CN105097050B - A kind of storage life test method - Google Patents
A kind of storage life test method Download PDFInfo
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- CN105097050B CN105097050B CN201510523522.4A CN201510523522A CN105097050B CN 105097050 B CN105097050 B CN 105097050B CN 201510523522 A CN201510523522 A CN 201510523522A CN 105097050 B CN105097050 B CN 105097050B
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Abstract
A kind of storage life testing algorithm adds in unit calculator in storage life test program, according to the memory data guide settings rated life time upper limit, resets the ultimate life upper limit of at least 2 times rated life time upper limits；Number is such as read and write more than the ultimate life upper limit, then judges out of memory；It such as reads and writes number and is less than the ultimate life upper limit, then the test limits service life upper limit adds the test total degree of a testing time, then operation continuously is written and read to the storage region of memory, the data for the regular length being written every time are all different, and total number of operations, total write error number, total read error number are recorded, after the completion of test total degree test, whether judgement read-write error number is more than the 60% of test total degree, such as it is more than to judge out of memory；It is such as less than, judgement memory does not fail；Inspection of the present invention for the storage life of volume shipment, testing data reliability and meter the storage algorithm of electric energy meter provide reliable, strong foundation.
Description
Technical field
The present invention relates to memory areas, and in particular to a kind of storage life test method.
Background technology
Memory is for protecting stored memory device in modern information technologies, and concept is very wide, there is many levels,
In digital display circuit, as long as can preserve binary data can be memory；In integrated circuits, one does not have physical form
The circuit with store function be also memory, such as RAM, FIFO；In systems, there is the storage device of physical form
Memory is, such as memory bar, TF card；All information in computer, initial data, computer program including input, intermediate fortune
Row result and final operation result all preserve in memory.It is stored in and takes out information according to the position that controller is specified；Have
Memory, computer just have memory function, just can guarantee normal work；Memory in computer can be divided by purposes memory
For main memory and additional storage, also there is the sorting technique for being divided into external memory and internal storage；External memory is typically magnetic
Property medium or CD etc., can preserve information for a long time；Memory refers to the storage unit on mainboard, is used to store the number being currently executing
According to and program, but be only used for temporarily storing program and data, closing power supply or power-off, data can lose.
Nowadays electric energy meter all can use memory to metering units, collected information is written and is read, and as country
The reliability requirement that power grid stores data is higher and higher, within 10 year service life of electric energy meter, needs to ensure that the safety of data can
It leans on, prevents dispute；And for general nonvolatile memory, such as FLASH, erasing and writing life is only 100,000 times or so,
The erasable number of EEprom also only has 1,000,000 times or so, and just there is higher in the service life of limited memory to the storage method of software
Requirement.
In memory batch production, the consistency of memory product will have differences, and the memory of different batches is wiped
Write number and also have difference, at present to the memory of volume shipment inspection also only have electric property inspection, without for
The test of memory erasing and writing life so that the service life of memory does not know, and can not be meter storage method and the data of electric energy meter
Reliability test provides reliable, effective foundation.
Invention content
The object of the present invention is to provide can be to method that memory erasing and writing life is tested.
The invention is realized by the following technical scheme：A kind of storage life test method, storage life test program
Middle addition unit calculator sets the rated life time upper limit according to the databook of memory, resets at least 2 times of rated life times
The ultimate life upper limit of limit, step are as follows：
Step a）：Storage life test program is detected memory, detects it and reads and writes whether number oversteps the extreme limit
The service life upper limit, the service life upper limit if read-write number oversteps the extreme limit, assert out of memory, reaches maximum erasing and writing life；As read
It writes number and is less than the ultimate life upper limit, then testing time of the testing time of the test limits service life upper limit and increase, then
Enter step b；
Step b）：The data of regular length are written in memory, is such as written unsuccessful, then judges write error, return
The data of regular length are re-write, is such as written successfully, enters step c；
Step c）：The data of regular length are read in memory, such as reads unsuccessful, then judges read error, are returned
Enter step b；Success is such as read, then enters step d；
Step d）：It reads successfully, whether the data of judgement write-in regular length and the data for reading regular length are consistent, such as
Unanimously, then success is read and write, backs into step b；It is such as inconsistent, then enter step c；Data and the reading of regular length is such as written
Continuously there is write-in several times in the data of regular length and reading is inconsistent, then read the fixed length read several times in memory
The data of degree, and judge whether the data of regular length read several times are consistent, it is such as consistent, then judge write error, return
B is entered step, it is such as inconsistent, then judge read error, back into step b；
Step e）：After the completion of the testing time of the ultimate life upper limit adds the test total degree test of a testing time, read
Write error number is read, and judges whether read-write error number is more than the 60% of test total degree, is such as more than then to judge memory
Failure, reaches maximum erasing and writing life；It is such as less than, then judges that memory does not fail.
