CN110993644A - Oled显示面板及制备方法 - Google Patents
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- 238000002360 preparation method Methods 0.000 title claims description 7
- 239000010410 layer Substances 0.000 claims abstract description 367
- 239000000758 substrate Substances 0.000 claims abstract description 39
- 229910052581 Si3N4 Inorganic materials 0.000 claims abstract description 32
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims abstract description 32
- 239000003990 capacitor Substances 0.000 claims abstract description 24
- 238000000151 deposition Methods 0.000 claims abstract description 22
- 239000002346 layers by function Substances 0.000 claims abstract description 19
- 238000003860 storage Methods 0.000 claims abstract description 16
- 229910052751 metal Inorganic materials 0.000 claims description 37
- 239000002184 metal Substances 0.000 claims description 37
- 239000004065 semiconductor Substances 0.000 claims description 30
- 239000000463 material Substances 0.000 claims description 26
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 20
- 229910052802 copper Inorganic materials 0.000 claims description 20
- 239000010949 copper Substances 0.000 claims description 20
- 239000011229 interlayer Substances 0.000 claims description 18
- 238000000059 patterning Methods 0.000 claims description 16
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 14
- 229910052750 molybdenum Inorganic materials 0.000 claims description 14
- 239000011733 molybdenum Substances 0.000 claims description 14
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 10
- 229910045601 alloy Inorganic materials 0.000 claims description 10
- 239000000956 alloy Substances 0.000 claims description 10
- 229910052782 aluminium Inorganic materials 0.000 claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052719 titanium Inorganic materials 0.000 claims description 10
- 239000010936 titanium Substances 0.000 claims description 10
