CN111341878A - 一种晶硅太阳能电池片的制备方法 - Google Patents

一种晶硅太阳能电池片的制备方法 Download PDF

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CN111341878A
CN111341878A CN201811555750.XA CN201811555750A CN111341878A CN 111341878 A CN111341878 A CN 111341878A CN 201811555750 A CN201811555750 A CN 201811555750A CN 111341878 A CN111341878 A CN 111341878A
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赵桂梅
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Zhejiang Fortune Energy Co ltd
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Abstract

本发明公开了一种晶硅太阳能电池片的制备方法,具体技术方案步骤依次为:原始硅片预清洗、制绒及酸清洗;高温磷扩散;湿法刻蚀;热氧化处理;背面镀膜处理;正面PECVD镀膜处理;激光开槽;背电极、背电场和正电极丝网印刷及烧结,完成电池片制备。本发明的有益效果是有效地提升了晶硅太阳能电池片的开路电压、短路电流,光电转换效率提高1%以上。

Description

一种晶硅太阳能电池片的制备方法
技术领域
本发明涉及晶硅太阳能电池片制造领域,具体地涉及一种晶硅太阳能电池片的制备方法。
背景技术
目前,高效多晶硅太阳能电池是光伏行业领域的研究热点之一。目前太阳能电池片制作常规工艺流程为:常规片、预清洗、制绒、磷扩散、湿法刻蚀、背面PECVD镀膜、背电极、背电场和正电极丝网印刷及烧结。硅表面复合速率较高,严重制约多晶硅太阳能电池的光电转换效率。通过晶硅表面的钝化技术可以降低晶硅表面的复合速率,从而提高晶硅太阳能电池的光电转换效率。传统的表面钝化技术使用PECVD法在硅表面沉积一层氮化硅薄膜,但热氧化法生长的二氧化硅薄膜与衬底硅的晶格系数更加匹配,钝化效果更加好。经过大量有关晶硅太阳能电池表面钝化技术的研究结果表明,半导体表面存在大量悬挂键、断键等不饱和键,容易在禁带形成复合中心能级,加大载流子在表面复合消失速率,严重影响少子寿命,从而降低电池的光电转换效率。而表面钝化能很好地去除这些复合中心,降低硅的表面态密度,从而降低载流子的表面复合速率。
发明内容
本发明的目的是提供一种晶硅太阳能电池片的制备方法,达到更好地控制SiO2层的厚度,使硅片表面起到多层减反射膜的效果,增强电池片对光的吸收,提高短路电流;降低光生载流子复合,提高少子寿命,进而提高开路电压的目的;使电池片短路电流提升300~600mA、开路电压提升10~20mV、光电转换效率提升1%以上。
为了解决上述技术问题,本发明提供一种晶硅太阳能电池片的制备方法。本发明的具体技术方案步骤为:
(1)原始硅片预清洗、制绒及酸清洗;
(2)高温磷扩散;
(3)湿法刻蚀;
(4)热氧化处理;
(5)背面镀膜处理;
(6)正面PECVD镀膜处理;
(7)激光开槽;
(8)背电极、背电场和正电极丝网印刷及烧结,完成电池片制备。
进一步地,
步骤(1)中,所述硅片制绒减重小于等于0.05g,反射率控制在13%~18%;
步骤(2)中,所述磷扩散后方阻控制在70~120 ohm/squ;
步骤(3)中,所述湿法刻蚀后减重控制在0.1~0.2g,方阻提升在8~15欧姆;
步骤(4)中,所述热氧化处理具体为:初始温度为700~750℃,经过500~700s恒温恒压至680~720℃,恒温恒压(800-1200mbar)氧化800~1500s,氧气流量为300~400sccm,氮气流量为8000~12000sccm。然后经过400~600s的冷却,降温至550~650℃,氮气流量为8000~12000sccm;热氧化后方阻较热氧化前方阻提升5~12欧姆,硅片亲水性强,距离硅片表面2cm处,滴一滴水滴,水滴扩散直径>15cm;
步骤(5)中,所述背面镀膜处理工艺具体为:通入流量为4~6slm 的N2O,70~90% 的三甲胺液体,经过100~200s,通入流量为4~6slm的N2O,流量为100~200sccm的 SiN4,流量为0.2~1slm的 NH3, 经过200~300s处理,通入流量为600~900sccm的SiN4,流量为3~5slm的NH3,经过200~300s,再通入流量为600~900sccm的SiN4,流量为6~8slm的NH3,经过500~600s;膜厚控制在90~200nm,折射率控制在2.0~2.15之间;
