装基板100内设置半导体芯片,例如如图4所示的在封装基板100的芯部110嵌入另外的半导体芯片。
如图6所示,半导体封装1f包括多个半导体芯片,例如半导体芯片30a和半导体芯片30b。半导体芯片30a可以设置在底部芯片封装10的第一侧10a上。半导体芯片30b可以嵌入封装基板100中。当然半导体芯片30a也可以设置在底部芯片封装10的第二侧10b上。半导体芯片30b嵌入到封装基板100中可以更好的保护半导体芯片30b,并避免半导体芯片30b占用表面位置,节省空间。
如图7所示,类似地,半导体封装1g包括底部芯片封装10和安装在底部芯片封装10的第一侧10a上的顶部天线封装20。根据所示实施例,顶部天线封装20在尺寸上可以比底部芯片封装10更大。此外,半导体芯片30可以设置在底部芯片封装10的第一侧10a上。当然,类似于图1和图4所示,在底部芯片封装10的第二侧10b上以及在封装基板100内设置额外的半导体芯片。较大的顶部天线封装尺寸可以提高收发信号的面积,提供更高的信号强度。
如图8所示,半导体封装1h包括底部芯片封装10和安装在底部芯片封装10的第一侧10a上的多个顶部天线封装,例如顶部天线封装20a和顶部天线封装20b。半导体芯片30可以安装在底部芯片封装10的第二侧10b上。根据所示实施例,顶部天线封装20a和20b的尺寸可以小于底部芯片封装10的尺寸。根据另一实施例,顶部天线封装20a和20b的尺寸可以大于底部芯片封装10的尺寸。具体的,可以是顶部天线封装20a的尺寸小于底部芯片封装10的尺寸,顶部天线封装20b的尺寸小于底部芯片封装10的尺寸。此外,半导体芯片30可以设置在底部芯片封装10的第二侧10b上。当然,类似于图1和图4所示,在底部芯片封装10的第一侧10a上以及在封装基板100内设置额外的半导体芯片。在底部芯片封装10的第一侧10a上设置半导体芯片时,可以设置两个,例如分别在顶部天线封装20a和20b的下方设置。此外在封装基板100内设置半导体芯片时,也可以不限制数量,例如设置两个或更多个。顶部天线封装20b可以具有与顶部天线封装20a相同或相似的层级和结构,关于顶部天线封装20b的结构可参考上述对顶部天线封装20a的描述,因此不再赘述。设置多个顶部天线封装,可以对不同的顶部天线封装设置不同的功能,从而满足多功能的要求,并且提高半导体封装的集成度,并且可以增加半导体封装的设计弹性,以满足不同的需求。
如图9所示,半导体封装1i包括底部芯片封装10和安装在底部芯片封装10的第一侧10a上的顶部天线封装20。顶部天线封装20可以包括设置在基板210的表面上的导电迹线214中的辐射天线组件220。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。如图9所示,顶部天线封装20的尺寸可以小于底部芯片封装10的尺寸。
半导体封装1i还可以包括设置在底部芯片封装10的第一侧10a上的导电迹线124中的辐射天线组件520。辐射天线组件520不与辐射天线组件220重叠(在竖直方向上的位置相互错开)。在非限制性的示例中,辐射天线组件220可以是双频带天线组件,辐射天线组件520可以是单频带天线组件。采用这种方式,可以综合分离天线和集成在底部芯片封装的天线的优势,从而保证收发信号的稳定,并且可以增加半导体封装的设计弹性,以满足不同的需求。
使用本发明是有优势的,因为通过与底部芯片封装10分隔开形成顶部天线封装20,可以实现较低的封装成本、较短的前置时间和较好的设计灵活性。顶部天线封装20和底部芯片封装10可以使用对于半导体封装来说相对可能最佳的材质、结构和/或工艺来制造。例如,底部芯片封装10可以用多层互连(例如在芯部110的任一侧上多个堆积层)制造以适应密集布线。另一方面,在本实施例中,顶部天线封装20可以仅具有单层(例如,一侧上是具有焊盘接口的电介质带,另一侧上具有辐射天线组件)。在非限制性示例中,可以在底部芯片封装10中使用低k(low-k)电介质,从而以减少的寄生效应(例如减少的电阻-电容(resistive-capacitive,RC)延迟)来路由信号,而相对较高k(higher-k)材质可以用于顶部天线封装20以实现形状系数(form factor)降低的天线。