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 8
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 239000012780 transparent material Substances 0.000 claims description 4
- 238000004806 packaging method and process Methods 0.000 claims description 3
- 239000007769 metal material Substances 0.000 claims description 2
- 230000008021 deposition Effects 0.000 abstract description 8
- 238000006722 reduction reaction Methods 0.000 abstract description 5
- 229910044991 metal oxide Inorganic materials 0.000 description 18
- 150000004706 metal oxides Chemical class 0.000 description 18
- 239000007789 gas Substances 0.000 description 14
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- 229910052733 gallium Inorganic materials 0.000 description 6
- 229910052738 indium Inorganic materials 0.000 description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 6
- 238000005530 etching Methods 0.000 description 5
- 239000011787 zinc oxide Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000010416 ion conductor Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- HRHKULZDDYWVBE-UHFFFAOYSA-N indium;oxozinc;tin Chemical compound [In].[Sn].[Zn]=O HRHKULZDDYWVBE-UHFFFAOYSA-N 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- KYKLWYKWCAYAJY-UHFFFAOYSA-N oxotin;zinc Chemical compound [Zn].[Sn]=O KYKLWYKWCAYAJY-UHFFFAOYSA-N 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1216—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being capacitors
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- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
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Abstract
本发明提供一种OLED显示面板,该OLED显示面板包括衬底、驱动电路层、发光功能层以及像素定义层,驱动电路层包括缓冲层、第一电极板和第二电极板,第一电极板和第二电极板形成存储电容;在沉积氮化硅形成第一缓冲层时,未沉积第一电极板,避免了氮化硅沉积时产生离子气体与第一电极板发生还原反应,解决了现有OLED显示面板存在暗纹的技术问题。
Description
技术领域
本发明涉及显示技术领域,尤其涉及一种OLED显示面板和OLED显示面板制备方法。
背景技术
现有OLED显示面板,氮化硅沉积形成缓冲层的过程中,氮化硅的等离子气体与氧化铟锡或氧化铟锌反应,产生暗纹。
所以,现有OLED显示面板存在暗纹的技术问题。
