CN1110836C - 一种质谱仪及其使用方法 - Google Patents

一种质谱仪及其使用方法 Download PDF

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Publication number
CN1110836C
CN1110836C CN98119336A CN98119336A CN1110836C CN 1110836 C CN1110836 C CN 1110836C CN 98119336 A CN98119336 A CN 98119336A CN 98119336 A CN98119336 A CN 98119336A CN 1110836 C CN1110836 C CN 1110836C
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CN
China
Prior art keywords
ion source
ionization chamber
gas inlet
branch
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CN98119336A
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English (en)
Chinese (zh)
Other versions
CN1214528A (zh
Inventor
糸井弘人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
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Publication date
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Publication of CN1214528A publication Critical patent/CN1214528A/zh
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Publication of CN1110836C publication Critical patent/CN1110836C/zh
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Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN98119336A 1997-09-19 1998-09-17 一种质谱仪及其使用方法 Expired - Fee Related CN1110836C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP27359297A JP3718971B2 (ja) 1997-09-19 1997-09-19 質量分析計
JP273592/1997 1997-09-19
JP273592/97 1997-09-19

Publications (2)

Publication Number Publication Date
CN1214528A CN1214528A (zh) 1999-04-21
CN1110836C true CN1110836C (zh) 2003-06-04

Family

ID=17529940

Family Applications (1)

Application Number Title Priority Date Filing Date
CN98119336A Expired - Fee Related CN1110836C (zh) 1997-09-19 1998-09-17 一种质谱仪及其使用方法

Country Status (4)

Country Link
US (1) US6147346A (enExample)
JP (1) JP3718971B2 (enExample)
CN (1) CN1110836C (enExample)
DE (1) DE19842689A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106093176A (zh) * 2016-07-27 2016-11-09 南京信息工程大学 一种气态硫酸测量的标定方法及标定装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method
DE10310394A1 (de) * 2003-03-07 2004-09-23 Wma Airsense Analysentechnik Gmbh Verfahren und Meßsystem zur Erfassung von Gefahrstoffen
US6842008B2 (en) * 2003-03-11 2005-01-11 Stanley D. Stearns Gas detector with modular detection and discharge source calibration
EP2237862A1 (en) * 2008-01-16 2010-10-13 Syngenta Participations AG Apparatus system and method for mass analysis of a sample
CN103163209B (zh) * 2011-12-19 2014-12-10 中国科学院大连化学物理研究所 一种气体样品在线连续监测的质谱方法
FI124792B (fi) * 2013-06-20 2015-01-30 Helsingin Yliopisto Menetelmä ja laite näytekaasuvirtauksen partikkelien ionisoimiseksi
CN106546656A (zh) * 2016-10-09 2017-03-29 中国科学院化学研究所 一种化学电离直链烷烃的方法
CN109884156B (zh) * 2017-12-06 2021-07-20 中国科学院大连化学物理研究所 一种快速分析全氟丙烷中多种杂质的检测装置及方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3555272A (en) * 1968-03-14 1971-01-12 Exxon Research Engineering Co Process for chemical ionization for intended use in mass spectrometry and the like
JPS5387791A (en) * 1977-01-12 1978-08-02 Hitachi Ltd Composite ion source apparatus
US4266127A (en) * 1978-12-01 1981-05-05 Cherng Chang Mass spectrometer for chemical ionization and electron impact ionization operation
US4839143A (en) * 1985-02-15 1989-06-13 Allied-Signal Inc. Selective ionization of gas constituents using electrolytic reactions
CN2195138Y (zh) * 1994-08-24 1995-04-19 东南大学 质谱计的封闭式气体放电离子源

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3555272A (en) * 1968-03-14 1971-01-12 Exxon Research Engineering Co Process for chemical ionization for intended use in mass spectrometry and the like
JPS5387791A (en) * 1977-01-12 1978-08-02 Hitachi Ltd Composite ion source apparatus
US4266127A (en) * 1978-12-01 1981-05-05 Cherng Chang Mass spectrometer for chemical ionization and electron impact ionization operation
US4839143A (en) * 1985-02-15 1989-06-13 Allied-Signal Inc. Selective ionization of gas constituents using electrolytic reactions
CN2195138Y (zh) * 1994-08-24 1995-04-19 东南大学 质谱计的封闭式气体放电离子源

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106093176A (zh) * 2016-07-27 2016-11-09 南京信息工程大学 一种气态硫酸测量的标定方法及标定装置
CN106093176B (zh) * 2016-07-27 2019-08-06 南京信息工程大学 一种气态硫酸测量的标定方法及标定装置

Also Published As

Publication number Publication date
US6147346A (en) 2000-11-14
JPH1196963A (ja) 1999-04-09
JP3718971B2 (ja) 2005-11-24
CN1214528A (zh) 1999-04-21
DE19842689A1 (de) 1999-03-25

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