CN109638101A - The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell - Google Patents

The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell Download PDF

Info

Publication number
CN109638101A
CN109638101A CN201811472129.7A CN201811472129A CN109638101A CN 109638101 A CN109638101 A CN 109638101A CN 201811472129 A CN201811472129 A CN 201811472129A CN 109638101 A CN109638101 A CN 109638101A
Authority
CN
China
Prior art keywords
layer
amorphous silicon
doped layer
solar cell
conductive film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811472129.7A
Other languages
Chinese (zh)
Inventor
郭小勇
易治凯
汪涛
王永谦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Love Energy Research Institute Co Ltd
Original Assignee
Jiangsu Love Energy Research Institute Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu Love Energy Research Institute Co Ltd filed Critical Jiangsu Love Energy Research Institute Co Ltd
Priority to CN201811472129.7A priority Critical patent/CN109638101A/en
Publication of CN109638101A publication Critical patent/CN109638101A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/072Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/072Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
    • H01L31/0725Multiple junction or tandem solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/072Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
    • H01L31/074Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type comprising a heterojunction with an element of Group IV of the Periodic Table, e.g. ITO/Si, GaAs/Si or CdTe/Si solar cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Sustainable Energy (AREA)
  • Photovoltaic Devices (AREA)

Abstract

A kind of emitter structure and preparation method thereof of double-deck amorphous silicon doped layer solar cell of the present invention, it includes N-type crystalline silicon piece, the front and back of the N-type crystalline silicon piece is equipped with amorphous silicon intrinsic layer, TCO conductive film is equipped on the outside of amorphous silicon intrinsic layer, the outside of the TCO conductive film is equipped with several Ag electrodes, the different amorphous silicon doped layer of two layers of doping concentration is equipped between the amorphous silicon intrinsic layer and TCO conductive film at the back side, that is first layer doped layer and second layer doped layer, the first layer doped layer is positioned close to the side of amorphous silicon intrinsic, the second layer doped layer is positioned close to the side of TCO conductive film.Shady face amorphous silicon doped layer of the present invention is using the double-deck amorphous silicon doped layer, first layer uses the doping concentration of 0.5%-1%, and the second layer uses the doping concentration of 1%-4%, both increased the electric conductivity of film, it does not reduce the transmitance of film again, promotes the photoelectric conversion efficiency of HJT solar battery.

