CN110321256A - A kind of test method, test equipment and computer storage medium storing equipment - Google Patents
A kind of test method, test equipment and computer storage medium storing equipment Download PDFInfo
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- 238000003860 storage Methods 0.000 title claims abstract description 150
- 238000012360 testing method Methods 0.000 title claims abstract description 115
- 238000010998 test method Methods 0.000 title claims abstract description 40
- 238000013479 data entry Methods 0.000 claims description 16
- 238000004590 computer program Methods 0.000 claims description 12
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
- G06F11/2635—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files
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Abstract
This application discloses a kind of test method, test equipment and computer storage medium for storing equipment, which includes at least one bare die, and this method includes that the first data are written into the register of the bare die of storage equipment；The second data are read from register；Judge whether the first data are identical as the second data, obtain test result.Using aforesaid way, the application improves the test intensity to storage equipment, and will not generate adverse effect to the service life of storage equipment.
Description
Technical field
This application involves field of computer technology, and in particular to a kind of test method, test equipment and meter for storing equipment
Calculation machine storage medium.
Background technique
Flash memory (Flash) is the nonvolatile memory that a kind of capacity is big, read or write speed is high, low in energy consumption and at low cost,
Especially it has the characteristics that non-volatile, i.e., remains to save data after a loss of power, so that its application in life is increasingly
Extensively.It is higher and higher for flash reading and writing rate request with multimedia development and the arrival of big data era, with opening
With for non-flash interface standard (ONFI, Open NAND Flash Interface), ONFI also experienced from ONFI1.0 formula
The gradually development of ONFI4.0 is arrived to ONFI2.0 to ONFI3.0, interface rate is improved by 50Mbps to present 1200Mbps, this
Harsh test is proposed to the reliability of flash interface signal.
Present inventor has found that flash memory is needed in process of production by cutting, binding and envelope in long-term R & D
Dress, cutting be monocrystalline silicon is cut, the process operations such as multiple photoetching and doping；Binding is integrated circuit die
(DIE) and a kind of technology for connecting of substrate cabling (ordinary circumstance is gold thread), it is divided into the binding and sudden strain of a muscle of master control to substrate
It is stored to the binding of substrate；Encapsulation refers to and is enclosed in one or more DIE together, encapsulation format have double vertical type encapsulation (DIP,
Dual Inline Package), BGA Package (BGA, Ball Grid Array Package), contact pin grid array envelope
Dress technology (PGA, Pin Grid Array Package) or TSOP (Outline Package, Thin Small Outline
Package) etc.；Any step in these process operations is not carried out and may all be impacted to flash interface signal, so that patch
Piece is likely to occur that substrate cabling is bad, resistance matching problem, generates flash interface signal problem.Therefore, how signal survey is carried out
Examination, becomes urgent problem to be solved.
Summary of the invention
The application mainly solves the problems, such as the test method, test equipment and computer storage that are to provide a kind of storage equipment
Medium improves the test intensity to storage equipment, and will not generate adverse effect to the service life of storage equipment.
In order to solve the above technical problems, the application the technical solution adopted is that provide it is a kind of store equipment test method,
The storage equipment includes at least one bare die, this method comprises: the first data are written into the register of the bare die of storage equipment；
The second data are read from register；Judge whether the first data are identical as the second data, obtain test result.
Wherein, the step of the first data being written into the register of the bare die of storage equipment, comprising: sent to storage equipment
Data entry command, the offset address of register and the first data, to be written the into the register of the bare die of storage equipment
One data；The offset address of random data reading order and register is sent, to storage equipment with from the bare die of storage equipment
Register in read the second data.
Wherein, bare die further includes the input/output interface connecting with register, and register includes command register, address
Register and data register.
Wherein, the offset address and the first data of data entry command, register are sent, to storage equipment with to storage
The step of the first data are written in the register of the bare die of equipment, comprising: utilize input/output interface input data input life
It enables, and data entry command is made to be transmitted to command register；Using the offset address of input/output interface input register, and
The offset address of register is set to be transmitted to address register；The first data are inputted using input/output interface, and make the first data
It is transmitted to data register.
Wherein, data entry command includes serial date transfer order or random data input order.
Wherein, the offset address of random data reading order and register is sent, to storage equipment with from storage equipment
Bare die register in the step of reading the second data, comprising: read life using input/output interface input random data
It enables, and random data reading order is made to be transmitted to command register；Utilize the offset of input/output interface input register
Location, and the offset address of register is made to be transmitted to address register；Utilize in input/output interface read data register
Two data.