发明内容
本发明提供一种OLED显示面板,用于解决现有OLED显示面板存在暗纹的技术问题。
为解决上述问题,本发明提供的技术方案如下:
本发明实施例提供一种OLED显示面板,其包括:
衬底;
发光功能层,所述发光功能层包括发光区域和非发光区域;
像素定义层,设置于所示发光功能层上;
驱动电路层,包括缓冲层、第一电极板和第二电极板,所述缓冲层包括第一缓冲层和第二缓冲层,所述第一缓冲层设置于所述衬底上,所述第二缓冲层设置于所述第一缓冲层远离所述衬底的方向上,所述第一电极板设置于第一缓冲层和第二缓冲层之间,第二电极板设置于所述第二缓冲层远离所述基板的方向上,所述第一电极板和所述第二电极板形成存储电容。
在本发明提供的OLED显示面板中,所述存储电容设置于所述发光区域,所述第一电极板和所述第二电极板为透明材料。
在本发明提供的OLED显示面板中,所述第一电极板的材料为氧化铟锡或氧化铟锌中的至少一种。
在本发明提供的OLED显示面板中,所述栅极层材料为钼、铝、铜、钛等中的任意一种,或者是一种或多种合金。
在本发明提供的OLED显示面板中,所述驱动电路层包括层叠设置的遮光层、缓冲层、有源层、栅极绝缘层、栅极层、层间绝缘层、源漏极层。
在本发明提供的OLED显示面板中,所述第二电极板为有源层图案化形成。
在本发明提供的OLED显示面板中,所述第二电极板和源漏掺杂区有源层均设置于第二缓冲层上。
在本发明提供的OLED显示面板中,所述遮光层为金属层图案化形成,金属层材料为铜或钼,所述遮光层充当走线,增加走线的设计空间。
本发明实施例提供一种OLED显示面板制备方法,包括:
提供衬底;
在衬底上沉积一层金属,图案化形成遮光层;
沉积一层氮化硅形成第一缓冲层;
沉积氧化铟锡或氧化铟锌中的一种或者多种,形成一层半导体层,并图案化形成第一电极板;
沉积一层氮化硅形成第二缓冲层;
再形成第二电极板、有源层、栅极绝缘层、栅极层、层间绝缘层、源漏极层、发光功能层、像素电极层、像素定义层、公共电极层以及封装层。
在本发明提供的OLED显示面板制备方法中,所述形成栅极层的步骤包括:在栅极绝缘层上沉积一层金属层,作为栅极层,所述金属材料可以是钼、铝、铜、钛等,或者是一种或多种合金。
本发明的有益效果为:本发明提供一种OLED显示面板和OLED显示面板制备方法,该OLED显示面板包括衬底、驱动电路层、发光功能层以及像素定义层,所述发光功能层包括发光区域和非发光区域,所述像素定义层设置于所示发光功能层上,所述驱动电路层包括缓冲层、第一电极板和第二电极板,所述缓冲层包括第一缓冲层和第二缓冲层,所述第一缓冲层设置于所述衬底上,所述第二缓冲层设置于所述第一缓冲层远离所述衬底的方向上,所述第一电极板设置于第一缓冲层和第二缓冲层之间,第二电极板设置于所述第二缓冲层远离所述基板的方向上,所述第一电极板和所述第二电极板形成存储电容;在沉积氮化硅形成第一缓冲层时,还未沉积形成所述第一电极板,避免了氮化硅沉积时产生离子气体与第一电极板发生还原反应,解决了现有OLED显示面板存在暗纹的技术问题。
附图说明
为了更清楚地说明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单介绍,显而易见地,下面描述中的附图仅仅是申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为本发明实施例提供的OLED显示面板的第一种截面示意图;
图2为本发明实施例提供的OLED显示面板图案化形成第二电极板的第一种示意图;
图3为本发明实施例提供的OLED显示面板的第二种截面示意图;
图4为本发明实施例提供的OLED显示面板图案化形成第二电极板的第二种示意图;
图5为本发明实施例提供的OLED显示面板的第三种截面示意图;
图6为本发明实施例提供的OLED显示面板制备方法的示意图。
具体实施方式
以下各实施例的说明是参考附加的图示,用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语,例如[上]、[下]、[前]、[后]、[左]、[右]、[内]、[外]、[侧面]等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本发明,而非用以限制本发明。在图中,结构相似的单元是用以相同标号表示。
针对现有OLED显示面板存在暗纹的技术问题,本发明实施例可以解决这个问题。
如图1所示,本发明提供的OLED显示面板包括:
衬底10;
发光功能层30,所述发光功能层30包括发光区域和非发光区域;