图10至图13是示出了根据本发明的其他实施例的一些示例性封装(例如,顶部天线封装)的示意性截面图,其中相同的数字标号表示相同的层、区域或组件。应该理解的是,除非另外特别指出,否则这里描述的各种示例性实施例的特征可以彼此组合。为了简单起见,图中仅示出了示例性顶部天线封装的相关部分。
应该理解的是,如图10至图13所示的结构或特征不限于顶部天线封装。应该理解的是,如前面图中所示,图10至图13所示的结构或特征可以用于底部芯片封装10中。还应该理解的是,在不脱离本发明的精神和范围的情况下,图10至图13的一个图中描绘的一些特征可以与图10至图13的另一个图中的其他特征组合。
如图10所示,顶部天线封装2a包括基板210。例如,基板210可以是陶瓷基板、半导体基板、电介质基板、玻璃基板,但不限于此。导电迹线214形成在基板210的两个相对的表面上。基板210可以包括一个或多个电镀通孔212,以将信号从基板210的一侧路由到基板210的另一侧。根据本发明的实施例,例如,顶部天线封装2a可以是具有芯片或电子组件的封装。在基板210的一个表面上,例如基板210的底表面上,可以在基板210的底表面上设置重布线(re-wiring)层300。
在非限制性示例中,重布线层300可以包括层压在基板210的底表面上的电介质层320、在电介质层320上的导电层340以及导电层340上的保护层360。电介质层320可以包括任何适合的绝缘层,例如氧化硅、氮化硅、聚酰亚胺等。导电层340可以包括铜、银或其他合金等,但不限于此。保护层360可以包括任何适合的钝化层或阻焊层。导电层340可以通过电介质层320中的通孔322电连接到导电迹线214。在非限制性示例中,半导体芯片40可以安装在重布线层300上。半导体芯片40可以通过接触组件(contact element)342和导电组件412电连接到导电层340。在其他一些实施例中,可以省略半导体芯片40。
辐射天线组件220可以设置在基板210的表面(例如,基板210的顶表面)上的导电迹线214中。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。尽管在该图中没有示出,但应该理解的是,辐射天线组件220可以根据设计要求设置在基板210的底表面处或其他位置处。例如,辐射天线组件220可以是任何适合的类型,例如贴片天线、缝隙耦合天线、叠层贴片、偶极天线、单极天线等,并且可以具有不同的取向和/或极化。
如第11图所示,类似地,顶部天线封装2b包括芯部或基板210。例如,基板210可以是陶瓷基板、半导体基板、电介质基板、玻璃基板,但不限于此。电介质层520和导电迹线214、224分别形成在基板210的两个相对的表面上。可以设置保护层560以覆盖导电迹线224和电介质层520。电介质层520可以包括任何适合的绝缘层,例如氧化硅、氮化硅、聚酰亚胺等。保护层560可以包括任何适合的钝化层或阻焊层。基板210可以包括一个或多个电镀通孔212以将信号从基板210的一侧路由到基板210的另一侧。
根据本发明的实施例,例如,顶部天线封装2b可以是嵌入式芯片(embedded-chip)封装,即,内置有半导体芯片40的封装。在非限制性示例中,半导体芯片40可以嵌入在基板210中。半导体芯片40可以通过接触组件422电连接到导电迹线214。此外还可以设置多个半导体芯片,例如可以在顶部天线封装2b的相对的两侧分别设置半导体芯片,以及在顶部天线封装2b的内部设置半导体芯片封装。在其他一些实施例中,可以省略半导体芯片40。
