CN110444247A - Store the test device of equipment write error error correcting capability - Google Patents
Store the test device of equipment write error error correcting capability Download PDFInfo
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- CN110444247A CN110444247A CN201910701394.6A CN201910701394A CN110444247A CN 110444247 A CN110444247 A CN 110444247A CN 201910701394 A CN201910701394 A CN 201910701394A CN 110444247 A CN110444247 A CN 110444247A
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The present invention provides a kind of test devices for storing equipment write error error correcting capability, the error correcting capability measuring technology being related in storage system, with storage chip, control chip and the interface for mutually plugging connection with storage equipment, wherein, control chip and interface can around storage equipment error correction circuit and directly with storage equipment on flash block connection communication and be written and read, wherein control chip includes writing module, reads erasing module, then writing module and reading inspection module.By being previously inserted write error data on scheduled position, storage chip is written or stores in the data page in equipment, it carries out write operation again and reads to examine, the data finally read are exactly the error correction circuit and algorithm, program treated data that have passed through storage chip, the data are compared with the write error data being previously inserted, obtained comparing result just represents the write error error correcting capability of the storage equipment with storage chip.
Description
Technical field
The present invention relates to the error correcting capability measuring technologies in storage system, and in particular to a kind of storage equipment write error error correction
The test device of ability.
Background technique
Flash chip is a kind of storage medium for reaching storage electronic information using flash memory technology, is quickly deposited since it has
Data such as do not disappear at the features after entering and powering off, and have the advantages such as small volume, memory capacity be big, more and more to store
Equipment selects to use flash chip as storage medium.However, physical characteristic of the flash chip due to itself, the number write into
According to the overturning mistake that a certain amount of data bit can occur when reading out, reduced so as to cause the accuracy of storing data.
The generation of such issues that in order to be reduced or avoided, it is just necessary on the storage device controller using flash chip as storage medium
In addition redundant correcting and error handler guarantee the correctness of storing data.The error processing capacity of flash memory also gradually at
For one of the important indicator of reliability for evaluating the entirely storage equipment based on flash chip.
Currently, the production of storage equipment is substantially from from international rare several monopolization storage chip manufacturer (Samsungs, Hai Li
Scholar, Toshiba, ProMos, Micron Technology etc.) at purchase chip or chip after carry out, before actual use, deposited to guarantee to store equipment
Store up the reliability and read-write accuracy of data, it is necessary to error correcting capability inspection is carried out to chip or chip, with verification wafer or
It is the write error error correcting capability of the error correction circuit and algorithm, program carried in chip.
And storage equipment (mobile hard disk, the storage array or storage server) system for once manufacturing multiple storage chips
After the completion of making, it is also desirable to carry out the write error error correcting capability test of integral device, and need to mark the equipment in industry
Error correcting capability, although the existing certain progress of existing the relevant technologies, substantially passes through the data of one section of special designing of write-in
Repeatedly test is carried out to obtain.Although this method can achieve the purpose that test, error handler is complex and quasi-
True property is not high, therefore specific test method could be improved.
Summary of the invention
The present invention is not high in order to solve and accuracy more complex about the error handler of flash memory in the prior art
The problem of and carry out, and it is an object of the present invention to provide it is a kind of store equipment write error error correcting capability test device.
The present invention provides a kind of test device for storing equipment write error error correcting capability, which has storage core
Piece, control chip and the interface for mutually plugging connection with the storage equipment, wherein the control chip includes
Writing module is used to select a blank on storage chip to be detected or storage equipment or has been wiped free of number
According to flash block, and data are written on the data page in the flash block selected；
Erasing module is read, is used to read all data pages in the flash block that data are written in the write module
Data and save in the buffer, then wipe the data in the flash block；
Writing module again is used to carry out write operation to the data block data page being wiped free of in reading erasing step；
Inspection module is read, is used to be read out the data page for the data block for being again written data inspection, according to
The population size of data bit of the population size of the data bit to report an error and write module write-in data compares, and obtains the
One comparison as a result, and will first comparing result write-in test result,
Wherein, it is described control chip and the interface can around it is described storage equipment error correction circuit and with the storage
Flash block connection communication in equipment is simultaneously written and read.