像素定义层40,设置于所示发光功能层30上;
驱动电路层20,包括缓冲层202、第一电极板208和第二电极板209,所述缓冲层202包括第一缓冲层2001和第一缓冲层2002,所述第一缓冲层2001设置于所述衬底10上,所述第一缓冲层2002设置于所述第一缓冲层2001远离所述衬底10的方向上,所述第一电极板208设置于第一缓冲层2001和第一缓冲层2002之间,第二电极板209设置于所述第一缓冲层2002远离所述基板的方向上,所述第一电极板208和所述第二电极板209形成存储电容。
在本实施例中,OLED显示面板包括:
衬底;
发光功能层,所述发光功能层包括发光区域和非发光区域;
像素定义层,设置于所示发光功能层上;
驱动电路层,包括缓冲层、第一电极板和第二电极板,所述缓冲层包括第一缓冲层和第一缓冲层,所述第一缓冲层设置于所述衬底上,所述第一缓冲层设置于所述第一缓冲层远离所述衬底的方向上,所述第一电极板设置于第一缓冲层和第一缓冲层之间,第二电极板设置于所述第一缓冲层远离所述基板的方向上,所述第一电极板和所述第二电极板形成存储电容;在沉积氮化硅形成第一缓冲层时,还未沉积形成所述第一电极板,避免了氮化硅沉积时产生离子气体与第一电极板发生还原反应,解决了现有OLED显示面板存在暗纹的技术问题。
在一种实施例中,所述存储电容设置于所述发光区域,所述第一电极板208和所述第二电极板209为透明材料,这样设置的好处是使得像素尺寸降低,增加开口率。
在一种实施例中,在OLED显示面板中,所述存储电容的尺寸大小与上方对应的所述发光功能层30的发光区域大小相同。
在一种实施例中,在OLED显示面板中,所述存储电容的尺寸大小,小于上方对应的所述发光功能层30的发光区域大小。
在一种实施例中,所述第一电极板208的材料为氧化铟锡或氧化铟锌中的至少一种。
在一种实施例中,所述第二电极板209的材料为铟镓锌氧化物、铟锌锡氧化物或铟镓锌锡氧化物中的至少一种,在第一缓冲层2002上沉积一层金属氧化物半导体材料,对半导体层进行整面的等离子气体处理,对上方没有栅极绝缘层和栅极金属保护的半导体层,处理后作为第二电极板209。
在一种实施例中,所述驱动电路层20包括层叠设置的遮光层201、缓冲层202、有源层203、栅极2051绝缘层204、栅极层205、层间绝缘层206、源漏极层207。
在一种实施例中,先在第一缓冲层2002上形成一整层,然后同时图案化形成源漏掺杂区2003的有源层203和第二电极板209。
在一种实施例中,如图2所示,先在第一缓冲层2002上形成一整层,然后先图案化形成源漏掺杂区2003的有源层203,再图案化形成第二电极板209。
在一种实施例中,所述第二电极板209为有源层203图案化形成。
在一种实施例中,所述第二电极板209和源漏掺杂区2003有源层203均设置于第一缓冲层2002上。
在一种实施例中,所述遮光层201为金属层图案化形成,金属层材料为铜或钼,所述遮光层201充当走线,增加走线的设计空间。
在一种实施例中,如图3所示,在OLED显示面板中,栅极层205图案化形成第二电极板209,先在栅极2051绝缘层204上沉积一层金属,再对金属层图案化形成栅极2051和第二电极板209,第二电极板209形成于发光区域,电容区域和发光区域合并。
在一种实施例中,先在栅极2051绝缘层204上形成一整层,然后同时图案化形成栅极2051和第二电极板209。
在一种实施例中,先在第一缓冲层2002上形成一整层,然后先图案化形成栅极2051,再图案化形成第二电极板209。
在一种实施例中,如图4所示,在OLED显示面板中,源漏极层207图案化形成第二电极板209,先在层间绝缘层206上沉积一层金属,再对金属层图案化,同时形成源极、漏极以及第二电极板209。
在一种实施例中,如图5所示,在OLED显示面板中,源漏极层207图案化形成第二电极板209,先在层间绝缘层206上沉积一层金属,再对金属层图案化,形成源极和漏极,然后再图案化形成第二电极板209。
在一种实施例中,在OLED显示面板中,第一缓冲层2001材料为氮化硅,厚度为300至10000埃米,同时氮化硅可以作为铜扩散阻挡层及铜保护层。
在一种实施例中,在OLED显示面板中,第一缓冲层2001材料为氮化硅,厚度为500至6000埃米,同时可以作为铟镓锌氧化物的接触层。
在一种实施例中,第二电极板209厚度为100至1000埃米,材料为金属氧化物半导体材料,进行整面的离子气体处理,对上方没有栅极绝缘层和栅极金属保护的半导体层,处理后作为第二电极板,处理以后电阻明显降低,形成氮离子导体层,栅极2051绝缘层204下方的金属氧化物半导体材料没有被处理到,保持半导体特性,可作为驱动电路层20沟道,位于第一电极板208上方的金属氧化物半导体材料经导体化处理后形成电容的第二电极板209。