辐射天线组件220可以设置在基板210上(例如,基板210的顶表面上)的导电迹线224中。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。尽管在该图中没有示出,但应该理解的是,辐射天线组件220可以根据设计要求设置在基板210的底表面处或其他位置处。例如,辐射天线组件220可以是任何适合的类型,例如贴片天线、缝隙耦合天线、叠层贴片、偶极天线、单极天线等,并且可以具有不同的取向和/或极化。
如图12所示,顶部天线封装2c可以是扇出型芯片封装,其中至少一些封装焊盘和/或用于将芯片连接到封装焊盘的导线位于芯片轮廓(outline)的横向外侧或者至少与芯片的轮廓相交。这样可以提高更多的导电层、导电组件,方便顶部天线封装与其他部件如主板、电路板等的连接。此外,顶部天线封装2c可以是晶圆级芯片尺寸封装(wafer levelchip scale package,WLCSP)。在非限制性示例中,顶部天线封装2c可以包括由第一模塑料61封装的半导体芯片40。第一模塑料61可以覆盖半导体芯片40的非活性(inactive)底部表面和四个侧壁表面,并且可以暴露半导体芯片40的活性(active)表面。在半导体芯片40的活性表面上,设置有多个接合焊盘或输入/输出(I/O)焊盘402。在其他一些示例中,可以省略半导体芯片40。
重分布层(re-distribution layer,RDL)结构600可以设置在半导体芯片40的活性表面上和第一模塑料61的表面上,并且可以电连接到半导体芯片40的I/O焊盘402。在非限制性示例中,RDL结构600可以包括电介质层601、603和605以及电介质层601、603和605中的导电层602、604。至少一个导电组件640(例如焊料凸块、焊球或金属凸块/柱)可以形成在电介质层605上以用于进一步地连接。电介质层601、603和605可以包括任何适合的绝缘层,例如氧化硅、氮化硅、聚酰亚胺等。导电层602、604可以包括铜、银或其他合金等,但不限于此。
在非限制性示例中,顶部天线封装2c可以包括第一模塑料61上的导电迹线614、第一模塑料61和导电迹线614上的第二模塑料62、第二模塑料62上的导电迹线624、第二模塑料62和导电迹线624上的第三模塑料63、以及第三模塑料63上的导电迹线634。贯穿模塑通孔612可以设置在第一模塑料61中用于RDL结构600与导电迹线614、624和634之间的信号传输。采用这种结构,将重分布层设置在半导体芯片和第一模塑料上,不仅可以保护半导体芯片,还可以让顶部天线封装结构的更加紧凑,提高顶部天线封装的机械强度和稳固性。
辐射天线组件620可以设置在导电迹线624、634中。辐射天线组件620可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。尽管在该图中没有示出,但是应该理解的是,辐射天线组件620可以根据设计要求设置在导电迹线614、624和634的任何层中。例如,辐射天线组件620可以是任何适合的类型,例如贴片天线、缝隙耦合天线、叠层贴片、偶极天线、单极天线等,并且可以具有不同的取向和/或极化。
如图13所示,顶部天线封装2d可以具有与图12所示的类似的堆栈结构。顶部天线封装2d和图12中所示的顶部天线封装2c之间的区别在于顶部天线封装2d的半导体芯片40从外部安装在RDL结构600上。同样地,辐射天线组件620可以设置在导电迹线624、634中。辐射天线组件620可以包括天线阵列或用于辐射和/或接收电磁信号(例如RF无线信号或毫米波(mmW)信号)的机构。尽管在该图中没有示出,但是应该理解的是,辐射天线组件620可以根据设计要求设置在导电迹线614、624和634的任何层中。例如,辐射天线组件620可以是任何适合的类型,例如贴片天线、缝隙耦合天线、叠层贴片、偶极天线、单极天线等,并且可以具有不同的取向和/或极化。在其他一些示例中,可以省略半导体芯片40。