Description

The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell
Technical field
The present invention relates to photovoltaic high-efficiency battery technical field more particularly to a kind of double-deck amorphous silicon doped layer solar cells Emitter structure and preparation method thereof.
Background technique
With the fast development of photovoltaic technology, the transfer efficiency of crystal-silicon solar cell improves year by year.In current photovoltaic work Industry, the transfer efficiency of single crystal silicon solar cell have reached 20% or more, and the transfer efficiency of polycrystalline silicon solar cell is up to 18.5% More than.However the back of the silica-based solar cell of large-scale production, transfer efficiency up to 22.5% or more only U.S. SunPower company Contact the amorphous with intrinsic sheet of solar cell (Interdigitated Back Contact, IBC) and Matsushita Corporation of Japan Silicon/crystalline silicon heterojunction solar battery (Hetero-junction with Intrinsic Thin layer, HJT).And IBC Solar cell is compared, and HJT battery has many advantages, such as less energy consumption, process flow are simple, temperature coefficient is small, these are also HJT The reason of solar battery can show one's talent from numerous efficient silica-based solar cell schemes.
Currently, China is wideling popularize distributed solar energy photovoltaic power generation, since Roof Resources are limited, and also it is distributed The solar module of photovoltaic power generation demand high conversion efficiency has efficient, generating electricity on two sides excellent just because of HJT solar cell Gesture shows wide application prospect in photovoltaic power station.
The structure of existing HJT battery is to do one layer of amorphous silicon intrinsic layer and doped layer n type single crystal silicon is two-sided.Amorphous silicon sheet It levies layer and is mainly passivated surface of crystalline silicon defect, surface defect state is reduced, to reduce Carrier recombination;Amorphous silicon doped layer master If forming PN junction and field-effect passivation layer with crystal silicon.
Referring to Fig. 1, the prior art is single layer amorphous silicon doped layer P, and wherein the doping ratio of B2H6 doping is 1%-3%;It is non- Doped polycrystal silicon layer is there are the relationship that transmitance is contradicted with conductivity, and then electric conductivity is poor for transmitance height, and electric conductivity height then penetrates Rate is low, and therefore, single layer B2H6 doped amorphous silicon cannot achieve the high conversion efficiency of HJT battery.
Summary of the invention
The purpose of the present invention is to overcome the above shortcomings and to provide a kind of emitters of double-deck amorphous silicon doped layer solar cell Structure and preparation method thereof, had not only been able to satisfy the satisfactory electrical conductivity of amorphous silicon, but also was able to satisfy high transmittance.
The object of the present invention is achieved like this:
A kind of emitter structure of bilayer amorphous silicon doped layer solar cell, it includes N-type crystalline silicon piece, the N-type crystalline silicon The front and back of piece is equipped with amorphous silicon intrinsic layer, and TCO conduction is equipped on the outside of the amorphous silicon intrinsic layer of front and back The outside of film, the TCO conductive film is equipped with several Ag electrodes, the amorphous silicon intrinsic layer and TCO at the back side of the N-type crystalline silicon piece The different amorphous silicon doped layer of two layers of doping concentration, i.e. first layer doped layer and second layer doped layer, institute are equipped between conductive film The side that first layer doped layer is positioned close to amorphous silicon intrinsic layer is stated, the second layer doped layer is positioned close to TCO conduction The side of film.
A kind of emitter structure of bilayer amorphous silicon doped layer solar cell, the first layer doped layer with a thickness of 1 ~ 20nm, doping concentration are 0.5% ~ 1%.
A kind of emitter structure of bilayer amorphous silicon doped layer solar cell, the second layer doped layer with a thickness of 1 ~ 20nm, doping concentration are 1% ~ 4%.
A kind of preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell, including the following steps:
The first step chooses substrate n type single crystal silicon piece progress making herbs into wool, cleaning treatment;
Second step, double intrinsic amorphous silicon layers that the positive back side is prepared by PECVD;
Third step, selection N-type amorphous silicon film are light-receiving surface doped layer;
4th step, using plasma enhanced chemical vapor deposition prepare N-type non-crystalline silicon layer, i.e., amorphous silicon doped layer N layers;
5th step prepares P-type non-crystalline silicon layer using PECVD, and first layer forms the first doping using 0.5% ~ 1% doping concentration Layer, the second layer form the second doped layer using 1% ~ 4% doping concentration;
6th step deposits TCO conductive film using RPD PVD method;
7th step forms positive back side Ag electrode by silk-screen printing;
8th step, solidification are so that form good Ohmic contact between silver grating line and TCO conductive film;
