CN111676516B - 熔体法生长碳化硅单晶用碳源供应装置 - Google Patents
熔体法生长碳化硅单晶用碳源供应装置 Download PDFInfo
- Publication number
- CN111676516B CN111676516B CN202010776039.8A CN202010776039A CN111676516B CN 111676516 B CN111676516 B CN 111676516B CN 202010776039 A CN202010776039 A CN 202010776039A CN 111676516 B CN111676516 B CN 111676516B
- Authority
- CN
- China
- Prior art keywords
- carbon source
- silicon carbide
- melt
- source block
- crucible body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 168
- 229910052799 carbon Inorganic materials 0.000 title claims abstract description 157
- 229910010271 silicon carbide Inorganic materials 0.000 title claims abstract description 66
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims abstract description 65
- 239000013078 crystal Substances 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 29
- 239000000155 melt Substances 0.000 claims abstract description 76
- 239000000463 material Substances 0.000 claims description 21
- 229910002804 graphite Inorganic materials 0.000 claims description 13
- 239000010439 graphite Substances 0.000 claims description 13
- 230000008569 process Effects 0.000 claims description 6
- 229910052582 BN Inorganic materials 0.000 claims description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 238000002844 melting Methods 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 239000011733 molybdenum Substances 0.000 claims description 4
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- 239000010955 niobium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 229910052715 tantalum Inorganic materials 0.000 claims description 4
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical group [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- QIJNJJZPYXGIQM-UHFFFAOYSA-N 1lambda4,2lambda4-dimolybdacyclopropa-1,2,3-triene Chemical compound [Mo]=C=[Mo] QIJNJJZPYXGIQM-UHFFFAOYSA-N 0.000 claims description 3
- 229910039444 MoC Inorganic materials 0.000 claims description 3
- UNASZPQZIFZUSI-UHFFFAOYSA-N methylidyneniobium Chemical compound [Nb]#C UNASZPQZIFZUSI-UHFFFAOYSA-N 0.000 claims description 3
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 claims description 3
- 229910003468 tantalcarbide Inorganic materials 0.000 claims description 3
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 claims description 3
- 230000009286 beneficial effect Effects 0.000 abstract description 3
- 230000007246 mechanism Effects 0.000 description 11
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 238000004090 dissolution Methods 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 150000001721 carbon Chemical class 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 210000000078 claw Anatomy 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/002—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/04—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method adding crystallising materials or reactants forming it in situ to the melt
- C30B11/08—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method adding crystallising materials or reactants forming it in situ to the melt every component of the crystal composition being added during the crystallisation
- C30B11/10—Solid or liquid components, e.g. Verneuil method
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010776039.8A CN111676516B (zh) | 2020-08-05 | 2020-08-05 | 熔体法生长碳化硅单晶用碳源供应装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010776039.8A CN111676516B (zh) | 2020-08-05 | 2020-08-05 | 熔体法生长碳化硅单晶用碳源供应装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN111676516A CN111676516A (zh) | 2020-09-18 |
CN111676516B true CN111676516B (zh) | 2024-01-19 |
Family
