CN107706250B - 太阳能电池和用于制造太阳能电池的方法 - Google Patents
太阳能电池和用于制造太阳能电池的方法 Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000000758 substrate Substances 0.000 claims abstract description 78
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 77
- 239000002019 doping agent Substances 0.000 claims abstract description 26
- 229910021419 crystalline silicon Inorganic materials 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims description 14
- 229910052698 phosphorus Inorganic materials 0.000 claims description 11
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical group [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 10
- 239000011574 phosphorus Substances 0.000 claims description 10
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 91
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 52
- 229910052710 silicon Inorganic materials 0.000 description 52
- 239000010703 silicon Substances 0.000 description 52
- 239000000969 carrier Substances 0.000 description 9
- 230000006798 recombination Effects 0.000 description 9
- 238000005215 recombination Methods 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 7
- 238000005530 etching Methods 0.000 description 7
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- 239000002253 acid Substances 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 230000002401 inhibitory effect Effects 0.000 description 4
- 238000010248 power generation Methods 0.000 description 4
- 239000011241 protective layer Substances 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000005468 ion implantation Methods 0.000 description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 2
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- 230000007547 defect Effects 0.000 description 2
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- 230000012447 hatching Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000004151 rapid thermal annealing Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 1
- 229910007264 Si2H6 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N SnO2 Inorganic materials O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- -1 hydrogen Chemical class 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N titanium dioxide Inorganic materials O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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Abstract