A kind of test device storing equipment write error error correcting capability provided by the invention, wherein the reading inspection module
Also according to the address data corresponding with the write module write-in data bit of data of the address of the data block to report an error, data page
The address of block, the address of data page compare, and obtain the second comparing result, and test is also written in second comparing result
As a result.
A kind of test device storing equipment write error error correcting capability provided by the invention, wherein first comparing result
For accurate judgement, the data that are written are with the presence or absence of write error in storage chip to be detected or storage equipment, and described second
Comparing result is used to determine that the address of the data page of institute's error correction is the data page of preset write error, to avoid encountering non-
Expected mistake.
The present invention provides a kind of test device for storing equipment write error error correcting capability, the sky selected in the test device
Flash block that is white or being wiped free of data be it is random, can be multiple, selected data blocks storage equipment storage
Address in chip is continuous interval or continuous and interval and deposits.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein in the flash block selected
Data page can be multiple, and wherein data page is the smallest write-in unit.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein in the flash block selected
The data of write-in are random.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein in the writing module again
Carry out write operation data block be it is random, when valid data page write in the write module when making wrong data page, due to
Flash memory wipe after can only write primary characteristic, flash chip will report write error, and store equipment will triggering following mistake at
Manage program.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein in the flash block selected
The quantity of the data bit of write-in is determined as being greater than the error correction threshold value of storage equipment according to the threshold value of the error correction algorithm of storage equipment
Or less than the error correction threshold value of storage equipment or equal to the error correction threshold value for storing equipment.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein the control chip also has
There is logging modle, for being recorded in the size for the data bit being written in the flash block selected, is respectively greater than entangling for storage equipment
Wrong threshold value, the error correction threshold value less than storage equipment and three test results equal to the error correction threshold value for storing equipment.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein the storage chip is to dodge
Deposit chip.
The present invention provides a kind of test devices for storing equipment write error error correcting capability, wherein the storage equipment is deposited
Each of blank or the flash block for being wiped free of data data block are selected described in being dispersed throughout in storage address, but in each data
The address of the data page of block is random distribution.
The effect and effect of invention
The test device of storage equipment write error error correcting capability provided by according to the present invention, because the control chip has
Have: writing module is used to select a blank on storage chip to be detected or storage equipment or has been wiped free of data
Flash block, and data are written on the data page in the flash block selected；Erasing module is read, is used to read said write mould
The data on all data pages in the flash block of data and preservation are written in block in the buffer, then wipe in the flash block
Data；Writing module again is used to carry out write operation to the data block data page being wiped free of in reading erasing step；It reads and examines
Module is used to be read out the data page for the data block for being written into data again inspection, and respectively according to the data to report an error
The population size that the data bit of data is written in the population size and the write module of position compares, and obtains the first comparison knot
Fruit, and according to the data bit pair that data are written in the address of the data block to report an error, the address of data page and the write module
The address for the data block answered, the address of data page compare, and obtain the second comparing result, wherein first, second comparison
As a result the test result of the error correcting capability of the write error of the storage equipment is written, so, by preparatory on scheduled position
Write error data are inserted into, storage chip is written or stores in the data page in equipment, then carry out write operation and read to examine, most
The data read eventually are exactly the error correction circuit and algorithm, program treated data that have passed through storage chip, compare the data
It is compared with the write error data being previously inserted, the result of comparison just represents wrongly writing for the storage equipment with storage chip
Accidentally error correcting capability.
Detailed description of the invention
Fig. 1 is the structural frames that the test device of equipment write error error correcting capability is stored described in one embodiment of the present of invention
Frame schematic diagram；
Fig. 2 is the comprising modules block diagram that chip is controlled described in the above embodiment of the present invention；
Fig. 3 is the structural framing schematic diagram of data block in the above embodiment of the present invention, data page；And
Fig. 4 is the operating procedure signal for the test device that equipment write error error correcting capability is stored in the embodiment of the present invention
Figure.