Memory preserves number of operations, and write error number, read error number, powering on data after power down again will not lose
It loses, can continue to test；Test data can be read and be removed by 485 communication modes.
Unit calculator is added in storage life test program, according to the storage illustrated in the databook of memory
The device service life upper limit sets the rated life time upper limit, resets the ultimate life upper limit of at least 2 times rated life time upper limits, then detect its reading
Number is write to be compared with the ultimate life upper limit, and record read-write number；The ultimate life upper limit is at least 2 times of rated life times
The storage life upper limit of the upper limit once the service life upper limit that reaches capacity, memory will fail, can not be wiped effectively again
It writes；If memory read/write number is more than the ultimate life upper limit, judges out of memory, reach maximum erasing and writing life；Such as deposit
Reservoir read-write number is less than the ultimate life upper limit, then the testing time of the test limits service life upper limit and the primary test time of increase
Number, is then continuously written and read operation, the data for the regular length being written every time are all different, and remember to the storage region of memory
Record total number of operations, total write error number, total read error number；The testing time of the ultimate life upper limit adds once
After the completion of the test total degree test of testing time, read-write error number is read, and judges whether read-write error number is more than to survey
The 60% of total degree is tried, is such as more than then to judge out of memory, reaches maximum erasing and writing life；It is such as less than, then judges memory
It does not fail.
The invention has the beneficial effects that：1）This storage life test method accurately and reliably, can calculate memory
Service life；2）The erasable number of the reality of memory in itself is much larger than the erasable number in databook, and the present invention obtains accurately
Storage life saves cost, and the testing data reliability and meter storage method of inspection, electric energy meter for memory provide
Reliable, strong foundation.
Description of the drawings
Fig. 1 is the step flow chart of the present invention.
Fig. 2 is the test data chart of EEprom memories EE read-writes number under 70 degree of high temperature.
Fig. 3 is the test data chart that EEprom memories EE under the degree of low temperature -40 reads and writes number.
Fig. 4 is the test data chart of flash storage EE read-writes number under 70 degree of high temperature.
Fig. 5 is the test data chart that flash storage EE under the degree of low temperature -40 reads and writes number.
Specific embodiment
Below in conjunction with the accompanying drawings with specific embodiment, the invention will be further described.
See Fig. 1 to Fig. 5, a kind of storage life test method adds in unit calculator in storage life test program,
The rated life time upper limit is set according to the databook of memory, resets the ultimate life upper limit of at least 2 times rated life time upper limits,
Step is as follows：
Step a）：Storage life test program is detected memory, detects it and reads and writes whether number oversteps the extreme limit
The service life upper limit, the service life upper limit if read-write number oversteps the extreme limit, assert out of memory, reaches maximum erasing and writing life；As read
It writes number and is less than the ultimate life upper limit, then testing time of the testing time of the test limits service life upper limit and increase, then
Enter step b；
Step b）：The data of regular length are written in memory, is such as written unsuccessful, then judges write error, return
The data of regular length are re-write, is such as written successfully, enters step c；
Step c）：The data of regular length are read in memory, such as reads unsuccessful, then judges read error, are returned
Enter step b；Success is such as read, then enters step d；
Step d）：It reads successfully, whether the data of judgement write-in regular length and the data for reading regular length are consistent, such as
Unanimously, then success is read and write, backs into step b；It is such as inconsistent, then enter step c；Data and the reading of regular length is such as written
Continuously there is write-in several times in the data of regular length and reading is inconsistent, then read the fixed length read several times in memory
The data of degree, and judge whether the data of regular length read several times are consistent, it is such as consistent, then judge write error, return
B is entered step, it is such as inconsistent, then judge read error, back into step b；
Step e）：After the completion of the testing time of the ultimate life upper limit adds the test total degree test of a testing time, read
Write error number is read, and judges whether read-write error number is more than the 60% of test total degree, is such as more than then to judge memory
Failure, reaches maximum erasing and writing life；It is such as less than, then judges that memory does not fail.
