CN108231678B - 一种平面波导型光分路器芯片切割工艺 - Google Patents

一种平面波导型光分路器芯片切割工艺 Download PDF

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CN108231678B
CN108231678B CN201711462410.8A CN201711462410A CN108231678B CN 108231678 B CN108231678 B CN 108231678B CN 201711462410 A CN201711462410 A CN 201711462410A CN 108231678 B CN108231678 B CN 108231678B
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蔡文龙
刘丹
黄望隆
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Wuhan Yilut Technology Co ltd
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    • HELECTRICITY
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
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Abstract

本发明提供一种平面波导型光分路器芯片切割工艺,包括:将平面波导型分光路由器芯片的晶圆粘接在基板上,将所述基板放置在金属切割盘上,抽空所述基板与金属切割盘接触面的空气;上述晶圆也可以是条状芯片;对所述圆晶进行切割,切割后将所述圆晶与所述基板分离,得到切割后的圆晶芯片。通过UV膜对平面波导型分光路由器芯片的晶圆于基板固定,通过带孔的金属切割盘将基板固定,解决了现有技术中芯片的粘接和取出工艺流程复杂,效率低的问题,固定和分离过程中不会损坏圆晶,切割完毕后,关掉抽真空装置,取下塑料薄板,放置在UV灯下照射5秒以上,此时UV膜失去粘性,即可取下切割好的芯片和塑料薄板。