例如,图14示出了用于顶部天线封装的示例性扇出型芯片封装2e。如图14所示,扇出型芯片封装2e是嵌入有半导体芯片40的封装,其中至少一些封装焊盘724和/或将半导体芯片40连接到封装焊盘724的导线714位于半导体芯片40的轮廓的横向外侧或者至少与半导体芯片40的轮廓相交。扇出型芯片封装2e可以包括用于封装半导体芯片40的侧壁和非活性上表面的模塑料710。半导体芯片40的活性表面未被模塑料710覆盖。半导体芯片40的活性表面上的输入/输出(I/O)焊盘402电连接到重分布层(RDL)结构700,RDL结构700构造在半导体芯片40的活性表面上和模塑料710的下表面上。RDL结构700包括至少一个电介质层720、在至少一个电介质层720中的用于将半导体芯片40的I/O焊盘402连接至封装焊盘724的导电线路714、以及在至少一个电介质层720中或在至少一个电介质层720上的至少一个辐射天线组件722。导电组件740例如凸块或者焊球,可以设置在封装焊盘724上用于进一步地连接。在其他一些示例中,可以省略半导体芯片40。此外,图14中可采用与图12和图13相类似或相同的导电迹线、辐射天线组件等结构。采用导电线路连接I/O焊盘与封装焊盘将节省生产步骤,从而降低成本。此外扇出型芯片封装可以设置更多的导电组件740(例如焊球或凸块),以方便布线和进一步的连接。
图15是示出了根据本发明的另一实施例的示例性半导体封装3a的示意性截面图,该半导体封装3a包括安装在底部芯片封装上的分立天线装置,其中,相同的层、区域或组件由相同的标号表示。根据一个实施例,半导体封装可以是适合于5G应用的天线模块。
如图15所示,半导体封装3a包括底部芯片封装10和安装在底部芯片封装10上的顶部天线封装20。底部芯片封装10具有第一侧10a和与第一侧10a相对的第二侧10b。顶部天线封装20可以安装在第一侧10a上。底部芯片封装10可以包括以并排方式安装在第二侧10b上的第一半导体芯片30a和第二半导体芯片30b。例如,第一半导体芯片30a和第二半导体芯片30b可以是RFIC芯片、基带IC芯片、系统单芯片(SOC)晶粒、电源管理IC芯片或收发器,但是不限于此。例如,第一半导体芯片30a可以是RFIC芯片,第二半导体芯片30b可以是功率管理IC芯片。
根据一个实施例,可以通过使用倒装芯片(flip-chip)技术将第一半导体芯片30a和第二半导体芯片30b接合到第二侧10b,但是不限于此。根据一个实施例,第一无源部件502和第二无源部件504可以安装在第二侧10b上,并且可以分别靠近第一半导体芯片30a和第二半导体芯片30b。例如,第一无源部件502和第二无源部件504可以包括分立电容器、分立电感器或分立电阻器。根据一个实施例,第一半导体芯片30a、第二半导体芯片30b、第一无源部件502和第二无源部件504可以由模塑料50封装。可以在模塑料50的表面上提供诸如铜层的金属涂层510,以屏蔽电磁干扰(electromagnetic interference,EMI)。此外,可以在模塑料50中在第一半导体芯片30a和第二半导体芯片30b之间设置金属间壁(inter-wall)511。
根据一个实施例,半导体封装3a还包括连接器60,例如可以设置在第二侧10b上。根据一个实施例,连接器60与第一半导体芯片30a和第二半导体芯片30b共面。根据一个实施例,连接器60可以通过例如封装基板100中的导电迹线114电耦接到第一半导体芯片30a和第二半导体芯片30b。根据一个实施例,例如,连接器60可以通过柔性电缆(未示出)电耦接到5G调制解调器(modem)。