Wherein, the offset address of register includes the first offset address of register and the second offset address of register；
The offset address of random data reading order and register is sent, to storage equipment with from the register of the bare die of storage equipment
The step of the second data of middle reading, comprising: using input/output interface input setting period reading order, and make to set the period
Reading order is transmitted to command register；Using the first offset address of input/output interface input register, and make register
The first offset address be transmitted to address register；Random data reading order is inputted using input/output interface, and is made random
Data read command is transmitted to command register；Using the second offset address of input/output interface input register, and make to post
Second offset address of storage is transmitted to address register；Utilize the second number in input/output interface read data register
According to.
Wherein, after the step of judging whether the first data are identical as the second data, obtaining test result, further includes: inspection
Survey whether accumulative testing time is greater than default testing time；If it is not, then executing the register of the bare die to storage equipment again
The step of the first data of middle write-in, until accumulative testing time is greater than default testing time；Or judge the first data and the
After the step of whether two data are identical, obtain test result, further includes: detect whether the accumulative testing time is greater than default survey
Try the time；If it is not, the step of the first data are written into the register of the bare die of storage equipment is then executed again, until what is added up
Testing time is greater than the default testing time.
In order to solve the above technical problems, another technical solution that the application uses is to provide a kind of test equipment, the test
Equipment includes the memory and processor interconnected, wherein memory is for storing computer program, and computer program is in quilt
When processor executes, for realizing the test method of above-mentioned storage equipment.
In order to solve the above technical problems, another technical solution that the application uses is to provide a kind of computer storage medium,
The computer storage medium is for storing computer program, and computer program is when being executed by processor, for realizing above-mentioned
Store the test method of equipment.
Using above scheme, the beneficial effect of the application is: the first number of register write-in into the bare die of storage equipment
According to then reading the second data from the register in bare die, compare the first data and whether the second data are identical, tested
As a result；Storage equipment is tested by way of only reading and writing the register of storage equipment, the first data are not written to storage
In array, because without wearing storage array, since the service life of flash memory is mainly determined by the service life of storage array, so to storage
The service life of equipment will not have any impact；And since data not being written into storage array, so will not be by storage array
Interference, storage array failure will not disturbed test；The waiting time for not being written and reading data, to storage equipment
Write-in and read access time be far smaller than data transmission period, so, and degree of randomization big to the test intensity of storage equipment
Height can test various data, the inaccuracy of test result caused by preventing test sample small.
Detailed description of the invention
To describe the technical solutions in the embodiments of the present invention more clearly, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the invention, for
For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings other
Attached drawing.Wherein:
Fig. 1 is the structural schematic diagram of the test method first embodiment of storage equipment provided by the present application；
Fig. 2 is the structural schematic diagram of the test method second embodiment of storage equipment provided by the present application；
Fig. 3 is the structural schematic diagram of the test method 3rd embodiment of storage equipment provided by the present application；
Fig. 4 is the structural schematic diagram of the test method fourth embodiment of storage equipment provided by the present application；
Fig. 5 is the structural schematic diagram of the 5th embodiment of test method of storage equipment provided by the present application；
Fig. 6 is the structural schematic diagram of the test method sixth embodiment of storage equipment provided by the present application；
Fig. 7 is the structural schematic diagram of one embodiment of test equipment provided by the present application；
Fig. 8 is the structural schematic diagram of one embodiment of computer storage medium provided by the present application.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of embodiments of the present application, rather than whole embodiments.Based on this
Embodiment in application, those of ordinary skill in the art are obtained every other under the premise of not making creative labor
Embodiment shall fall in the protection scope of this application.
Refering to fig. 1, Fig. 1 is the structural schematic diagram of one embodiment of test method of storage equipment provided by the present application, this is deposited
Storing up equipment includes at least one bare die, and the test method of the storage equipment includes:
Step 11: the first data are written into the register of the bare die of storage equipment.
The storage equipment can be solid state drive (SSD, Solid State Drive), USB flash disk or embedded multi-media card
(eMMC, Embedded Multi Media Card) etc., bare die are flash chip bare die.
In order to which the performance to storage equipment is tested, the first data can be written in test equipment into the register of bare die,
The bare die for receiving the first data can be the part bare die of setting, be also possible to store whole bare dies in equipment.