9th step, the electrical property for carrying out test battery.
A kind of preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell, the thickness of first doped layer Degree is 1 ~ 20nm, second doped layer with a thickness of 1 ~ 20nm, the overall thickness of two layers of amorphous silicon doped layer is 7 ~ 15nm.
A kind of preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell, the amorphous silicon at the positive back side Intrinsic layer thickness is 5 ~ 10nm.
A kind of preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell, the amorphous silicon doped layer N Layer is with a thickness of 4 ~ 8nm.
A kind of preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell, the TCO conduction film thickness For 70 ~ 110nm.
Compared with prior art, the beneficial effects of the present invention are:
For the present invention for HJT heterojunction solar battery structure, shady face amorphous silicon doped layer uses the double-deck amorphous silicon doped layer, First layer uses the doping concentration of 0.5%-1%, and the second layer uses the doping concentration of 1%-4%, not only increased the electric conductivity of film, but also The transmitance of film is not reduced, promotes the photoelectric conversion efficiency of HJT solar battery.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of existing HJT heterojunction solar battery.
Fig. 2 is the structural schematic diagram of HJT heterojunction solar battery of the present invention.
Wherein:
N-type crystalline silicon piece 1, amorphous silicon intrinsic layer 2, amorphous silicon doped layer N layer 3, amorphous silicon doped layer P layer 4, first layer doped layer 5, second layer doped layer 6, TCO conductive film 7, Ag electrode 8.
Specific embodiment
Embodiment 1:
Referring to fig. 2, the emitter structure of a kind of double-deck amorphous silicon doped layer solar cell of the present invention, it includes N-type crystalline substance The front and back of body silicon wafer 1, the N-type crystalline silicon piece 1 is equipped with amorphous silicon intrinsic layer 2;
The outside of the positive amorphous silicon intrinsic layer 2 is equipped with amorphous silicon doped layer N layer 3, the positive amorphous silicon doped layer N The outside of layer 3 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is equipped with several Ag electrodes 8;
The outside of the amorphous silicon intrinsic layer 2 at the back side is equipped with first layer doped layer 5, and the outside of the first layer doped layer 5 is set There is second layer doped layer 6, the outside of the second layer doped layer 6 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is set There are several Ag electrodes 8.
The first layer doped layer 5 with a thickness of 4nm, doping concentration 1%;The second layer doped layer 6 with a thickness of 6nm, doping concentration 3%.
A kind of preparation method of the emitter structure of double-deck amorphous silicon doped layer solar cell of the present invention, including with Under several steps:
(1) making herbs into wool, cleaning treatment are carried out to having a size of 156.75mm, with a thickness of the n type single crystal silicon piece 1 of 180um;
(2) double intrinsic amorphous silicon layers at the positive back side are prepared by PECVD, the amorphous silicon intrinsic layer 2 at the positive back side is with a thickness of 8nm;
(3) choosing N-type amorphous silicon film is light-receiving surface doped layer;
(4) N-type non-crystalline silicon layer, i.e. amorphous silicon doped layer N layer 3 are prepared using plasma enhanced chemical vapor deposition, with a thickness of 6nm;
(5) P-type non-crystalline silicon layer, 10 nm of overall thickness are prepared using PECVD, first layer forms first using 1% doping concentration and mixes Diamicton 5, first doped layer 5 with a thickness of 4nm, the second layer forms the second doped layer 6 using 3% doping concentration, described the Two doped layers 6 with a thickness of 6nm;
(6) TCO conductive film 7 is deposited using RPD PVD method, with a thickness of 100nm;
(7) positive back side Ag electrode 8 is formed by silk-screen printing;
(8) solidification is so that form good Ohmic contact between silver grating line and TCO conductive film 7;
(9) electrical property of test battery is carried out.
Embodiment 2:
Referring to fig. 2, the emitter structure of a kind of double-deck amorphous silicon doped layer solar cell of the present invention, it includes N-type crystalline substance The front and back of body silicon wafer 1, the N-type crystalline silicon piece 1 is equipped with amorphous silicon intrinsic layer 2;
The outside of the positive amorphous silicon intrinsic layer 2 is equipped with amorphous silicon doped layer N layer 3, the positive amorphous silicon doped layer N The outside of layer 3 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is equipped with several Ag electrodes 8;
The outside of the amorphous silicon intrinsic layer 2 at the back side is equipped with first layer doped layer 5, and the outside of the first layer doped layer 5 is set There is second layer doped layer 6, the outside of the second layer doped layer 6 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is set There are several Ag electrodes 8.