步骤(6)中,所述正面PECVD镀膜膜厚控制在75~95nm之间,折射率控制在2.0~2.15之间;
步骤(7)中,所述激光开槽,槽深控制在100~200nm之间,槽宽控制在20~60um之间。
本发明的有益效果是有效地提升了晶硅太阳能电池片的开路电压、短路电流,光电转换效率提高1%以上。
附图说明
图1本发明提供的一种晶硅太阳能电池片的制备方法的工艺流程。
具体实施方式
下面结合实施例对本发明的技术方案作进一步地详细说明。
实施例1
一种晶硅太阳能电池片的制备方法,包括以下步骤:
(1)原始硅片经过预清洗、制绒及酸清洗,硅片制绒后减重控制在0.03g,反射率控制在15%。
(2)高温磷扩散:方阻控制在90±5ohm/squ之间。
(3)湿法刻蚀:减重为0.15g,方阻提升8.5±1.5欧姆。
(4)热氧化处理:初始温度720℃,经过600s恒温恒压至700℃,恒温恒压(1000mbar)氧化时间为1000s,氧气流量为320sccm,氮气流量为10000sccm。然后经过450s的冷却,降温至630℃,氮气流量为10000sccm。氧化后方阻较氧化前提升6.5±1.5欧姆,水滴扩散直径为16cm。
(5)背面镀膜:通入流量为5slm的N2O,80% 三甲胺液体,经过150s,通入流量为5slm的 N2O,流量为150sccm的SiN4,NH3流量为0.5slm, 经过250s,通入流量为750sccm的SiN4,流量为4slm的NH3,经过250s,再通入流量为750sccm的SiN4,流量为7slm的NH3,经过550s;膜厚控制在105±5nm,折射率控制在2.06±0.02。
(6)正面PECVD镀膜:膜厚控制在82±4nm,折射率控制在2.06±0.02。
(7)激光开槽:槽深控制在150±10nm,槽宽控制在40±5um;
(8)背电极、背电场和正电极丝网印刷及烧结,完成电池片制备。
表1:常规工艺方案与发明实施例1的电性能参数对比表
工艺 Uoc(V) Isc(A) Rs(ohm) Rsh(ohm) FF(%) 转换效率(%)
常规工艺 0.6387 9.105 0.00139 465.72 80.96 19.16%
实施例1 0.6515 9.5828 0.00163 397.25 80.37 20.27%
由上表可知,实施例1采用本发明制备的电池片与常规工艺制得的电池片,在各项电性能参数上均更有优势,光电转换效率提高了1.11%,其中开路电压提升了12.8mV,短路电流提升了478mA。
实施例2
一种晶硅太阳能电池片的制备方法,包括以下步骤:
(1)原始硅片预清洗、制绒及酸清洗,硅片制绒后减重控制在0.04g,反射率控制在17%。
(2)高温磷扩散:方阻控制在100±5ohm/squ之间。
(3)湿法刻蚀:减重为0.12g,方阻提升9±1欧姆。
(4)热氧化处理:初始温度750℃,经过700s恒温恒压至680℃,恒温恒压(1000mbar)氧化1300s,氧气流量为380sccm,氮气流量为10000sccm;然后经过550s的冷却,降温至550℃,氮气流量为10000sccm。氧化后方阻较氧化前提升10±2欧姆,水滴扩散直径19cm。
(5)背面镀膜:通入流量为6slm的N2O, 75% 三甲胺液体,经过180s,通入流量为6slm的N2O,流量为180sccm的SiN4,流量为0.8slm的NH3, 经过220s,通入流量为800sccm的SiN4,流量为5slm的NH3,经过280s,再通入流量为800sccm 的SiN4,流量为8slm NH3,经过580s;膜厚控制在110±5nm,折射率控制在2.02~2.05之间。
(6)正面PECVD镀膜:膜厚控制在90±5nm之间,折射率控制在2.08~2.15之间。
(7)激光开槽:槽深控制在180±10nm之间,槽宽控制在35±5um之间。
(8)背电极、背电场和正电极丝网印刷及烧结,完成电池片制备。
表2:常规工艺方案与发明实施例2的热氧化工艺方案的效率对比
工艺 Uoc(V) Isc(A) Rs(ohm) Rsh(ohm) FF(%) 转换效率(%)
常规工艺 0.6378 9.1843 0.00153 669.09 80.98 19.20%
实施例2 0.6534 9.5256 0.00154 347.29 80.74 20.29%
由上表可知,实施例2的电池与常规工艺制得的电池片,在各项电性能上均有显著提高,光电转换效率提高了1.09%,其中开路电压提升了15.5mV,短路电流提升了341mA。