顶部天线封装20通过导电组件240电耦接至底部芯片封装10,导电组件240以一个或多个焊盘的形式耦接至顶部堆积层120的顶表面上的迹线124以及以一个或多个焊盘的形式耦接至基板210的底表面上的迹线214。例如,导电组件240可以包括焊球、焊料凸块、铜凸块、金凸块或本领域中已知的任何合适的导电方式。顶部天线封装20可以包括基板210。基板210可以包括一个或多个电镀通孔212,以将信号从基板210的一侧路由到基板210的另一侧。
例如,基板210可以是陶瓷基板、半导体基板、电介质基板、玻璃基板,但不限于此。根据本发明的实施例,顶部天线封装20可以是LTCC、FCCSP、扇出型芯片封装、基于层压的封装或引线接合型封装,但不限于此。
根据一个实施例,顶部天线封装20不包括半导体芯片或晶粒。顶部天线封装20还可以包括位于在基板210的表面上布置的导电迹线214中的辐射天线组件220。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号(例如,RF无线信号或mmW信号)的机构。尽管在该图中未示出,但是应当理解,可以根据设计要求将辐射天线组件220设置在基板210的底表面处。例如,辐射天线组件220可以是任何合适的类型,例如贴片天线、缝隙耦合天线、叠层贴片、偶极天线、单极天线等,并且可以具有不同的取向和/或极化。在一些实施例中,辐射天线组件220可以通过一个或多个电镀通孔212或设置在基板210内的其他导电迹线将信号从基板210的一侧路由到基板210的另一侧。此外,辐射天线组件220可以包括多个天线模块,例如,双频带天线组件和单频带天线组件,但不限于此。
图16是示出根据本发明另一实施例的示例性半导体封装3b的示意性截面图,该半导体封装3b包括安装在底部芯片封装件上的分立天线装置,其中,相同的层、区域或组件由相同的标号表示。在一些实施例中,如图16所示,第一无源部件502和/或第二无源部件504可以设置在第一侧10a上(即,与安装有第一半导体芯片30a和第二半导体芯片30b的侧相对的侧上)。例如,第一无源部件502和/或第二无源部件504可以是厚度小于70微米的小尺寸电容器,其可以通过表面安装技术安装在第一侧10a上。
图17是示出根据本发明另一实施例的示例性半导体封装3c的示意性截面图,该半导体封装3c包括安装在底部芯片封装上的分立天线装置,其中相同的层、区域或组件由相同的标号表示。在一些实施例中,如图17中所示,连接器60可以安装在基板210的底表面210b上。连接器60可以通过基板210的底表面210b上的迹线214电耦接到底部芯片封装10。辐射天线组件220设置在基板210的顶表面210a上。辐射天线组件220可以包括天线阵列或用于辐射和/或接收电磁信号的机构。
图18是示出根据本发明另一实施例的示例性半导体封装3d的示意性截面图,该半导体封装3d包括安装在底部芯片封装上的分立天线装置,其中,相同的层、区域或组件由相同的标号表示。在一些实施例中,如图18中所示,半导体封装3d可以包括安装在底部芯片封装10的第一侧10a上的多个天线封装20a~20c。物理上分离的天线封装20a~20c可以减轻封装翘曲的问题。多个天线封装20a~20c中的每个均可以包括在基板210的顶表面210a上的辐射天线组件220。辐射天线组件220可以包括天线阵列或用于辐射和/或接收诸如RF无线信号或mmW信号的电磁信号的机构。在一些实施例中,分离的天线封装20a~20c可以包括不同的辐射天线组件,分离的天线封装的辐射天线组件220可以是任何不同合适类型天线(例如,贴片天线、缝隙耦合天线、偶极天线、单极天线等,但不限于此)的各种组合。此外,在另一些实施例中,分离的天线封装20a~20c的辐射天线组件220可包括多个天线模块,例如双频带天线组件和单频带天线组件,但不限于此。