The first layer doped layer 5 with a thickness of 3nm, doping concentration 0.5%;The second layer doped layer 6 with a thickness of 7nm, doping concentration 2.5%.
A kind of preparation method of the emitter structure of double-deck amorphous silicon doped layer solar cell of the present invention, including with Under several steps:
(1) making herbs into wool, cleaning treatment are carried out to having a size of 156.75mm, with a thickness of the n type single crystal silicon piece 1 of 180um;
(2) double intrinsic amorphous silicon layers at the positive back side are prepared by PECVD, the amorphous silicon intrinsic layer 2 at the positive back side is with a thickness of 8nm;
(3) choosing N-type amorphous silicon film is light-receiving surface doped layer;
(4) N-type non-crystalline silicon layer, i.e. amorphous silicon doped layer N layer 3 are prepared using plasma enhanced chemical vapor deposition, with a thickness of 6nm;
(5) P-type non-crystalline silicon layer, 10 nm of overall thickness are prepared using PECVD, first layer forms first using 0.5% doping concentration Doped layer 5, first doped layer 5 with a thickness of 3nm, the second layer forms the second doped layer 6, institute using 2.5% doping concentration State the second doped layer 6 with a thickness of 7nm;
(6) TCO conductive film 7 is deposited using RPD PVD method, with a thickness of 100nm;
(7) positive back side Ag electrode 8 is formed by silk-screen printing;
(8) solidification is so that form good Ohmic contact between silver grating line and TCO conductive film 7;
(9) electrical property of test battery is carried out.
Embodiment 3:
Referring to fig. 2, the emitter structure of a kind of double-deck amorphous silicon doped layer solar cell of the present invention, it includes N-type crystalline substance The front and back of body silicon wafer 1, the N-type crystalline silicon piece 1 is equipped with amorphous silicon intrinsic layer 2;
The outside of the positive amorphous silicon intrinsic layer 2 is equipped with amorphous silicon doped layer N layer 3, the positive amorphous silicon doped layer N The outside of layer 3 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is equipped with several Ag electrodes 8;
The outside of the amorphous silicon intrinsic layer 2 at the back side is equipped with first layer doped layer 5, and the outside of the first layer doped layer 5 is set There is second layer doped layer 6, the outside of the second layer doped layer 6 is equipped with TCO conductive film 7, and the outside of the TCO conductive film 7 is set There are several Ag electrodes 8.
The first layer doped layer 5 with a thickness of 5nm, doping concentration 1%;The second layer doped layer 6 with a thickness of 5nm, doping concentration 2%.
A kind of preparation method of the emitter structure of double-deck amorphous silicon doped layer solar cell of the present invention, including with Under several steps:
(1) making herbs into wool, cleaning treatment are carried out to having a size of 156.75mm, with a thickness of the n type single crystal silicon piece 1 of 180um;
(2) double intrinsic amorphous silicon layers at the positive back side are prepared by PECVD, the amorphous silicon intrinsic layer 2 at the positive back side is with a thickness of 8nm;
(3) choosing N-type amorphous silicon film is light-receiving surface doped layer;
(4) N-type non-crystalline silicon layer, i.e. amorphous silicon doped layer N layer 3 are prepared using plasma enhanced chemical vapor deposition, with a thickness of 6nm;
(5) P-type non-crystalline silicon layer, 10 nm of overall thickness are prepared using PECVD, first layer forms first using 1% doping concentration and mixes Diamicton 5, first doped layer 5 with a thickness of 5nm, the second layer forms the second doped layer 6 using 2% doping concentration, described the Two doped layers 6 with a thickness of 5nm;
(6) TCO conductive film 7 is deposited using RPD PVD method, with a thickness of 100nm;
(7) positive back side Ag electrode 8 is formed by silk-screen printing;
(8) solidification is so that form good Ohmic contact between silver grating line and TCO conductive film 7;
(9) electrical property of test battery is carried out.
The present invention is used with superimposed layer doping concentration parameter, is not influenced on passivation, is cut transmitance, the electric conductivity of doped layer All very well, the open-circuit voltage, short circuit current, fill factor of battery is made all to have greatly improved.
By the embodiment of the present invention data and the prior art all the same in addition to P-type non-crystalline silicon layer structure difference other parameters The electrical property of comparison, the present invention and the prior art is compared referring to following table, mainly from open-circuit voltage Voc, short circuit current Isc and filling Factor FF embodies, and the promotion of available solar battery unit for electrical property parameters of the invention makes the transfer efficiency of solar battery Eta is promoted.
The above is only specific application examples of the invention, are not limited in any way to protection scope of the present invention.All uses Equivalent transformation or equivalent replacement and the technical solution formed, all fall within rights protection scope of the present invention.