Specific embodiment
It is real below in order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention
Example combination attached drawing is applied specifically to explain the test method of present invention storage equipment write error error correcting capability, system and storage medium work
It states.
Embodiment 1
As shown in Fig. 1 in attached drawing, 2, it is shown that the test device of storage equipment write error error correcting capability of the present invention,
It is with storage chip 10, the interface for controlling chip 20 and mutually plugging connection for the storage equipment and external data source
30 and pcb board 40, wherein the storage chip 10 can store the data being written into, wherein storing in the control chip 20
There is control program, to ensure timely processing of the storage equipment to mistake, to improve the reliability of storage, and the control
Coremaking piece 20 and the interface 30 can around the storage equipment error correction circuit and directly with the flash memory in the storage equipment
Block connection communication is simultaneously written and read, to simplify error handler while improving memory reliability.
Further, as shown in Fig. 2 in attached drawing, the control chip 20 has writing module 100, reads erasing module
200, again writing module 300 and read inspection module 400, wherein the write module 100 be used in storage core to be detected
A blank is selected on piece 10 or storage equipment or has been wiped free of the flash block of data, and on the data page in the flash block selected
Data are written, wherein being written in the reading erasing module 200 reading write module 100 all in the flash block of data
Then data and preservation on data page wipe the data in the flash block in the buffer, wherein the writing module 300 again is right
Write operation is carried out by the data page for reading the data block that erasing module 200 reads and wipes, wherein mould is examined in the reading
Block 400 is for testing to the data page for the data block for being again written data, according to the population size of the data bit to report an error
It compares to obtain the first comparing result, Yi Jigen with the population size for the data bit that data are written in the write module 100
According to the address of the address of the data block to report an error, data page number corresponding with the data bit of data is written in the write module 100
It is compared according to the address of the address of block, data page, obtains the second comparing result, wherein first, second comparing result is equal
The test result of the error correcting capability of the write error of the storage equipment is written.
As illustrated in figure 3 of the drawings, random data is written to be checked by the write module 100 according to preset storage address
In the storage chip of survey or storage equipment, wherein the storage address is dispersed throughout and described select blank or be wiped free of data
Each of flash block data block, but the address of the data page in each data block is random distribution.
In this way this data block for being written into data normally selected below using when, in writing module again
In 300, when valid data page is written on the page for making mistake in writing module 100, it can only be write after being wiped due to flash memory primary
Characteristic, flash chip will report write error, and store equipment will triggering following error handler.
For example, select 8 data pages in data block in the write module 100, be respectively written into 15,15,30,30,
45,45,60,60 total 300bit, it is then erased and after being written again by the writing module again 300, as a result pass through error correction electricity
Road and algorithm, program are fed back to obtain 289bit mistake and obtain error correction, then by comparing preset write error 300bit with entangle
Mistake the write error error correcting capability that the tested storage chip can be quantitatively evaluated in existing wrong 289bit.Further,
Under conditions of knowing the address of specific data block and data page, check problem, the algorithm of error correction circuit can be according to above-mentioned
Feed back the result of the 289bit of obtained error correction to do accurate judgement: the address of the data page of institute's error correction is preset wrongly writes
Data page accidentally, to avoid encountering unexpected mistake.
Embodiment 2
On the basis of embodiment 1, as shown in Fig. 3 in figure attached drawing, storage equipment write error error correction energy of the present invention
The control chip 20 of the test device of power also has logging modle 500, and number is written for being recorded in the flash block selected
According to data bit size, respectively be greater than storage equipment error correction threshold value, less than storage equipment error correction threshold value and be equal to
Store three test results of the error correction threshold value of equipment.
