CN109668895A - 太阳能电池检查装置以及带照相机的太阳光模拟器 - Google Patents

太阳能电池检查装置以及带照相机的太阳光模拟器 Download PDF

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Publication number
CN109668895A
CN109668895A CN201811189611.XA CN201811189611A CN109668895A CN 109668895 A CN109668895 A CN 109668895A CN 201811189611 A CN201811189611 A CN 201811189611A CN 109668895 A CN109668895 A CN 109668895A
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CN
China
Prior art keywords
camera
solar battery
photovoltaic devices
inspecting apparatus
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811189611.XA
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English (en)
Chinese (zh)
Inventor
冈原孔明
甲斐慎太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dj Solar Ltd By Share Ltd
Denken Co Ltd
Original Assignee
Dj Solar Ltd By Share Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dj Solar Ltd By Share Ltd filed Critical Dj Solar Ltd By Share Ltd
Publication of CN109668895A publication Critical patent/CN109668895A/zh
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/30—Collimators
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Photovoltaic Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN201811189611.XA 2017-10-16 2018-10-12 太阳能电池检查装置以及带照相机的太阳光模拟器 Pending CN109668895A (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2017-200148 2017-10-16
JP2017200148 2017-10-16
JP2018-009855 2018-01-24
JP2018009855A JP6411683B1 (ja) 2017-10-16 2018-01-24 太陽電池検査装置及びカメラ付きソーラーシミュレータ

Publications (1)

Publication Number Publication Date
CN109668895A true CN109668895A (zh) 2019-04-23

Family

ID=63920615

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811189611.XA Pending CN109668895A (zh) 2017-10-16 2018-10-12 太阳能电池检查装置以及带照相机的太阳光模拟器

Country Status (4)

Country Link
JP (1) JP6411683B1 (ko)
KR (1) KR101962157B1 (ko)
CN (1) CN109668895A (ko)
TW (1) TW201931763A (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112702018A (zh) * 2019-10-22 2021-04-23 胜焱电子科技(上海)有限公司 太阳能电池侦测装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI713299B (zh) * 2019-10-01 2020-12-11 大陸商勝焱電子科技(上海)有限公司 太陽能電池偵測裝置
CN113884882A (zh) * 2021-10-09 2022-01-04 东风时代(武汉)电池系统有限公司 碰撞信号模拟发生装置、动力电池下线测试系统及方法

Citations (6)

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JP2009158844A (ja) * 2007-12-27 2009-07-16 Daido Steel Co Ltd 太陽電池の検査装置および太陽電池の検査方法
CN202008060U (zh) * 2010-03-01 2011-10-12 纳达特光电公司 模拟太阳光照射装置
WO2011152445A1 (ja) * 2010-06-04 2011-12-08 株式会社アイテス 太陽電池パネルのｅｌ検査装置、及びｅｌ検査方法
CN102346231A (zh) * 2010-07-30 2012-02-08 致茂电子(苏州)有限公司 具有检知装置的太阳光模拟器及太阳能电池检测装置
JP2013098407A (ja) * 2011-11-02 2013-05-20 Hamamatsu Photonics Kk 太陽電池関連試料測定システム
CN105473999A (zh) * 2013-08-30 2016-04-06 富士胶片株式会社 光学特性测量装置及光学特性测量方法

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JPS5051854A (ko) 1973-09-05 1975-05-08
JP2005183744A (ja) * 2003-12-22 2005-07-07 Nikon Corp 露光装置及びデバイス製造方法
ES2659781T3 (es) * 2005-10-11 2018-03-19 Bt Imaging Pty Limited Método y sistema para inspeccionar una estructura semiconductora de salto de banda indirecto
JP2008032549A (ja) * 2006-07-28 2008-02-14 Eko Instruments Trading Co Ltd 光学調整装置、光源装置、太陽電池の特性計測システム
JP4235685B1 (ja) 2008-07-01 2009-03-11 日清紡績株式会社 太陽電池の検査装置及び太陽電池の欠陥判定方法
JP5271185B2 (ja) * 2009-07-28 2013-08-21 株式会社アイテス 太陽光発電素子の検査装置
US9863890B2 (en) * 2011-06-10 2018-01-09 The Boeing Company Solar cell testing apparatus and method
JP5956198B2 (ja) * 2012-03-05 2016-07-27 旭化成株式会社 集光型太陽電池用レンズ及び集光型太陽電池用レンズの製造方法
KR101325356B1 (ko) * 2012-05-31 2013-11-08 광운대학교 산학협력단 태양전지 품질 측정 방법 및 장치
JP5692193B2 (ja) * 2012-09-27 2015-04-01 ダイキン工業株式会社 擬似太陽光照射装置
JP2014075216A (ja) * 2012-10-03 2014-04-24 Nisshinbo Mechatronics Inc ソーラーシミュレータ
JP6446900B2 (ja) 2014-08-06 2019-01-09 オムロン株式会社 太陽光発電システムの検査装置および太陽光発電システムの検査方法
KR20160125760A (ko) * 2015-04-22 2016-11-01 엘지전자 주식회사 태양 전지용 통합 계측기
JP3201710U (ja) * 2015-10-09 2015-12-24 株式会社ケミトックス 移動式試験装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009158844A (ja) * 2007-12-27 2009-07-16 Daido Steel Co Ltd 太陽電池の検査装置および太陽電池の検査方法
CN202008060U (zh) * 2010-03-01 2011-10-12 纳达特光电公司 模拟太阳光照射装置
WO2011152445A1 (ja) * 2010-06-04 2011-12-08 株式会社アイテス 太陽電池パネルのｅｌ検査装置、及びｅｌ検査方法
CN102346231A (zh) * 2010-07-30 2012-02-08 致茂电子(苏州)有限公司 具有检知装置的太阳光模拟器及太阳能电池检测装置
JP2013098407A (ja) * 2011-11-02 2013-05-20 Hamamatsu Photonics Kk 太陽電池関連試料測定システム
CN105473999A (zh) * 2013-08-30 2016-04-06 富士胶片株式会社 光学特性测量装置及光学特性测量方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112702018A (zh) * 2019-10-22 2021-04-23 胜焱电子科技(上海)有限公司 太阳能电池侦测装置

Also Published As

Publication number Publication date
TW201931763A (zh) 2019-08-01
JP6411683B1 (ja) 2018-10-24
KR101962157B1 (ko) 2019-03-26
JP2019075971A (ja) 2019-05-16

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