Memory preserves number of operations, and write error number, read error number, powering on data after power down again will not lose
It loses, can continue to test；Test data can be read and be removed by 485 communication modes.
In present embodiment, unit calculator is added in storage life test program, according to the databook of memory
The rated life time upper limit is set, it is 900W times to reset the ultimate life upper limit, then carries out following steps：
Step a）：Detection memory read/write number is compared, and record read-write number with the ultimate life upper limit；Such as read-write
Number is more than 900W times, then assert out of memory, reach maximum erasing and writing life；Number is such as read and write less than 900W times, then is increased
Testing time, makes test total degree reach 900W+1 times, enters step b；
Step b）：The data of 200 byte lengths are written in memory, are such as written unsuccessful, then judges write error, returns
The data for re-writing regular length are returned, is such as written successfully, then enters step c；
Step c）：It reads the data of 200 byte lengths for the first time in memory, such as first time read error, then judges
First time read error returns to the data that regular length is written in memory again；If first time reads successfully, then enter step
Rapid d；
Step d）：It reads for the first time successfully, the data of judgement 200 byte lengths of write-in and 200 bytes read for the first time
Whether the data of length are consistent, such as consistent, then read and write success, return to the data that regular length is written in memory again；Such as
It is inconsistent, then enter step e；
Step e）：Second of data for reading 200 byte lengths in memory, such as second of read error, then judge
Second of read error returns to the data that regular length is written in memory again；If second is read successfully, then enter step
Rapid f；
Step f）：It reads for the second time successfully, the data and 200 bytes of second of reading of judgement 200 byte lengths of write-in
Whether the data of length are consistent, such as consistent, then judge first time read error, this is read and write successfully, returns again in memory
The data of middle write-in regular length；It is such as inconsistent, then enter step g；
Step g）：Third time reads the data of 200 byte lengths in memory, such as third time read error, then judges
Third time read error returns to the data that regular length is written in memory again；If third time is read successfully, then enter step
Rapid h；
Step h）：Third time is read successfully, the data of judgement 200 byte lengths of write-in and 200 bytes read for the third time
Whether the data of length are consistent, such as consistent, then judge second of read error, this is read and write successfully, returns again in memory
The data of middle write-in regular length；It is such as inconsistent, then enter step I；
Step i）：Detect the data of 200 byte lengths read three times；And judge 200 byte lengths read three times
Whether data are consistent, such as consistent, then judge the error in data of 200 byte lengths is written, be write error, return is storing again
The data of regular length are written in device；It is such as inconsistent, then judge to read the error in data of 200 byte lengths three times, it is wrong to read
Accidentally, the data that regular length is written in memory again are returned；Step j）：The test total degree test of 900W+1 times is completed
Afterwards, read-write error number is read, and judges whether read-write error number is more than the 60% of test total degree, is such as more than, then judgement is deposited
Reservoir fails, and reaches maximum erasing and writing life；It is such as less than, then judges that memory does not fail.
In present embodiment, in storage life test, power down is encountered, memory can preserve number of operations, and write-in is wrong
Accidentally number, read error number, powering on data after power down again will not lose, and can continue to test, and prevent from testing repeatedly, save into
This.
In present embodiment, test data can be read and be removed by 485 communication modes, can be convenient for users to efficiently general
Data export, and reliable, effective foundation is provided to other tests.
In present embodiment, EEprom memories M24512R and FLASH memory MX25L3206E are selected as test pair
As, and tested at different temperatures；In its databook, the erasing and writing life of M24512R is 1,000,000 times,
MX25L3206E is 100,000 times.
In present embodiment, Fig. 2 to Fig. 5 is seen, obtained from two different memory test data, memory reality
Erasable number is much larger than the erasable number that its databook provides, and the present invention can accurately, reliably calculate the service life of memory,
The testing data reliability and meter storage method of inspection, electric energy meter for memory provide reliable, strong foundation.