As shown in Fig. 4 in attached drawing, it is shown that the test device of the above-mentioned storage equipment write error error correcting capability of the present invention
Operating procedure.After connecting test device with storage device to be tested by interface, the control chip 20 passes through interface
It is directly connect with the storage chip 10 of storage device to be tested, and automatic running following steps:
S0, the write module 100 are after selecting blank or being wiped free of the flash block of data, and in the flash block selected
In data page in data are written；
All numbers in the flash block of data are written in S1, described read in the erasing reading write module 100 of module 200
It according to the data on page and saves in the buffer, then wipes the data in the flash block；
S2,300 pairs of the writing module again data pages for reading the data block being wiped free of in erasing step carry out write operation；
S3, the reading inspection module 400 test to the data page for the data block for being again written data, according to report
The population size of wrong data bit and the population size for the data bit that data are written in the step S0 compare, and obtain first
Comparing result, and the test result is written into first comparing result.
S4, the logging modle 500 are recorded in the size for the data bit being written in the flash block selected, and are respectively greater than and deposit
Store up the error correction threshold value of equipment, three tests knot of the error correction threshold value less than storage equipment and the error correction threshold value equal to storage equipment
Fruit.
It is noted that address, data in the operating procedure of the test device, also according to the data block to report an error
The address of page and the address of the corresponding data block of the write-in data bit of data in the step S0, the address of data page carry out pair
Than obtaining the second comparing result, and the test result is also written in second comparing result.
In the step S0, the data page in flash block selected can be multiple, and wherein data page is the smallest writes
Enter unit.
For example, in the step S0,8 data pages in data block are selected in the write module 100, point
Not Xie Ru 15,15,30,30,45,45,60,60 total 300bit, it is then erased and again be written after, as a result pass through error correction circuit
And algorithm, program are fed back to obtain 289bit mistake and obtain error correction, then by comparing preset write error 300bit and error correction
It was found that wrong 289bit the write error error correcting capability of the tested storage chip can be quantitatively evaluated.Further, In
Under conditions of the address for knowing specific data block and data page, check problem, the algorithm of error correction circuit can be according to above-mentioned anti-
The result of the 289bit of obtained error correction is presented to do accurate judgement: the address of the data page of institute's error correction is preset write error
Data page, to avoid encountering unexpected mistake.
In this way, by being previously inserted write error data on scheduled position, to be written in storage chip or storage equipment
Data page in, then carry out write operation and read examine, the data finally read be exactly have passed through storage chip error correction electricity
Road and algorithm, program treated data, compare the data and are compared with the write error data being previously inserted, the result of comparison
Just represent the write error error correcting capability of the storage equipment with storage chip.
The action and effect of embodiment
The test device for the storage equipment write error error correcting capability that embodiment provides in the present invention, because of the control chip
Writing module is included, be used to select a blank on storage chip to be detected or storage equipment or has been wiped free of data
Flash block, and data are written on the data page in the flash block selected；Erasing module is read, is used to read said write
The data on all data pages in the flash block of data and preservation are written in module in the buffer, then wipe in the flash block
Data；Inspection module is read, is used to be read out the data page for the data block for being written into data inspection, and according to reporting an error
Data bit population size and write-in data step in the population sizes of data bit of data be written compare to obtain first
Comparing result, and according to the number that data are written in the address of the data block to report an error, the address of data page and write-in data step
It compares to obtain the second comparing result according to the address of the address of the corresponding data block in position, data page, wherein described first, second
The test result of the error correcting capability of the write error of the storage equipment is written in comparing result, so, by scheduled position
Write error data are previously inserted, storage chip is written or stores in the data page in equipment, then write operation is carried out and reads inspection
It tests, the data finally read are exactly the error correction circuit and algorithm, program treated data that have passed through storage chip, and comparison should
Data are compared with the write error data being previously inserted, and the result of comparison just represents the storage equipment with storage chip
Write error error correcting capability.
The present invention is not limited to the above-described embodiments, for those skilled in the art, is not departing from
Under the premise of the principle of the invention, several improvements and modifications can also be made, these improvements and modifications are also considered as protection of the invention
Within the scope of.