Claims (8)

1.一种晶硅太阳能电池片的制备方法,其特征在于按照以下具体技术方案实施步骤依次为:
(1)原始硅片预清洗、制绒及酸清洗;
(2)高温磷扩散;
(3)湿法刻蚀;
(4)热氧化处理;
(5)背面镀膜处理;
(6)正面PECVD镀膜处理;
(7)激光开槽;
(8)背电极、背电场和正电极丝网印刷及烧结,完成电池片制备。
2.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(1)中,所述硅片制绒减重小于等于0.05g,反射率控制在13%~18%。
3.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(2)中,所述磷扩散后方阻控制在70~120 ohm/squ。
4.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(3)中,所述湿法刻蚀后减重控制在0.1~0.2g,方阻提升在8~15欧姆。
5.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(4)中,所述热氧化处理具体为:初始温度为700~750℃,经过500~700s恒温恒压至680~720℃,恒温恒压(800-1200mbar)氧化800~1500s,氧气流量为300~400sccm,氮气流量为8000~12000sccm;然后经过400~600s的冷却,降温至550~650℃,氮气流量为8000~12000sccm;热氧化后方阻较热氧化前方阻提升5~12欧姆,硅片亲水性强,距离硅片表面2cm处,滴一滴水滴,水滴扩散直径>15cm。
6.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(5)中,所述背面镀膜处理工艺具体为:通入流量为4~6slm 的N2O,70~90% 的三甲胺液体,经过100~200s,通入流量为4~6slm的N2O,流量为100~200sccm的 SiN4,流量为0.2~1slm的 NH3, 经过200~300s处理,通入流量为600~900sccm的SiN4,流量为3~5slm的NH3,经过200~300s,再通入流量为600~900sccm的SiN4,流量为6~8slm的NH3,经过500~600s;膜厚控制在90~200nm,折射率控制在2.0~2.15之间。
7.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(6)中,所述正面PECVD镀膜膜厚控制在75~95nm之间,折射率控制在2.0~2.15之间。
8.根据权利要求1所述的一种晶硅太阳能电池片的制备方法,其特征在于:所述的步骤(7)中,所述激光开槽,槽深控制在100~200nm之间,槽宽控制在20~60um之间。
CN201811555750.XA 2018-12-19 2018-12-19 一种晶硅太阳能电池片的制备方法 Pending CN111341878A (zh)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111969083A (zh) * 2020-09-22 2020-11-20 浙江鸿禧能源股份有限公司 一种抗pid太阳能电池片的制备方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111969083A (zh) * 2020-09-22 2020-11-20 浙江鸿禧能源股份有限公司 一种抗pid太阳能电池片的制备方法

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