Step 12: the second data are read from register.
After the register in storage equipment receives the first data of test equipment transmission, i.e., it is stored in register
Data, test equipment can read data from the register in bare die.
Step 13: judging whether the first data are identical as the second data, obtain test result.
Since storage equipment will do it formatting before factory, data will not be generally stored with by storing in equipment；Test is set
It is standby to carry out consistency judgement to the second data received and the first data sent, when test equipment is detecting the
When one data are identical with the content of the second data, that is, it can determine that being this time written and read data is correctly, mistake do not occur,
The function of storing equipment is normal, and it is normal that test equipment, which can record this test result,；If detecting the second data and the first number
According to inconsistent, then it can determine that storage equipment breaks down, record corresponding test result.
It is alternatively possible to which the operation that the second data of the first data and reading to write-in are set, obtains a spy
Value indicative, it is then whether identical by two characteristic values of comparison, and then judge whether the first data and the second data are identical.For example,
Hash (hash) operation can be carried out to the first data and the second data respectively, obtain the first cryptographic Hash and the second cryptographic Hash, so
It is whether identical by comparing the first cryptographic Hash and the second cryptographic Hash afterwards, to judge whether the first data and the second data are identical.
In addition, detection device can be tested repeatedly, establish between the first data, the second data and test result
Mapping table, so that the failure to storage equipment is analyzed；The ratio for occurring mistake in detecting test result is more than default
When ratio, determines that storage equipment breaks down, terminate test；Or can also single test after, determine the first data and
When second data mismatch, just terminate to test.
Order is wiped frequently with the read-write of standard at present and carrys out test flash memory interface signal, and the read-write of standard is wiped order and dodged to test
It deposits interface signal and refers to and be written and read again after random padding data wipes flash memory repeatedly, there are Railway Project,
First, service life of flash memory is impacted；Second, the execution time that order is wiped in read-write is far longer than data transmission period, causes pair
The intensity of interface testing is inadequate；Third, standard read/write are difficult to exclude the interference of the error in data of storage array generation.Another kind is surveyed
Method for testing is that standard read/write or read-only test flash memory interface signal are carried out to fixed position, and fixed position carries out standard read/write or only
It reads test flash memory interface signal and refers to that random padding data is read and write the fixed position of flash memory or read-only operation repeatedly, also deposits
In Railway Project, first, Finite Samples, random degree is high；Second, the execution time of read write command is far longer than data transmission
Time causes the intensity to interface testing inadequate；Third, standard read/write are difficult to exclude the dry of the error in data of storage array generation
It disturbs.
Test method provided in this embodiment tests storage equipment by way of only reading and writing the register of storage equipment,
First data are not written in storage array, because without wearing storage array, after storage array is repeatedly wiped, and service life meeting
It reduces, since the service life of flash memory is mainly determined by the service life of storage array, so the test method in the present embodiment sets storage
The standby service life will not have any impact, and need to extend and deposit for storage array repeatedly wipe compared to existing method
Store up the service life of equipment；And since data not being written into storage array, so will not be stored by the interference of storage array
Array failure will not disturbed test；The waiting time for not being written and reading data, write-in and reading to storage equipment
The time is taken to be far smaller than data transmission period, thus it is big to the test intensity of storage equipment, and degree of randomization is high, it can be to each
Kind data are tested, the inaccuracy of test result caused by preventing test sample small.
Referring to Fig.2, Fig. 2 is the structural schematic diagram of the test method second embodiment of storage equipment provided by the present application, it should
Storing equipment includes at least one bare die, and the test method of the storage equipment includes:
Step 21: sending the offset address and the first data of data entry command, register, to storage equipment with to depositing
It stores up in the register of the bare die of equipment and the first data is written.
In a specific embodiment, storage equipment is nand flash memory, the test equipment successively deposit into storage equipment
Device sends the offset address and the first data of data entry command, register, realizes the offset of the register into register
The first data are written in address, which can be the data of random writing, and size can be the size of a logical page (LPAGE),
Logical page (LPAGE) can be to combine page included by storage matrix each in the bare die for storing equipment in order.
Step 22: sending the offset address of random data reading order and register, to storage equipment to set from storage
The second data are read in the register of standby bare die.
