CN107481764B - 3D Nand Flash scanning detection method and system - Google Patents
3D Nand Flash scanning detection method and system Download PDFInfo
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- CN107481764B CN107481764B CN201710641935.1A CN201710641935A CN107481764B CN 107481764 B CN107481764 B CN 107481764B CN 201710641935 A CN201710641935 A CN 201710641935A CN 107481764 B CN107481764 B CN 107481764B
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/32—Serial access; Scan testing
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
Abstract
The invention discloses a 3D Nand Flash scanning detection method and a system, wherein the method comprises the following steps: randomly selecting storage blocks according to a certain proportion to perform data error code test, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template; sequentially grouping storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on a page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist; all packets are scanned and a bad block table is generated. The system is used for executing the corresponding method. According to the invention, the local storage blocks are tested to obtain the defective distribution, the grouped storage blocks are detected based on the defective distribution, and the quality degree of the storage blocks is judged according to the detection result, so that the detection of the storage blocks can be rapidly realized, and the generation efficiency is improved.
Description
Technical Field
The invention relates to a 3D Nand Flash scanning detection method and a system, and belongs to the technical field of storage.
Background
With the rapid development of computers and mobile storage devices, the demand for large-capacity mobile storage devices is more and more extensive, which requires that the storage devices have larger capacity, faster speed and higher stability. In general, TF cards, EMMC and SSD meet the requirements of large-capacity storage devices by using large-capacity Nand Flash, and the 3D NAND Flash has been released from the world to solve the requirements of the mobile storage devices on capacity, but the mass production scanning time is too long, which also becomes a very outstanding contradiction. At present, scanning detection aiming at 3D Nand Flash is in a full-disk scanning detection mode, although a detection result is accurate, the mass production efficiency is very low due to too long detection time, the production efficiency cannot be guaranteed, the reason for damage of a storage block is not independent, and other storage blocks are likely to be repeatedly damaged in the same way. In summary, the existing scan detection algorithm for 3DNand Flash cannot meet the actual needs of the modern society, and needs to be improved.
Disclosure of Invention
In order to solve the problems, the invention provides a 3D Nand Flash scanning detection method.
The technical scheme adopted by the invention is that on one hand, the 3D Nand Flash scanning detection method comprises the following steps: randomly selecting storage blocks according to a certain proportion to perform data error code test, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template; sequentially grouping storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on a page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist; all packets are scanned and a bad block table is generated.
Preferably, the data error code test includes reading and writing data for each page, marking the page as a damaged page when a difference between the read data and the written data is greater than a preset error threshold, and recording a position of the damaged page in the block to generate a damaged page distribution.
Preferably, the data error code test includes reading and writing data for each block, marking the block as a damaged block when a difference between the read data and the written data is greater than a preset error threshold, and recording a position of the damaged block in the storage block to generate damaged block distribution.
Preferably, reading an additional page distribution and a block distribution; and combining the additional page distribution and page template, the additional block distribution and block template to generate a new page template and block template.
Preferably, the method further comprises randomly selecting a part of page distribution from the page template, scanning all storage blocks in the group based on the part of page distribution, marking the group of storage blocks as normal blocks if no damaged page exists, and performing full scanning on the grouped storage blocks if damaged page exists.
Preferably, the method further comprises the steps of randomly selecting a plurality of storage blocks from the grouped storage blocks, scanning the selected storage blocks based on a block template, marking the group of storage blocks as normal blocks if damaged blocks do not exist, and comprehensively scanning the grouped storage blocks if damaged blocks exist.
In another aspect, the invention provides a 3D Nand Flash scanning detection system, for performing the above method, including: the template module is used for randomly selecting the storage blocks according to a certain proportion to carry out data error code test, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template; the grouping module is used for sequentially grouping the storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on the page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist; and the scanning module is used for scanning all the groups and generating a bad block table.
The invention has the advantages that the partial storage blocks are tested to obtain the defective distribution, the grouped storage blocks are detected based on the defective distribution, and the quality degree of the storage blocks is judged according to the detection result, so that the detection of the storage blocks can be rapidly realized, and the generation efficiency is favorably improved.
Drawings
Fig. 1 is a schematic diagram illustrating a 3D Nand Flash scanning detection method according to an embodiment of the present invention.
