CN111798776A - 显示面板的两侧对准及检查装置 - Google Patents

显示面板的两侧对准及检查装置 Download PDF

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Publication number
CN111798776A
CN111798776A CN202010249352.6A CN202010249352A CN111798776A CN 111798776 A CN111798776 A CN 111798776A CN 202010249352 A CN202010249352 A CN 202010249352A CN 111798776 A CN111798776 A CN 111798776A
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CN
China
Prior art keywords
display panel
clamp
base
axis
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010249352.6A
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English (en)
Chinese (zh)
Inventor
崔材斌
金贤岐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elp Corp
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Elp Corp
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Filing date
Publication date
Application filed by Elp Corp filed Critical Elp Corp
Publication of CN111798776A publication Critical patent/CN111798776A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H10K59/1201—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
CN202010249352.6A 2019-04-09 2020-04-01 显示面板的两侧对准及检查装置 Pending CN111798776A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020190041504A KR102153910B1 (ko) 2019-04-09 2019-04-09 디스플레이 패널의 양측 얼라인 및 검사장치
KR10-2019-0041504 2019-04-09

Publications (1)

Publication Number Publication Date
CN111798776A true CN111798776A (zh) 2020-10-20

Family

ID=72469138

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010249352.6A Pending CN111798776A (zh) 2019-04-09 2020-04-01 显示面板的两侧对准及检查装置

Country Status (2)

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KR (1) KR102153910B1 (ko)
CN (1) CN111798776A (ko)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0374853A (ja) * 1989-08-15 1991-03-29 Tokyo Electron Ltd Ｔａｂディバイスの検査方法及びそれに用いるｔａｂディバイス用キャリア並びに測定モジュール及びインサート装置
WO2006090891A1 (ja) * 2005-02-23 2006-08-31 Oht Inc. 検査装置及び検査方法並びに位置決め方法
JP2007033822A (ja) * 2005-07-26 2007-02-08 Optrex Corp 検査用治具
JP2008084648A (ja) * 2006-09-27 2008-04-10 Matsushita Electric Ind Co Ltd ディスプレイパネルの点灯検査装置
KR101378997B1 (ko) * 2012-12-14 2014-03-27 (주) 루켄테크놀러지스 일체형 패널 검사 장치 및 패널 검사 장치 정렬 방법
CN105247373A (zh) * 2013-12-05 2016-01-13 株式会社Elp 用于检测amoled面板的显示面板检测装置及其方法
CN105445971A (zh) * 2014-09-24 2016-03-30 De&T株式会社 液晶显示面板的检查装置及其控制方法
CN105510797A (zh) * 2014-10-14 2016-04-20 富士施乐株式会社 检查装置
KR101906793B1 (ko) * 2017-09-14 2018-10-15 주식회사 디이엔티 디스플레이 패널 검사를 위한 fpcb 교체시스템

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101346952B1 (ko) * 2012-11-21 2014-01-16 주식회사 이엘피 Ａｍｏｌｅｄ 패널 검사를 위한 표시 패널 검사 장치 및 그 방법

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0374853A (ja) * 1989-08-15 1991-03-29 Tokyo Electron Ltd Ｔａｂディバイスの検査方法及びそれに用いるｔａｂディバイス用キャリア並びに測定モジュール及びインサート装置
WO2006090891A1 (ja) * 2005-02-23 2006-08-31 Oht Inc. 検査装置及び検査方法並びに位置決め方法
JP2007033822A (ja) * 2005-07-26 2007-02-08 Optrex Corp 検査用治具
JP2008084648A (ja) * 2006-09-27 2008-04-10 Matsushita Electric Ind Co Ltd ディスプレイパネルの点灯検査装置
KR101378997B1 (ko) * 2012-12-14 2014-03-27 (주) 루켄테크놀러지스 일체형 패널 검사 장치 및 패널 검사 장치 정렬 방법
CN105247373A (zh) * 2013-12-05 2016-01-13 株式会社Elp 用于检测amoled面板的显示面板检测装置及其方法
CN105445971A (zh) * 2014-09-24 2016-03-30 De&T株式会社 液晶显示面板的检查装置及其控制方法
CN105510797A (zh) * 2014-10-14 2016-04-20 富士施乐株式会社 检查装置
KR101906793B1 (ko) * 2017-09-14 2018-10-15 주식회사 디이엔티 디스플레이 패널 검사를 위한 fpcb 교체시스템

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Application publication date: 20201020