Test equipment is after sending the first data, in order to test read functions, can to storage equipment in register according to
The secondary offset address for sending random data reading order and register realizes the second number in the offset address for reading register
According to.
Step 23: judging whether the first data are identical as the second data, obtain test result.
Wherein, step 23 is identical as step 13 in above-described embodiment, and details are not described herein.
Test equipment sends order, address and data that data and reading is written into storage equipment to storage equipment respectively
Data out test storage equipment by way of only reading and writing the register of storage equipment, will not make to the service life of storage equipment
At any influence, the test intensity to storage equipment will not be improved by the interference of storage array, be able to detect flash interface letter
Number problem.
It is the structural schematic diagram of the test method 3rd embodiment of storage equipment provided by the present application refering to Fig. 3, Fig. 3, it should
Storage equipment includes at least one bare die, and each bare die includes: register and the input/output interface that connect with register,
Register includes command register, address register and data register；The test method of the storage equipment includes:
Step 31: using the input order of input/output interface input data, and so that data entry command is transmitted to order and post
Storage.
In order to which data are written to storage equipment, need first to send command register of the data entry command into bare die, number
It include serial date transfer order (0x80) or random data input order (0x85) according to input order.
In a specific embodiment, when sending data entry command, test equipment sends the life of high level to bare die
Enable and latch enable end, while sending pulse to writing enable end so that in the rising edge of pulse, data entry command by input/
Output interface is latched into command register.
Step 32: using the offset address of input/output interface input register, and transmitting the offset address of register
To address register.
When the offset address of transmitter register, test equipment transmission high level to the address latch enable end of bare die, together
When send pulse to writing enable end so that the offset address of register passes through input/output interface latch in the rising edge of pulse
To address register.
Step 33: inputting the first data using input/output interface, and make first data transmission to data register.
When sending the first data, enable end and address latch are latched in the order that test equipment sends low level to bare die to be made
Energy end, while pulse is sent to enable end is write, so that the first data pass through input/output interface and latch in the rising edge of pulse
To data register, the write-in of data is realized.In addition, test equipment programs when to storage equipment write-in data without sending
Confirmation order (0x10).
Step 34: inputting random data reading order using input/output interface, and transmit random data reading order
To command register.
Test equipment need to send random data by input/output interface first and read to read data from register
Take order (0x05 or 0x06) to command register.
In a specific embodiment, when sending random data reading order, test equipment sends high level to bare die
Order latch enable end, while pulse is sent to writing enable end, so that random data reading order is logical in the rising edge of pulse
It crosses input/output interface and is latched into command register.
Step 35: using the offset address of input/output interface input register, and transmitting the offset address of register
To address register.
When the offset address of test equipment transmitter register, transmission high level to the address latch enable end of bare die,
Pulse is sent simultaneously to enable end is write, so that the offset address of register is locked by input/output interface in the rising edge of pulse
It is stored to address register.
Step 36: utilizing the second data in input/output interface read data register.
When reading the second data, enable end is latched in the order that test equipment sends low level to bare die and address latch is enabled
End, while pulse is sent to enable end is write, so that the second data being stored in register pass through defeated in the rising edge of pulse
Enter/output interface is transmitted to detection device, realize the reading of data.
Step 37: judging whether the first data are identical as the second data, obtain test result.
Wherein, step 37 is identical as step 13 in above-described embodiment, and details are not described herein.
Test equipment to storage equipment successively sends be written the first data needed for order, register offset address and
First data, and send the first data and then successively send read the second data needed for order and register it is inclined
Address is moved, tests storage equipment by way of only reading and writing the register of storage equipment, the service life of storage equipment will not be made
At any influence, and will not be big to the test intensity of storage equipment by the interference of storage array.
It is the structural schematic diagram of the test method fourth embodiment of storage equipment provided by the present application refering to Fig. 4, Fig. 4, it should
Storage equipment includes at least one bare die, and each bare die includes: register and the input/output interface that connect with register,
Register includes command register, address register and data register；The test method of the storage equipment includes:
Step 41: using the input order of input/output interface input data, and so that data entry command is transmitted to order and post
Storage.
Step 42: using the offset address of input/output interface input register, and transmitting the offset address of register
To address register.
Step 43: inputting the first data using input/output interface, and make first data transmission to data register.
Wherein, step 41-43 is identical as step 31-33 in above-described embodiment, and details are not described herein.