Detailed Description
The present invention will be described with reference to examples.
Based on the embodiment of the invention, as shown in fig. 1, a 3D Nand Flash scanning detection method includes: randomly selecting storage blocks according to a certain proportion to perform data error code test, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template; sequentially grouping storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on a page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist; all packets are scanned and a bad block table is generated.
Since industrial production is a standardized operation, if a step or a flow of damaging a memory block occurs, other memory blocks are likely to be affected, and therefore 3% of valid blocks in all the memory blocks are randomly extracted for preliminary detection; the specific detection method comprises the steps of reading and writing data, if a storage block is damaged, judging whether the read data and the written data are damaged (namely, wrong codes) according to the degree of the difference, recording the distribution condition of the pages and the blocks in the blocks/storage block, wherein the distribution condition is used as a template for subsequent detection and marked as a page template and a block template; all the storage blocks are grouped in sequence according to a preset grouping parameter (for example, every 8 storage blocks are divided into a group), then the storage blocks are scanned based on a page template and a block template, if the page/block of the corresponding position is not damaged (namely, the read-write test has no problem), all the storage blocks of the group can be judged to be the storage blocks which work well, otherwise, all the storage blocks need to be scanned comprehensively.
The page/block distribution generation method comprises the following steps: the storage blocks have damaged parts, and the positions of the damaged parts are increased to the template as long as the damaged parts occur once no matter the occurrence times of the damaged parts, or the damaged parts can be determined according to the occurrence times;
for example, one block comprises pages 1-50, in 100 detections, the number of times of a page1 is 1, the number of times of a page2 is 55, the number of times of a page3 is 21, and all the other pages 4-50 are not damaged; templates may be generated including page1, page2, and page 3; a template may also be generated that includes only page2 and page3 (i.e., pages that have fewer than a certain threshold number of defects may be ignored).
Each packet is scanned in turn until a complete bbt (bad Block table) is obtained after all scans are completed.
According to the method of the embodiment, the data error code test comprises the steps of reading and writing data for each page, marking the page as a damaged page when the difference between the read data and the written data is larger than a preset error threshold value, and recording the position of the damaged page in block to generate damaged page distribution.
And forming a block by a plurality of pages, and recording the positions of damaged pages in the block to generate page distribution records.
According to the method of the embodiment, the data error code test comprises the steps of reading and writing data of each block, marking the block as a damaged block when the difference between the read data and the written data is larger than a preset error threshold value, and recording the position of the damaged block in a storage block to generate damaged block distribution.
And forming a storage block group by a plurality of blocks, and recording the positions of damaged blocks in the storage block group to generate block distribution records.
The method based on the embodiment further comprises reading additional page distribution and block distribution; and combining the additional page distribution and page template, the additional block distribution and block template to generate a new page template and block template.
Sometimes, the page/block locations of many defective memory blocks can be identified according to customer feedback, or pages/blocks found to be more susceptible to defects in other detection processes;
in this case, in addition to the originally detected template, it is necessary to add these extra portions for detection, combine the two and generate a new template, and then perform detection according to the method of the above embodiment.
The method based on the embodiment further comprises the steps of randomly selecting a part of page distribution from the page template, scanning all storage blocks in the group based on the part of page distribution, marking the group of storage blocks as normal blocks if no damaged page exists, and comprehensively scanning the grouped storage blocks if damaged pages exist.
Some damaged pages are rarely found, but are included in the template, and for efficiency, the scanning may be performed by selecting only a part of the pages to scan instead of using the entire page distribution, which may increase the scanning efficiency.
The method based on the embodiment further comprises the steps of randomly selecting a plurality of storage blocks from the grouped storage blocks, scanning the selected storage blocks based on the block template, marking the group of storage blocks as normal blocks if damaged blocks do not exist, and comprehensively scanning the grouped storage blocks if damaged blocks exist.
And randomly selecting a plurality of storage blocks (the number of the storage blocks is less than the grouping parameter) from the grouped storage blocks, and scanning the selected storage blocks based on the block template.
Based on the embodiment of the invention, the 3D Nand Flash scanning detection system is used for executing the method and comprises the following steps: the template module is used for randomly selecting the storage blocks according to a certain proportion to carry out data error code test, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template; the grouping module is used for sequentially grouping the storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on the page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist; and the scanning module is used for scanning all the groups and generating a bad block table.