Claims (8)

1. a kind of emitter structure of bilayer amorphous silicon doped layer solar cell, it includes N-type crystalline silicon piece (1), and the N-type is brilliant The front and back of body silicon wafer (1) is equipped with amorphous silicon intrinsic layer (2), the outside of the amorphous silicon intrinsic layer (2) of front and back It is equipped with TCO conductive film (7), the outside of the TCO conductive film (7) is equipped with several Ag electrodes (8), it is characterised in that: the N-type Different non-of two layers of doping concentration is equipped between the amorphous silicon intrinsic layer (2) and TCO conductive film (7) at the back side of crystal silicon chip (1) Doped polycrystal silicon layer, i.e. first layer doped layer (5) and second layer doped layer (6), the first layer doped layer (5) are positioned close to non- The side of crystal silicon intrinsic layer (2), the second layer doped layer (6) are positioned close to the side of TCO conductive film (7).
2. a kind of emitter structure of double-deck amorphous silicon doped layer solar cell according to claim 1, it is characterised in that: The first layer doped layer (5) with a thickness of 1 ~ 20nm, doping concentration is 0.5% ~ 1%.
3. a kind of emitter structure of double-deck amorphous silicon doped layer solar cell according to claim 1, it is characterised in that: The second layer doped layer (6) with a thickness of 1 ~ 20nm, doping concentration is 1% ~ 4%.
4. a kind of preparation method of the emitter structure of the double-deck amorphous silicon doped layer solar cell described in claim 1, special Sign is, including the following steps:
The first step chooses substrate n type single crystal silicon piece (1) progress making herbs into wool, cleaning treatment;
Second step, double intrinsic amorphous silicon layers that the positive back side is prepared by PECVD;
Third step, selection N-type amorphous silicon film are light-receiving surface doped layer;
4th step, using plasma enhanced chemical vapor deposition prepare N-type non-crystalline silicon layer, i.e., amorphous silicon doped layer N layers (3);
5th step prepares P-type non-crystalline silicon layer using PECVD, and first layer forms the first doped layer using 0.5% ~ 1% doping concentration (5), the second layer forms the second doped layer (6) using 1% ~ 4% doping concentration;
6th step deposits TCO conductive film (7) using RPD PVD method;
7th step forms positive back side Ag electrode (8) by silk-screen printing;
8th step, solidification are so that form good Ohmic contact between silver grating line and TCO conductive film (7);
9th step, the electrical property for carrying out test battery.
5. the preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell according to claim 4, special Sign is: first doped layer (5) with a thickness of 1 ~ 20nm, second doped layer (6) with a thickness of 1 ~ 20nm, two layers The overall thickness of amorphous silicon doped layer is 7 ~ 15nm.
6. the preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell according to claim 4, special Sign is: the amorphous silicon intrinsic layer (2) at the positive back side is with a thickness of 5 ~ 10nm.
7. the preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell according to claim 4, special Sign is: N layers of the amorphous silicon doped layer (3) is with a thickness of 4 ~ 8nm.
8. the preparation method of the emitter structure of bilayer amorphous silicon doped layer solar cell according to claim 4, special Sign is: the TCO conductive film (7) is with a thickness of 70 ~ 110nm.
CN201811472129.7A 2018-12-04 2018-12-04 The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell Pending CN109638101A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811472129.7A CN109638101A (en) 2018-12-04 2018-12-04 The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811472129.7A CN109638101A (en) 2018-12-04 2018-12-04 The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell

Publications (1)

Publication Number Publication Date
CN109638101A true CN109638101A (en) 2019-04-16

Family

ID=66070914

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811472129.7A Pending CN109638101A (en) 2018-12-04 2018-12-04 The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell

Country Status (1)

Country Link
CN (1) CN109638101A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109950352A (en) * 2019-04-23 2019-06-28 通威太阳能(成都)有限公司 A kind of solar cell and its manufacturing method using amorphous silicon passivation layer
CN112713212A (en) * 2021-01-28 2021-04-27 湖南红太阳光电科技有限公司 HJT battery based on double-layer transparent conductive oxide film and preparation method thereof
CN113451445A (en) * 2021-01-08 2021-09-28 宣城睿晖宣晟企业管理中心合伙企业(有限合伙) Solar cell and manufacturing method thereof
CN114628543A (en) * 2020-11-27 2022-06-14 嘉兴阿特斯技术研究院有限公司 Heterojunction solar cell and manufacturing method thereof
WO2023103616A1 (en) * 2021-12-07 2023-06-15 嘉兴阿特斯技术研究院有限公司 Solar cell and preparation method therefor

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102683468A (en) * 2012-06-06 2012-09-19 南昌大学 Emitter structure of crystal silicon heterojunction solar battery
KR20130016848A (en) * 2011-08-09 2013-02-19 현대중공업 주식회사 Heterojunction with intrinsic thin layer solar cell
CN107819052A (en) * 2017-12-11 2018-03-20 晋能光伏技术有限责任公司 A kind of efficiently crystal silicon non crystal heterogeneous agglomeration battery structure and preparation method thereof
CN108922937A (en) * 2018-07-29 2018-11-30 江苏润阳悦达光伏科技有限公司 The boron doping emitter structure and preparation method of HIT solar cell