在一种实施例中,在OLED显示面板中,所述栅极2051绝缘层204材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为1000至3000埃米,主要作用为绝缘的作用,将有源层203和栅极层205隔开。
在一种实施例中,在OLED显示面板中,所述栅极层205材料为钼、铝、铜、钛等中的任意一种,或者材料是一种或多种合金,厚度为2000至10000埃米。
在一种实施例中,在OLED显示面板中,层间绝缘层206材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为2000埃米至10000埃米,在制程工艺上通过进行黄光和蚀刻形成层间绝缘层206。
在一种实施例中,在OLED显示面板中,源漏极层207305材料为钼、铝、铜、钛等中的任意一种,或者材料是一种或多种合金,厚度为2000至8000埃米,然后定义出图形。
在一种实施例中,在OLED显示面板中,钝化层材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为1000至5000埃米。
在一种实施例中,电容第一电极层设置于第一缓冲层2001和第一缓冲层2002之间,降低了电容面积,可以提高电容值大小。
在一种实施例中,缓冲层202使用第一缓冲层2001和第一缓冲层2002的叠层结构,避免了铜氧化。
本发明还提供一种OLED显示装置,所述OLED显示装置包括显示面板,如图1所示,显示面板包括:
衬底10;
发光功能层30,所述发光功能层30包括发光区域和非发光区域;
像素定义层40,设置于所示发光功能层30上;
驱动电路层20,包括缓冲层202、第一电极板208和第二电极板209,所述缓冲层202包括第一缓冲层2001和第一缓冲层2002,所述第一缓冲层2001设置于所述衬底10上,所述第一缓冲层2002设置于所述第一缓冲层2001远离所述衬底10的方向上,所述第一电极板208设置于第一缓冲层2001和第一缓冲层2002之间,第二电极板209设置于所述第一缓冲层2002远离所述基板的方向上,所述第一电极板208和所述第二电极板209形成存储电容。
在本实施例中,OLED显示装置包括OLED显示面板,OLED显示面板包括:
衬底;
发光功能层,所述发光功能层包括发光区域和非发光区域;
像素定义层,设置于所示发光功能层上;
驱动电路层,包括缓冲层、第一电极板和第二电极板,所述缓冲层包括第一缓冲层和第一缓冲层,所述第一缓冲层设置于所述衬底上,所述第一缓冲层设置于所述第一缓冲层远离所述衬底的方向上,所述第一电极板设置于第一缓冲层和第一缓冲层之间,第二电极板设置于所述第一缓冲层远离所述基板的方向上,所述第一电极板和所述第二电极板形成存储电容;在沉积氮化硅形成第一缓冲层时,还未沉积形成所述第一电极板,避免了氮化硅沉积时产生离子气体与第一电极板发生还原反应,解决了现有OLED显示面板存在暗纹的技术问题。
在一种实施例中,在OLED显示装置中,所述存储电容设置于所述发光区域,所述第一电极板208和所述第二电极板209为透明材料,使得像素尺寸降低,增加开口率。
在一种实施例中,在OLED显示装置中,所述存储电容的尺寸大小与上方对应的所述发光功能层30的发光区域大小相同。
在一种实施例中,在OLED显示装置中,所述存储电容的尺寸大小,小于上方对应的所述发光功能层30的发光区域大小。
在一种实施例中,所述第一电极板208的材料为氧化铟锡或氧化铟锌中的至少一种。
在一种实施例中,所述第二电极板209的材料为铟镓锌氧化物、铟锌锡氧化物或铟镓锌锡氧化物中的至少一种,在第一缓冲层2002上沉积一层金属氧化物半导体材料,对半导体层进行整面的等离子气体处理,对上方没有栅极绝缘层和栅极金属保护的半导体层,处理后作为第二电极板209。
在一种实施例中,所述驱动电路层20包括层叠设置的遮光层201、缓冲层202、有源层203、栅极2051绝缘层204、栅极层205、层间绝缘层206、源漏极层207。
在一种实施例中,先在第一缓冲层2002上形成一整层,然后同时图案化形成源漏掺杂区2003的有源层203和第二电极板209。
在一种实施例中,如图2所示,先在第一缓冲层2002上形成一整层,然后先图案化形成源漏掺杂区2003的有源层203,再图案化形成第二电极板209。