Description

一种平面波导型光分路器芯片切割工艺
技术领域
本发明涉及半导体芯片制造技术领域,更具体地,涉及一种平面波导型光分路器芯片切割工艺。
背景技术
根据“十三五”规划中的宽带建设规划,光通信投资成为“十三五”期间的主要投资渠道之一。光通信行业将会明显受益于运营商资本性支出结构性倾斜,光通信产业在“十三五”期间将有爆发性的增长。光配线网(Optical Distribution Network,ODN)是基于无源光网络技术,通过光分路器为光线路终端(Optical Line Terminal,OLT)与光网络单元(Optical Network Unit,ONU)之间提供光传输通道。而平面波导型光分路器芯片的切割是光分路器生产过程中至关重要的环节,如何高效高质量的切割光分路器芯片以及降低切割的成本,成为众多光分路器生产厂商不得不考虑的问题。
平面波导型光分路器(PLCSplitter)是一种基于石英基板的集成波导光功率分配器件,具有体积小,工作波长范围宽,可靠性高,分光均匀性好等特点,特别适用于无源光网络(EPON,BPON,GPON等)中连接局端和终端设备并实现光信号的分路。
目前,现有的平面波导型光分路器晶圆在切割过程中,大多采用金刚石砂轮或树脂刀线切割等机械的方式,该种机械的切割方式存在如下缺点:1)切割后的平面波导型光分路器的切割面极易产生崩边,影响产品的质量和产能;2)因采用机械刀进行切割,平面波导型光分路器晶圆上相邻的两个平面波导型光分路器之间要留有较宽的切割道,严重影响产品的产能;3)使用陶瓷切割盘,价格昂贵,切割前芯片粘接固定过程复杂,切割后芯片的取出工艺流程复杂、效率低。
发明内容
本发明提供一种克服上述问题或者至少部分地解决上述问题的一种平面波导型光分路器切割工艺,解决了现有技术中芯片的粘接和取出工艺流程复杂,效率低的问题。
根据本发明的一个方面,提供一种平面波导型光分路器芯片切割工艺,包括:
将平面波导型分光路由器芯片的晶圆粘接在基板上,将所述基板放置在金属切割盘上,抽空所述基板与金属切割盘接触面的空气;
对所述晶圆进行切割,切割后将所述晶圆与所述基板分离,得到切割后的晶圆芯片。
作为优选的,所述基板为透明塑料薄板,所述晶圆通过双面有粘性的UV膜粘接在所述透明塑料薄板上。
作为优选的,将平面波导型分光路由器芯片的晶圆粘接在基板上,具体包括:
将晶圆底面置于UV膜的一侧,将基板置于UV膜的另一侧,通过UV灯照射和烘烤,使晶圆底面、基板与UV膜粘结。
作为优选的,抽空所述基板与金属切割盘接触面的空气具体包括:
通过真空装置抽空所述基板与金属切割盘接触面的空气;其中,所述真空装置连接所述金属切割盘上的抽气孔,所述抽气孔与多个气孔连通,所述多个气孔设于所述金属切割盘上,且所述气孔不贯穿所述金属切割盘,所述气孔的开口朝向所述基板。
作为优选的,所述金属切割盘为不锈钢材质,所述金属切割盘表面做镜面处理。
作为优选的,将平面波导型分光路由器芯片的晶圆粘接在基板上前还包括:将晶圆、金属切割盘和切割工具清洗洁净。
作为优选的,切割后将所述晶圆与所述基板分离具体包括:
关闭真空装置将所述基板与所述金属切割盘分离,通过UV灯对切割后的晶圆进行照射和烘烤,使晶圆底面、基板与UV膜分离。
作为优选的,对所述晶圆进行切割具体包括:
通过皮秒激光器对所述晶圆进行切割,所述皮秒激光器的激光束的波长为1064nm,激光束的功率为4~6W,激光束距离晶圆的切割面的聚焦距离为4~6㎜,激光束的移动速率为450~550mm/s。
本发明提出一种平面波导型光分路器芯片切割工艺,通过UV膜对平面波导型分光路由器芯片的晶圆于基板固定,通过带孔的金属切割盘将基板固定,解决了现有技术中芯片的粘接和取出工艺流程复杂,效率低的问题,固定和分离过程中不会损坏晶圆,切割完毕后,关掉抽真空装置,取下塑料薄板,放置在UV灯下照射5秒以上,此时UV膜失去粘性,即可取下切割好的芯片和塑料薄板。
附图说明
图1为根据本发明实施例的平面波导型光分路器芯片切割工艺流程框图;
图2为根据本发明实施例平面波导型光分路器芯片的切割工艺安装图;
图3为根据本发明实施例的平面波导型光分路器芯片的切割工艺安装剖面图。
具体实施方式
下面结合附图和实施例,对本发明的具体实施方式作进一步详细描述。以下实施例用于说明本发明,但不用来限制本发明的范围。
如图1至图3所示,图中示出了一种平面波导型光分路器芯片切割工艺,包括:
将平面波导型分光路由器芯片的晶圆1粘接在基板3上,将所述基板3放置在金属切割盘4上,抽空所述基板3与金属切割盘4接触面的空气;上述晶圆1也可以是条状芯片;
对所述晶圆进行切割,切割后将所述晶圆与所述基板3分离,得到切割后的晶圆芯片。
具体的,所述基板3为透明塑料薄板,所述晶圆1通过双面有粘性的UV膜2粘接在所述透明塑料薄板上。
在本实施例中,金属切割盘4的底座5用于固定金属切割盘4以及连接切割装置。
如图3中所示,在本实施例中,将平面波导型分光路由器芯片的晶圆1粘接在基板3上,具体包括:
将晶圆1按波导方向向上平放,把胶水均匀的点涂在晶圆1顶面上,再把晶圆1盖板轻放在上面,把压块放置在盖板上面,使晶圆1顶面与盖板粘接好,再将晶圆1底面置于UV膜的一侧,将基板3置于UV膜2的另一侧,通过UV灯照射和烘烤,使晶圆1底面、基板3与UV膜粘结好,UV膜2为透明膜。
具体的,在本实施例中,抽空所述基板3与金属切割盘4接触面的空气具体包括:
通过真空装置抽空所述基板3与金属切割盘4接触面的空气,所述真空装置连接所述金属切割盘4上的抽气孔42;
所述抽气孔42与多个气孔41连通,所述多个气孔41设于所述金属切割盘4上,且所述气孔41不贯穿所述金属切割盘4,所述气孔41的开口朝向所述基板3。具体的,每个气孔41的直径都为1mm,通过抽气孔42与真空装置连接,真空装置通过抽气孔42抽出气孔41内的空气,进而通过气压差使基板3与金属切割盘4紧密粘接。
在本实施例中,所述金属切割盘4为不锈钢材质,所述金属切割盘4表面做镜面处理。可以利用金属切割盘4的反射光线对待切割的晶圆1或者条状芯片的参数进行初始化。
在本实施例中,将平面波导型分光路由器芯片的晶圆1粘接在基板3上前还包括:将晶圆1、金属切割盘4和切割工具清洗洁净。
作为优选的,切割后将所述晶圆与所述基板3分离具体包括:
关闭真空装置将所述基板3与所述金属切割盘4分离,通过UV灯对切割后的晶圆进行照射和烘烤,使晶圆1底面、基板3与UV膜分离。
作为优选的,对所述晶圆进行切割具体包括:
通过皮秒激光器对所述晶圆1进行切割,所述皮秒激光器的激光束的波长为1064nm,激光束的功率为4~6W,激光束距离晶圆1的切割面的聚焦距离为4~6mm,激光束的移动速率为450~550mm/s。
使用常规的测高及切割步骤后,关闭抽真空装置,取下透明塑料薄板。在本实施例中,根据照激光切割工艺的特点设计定位标记,并按照激光切割的工艺特点进行晶圆1中芯片的排版布局;采用激光加工的方法通过定位标记将基板3加工形成多个层面不同高度的由若干个切割点组成的切割线;通过裂片方法,将晶圆1沿切割线掰开,即将晶圆1切割成芯片。
具体的,上述步骤中定位标记为设置于相邻两个芯片之间的标记槽,所述标记槽的宽度为8~12μm。定位标记为设置于各个芯片四角的标记点。上述标记点为圆形、方形、椭圆形、三角形的任一种或几种组合。
本发明提出一种平面波导型光分路器芯片切割工艺,通过UV膜对平面波导型分光路由器芯片的晶圆于基板固定,通过带孔的金属切割盘将基板固定,解决了现有技术中芯片的粘接和取出工艺流程复杂,效率低的问题,固定和分离过程中不会损坏晶圆,切割完毕后,关掉抽真空装置,取下塑料薄板,放置在UV灯下照射5秒以上,此时UV膜失去粘性,即可取下切割好的芯片和塑料薄板。
最后,本发明的方法仅为较佳的实施方案,并非用于限定本发明的保护范围。凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。