Step 44: using input/output interface input setting period reading order, and making to set the transmission of period reading order
To command register.
The setting period reading order can be the reading order (0x00) in first period, from storage in the present embodiment
When reading data in the data register in equipment, two offset address of register, i.e. the offset address packet of register are utilized
Include the first offset address of register and the second offset address of register.
Step 45: using the first offset address of input/output interface input register, and making the first of register to deviate
Address is transmitted to address register.
Step 46: inputting random data reading order using input/output interface, and transmit random data reading order
To command register.
Step 47: using the second offset address of input/output interface input register, and making the second of register to deviate
Address is transmitted to address register.
When reading data, successively sends setting period reading order, the first offset address of register, random data and read
The second offset address of order and register is taken to corresponding register, enables detection device by data register
The reading data of one logical address to the second logical address comes out.
Step 48: utilizing the second data in input/output interface read data register.
Step 49: judging whether the first data are identical as the second data, obtain test result.
Wherein, step 48-49 is identical as step 37-38 in above-described embodiment, and details are not described herein.
Test equipment successively sends needed for reading the second data three to storage equipment and orders and two registers
Offset address tests storage equipment by way of only reading and writing the register of storage equipment, will not to the service life of storage equipment
It has any impact, it will not be big to the test intensity of storage equipment by the interference of storage array.
It is the structural schematic diagram of the 5th embodiment of test method of storage equipment provided by the present application refering to Fig. 5, Fig. 5, it should
Storing equipment includes at least one bare die, and the test method of the storage equipment includes:
Step 51: the first data are written into the register of the bare die of storage equipment.
Step 52: the second data are read from register.
Step 53: judging whether the first data are identical as the second data, obtain test result.
Wherein, step 51-53 is identical as step 11-13 in above-described embodiment, and details are not described herein.
Step 54: detecting whether accumulative testing time is greater than default testing time.
In this embodiment, using accumulative testing time as the condition for terminating test, if detecting accumulative test
Number is less than or equal to default testing time, then executes again and the first data are written into the register of the bare die of storage equipment
Step, and accumulative testing time is added one, until accumulative testing time is greater than default testing time；If the accumulative survey of detection
It tries number and is greater than default testing time, then terminate to test, obtain final test result, test equipment can be to test result point
Analysis obtains that whether storage equipment breaks down as a result, can also analyze the reason of storage equipment breaks down.
It is the structural schematic diagram of the test method sixth embodiment of storage equipment provided by the present application refering to Fig. 6, Fig. 6, it should
Storing equipment includes at least one bare die, and the test method of the storage equipment includes:
Step 61: the first data are written into the register of the bare die of storage equipment.
Step 62: the second data are read from register.
Step 63: judging whether the first data are identical as the second data, obtain test result.
Step 64: detecting whether the accumulative testing time is greater than the default testing time.
In this embodiment, using the accumulative testing time as the condition for terminating test, if detecting accumulative test
Time is less than or equal to the default testing time, then executes again and the first data are written into the register of the bare die of storage equipment
Step is greater than the default testing time until the accumulative testing time；If the detection accumulative testing time is greater than the default testing time,
Then terminate to test, obtains final test result.
It is the structural schematic diagram of one embodiment of test equipment provided by the present application, the test equipment 70 packet refering to Fig. 7, Fig. 7
Include the memory 71 and processor 72 of interconnection, wherein memory 71 is for storing computer program, and computer program is in quilt
When processor 72 executes, for realizing the test method of the storage equipment in above-described embodiment.
It is the structural schematic diagram of one embodiment of computer storage medium provided by the present application, the computer refering to Fig. 8, Fig. 8
Storage medium 80 is for storing computer program 81, and computer program 81 is when being executed by processor, for realizing above-mentioned implementation
The test method of storage equipment in example.
Wherein, which can be server-side, USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only
Memory), random access memory (RAM, Random Access Memory), magnetic or disk etc. are various can store journey
The medium of sequence code.
In several embodiments provided herein, it should be understood that disclosed method and equipment, Ke Yili
It is realized with other modes.For example, equipment embodiment described above is only schematical, for example, module or unit
Division, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or group
Part can be combined or can be integrated into another system, or some features can be ignored or not executed.
Unit may or may not be physically separated as illustrated by the separation member, shown as a unit
Component may or may not be physical unit, it can and it is in one place, or may be distributed over multiple networks
On unit.It can select some or all of unit therein according to the actual needs to realize the mesh of present embodiment scheme
's.