The content being not described in detail in this specification belongs to the prior art well known to professional and technical personnel in the field.
Claims (10)
1. it is a kind of store equipment write error error correcting capability test device, which is characterized in that have storage chip, control chip with
And the interface for mutually plugging connection with the storage equipment, wherein the control chip includes
Writing module is used to select a blank on storage chip to be detected or storage equipment or has been wiped free of the sudden strain of a muscle of data
Counterfoil, and data are written on the data page in the flash block selected；
Erasing module is read, is used to read the number on all data pages in the flash block that data are written in the write module
According to and save in the buffer, then wipe the data in the flash block；
Writing module again is used to carry out write operation to the data block data page being wiped free of in erasing module that reads；
Inspection module is read, is used to be read out the data page for the data block for being again written data inspection, according to reporting an error
The population size of data bit and the population size of data bit of write module write-in data compare, obtain first pair
Than as a result, and by first comparing result be written test result,
Wherein, it is described control chip and the interface can around it is described storage equipment error correction circuit and directly with the storage
Flash block connection communication in equipment is simultaneously written and read.
2. test device according to claim 1, it is characterised in that:
Number is written also according to the address of the data block to report an error, the address of data page and the write module in the reading inspection module
According to the address of the corresponding data block of data bit, the address of data page compare, obtain the second comparing result, and by described
Test result is also written in two comparing results.
3. test device according to claim 1, it is characterised in that:
The number for the data bit being written in the flash block selected is determined according to the threshold value of the error correction algorithm of the storage equipment
Amount, wherein when the quantity for the data bit being written is greater than the error correction threshold value of storage equipment or less than the error correction threshold value for storing equipment or waiting
In the error correction threshold value of storage equipment.
4. test device according to claim 3, it is characterised in that:
The control chip also has logging modle, for being recorded in the big of the data bit being written in the flash block selected
It is small, respectively it is greater than the error correction threshold value, the error correction threshold value less than storage equipment and the error correction equal to storage equipment of storage equipment
Three test results of threshold value.
5. test device according to claim 1, which is characterized in that the flash memory selected blank or be wiped free of data
Block includes:
Multiple blank are selected in storage chip at random or are wiped free of the flash block of data, and the address of multiple flash blocks
It is continuous, interval or continuous and interval and deposits.
6. test device according to claim 5, it is characterised in that:
The data being written in the flash block selected in the write module are random.
7. test device according to claim 1, it is characterised in that:
The storage chip is flash chip.
8. test device according to claim 1, it is characterised in that:
The random data and the corresponding storage address of the data are stored in institute after random data is written by the storage equipment
It states in storage chip.
9. test device according to claim 1, it is characterised in that:
Data are written according to preset storage address in storage equipment to be detected at random, wherein the storage of the storage equipment
Each of blank or the flash block for being wiped free of data data block are selected described in being dispersed throughout in address, but in each data block
The address of data page be random distribution.
10. test device according to claim 1, it is characterised in that:
The random data is written to storage chip to be detected according to the storage address or deposited by the writing module again
It stores up in equipment.
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| CN115512757A (en) * | 2022-11-02 | 2022-12-23 | 深圳三地一芯电子有限责任公司 | Error recurrence repairing method, device, equipment and storage medium |
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| CN113470728A (en) * | 2021-06-29 | 2021-10-01 | 成都佰维存储科技有限公司 | Error correction capability test method and device, readable storage medium and electronic equipment |
| CN113470728B (en) * | 2021-06-29 | 2023-11-21 | 成都佰维存储科技有限公司 | Error correction capability test method and device, readable storage medium and electronic equipment |
| CN115512757A (en) * | 2022-11-02 | 2022-12-23 | 深圳三地一芯电子有限责任公司 | Error recurrence repairing method, device, equipment and storage medium |
| CN115512757B (en) * | 2022-11-02 | 2023-03-21 | 深圳三地一芯电子有限责任公司 | Error reproduction and repair method, device, equipment and storage medium |
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