在一种实施例中,所述第二电极板209为有源层203图案化形成。
在一种实施例中,所述第二电极板209和源漏掺杂区2003有源层203均设置于第一缓冲层2002上。
在一种实施例中,所述遮光层201为金属层图案化形成,金属层材料为铜或钼,所述遮光层201充当走线,增加走线的设计空间。
在一种实施例中,如图3所示,在OLED显示装置中,所述第二电极板209为栅极层205图案化形成,先形成一整层栅极层205,再对栅极层205图案化形成栅极2051和第二电极板209,所述第二电极板209形成于发光区域。
在一种实施例中,先在栅极2051绝缘层204上形成一整层,然后同时图案化形成栅极2051和第二电极板209。
在一种实施例中,先在第一缓冲层2002上形成一整层,然后先图案化形成栅极2051,再图案化形成第二电极板209。
在一种实施例中,如图4所示,在OLED显示装置中,所述源漏极层207图案化形成第二电极板209,先在层间绝缘层206上沉积一层金属,再对金属层图案化,同时形成源极、漏极以及第二电极板209。
在一种实施例中,如图5所示,在OLED显示装置中,源漏极层207图案化形成第二电极板209,先在层间绝缘层206上沉积一层金属,再对金属层图案化,形成源极和漏极,然后再图案化形成第二电极板209。在一种实施例中,在OLED显示装置中,第一缓冲层2001材料为氮化硅,厚度为300至10000埃米,同时氮化硅可以作为铜扩散阻挡层及铜保护层。
在一种实施例中,在OLED显示装置中,第一缓冲层2001材料为氮化硅,厚度为500至6000埃米,同时可以作为铟镓锌氧化物的接触层。
在一种实施例中,第二电极板209厚度为100至1000埃米,材料为金属氧化物半导体材料,进行整面的离子气体处理,对于上方没有栅极2051绝缘层204和栅极2051金属保护的金属氧化物半导体材料,处理以后电阻明显降低,形成氮离子导体层,栅极2051绝缘层204下方的金属氧化物半导体材料没有被处理到,保持半导体特性,可作为驱动电路层20沟道,位于第一电极板208上方的金属氧化物半导体材料经导体化处理后形成电容的第二电极板209。
在一种实施例中,在OLED显示装置中,所述栅极2051绝缘层204材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为1000至3000埃米,主要作用为绝缘的作用,将有源层203和栅极层205隔开。
在一种实施例中,在OLED显示装置中,所述栅极层205材料为钼、铝、铜、钛等中的任意一种,或者材料是一种或多种合金,厚度为2000至10000埃米。
在一种实施例中,在OLED显示装置中,层间绝缘层206材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为2000埃米至10000埃米,在制程工艺上通过进行黄光和蚀刻形成层间绝缘层206。
在一种实施例中,在OLED显示装置中,源漏极层207305材料为钼、铝、铜、钛等中的任意一种,或者材料是一种或多种合金,厚度为2000至8000埃米,然后定义出图形。
在一种实施例中,在OLED显示装置中,钝化层材料为氮化硅或是氮化硅或是多层结构薄膜,厚度为1000至5000埃米。
在一种实施例中,在OLED显示装置中,电容第一电极层设置于第一缓冲层2001和第一缓冲层2002之间,降低了电容面积,可以提高电容值大小。
在一种实施例中,在OLED显示装置中,缓冲层202使用第一缓冲层2001和第一缓冲层2002的叠层结构,避免了铜氧化。
如图6所示,本发明实施例还提供一种OLED显示面板制备方法,包括:
S1:提供衬底10;
S2:在衬底10上沉积一层金属,图案化形成遮光层201;
S3:沉积一层氮化硅形成第一缓冲层2001;
S4:沉积氧化铟锡或氧化铟锌中的一种或者多种,形成一层半导体层,并进行图案化形成第一电极板208;
S5:沉积一层氮化硅形成第一缓冲层2002;
S6:再形成第二电极板209、有源层203、栅极2051绝缘层204、栅极层205、层间绝缘层206、源漏极层207、发光功能层30、像素电极层、像素定义层40、公共电极层以及封装层。
在一种实施例中,形成第二电极板209的步骤包括:在第二缓冲层上沉积一层金属氧化物半导体材料,对半导体层进行整面的离子气体处理,对于上方没有栅极绝缘层和栅极金属保护的金属氧化物半导体材料,处理后形成第二电极板。
在一种实施例中,形成栅极2051金属层的步骤包括:通过气体沉积形成栅极2051金属层,材料可以是钼、铝、铜、钛等,或者是一种或多种合金,厚度2000至10000埃米。
