CN108287034A - 一种基于afm的微/纳观力-电耦合特性测量装置及其方法 - Google Patents
一种基于afm的微/纳观力-电耦合特性测量装置及其方法 Download PDFInfo
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- CN108287034A CN108287034A CN201810071309.8A CN201810071309A CN108287034A CN 108287034 A CN108287034 A CN 108287034A CN 201810071309 A CN201810071309 A CN 201810071309A CN 108287034 A CN108287034 A CN 108287034A
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 14
- 239000010931 gold Substances 0.000 claims description 14
- 229910052737 gold Inorganic materials 0.000 claims description 14
- 239000002245 particle Substances 0.000 claims description 14
- 239000004020 conductor Substances 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims description 8
- 229920001967 Metal rubber Polymers 0.000 claims description 6
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
Abstract
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CN201810071309.8A CN108287034B (zh) | 2018-01-25 | 2018-01-25 | 一种基于afm的微/纳观力-电耦合特性测量装置及其方法 |
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CN108287034A true CN108287034A (zh) | 2018-07-17 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109799369A (zh) * | 2019-02-13 | 2019-05-24 | 南昌大学 | 原子力显微镜外接设备多参数原位测量系统及测量方法 |
CN115753502A (zh) * | 2022-11-14 | 2023-03-07 | 西安交通大学 | 一种生物组织微纳米流变学特性的测试装置及方法 |
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CN1995962A (zh) * | 2006-12-29 | 2007-07-11 | 北京工业大学 | 扫描电镜中单根纳米线原位力学综合性能测试装置及方法 |
CN201083669Y (zh) * | 2007-07-20 | 2008-07-09 | 北京工业大学 | 透射电镜中纳米线原位压缩下力电性能测试装置 |
CN101419150A (zh) * | 2008-12-05 | 2009-04-29 | 北京工业大学 | 低维材料应力状态下性能测试装置 |
CN101793911A (zh) * | 2010-04-09 | 2010-08-04 | 北京工业大学 | 一种基于扫描电镜的纳米压痕系统 |
CN102353576A (zh) * | 2011-07-08 | 2012-02-15 | 吉林大学 | 小型化力学和电学耦合特性测试装置 |
CN102384985A (zh) * | 2011-09-28 | 2012-03-21 | 浙江大学 | 一种拉曼原子力显微检测装置及方法 |
CN102564654A (zh) * | 2012-01-10 | 2012-07-11 | 西安科技大学 | 一种用于扫描电子显微镜内部的激光测力系统 |
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CN106353535A (zh) * | 2016-10-10 | 2017-01-25 | 中国科学院深圳先进技术研究院 | 原位光电多功能耦合原子力显微镜测试系统 |
CN106645807A (zh) * | 2016-12-01 | 2017-05-10 | 中国科学院青岛生物能源与过程研究所 | 一个光电耦合环境可控原子力显微测试系统 |
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2018
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CN101419150A (zh) * | 2008-12-05 | 2009-04-29 | 北京工业大学 | 低维材料应力状态下性能测试装置 |
CN101793911A (zh) * | 2010-04-09 | 2010-08-04 | 北京工业大学 | 一种基于扫描电镜的纳米压痕系统 |
CN102353576A (zh) * | 2011-07-08 | 2012-02-15 | 吉林大学 | 小型化力学和电学耦合特性测试装置 |
CN102384985A (zh) * | 2011-09-28 | 2012-03-21 | 浙江大学 | 一种拉曼原子力显微检测装置及方法 |
CN102564654A (zh) * | 2012-01-10 | 2012-07-11 | 西安科技大学 | 一种用于扫描电子显微镜内部的激光测力系统 |
US20140143912A1 (en) * | 2012-11-20 | 2014-05-22 | Dcg Systems, Inc. | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing |
CN103645348A (zh) * | 2013-12-03 | 2014-03-19 | 中国科学院电工研究所 | 一种微纳米尺度耦合振动高分辨测量方法 |
CN106353535A (zh) * | 2016-10-10 | 2017-01-25 | 中国科学院深圳先进技术研究院 | 原位光电多功能耦合原子力显微镜测试系统 |
CN106645807A (zh) * | 2016-12-01 | 2017-05-10 | 中国科学院青岛生物能源与过程研究所 | 一个光电耦合环境可控原子力显微测试系统 |
CN106841687A (zh) * | 2017-02-21 | 2017-06-13 | 哈尔滨工业大学 | 采用开尔文探针力显微镜进行多参数同步测量的方法 |
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李喜德,苏东川,曾杜鹃: "《基于光学和探针技术的微纳米固体实验力学研究进展》", 《固体力学学报》 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109799369A (zh) * | 2019-02-13 | 2019-05-24 | 南昌大学 | 原子力显微镜外接设备多参数原位测量系统及测量方法 |
CN115753502A (zh) * | 2022-11-14 | 2023-03-07 | 西安交通大学 | 一种生物组织微纳米流变学特性的测试装置及方法 |
CN115753502B (zh) * | 2022-11-14 | 2023-08-18 | 西安交通大学 | 一种生物组织微纳米流变学特性的测试装置及方法 |
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Address after: No. 35 Leshan Road, Xinbei District, Changzhou City, Jiangsu Province, 213000 Patentee after: Jiangsu Liduoduoli New Materials Technology Co.,Ltd. Country or region after: China Patentee after: JIANGSU University Address before: 213022 No.35, Leshan Road, Xinbei District, Changzhou City, Jiangsu Province Patentee before: CHANGZHOU LIDUO ALLOY MATERIALS CO.,LTD. Country or region before: China Patentee before: JIANGSU University |