In addition, each functional unit in each embodiment of the application can integrate in one processing unit, it can also
To be that each unit physically exists alone, can also be integrated in one unit with two or more units.It is above-mentioned integrated
Unit both can take the form of hardware realization, can also realize in the form of software functional units.
The above is only embodiments herein, are not intended to limit the scope of the patents of the application, all to be said using the application
Equivalent structure or equivalent flow shift made by bright book and accompanying drawing content is applied directly or indirectly in other relevant technology necks
Domain similarly includes in the scope of patent protection of the application.
Claims (10)
1. a kind of test method for storing equipment, the storage equipment includes at least one bare die characterized by comprising
The first data are written into the register of the bare die of the storage equipment；
The second data are read from the register；
Judge whether first data and second data are identical, obtain test result.
2. the test method of storage equipment according to claim 1, which is characterized in that
The step of the first data are written in the register of the bare die to the storage equipment, comprising:
To it is described storage equipment send data entry command, the register offset address and first data, with to
First data are written in the register of the bare die of the storage equipment；
Described the step of reading the second data from the register, comprising:
The offset address of random data reading order and the register is sent, to the storage equipment to set from the storage
Second data are read in the register of standby bare die.
3. the test method of storage equipment according to claim 2, which is characterized in that
The bare die further includes the input/output interface connecting with the register, the register include command register,
Location register and data register.
4. the test method of storage equipment according to claim 3, which is characterized in that
It is described to send data entry command, the offset address of the register and first data to the storage equipment,
With the step of first data are written into the register of the bare die of the storage equipment, comprising:
The data entry command is inputted using the input/output interface, and it is described to be transmitted to the data entry command
Command register；
The offset address of the register is inputted using the input/output interface, and passes the offset address of the register
Transport to the address register；
First data are inputted using the input/output interface, and make the first data transmission to the data register
Device.
5. the test method of storage equipment according to claim 4, which is characterized in that
The data entry command includes serial date transfer order or random data input order.
6. the test method of storage equipment according to claim 3, which is characterized in that
The offset address that random data reading order and the register are sent to the storage equipment, to be deposited from described
Store up the step of reading second data in the register of the bare die of equipment, comprising:
The random data reading order is inputted using the input/output interface, and passes the random data reading order
Transport to the command register；
The offset address of the register is inputted using the input/output interface, and passes the offset address of the register
Transport to the address register；
Second data in the data register are read using the input/output interface.
7. the test method of storage equipment according to claim 3, which is characterized in that
The offset address of the register includes the first offset address of register and the second offset address of register；
The offset address that random data reading order and the register are sent to the storage equipment, to be deposited from described
Store up the step of reading second data in the register of the bare die of equipment, comprising:
Setting period reading order is inputted using the input/output interface, and is transmitted to the setting period reading order
The command register；
The first offset address of the register is inputted using the input/output interface, and make the register first partially
It moves address and is transmitted to the address register；
The random data reading order is inputted using the input/output interface, and passes the random data reading order
Transport to the command register；
The second offset address of the register is inputted using the input/output interface, and make the register second partially
It moves address and is transmitted to the address register；
Second data in the data register are read using the input/output interface.
8. the test method of storage equipment according to claim 1, which is characterized in that
It is described to judge whether first data and second data are identical, after the step of obtaining test result, further includes:
Whether the accumulative testing time of detection is greater than default testing time；If it is not, then executing again described to the storage equipment
Bare die register in the step of the first data are written, until accumulative testing time is greater than the default testing time；Or
Person
Whether the detection accumulative testing time is greater than the default testing time；If it is not, then executing again described to the storage equipment
Bare die register in the step of the first data are written, be greater than the default testing time until the accumulative testing time.
9. a kind of test equipment, which is characterized in that memory and processor including interconnection, wherein the memory is used
In storage computer program, the computer program by the processor when being executed, for realizing any in claim 1-8
The test method of storage equipment described in.
10. a kind of computer storage medium, for storing computer program, which is characterized in that the computer program is being located
When managing device execution, for realizing the test method of storage equipment of any of claims 1-8.
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| CN116610512A (en) * | 2023-07-20 | 2023-08-18 | 合肥康芯威存储技术有限公司 | Storage test equipment and test method thereof |
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Application publication date: 20191011 |