尽管已经对本发明实施例及其优点进行了详细说明,但应当理解的系,在不脱离本发明的精神以及权利要求所定义的范围内,可以对本发明进行各种改变、替换和变更。所描述的实施例在所有方面仅用于说明的目的而并非用于限制本发明。本发明的保护范围当视所附的权利要求所界定的为准。本领域普通技术人员皆在不脱离本发明的精神以及范围内做些许更动与修改。
Claims (17)
1.一种半导体封装,包括:
底部芯片封装,具有第一侧以及与该第一侧相对的第二侧,该底部芯片封装包括在第二侧上并排布置的第一半导体芯片和第二半导体芯片以及包括靠近该第一半导体芯片的第一无源部件;
顶部天线封装,安装在该底部芯片封装的该第一侧上,其中,该顶部天线封装包括辐射天线组件;以及
连接器,设置在该底部芯片封装的第二侧上或者该顶部天线封装的底表面上,该连接器通过柔性电缆电耦接到5G调制解调器。
2.根据权利要求1所述的半导体封装,其特征在于,该第一半导体芯片包括射频集成电路芯片,并且该第二半导体芯片包括功率管理集成电路芯片。
3.根据权利要求1所述的半导体封装,其特征在于,该顶部天线封装包括基板,该基板包括陶瓷基板、半导体基板、电介质基板或玻璃基板。
4.根据权利要求3所述的半导体封装,其特征在于,该基板包括至少一个电镀通孔,以将信号从该基板的一侧路由到该基板的另一侧。
5.根据权利要求3所述的半导体封装,其特征在于,该辐射天线组件设置在该基板的表面上。
6.根据权利要求1所述的半导体封装,其特征在于,该顶部天线封装是低温共烧陶瓷封装、倒装芯片尺寸封装、叠层式封装、引线接合型封装或者扇出型芯片封装。
7.根据权利要求1所述的半导体封装,其特征在于,还包括:
封装该第一半导体芯片和该第二半导体芯片的模塑料。
8.根据权利要求7所述的半导体封装,其特征在于,还包括:
在该模塑料上的金属涂层。
9.根据权利要求1所述的半导体封装,其特征在于,该顶部天线封装经由多个导电组件电耦接至该底部芯片封装的第一侧。
10.根据权利要求1所述的半导体封装,其特征在于,还包括:第二无源部件,其中该第一无源部件和该第二无源部件包括分立电容器、分立电感器或分立电阻器。
11.根据权利要求10所述的半导体封装,其特征在于,该第一无源部件和该第二无源部件设置在该第二侧上,并且分别靠近该第一半导体芯片和该第二半导体芯片。
12.根据权利要求10所述的半导体封装,其特征在于,该第一无源部件设置在该第一侧上,并且该第二无源部件设置在该第二侧上。
13.根据权利要求1所述的半导体封装,其特征在于,该连接器设置在该底部芯片封装的第二侧上时,该连接器在该第二侧上与该第一半导体芯片和该第二半导体芯片共面。
14.根据权利要求1所述的半导体封装,其特征在于,该连接器设置在该顶部天线封装的底表面上时,该连接器通过该顶部天线封装中的迹线电耦接至该底部芯片封装。
15.一种半导体封装,包括:
芯片封装,具有第一侧和与该第一侧相对的第二侧,该芯片封装包括在该第二侧上并排布置的第一半导体芯片和第二半导体芯片以及包括靠近该第一半导体芯片的第一无源部件;
安装在该芯片封装的第一侧上的多个天线封装,其中,该多个天线封装中的每一个均包括辐射天线组件;以及
连接器,设置在该芯片封装的第二侧上,该连接器通过柔性电缆电耦接到5G调制解调器。
16.根据权利要求15所述的半导体封装,其特征在于,该多个天线封装在物理上彼此分离。
17.根据权利要求15所述的半导体封装,其特征在于,该辐射天线组件包括天线阵列或用于辐射和/或接收电磁信号的机构。
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