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130016848A (en) * 2011-08-09 2013-02-19 현대중공업 주식회사 Heterojunction with intrinsic thin layer solar cell
CN102683468A (en) * 2012-06-06 2012-09-19 南昌大学 Emitter structure of crystal silicon heterojunction solar battery
CN107819052A (en) * 2017-12-11 2018-03-20 晋能光伏技术有限责任公司 A kind of efficiently crystal silicon non crystal heterogeneous agglomeration battery structure and preparation method thereof
CN108922937A (en) * 2018-07-29 2018-11-30 江苏润阳悦达光伏科技有限公司 The boron doping emitter structure and preparation method of HIT solar cell

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109950352A (en) * 2019-04-23 2019-06-28 通威太阳能(成都)有限公司 A kind of solar cell and its manufacturing method using amorphous silicon passivation layer
CN114628543A (en) * 2020-11-27 2022-06-14 嘉兴阿特斯技术研究院有限公司 Heterojunction solar cell and manufacturing method thereof
CN113451445A (en) * 2021-01-08 2021-09-28 宣城睿晖宣晟企业管理中心合伙企业(有限合伙) Solar cell and manufacturing method thereof
CN112713212A (en) * 2021-01-28 2021-04-27 湖南红太阳光电科技有限公司 HJT battery based on double-layer transparent conductive oxide film and preparation method thereof
WO2023103616A1 (en) * 2021-12-07 2023-06-15 嘉兴阿特斯技术研究院有限公司 Solar cell and preparation method therefor

Similar Documents

Publication Publication Date Title
CN109638101A (en) The emitter structure and preparation method thereof of the double-deck amorphous silicon doped layer solar cell
CN109509807A (en) Emitter structure of silicon/crystalline silicon heterojunction solar battery and preparation method thereof
CN109638094A (en) Efficient heterojunction battery intrinsic amorphous silicon passivation layer structure and preparation method thereof
CN211376648U (en) Heterojunction solar cell structure with double-layer TCO conductive film
CN106601855A (en) Preparation method of double-side power generation heterojunction solar cell
CN109411551A (en) Efficient silicon/crystalline silicon heterojunction solar battery electrode structure of multiple deposition and preparation method thereof
CN110310999A (en) The hetero-junction solar cell structure and preparation method thereof of gradual change lamination TCO conductive film
WO2011156486A2 (en) Transparent conducting oxide for photovoltaic devices
CN107819052A (en) A kind of efficiently crystal silicon non crystal heterogeneous agglomeration battery structure and preparation method thereof
CN109461780A (en) Efficient silicon/crystalline silicon heterojunction solar battery electrode structure of high matching degree and preparation method thereof
CN109449227A (en) Silicon/crystalline silicon heterojunction solar battery electrode structure of lamination intrinsic layer and preparation method thereof
EP4345913A1 (en) Heterojunction solar cell and preparation method therefor
CN208655672U (en) Heterojunction solar battery
CN106449850B (en) A kind of efficient silicon based hetero-junction double-side cell and preparation method thereof
CN114765235A (en) Heterojunction solar cell and manufacturing method thereof
CN110416345A (en) Heterojunction solar battery structure of the double-deck amorphous silicon intrinsic layer and preparation method thereof
CN103227228B (en) P-type silicon substrate heterojunction cell
CN112701181A (en) Preparation method of low-resistivity heterojunction solar cell
CN110459639A (en) Hetero-junction solar cell structure and preparation method thereof with hydrogen annealing TCO conductive film
CN207637825U (en) A kind of efficient crystal silicon non crystal heterogeneous agglomeration battery structure
CN217280794U (en) Photovoltaic cell
CN217182188U (en) Perovskite/silicon-germanium-based triple-junction laminated solar cell
CN112701194B (en) Preparation method of heterojunction solar cell
CN215220744U (en) HJT battery with high photoelectric conversion efficiency
CN210156406U (en) Heterojunction solar cell structure with double-layer amorphous silicon intrinsic layer

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20190416