ID=72458184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010776039.8A Active CN111676516B (zh) | 2020-08-05 | 2020-08-05 | 熔体法生长碳化硅单晶用碳源供应装置 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN111676516B (zh) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4152194A (en) * | 1977-07-29 | 1979-05-01 | Nasa | Growth of silicon carbide crystals on a seed while pulling silicon crystals from a melt |
CN1224084A (zh) * | 1998-01-23 | 1999-07-28 | 西安理工大学 | 用硅衬底β碳化硅晶体薄膜生长碳化硅单晶体 |
CN102203330A (zh) * | 2008-08-29 | 2011-09-28 | 住友金属工业株式会社 | 碳化硅单晶的制造方法 |
CN110747504A (zh) * | 2019-11-26 | 2020-02-04 | 中国科学院物理研究所 | 一种碳化硅单晶的生长方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7520930B2 (en) * | 2002-04-15 | 2009-04-21 | Sumitomo Metal Industries, Ltd. | Silicon carbide single crystal and a method for its production |
-
2020
- 2020-08-05 CN CN202010776039.8A patent/CN111676516B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4152194A (en) * | 1977-07-29 | 1979-05-01 | Nasa | Growth of silicon carbide crystals on a seed while pulling silicon crystals from a melt |
CN1224084A (zh) * | 1998-01-23 | 1999-07-28 | 西安理工大学 | 用硅衬底β碳化硅晶体薄膜生长碳化硅单晶体 |
CN102203330A (zh) * | 2008-08-29 | 2011-09-28 | 住友金属工业株式会社 | 碳化硅单晶的制造方法 |
CN110747504A (zh) * | 2019-11-26 | 2020-02-04 | 中国科学院物理研究所 | 一种碳化硅单晶的生长方法 |
Also Published As
Publication number | Publication date |
---|---|
CN111676516A (zh) | 2020-09-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8231727B2 (en) | Crystal growth apparatus and method | |
US9388508B2 (en) | Manufacturing apparatus of SiC single crystal, jig for use in the manufacturing apparatus, and method for manufacturing SiC single crystal | |
KR100987470B1 (ko) | 실리콘 단결정의 제조방법 및 실리콘 단결정과 실리콘웨이퍼 | |
US7588636B2 (en) | Method of production of silicon carbide single crystal | |
JP2004534710A (ja) | 炭素ドーピング、抵抗率制御、温度勾配制御を伴う、剛性サポートを備える半導体結晶を成長させるための方法および装置 | |
JP2007126335A (ja) | 溶液法による炭化ケイ素単結晶の製造のための製造設備 | |
KR20110094025A (ko) | 단결정 제조용 상부히터, 단결정 제조장치 및 단결정 제조방법 | |
CN111676516B (zh) | 熔体法生长碳化硅单晶用碳源供应装置 | |
JPH1179886A (ja) | 結晶成長方法および装置 | |
JP6249494B2 (ja) | 炭化珪素単結晶の製造方法 | |
EP1741808A1 (en) | InP SINGLE CRYSTAL WAFER AND InP SINGLE CRYSTAL MANUFACTURING METHOD | |
JP6409955B2 (ja) | SiC単結晶の製造方法 | |
WO2017047536A1 (ja) | SiC単結晶の製造装置、SiC単結晶の製造方法及びSiC単結晶材 | |
JP2010064936A (ja) | 半導体結晶の製造方法 | |
KR102166640B1 (ko) | 탄화규소 단결정 성장장치용 지그 | |
WO2011043777A1 (en) | Crystal growth apparatus and method | |
JP6230031B2 (ja) | 炭化珪素単結晶の製造方法 | |
CN101570882A (zh) | 一种制备确定取向纯金属单晶的坩埚及其应用方法 | |
CN114481288B (zh) | 一种用于碲锌镉晶体制备过程中生长坩埚的SiC支撑托 | |
WO2017043215A1 (ja) | SiC単結晶の製造方法 | |
KR102060188B1 (ko) | 실리콘카바이드 단결정의 제조 장치 및 실리콘카바이드 단결정의 제조 방법 | |
JP2009057237A (ja) | 化合物半導体単結晶の製造方法 | |
JPH0597566A (ja) | 単結晶の育成方法及びその装置 | |
JPH11130579A (ja) | 化合物半導体単結晶の製造方法及びその製造装置 | |
KR20200053817A (ko) | 단결정 성장용 도가니 및 이를 포함하는 탄화규소 단결정 성장장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20201103 Address after: Room 401, building 6, Ruiyun, No.99, Furong Zhongsan Road, Xishan District, Wuxi City, Jiangsu Province Applicant after: Zhongke Zhenjing (Wuxi) Semiconductor Co.,Ltd. Address before: Unit 401, unit 3, building 3, daoxiangyuan, Haidian District, Beijing Applicant before: Zheng Hongjun |
|
CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 213100 east of the first floor of plant 19, No. 377, Wuyi South Road, Wujin national high tech Industrial Development Zone, Wujin District, Changzhou City, Jiangsu Province Applicant after: Changzhou Zhenjing Semiconductor Co.,Ltd. Address before: 214000 Room 401, building 6, Ruiyun, No. 99, Furong Zhongsan Road, Xishan District, Wuxi City, Jiangsu Province Applicant before: Zhongke Zhenjing (Wuxi) Semiconductor Co.,Ltd. |
|
GR01 | Patent grant | ||
GR01 | Patent grant |