CN108140439B - 借助于电-机械换能器箔对用于差分相衬成像的光栅的聚焦 - Google Patents

借助于电-机械换能器箔对用于差分相衬成像的光栅的聚焦 Download PDF

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CN108140439B
CN108140439B CN201680057949.2A CN201680057949A CN108140439B CN 108140439 B CN108140439 B CN 108140439B CN 201680057949 A CN201680057949 A CN 201680057949A CN 108140439 B CN108140439 B CN 108140439B
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grating
ridges
layer
grating structure
ray
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CN108140439A (zh
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G·马滕斯
U·范斯特文达勒
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Koninklijke Philips NV
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
    • H10N30/206—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using only longitudinal or thickness displacement, e.g. d33 or d31 type devices

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
CN201680057949.2A 2015-09-30 2016-09-23 借助于电-机械换能器箔对用于差分相衬成像的光栅的聚焦 Expired - Fee Related CN108140439B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15187536 2015-09-30
EP15187536.6 2015-09-30
PCT/EP2016/072651 WO2017055181A1 (en) 2015-09-30 2016-09-23 Focussing of gratings for differential phase contrast imaging by means of electro-mechanic transducer foils

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CN108140439A CN108140439A (zh) 2018-06-08
CN108140439B true CN108140439B (zh) 2022-06-07

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US (1) US20180294065A1 (enExample)
EP (1) EP3192080B1 (enExample)
JP (1) JP2018537144A (enExample)
CN (1) CN108140439B (enExample)
WO (1) WO2017055181A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6613988B2 (ja) * 2016-03-30 2019-12-04 コニカミノルタ株式会社 放射線撮影システム
EP3403581A1 (en) * 2017-05-15 2018-11-21 Koninklijke Philips N.V. Grid-mounting device for slit-scan differential phase contrast imaging
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
US11116463B2 (en) * 2019-01-11 2021-09-14 The Board Of Trustees Of The Leland Stanford Junior University Apparatus with flexible x-ray gratings
EP3826032A1 (en) * 2019-11-22 2021-05-26 Koninklijke Philips N.V. Modular fabrication technique for gratings for interferometric x-ray imaging
CN115373010A (zh) * 2022-08-31 2022-11-22 山东航天电子技术研究所 一种基于磁致变形材料的智能x射线光学系统

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1178726A (en) * 1966-04-26 1970-01-21 Ibm Phase Plates for Use in Optical Systems
US4713985A (en) * 1984-05-31 1987-12-22 Kabushiki Kaisya Advance Kaihatsu Kenkyujo Transmission apparatus
US5794023A (en) * 1996-05-31 1998-08-11 International Business Machines Corporation Apparatus utilizing a variably diffractive radiation element
US6985294B1 (en) * 2003-03-27 2006-01-10 Eric Rosenthal Full spectrum color projector
JP2008048910A (ja) * 2006-08-24 2008-03-06 Shimadzu Corp Ｘ線グリッド
CN101813796A (zh) * 2010-02-26 2010-08-25 深圳大学 一种硅基x射线相位光栅制作方法及其制作装置
CN102365052A (zh) * 2009-03-27 2012-02-29 皇家飞利浦电子股份有限公司 利用圆形光栅进行差分相衬成像
CN102395877A (zh) * 2009-04-17 2012-03-28 西门子公司 用于进行相衬测量的检测装置和x射线断层摄影仪以及进行相衬测量的方法
CN102460237A (zh) * 2009-06-16 2012-05-16 皇家飞利浦电子股份有限公司 倾斜光栅和用于生产倾斜光栅的方法
CN102821693A (zh) * 2010-03-30 2012-12-12 富士胶片株式会社 放射线检测装置、放射线照相设备和放射线系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6930817B2 (en) * 2003-04-25 2005-08-16 Palo Alto Research Center Incorporated Configurable grating based on surface relief pattern for use as a variable optical attenuator
DE102006037256B4 (de) * 2006-02-01 2017-03-30 Paul Scherer Institut Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System
WO2008038752A1 (en) * 2006-09-29 2008-04-03 Nikon Corporation Mobile unit system, pattern forming device, exposing device, exposing method, and device manufacturing method
JP5634318B2 (ja) * 2011-04-19 2014-12-03 三菱電機株式会社 半導体装置
JP5930866B2 (ja) * 2012-06-22 2016-06-08 キヤノン株式会社 液体吐出ヘッド
JP2014006194A (ja) * 2012-06-26 2014-01-16 Canon Inc 構造体の製造方法
US10008659B2 (en) * 2014-12-09 2018-06-26 Lg Innotek Co., Ltd. Fingerprint sensor

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1178726A (en) * 1966-04-26 1970-01-21 Ibm Phase Plates for Use in Optical Systems
US4713985A (en) * 1984-05-31 1987-12-22 Kabushiki Kaisya Advance Kaihatsu Kenkyujo Transmission apparatus
US5794023A (en) * 1996-05-31 1998-08-11 International Business Machines Corporation Apparatus utilizing a variably diffractive radiation element
US6985294B1 (en) * 2003-03-27 2006-01-10 Eric Rosenthal Full spectrum color projector
JP2008048910A (ja) * 2006-08-24 2008-03-06 Shimadzu Corp Ｘ線グリッド
CN102365052A (zh) * 2009-03-27 2012-02-29 皇家飞利浦电子股份有限公司 利用圆形光栅进行差分相衬成像
CN102395877A (zh) * 2009-04-17 2012-03-28 西门子公司 用于进行相衬测量的检测装置和x射线断层摄影仪以及进行相衬测量的方法
CN102460237A (zh) * 2009-06-16 2012-05-16 皇家飞利浦电子股份有限公司 倾斜光栅和用于生产倾斜光栅的方法
CN101813796A (zh) * 2010-02-26 2010-08-25 深圳大学 一种硅基x射线相位光栅制作方法及其制作装置
CN102821693A (zh) * 2010-03-30 2012-12-12 富士胶片株式会社 放射线检测装置、放射线照相设备和放射线系统

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US20180294065A1 (en) 2018-10-11
WO2017055181A1 (en) 2017-04-06
EP3192080A1 (en) 2017-07-19
JP2018537144A (ja) 2018-12-20
CN108140439A (zh) 2018-06-08
EP3192080B1 (en) 2018-04-18

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