Claims (7)

1.一种平面波导型光分路器芯片切割工艺,其特征在于,包括:
将平面波导型分光路由器芯片的晶圆粘接在基板上,将所述基板放置在金属切割盘上,抽空所述基板与金属切割盘接触面的空气;
对所述晶圆进行切割,切割后将所述晶圆与所述基板分离,得到切割后的晶圆芯片;
所述金属切割盘为不锈钢材质,所述金属切割盘表面做镜面处理。
2.根据权利要求1所述的平面波导型光分路器芯片切割工艺,其特征在于,所述基板为透明塑料薄板,所述晶圆通过双面有粘性的UV膜粘接在所述透明塑料薄板上。
3.根据权利要求2所述的平面波导型光分路器芯片切割工艺,其特征在于,将平面波导型分光路由器芯片的晶圆粘接在基板上,具体包括:
将晶圆底面置于UV膜的一侧,将基板置于UV膜的另一侧,通过UV灯照射和烘烤,使晶圆底面、基板与UV膜粘结。
4.根据权利要求2所述的平面波导型光分路器芯片切割工艺,其特征在于,抽空所述基板与金属切割盘接触面的空气具体包括:
通过真空装置抽空所述基板与金属切割盘接触面的空气;其中,所述真空装置连接所述金属切割盘上的抽气孔,所述抽气孔与多个气孔连通,所述多个气孔设于所述金属切割盘上,且所述气孔不贯穿所述金属切割盘,所述气孔的开口朝向所述基板。
5.根据权利要求1所述的平面波导型光分路器芯片切割工艺,其特征在于,将平面波导型分光路由器芯片的晶圆粘接在基板上前还包括:将晶圆、金属切割盘和切割工具清洗洁净。
6.根据权利要求2所述的平面波导型光分路器芯片切割工艺,其特征在于,切割后将所述晶圆与所述基板分离具体包括:
关闭真空装置将所述基板与所述金属切割盘分离,通过UV灯对切割后的晶圆进行照射和烘烤,使晶圆底面、基板与UV膜分离。
7.根据权利要求1所述的平面波导型光分路器芯片切割工艺,其特征在于,对所述晶圆进行切割具体包括:
通过皮秒激光器对所述晶圆进行切割,所述皮秒激光器的激光束的波长为1064nm,激光束的功率为4~6W,激光束距离晶圆的切割面的聚焦距离为4~6㎜,激光束的移动速率为450~550mm/s。
CN201711462410.8A 2017-12-28 2017-12-28 一种平面波导型光分路器芯片切割工艺 Active CN108231678B (zh)

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CN106847846A (zh) * 2016-12-23 2017-06-13 江苏正桥影像科技股份有限公司 一种超薄图像传感器晶片的磨制方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103235364A (zh) * 2013-04-28 2013-08-07 四川天邑康和通信股份有限公司 平面光波导分路器芯片切割工艺
CN103972171A (zh) * 2014-05-28 2014-08-06 江苏联恒物宇科技有限公司 基于液体硅印刷的不锈钢基底的芯片切割工艺
CN106847846A (zh) * 2016-12-23 2017-06-13 江苏正桥影像科技股份有限公司 一种超薄图像传感器晶片的磨制方法

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