The above description is only a preferred embodiment of the present invention, and the present invention is not limited to the above embodiment, and the present invention shall fall within the protection scope of the present invention as long as the technical effects of the present invention are achieved by the same means. The invention is capable of other modifications and variations in its technical solution and/or its implementation, within the scope of protection of the invention.
Claims (7)
1. A3D Nand Flash scanning detection method is characterized by comprising the following steps:
randomly selecting storage blocks according to a proportion of 3% to perform data error code testing, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template;
sequentially grouping storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on a page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist;
all packets are scanned and a bad block table is generated.
2. The 3D Nand Flash scanning detection method of claim 1, wherein the data error code test comprises data reading and writing for each page, when the difference between the read data and the written data is larger than a preset error threshold value, the page is marked as a damaged page, and the position of the damaged page in block is recorded to generate damaged page distribution.
3. The 3D Nand Flash scanning detection method of claim 1, wherein the data error code test comprises data reading and writing for each block, when the difference between the read data and the written data is larger than a preset error threshold value, the block is marked as a damaged block, and the position of the damaged block is recorded in a storage block to generate damaged block distribution.
4. The 3D Nand Flash scanning detection method of claim 1, further comprising reading additional page distribution, block distribution;
and combining the additional page distribution and page template, the additional block distribution and block template to generate a new page template and block template.
5. The 3D Nand Flash scan detection method as claimed in claim 1 or 4, further comprising randomly selecting a part of page distribution from the page template, scanning all the memory blocks in the packet based on the part of page distribution, marking the group of memory blocks as normal blocks if no damaged page exists, and performing full scan on the grouped memory blocks if damaged page exists.
6. The 3D Nand Flash scanning detection method as claimed in claim 1 or 4, further comprising randomly selecting a plurality of storage blocks from the grouped storage blocks, scanning the selected storage blocks based on a block template, marking the group of storage blocks as normal blocks if no damaged block exists, and comprehensively scanning the grouped storage blocks if damaged block exists.
7. A 3D Nand Flash scan detection system for performing the method of claim 1, comprising:
the template module is used for randomly selecting the storage blocks according to the proportion of 3% to perform data error code testing, acquiring damaged page distribution and damaged block distribution based on a test result, and respectively marking the damaged page distribution and the damaged block distribution as a page template and a block template;
the grouping module is used for sequentially grouping the storage blocks according to preset grouping parameters, scanning corresponding pages or/and blocks based on the page template or/and block template, marking the group of storage blocks as normal blocks if no damaged pages or blocks exist, and comprehensively scanning the grouped storage blocks if damaged pages or blocks exist;
and the scanning module is used for scanning all the groups and generating a bad block table.
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| CN113051191A (en) * | 2021-03-05 | 2021-06-29 | 深圳三地一芯电子有限责任公司 | Method for increasing Flash chip capacity |
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| CN100514499C (en) * | 2003-07-29 | 2009-07-15 | 华为技术有限公司 | FLASH internal unit testing method |
| CN100446129C (en) * | 2006-09-07 | 2008-12-24 | 华为技术有限公司 | Method and system for RAM fault testing |
| US7859932B2 (en) * | 2008-12-18 | 2010-12-28 | Sandisk Corporation | Data refresh for non-volatile storage |
| CN103077748B (en) * | 2011-10-25 | 2015-09-16 | 珠海扬智电子科技有限公司 | The merging built-in self-test method of static RAM |
| KR20130134610A (en) * | 2012-05-31 | 2013-12-10 | 에스케이하이닉스 주식회사 | Semiconductor memory device and testing method thereof |
| US9443613B2 (en) * | 2014-03-28 | 2016-09-13 | Lenovo (Singapore) Pte. Ltd. | Advanced memory test diagnostics |
| CN106205737B (en) * | 2016-07-06 | 2019-04-26 | 深圳佰维存储科技股份有限公司 | A method of test Nand flash life cycle |
| CN106158047A (en) * | 2016-07-06 | 2016-11-23 | 深圳佰维存储科技股份有限公司 | A kind of NAND FLASH method of testing |
| CN106648942A (en) * | 2016-09-06 | 2017-05-10 | 深圳忆数存储技术有限公司 | Data switching method and device based on flash storage medium |
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