Protection scope of the present invention includes but not limited to embodiment of above, and protection scope of the present invention is with claims
Subject to, any replacement being readily apparent that those skilled in the art that this technology is made, deformation, improvement each fall within the present invention's
Protection domain.
Claims (3)
1. a kind of storage life test method, which is characterized in that unit calculator, root are added in storage life test program
The rated life time upper limit is set according to the databook of memory, resets the ultimate life upper limit of at least 2 times rated life time upper limits, step
It is rapid as follows：
Step a）：Storage life test program is detected memory, detects it and reads and writes whether number oversteps the extreme limit the service life
The upper limit, the service life upper limit if read-write number oversteps the extreme limit, assert out of memory, reaches maximum erasing and writing life；It such as reads and writes secondary
Number is less than the ultimate life upper limit, then the testing time of the test limits service life upper limit increases primary, subsequently into step b；
Step b）：The data of regular length are written in memory, are such as written unsuccessful, then judges write error, returns again
The data of regular length are written, is such as written successfully, enters step c；
Step c）：The data of regular length are read in memory, are such as read unsuccessful, are then judged read error, back into
Step b；Success is such as read, then enters step d；
Step d）：It reads successfully, whether the data of judgement write-in regular length and the data for reading regular length are consistent, and such as one
It causes, then reads and writes success, back into step b；It is such as inconsistent, then enter step c；The data that regular length is such as written are solid with reading
Continuously there is write-in several times in the data of measured length and reading is inconsistent, then read the regular length read several times in memory
Data, and judge whether the data of regular length that read several times consistent, it is such as consistent, then judge write error, return into
Enter step b, it is such as inconsistent, then judge read error, back into step b；
Step e）：After the completion of the testing time of the ultimate life upper limit adds the test total degree test of a testing time, read and read
Write error number, and judge whether read-write error number is more than the 60% of test total degree, such as it is more than then to judge out of memory,
Reach maximum erasing and writing life；It is such as less than, then judges that memory does not fail.
2. a kind of storage life test method according to claim 1, it is characterised in that：Memory preserves operation time
Number, write error number, read error number, powering on data after power down again will not lose, and can continue to test.
3. a kind of storage life test method according to claim 1, it is characterised in that：Test data can pass through 485
Communication mode reads and removes.
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| CN105807157B (en) * | 2016-03-10 | 2020-09-04 | 深圳市硅格半导体有限公司 | High-temperature aging test system |
| CN108269606B (en) * | 2018-01-10 | 2020-07-14 | 重庆金山医疗器械有限公司 | Method and system for testing storage parameters of eMMC chip |
| CN110060725B (en) * | 2018-01-18 | 2021-07-02 | 华邦电子股份有限公司 | Memory test method |
| CN108491740A (en) * | 2018-02-01 | 2018-09-04 | 珠海全志科技股份有限公司 | A kind of TF card performance method of real-time |
| CN109616151A (en) * | 2019-03-11 | 2019-04-12 | 深兰人工智能芯片研究院（江苏）有限公司 | A kind of method and device for testing memory data treatment effeciency |
| CN111312326B (en) * | 2020-03-09 | 2021-11-12 | 宁波三星医疗电气股份有限公司 | Flash memory life testing method and device, power acquisition terminal and storage medium |
| CN113820649B (en) * | 2021-08-31 | 2024-05-17 | 中国电力科学研究院有限公司 | Method and device for testing service life reliability of firmware of electric energy meter |
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| CN1553327A (en) * | 2003-05-30 | 2004-12-08 | 上海华园微电子技术有限公司 | Circuit for testing EEPROM and testing method thereof |
| TW200721182A (en) * | 2005-11-30 | 2007-06-01 | Advantest Corp | Test apparatus and test method |
| CN102590035A (en) * | 2012-01-20 | 2012-07-18 | 杭州中旺科技有限公司 | Viscosity measuring method for viscosity measuring platform |
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| CN1553327A (en) * | 2003-05-30 | 2004-12-08 | 上海华园微电子技术有限公司 | Circuit for testing EEPROM and testing method thereof |
| TW200721182A (en) * | 2005-11-30 | 2007-06-01 | Advantest Corp | Test apparatus and test method |
| CN102590035A (en) * | 2012-01-20 | 2012-07-18 | 杭州中旺科技有限公司 | Viscosity measuring method for viscosity measuring platform |
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