在一种实施例中,形成栅极2051绝缘层204的步骤包括:利用一道黄光,先蚀刻出栅极2051金属的图形,再利用栅极2051金属图形为自对准,蚀刻栅极2051绝缘层204,只在有栅极2051金属图形的膜层下方,才有栅极2051绝缘层204存在,其余地方栅极2051绝缘层204均被蚀刻掉。
在一种实施例中,形成第二电极板209的步骤包括:进行整面的离子气体处理,对于上方没有栅极2051绝缘层204和栅极2051金属保护的金属氧化物半导体材料,处理以后电阻明显降低,形成氮离子导体层,栅极2051绝缘层204下方的金属氧化物半导体材料没有被处理到,保持半导体特性,可作为驱动电路层20沟道,位于第一电极板208上方的金属氧化物半导体材料经导体化处理后形成电容的第二电极板209。
在一种实施例中,形成沉积层间绝缘层206的步骤包括:气体沉积形成层间绝缘层206,材料为氮化硅、氮化硅或是多层结构薄膜,厚度2000埃米至10000埃米,再进行黄光工艺和蚀刻工艺。
在一种实施例中,形成沉积源漏极层207的步骤包括:气体沉积一层金属作为源漏极金属层,可以是钼、铝、铜、钛等,或者是一种或多种合金,厚度2000至8000埃米,然后定义出图形。
根据上述实施例可知:
本发明提供一种OLED显示面板和OLED显示面板制备方法,该OLED显示面板包括衬底、驱动电路层、发光功能层以及像素定义层,发光功能层包括发光区域和非发光区域,像素定义层设置于所示发光功能层上,驱动电路层包括缓冲层、第一电极板和第二电极板,缓冲层包括第一缓冲层和第二缓冲层,第一缓冲层设置于衬底上,第二缓冲层设置于第一缓冲层远离衬底的方向上,第一电极板设置于第一缓冲层和第二缓冲层之间,第二电极板设置于第二缓冲层远离基板的方向上,第一电极板和第二电极板形成存储电容;在沉积氮化硅形成第一缓冲层时,还未沉积形成第一电极板,避免了氮化硅沉积时产生离子气体与第一电极板发生还原反应,解决了现有OLED显示面板存在暗纹的技术问题。
综上所述,虽然本发明已以优选实施例揭露如上,但上述优选实施例并非用以限制本发明,本领域的普通技术人员,在不脱离本发明的精神和范围内,均可作各种更动与润饰,因此本发明的保护范围以权利要求界定的范围为准。
Claims (10)
1.一种OLED显示面板,其特征在于,包括:
衬底;
发光功能层,所述发光功能层包括发光区域和非发光区域;
像素定义层,设置于所示发光功能层上;
驱动电路层,包括缓冲层、第一电极板和第二电极板,所述缓冲层包括第一缓冲层和第二缓冲层,所述第一缓冲层设置于所述衬底上,所述第二缓冲层设置于所述第一缓冲层远离所述衬底的方向上,所述第一电极板设置于第一缓冲层和第二缓冲层之间,第二电极板设置于所述第二缓冲层远离所述基板的方向上,所述第一电极板和所述第二电极板形成存储电容。
2.根据权利要求1所述的OLED显示面板,其特征在于,所述存储电容设置于所述发光区域,所述第一电极板和所述第二电极板为透明材料。
3.根据权利要求2所述的OLED显示面板,其特征在于,所述第一电极板的材料为氧化铟锡或氧化铟锌中的至少一种。
4.根据权利要求2所述的OLED显示面板,其特征在于,所述栅极层材料为钼、铝、铜、钛等中的任意一种,或者是一种或多种合金。
5.根据权利要求2所述的OLED显示面板,其特征在于,所述驱动电路层包括层叠设置的遮光层、缓冲层、有源层、栅极绝缘层、栅极层、层间绝缘层、源漏极层。
6.根据权利要求5所述的OLED显示面板,其特征在于,所述第二电极板为有源层图案化形成。
7.根据权利要求5所述的OLED显示面板,其特征在于,所述第二电极板和源漏掺杂区有源层均设置于第二缓冲层上。
8.根据权利要求5所述的OLED显示面板,其特征在于,金属层图案化形成所述遮光层,金属层材料为铜或钼,所述遮光层为走线层。
9.一种OLED显示面板制备方法,其特征在于,包括:
提供衬底;
在衬底上沉积一层金属,图案化形成遮光层;
沉积一层氮化硅形成第一缓冲层;
沉积氧化铟锡或氧化铟锌中的一种或者多种,形成一层半导体层,并图案化形成第一电极板;
沉积一层氮化硅形成第二缓冲层;
再形成第二电极板、有源层、栅极绝缘层、栅极层、层间绝缘层、源漏极层、发光功能层、像素电极层、像素定义层、公共电极层以及封装层。
10.根据权利要求9所述的OLED显示面板制备方法,其特征在于,所述形成栅极层的步骤包括:在栅极绝缘层上沉积一层金属层,作为栅极层,所述金属材料可以是钼、铝、铜、钛等,或者是一种或多种合金。
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