本发明提供一种太阳能电池,其具有:第一导电型晶体硅基板10,具有设置在表面上的纹理;和i型非晶硅层16,位于晶体硅基板10的表面上,其中,纹理的底部的曲率半径R1大于其峰部的曲率半径R2。晶体硅基板10在其表面上具有含有第一导电型掺杂剂的第一导电型高掺杂区域10b,并且第一导电型高掺杂区域10b中的掺杂剂浓度高于晶体硅基板10的厚度方向上的中部中的掺杂剂浓度。
Description
相关申请的交叉引用
2016年8月8日提交的日本专利申请第2016-155419号的全部公开内容(包括说明书、权利要求书、附图和摘要)通过引用全部合并于此。
技术领域
本公开内容涉及一种太阳能电池和用于制造太阳能电池的方法。
背景技术
已知表面上设置有纹理(texture)的太阳能电池,该纹理是凹凸结构。通过提供纹理,减少了光的反射,并且由于发电层中的光程长度的延长,可提高发电效率。为了减少透明导电层表面的光反射量,例如,已知如下方法,在该方法中,用碱性溶液或酸性溶液处理硅基板表面,从而通过利用取决于面方向的湿蚀刻速度的差异而形成纹理。
如图4所示,在硅基板50的表面设置有纹理的太阳能电池中,入射到硅基板50上的光在凹凸结构的峰部(图中由阴影所示的纹理的尖端部分)折射并汇聚。因此,与其它区域相比,产生的载流子的密度在纹理的峰部变得更高。同样在这样的太阳能电池中,需要太阳能电池中尽可能地抑制高密度载流子的重新组合并且需要太阳能电池具有进一步提高的输出。
本公开内容的目的在于,提供一种在使用具有纹理的硅基板的情况下,在硅基板的表面附近的载流子寿命改善的太阳能电池及其制造方法。
发明内容
本公开内容的一个方面是一种太阳能电池,其具有:第一导电型晶体硅基板,其表面上设置有纹理;和非晶硅层,位于晶体硅基板的表面上,其中,纹理的底部比其峰部具有更大的曲率半径;晶体硅基板在表面上具有包括第一导电型掺杂剂的第一导电型高掺杂区域;并且第一导电型高掺杂区域比在晶体硅基板的厚度方向上的中心部分具有更高的掺杂剂浓度。
本公开内容的另一方面是一种用于制造太阳能电池的方法,包括:第一步骤,在第一导电型晶体硅基板的表面上形成纹理;第二步骤,在其上形成有纹理的硅基板的表面上扩散第一导电型掺杂剂,使得该表面比硅基板的厚度方向上的中心部分具有更高的掺杂剂浓度;以及第三步骤,在其上形成有纹理的硅基板的表面侧形成非晶硅层,其中,在第一步骤中,形成纹理,使得其底部比其峰部具有更大的曲率半径。
附图说明
将基于以下附图描述本公开内容的实施方式,其中:
图1是示出本发明的实施方式中的太阳能电池的结构的截面示意图;
图2是示出本发明的实施方式中的太阳能电池的结构的放大截面示意图;
图3是用于说明本发明的实施方式中的太阳能电池的作用的视图;且
图4是用于说明相关技术中的太阳能电池的作用的视图。
具体实施方式
在下文中,将参考附图详细描述根据本公开内容的实施方式(以下称为实施方式)。在本说明书中,具体的形状、材料、数值、方向等是便于理解本公开内容的示例,并且可根据应用、目的、规格等适当地改变。此外,在以下包括多个实施方式和变型实例的情况下,一开始就假设,通过适当地组合它们来使用其特征部分。此外,示意性地示出了实施方式的描述过程中参考的附图,并且在一些情况下附图中绘制的构成元件的尺寸比例等与实际项目的尺寸比例不同。
图1是太阳能电池100的示意性截面图。如图1所示,太阳能电池100具有作为第一导电型的n型晶体硅基板(以下称为硅基板)10、第一i型非晶硅层12、作为第二导电型的p型非晶硅层(以下称为p型非晶硅层)14、第二i型非晶硅层16和n型非晶硅层18。
硅基板10可为n型多晶硅基板,但优选为n型单晶硅基板。在本实施方式中,使用硅基板10,其中在进行后述的蚀刻步骤之前的阶段中,前表面和后表面的面方向为(100)面。
第一i型非晶硅层12设置在硅基板10的第一主表面上。此外,p型非晶硅层14设置在硅基板10的第一主表面侧。详细地,p型非晶硅层14设置在第一i型非晶硅层12的与硅基板10侧相反的一侧。第二i型非晶硅层16设置在硅基板10的第二主表面上。n型非晶硅层18设置在第二i型非晶硅层16的与硅基板10侧相反的一侧。
第一i型非晶硅层12、p型非晶硅层14、第二i型非晶硅层16和n型非晶硅层18具有抑制光生载流子重新组合的功能。通过化学气相沉积(CVD)方法,特别是等离子体CVD方法适当地沉积这些硅层12、14、16和18。作为用于沉积硅层12、14、16和18的原料气体,适当地使用SiH4、Si2H6等的含硅气体或这些气体与H2的混合物。作为形成p型或n型非晶硅层14或18的掺杂气体,例如适当地使用B2H6或PH3。添加的杂质例如P和B的量仅需为痕量,并且也可使用与SiH4、H2等的混合气体。
第一和第二i型非晶硅层12和16优选为i型氢化非晶硅层(i型a-Si:H);并且p型非晶硅层14优选为p型氢化非晶硅层(p型a-Si:H)。此外,n型非晶硅层18优选为n型氢化非晶硅层(n型a-Si:H)。i型a-Si:H层可通过使用利用H2稀释的SiH4原料气体的CVD方法进行沉积。p型a-Si:H层的沉积使用添加有B2H6并用氢气稀释的SiH4原料气体。n型a-Si:H层的沉积使用含有PH3代替B2H6的原料气体。这里,非晶硅层12、14、16、18中的每一个都不一定需要氢化。此外,每一个半导体层的沉积方法都没有特别限定。
假定太阳能电池100从n型非晶硅层18侧接收光。如图1所示,太阳能电池100在与光入射侧相反的一侧的后表面侧具有顺序位于p型非晶硅层14上的透明导电层20和后侧集电极22。此外,太阳能电池100在作为光入射侧的前表面侧具有顺序位于n型非晶硅层18上的透明导电层24和前侧集电极26。透明导电层20形成在p型非晶硅层14的后表面的几乎整个区域上,并且透明导电层24形成在n型非晶硅层18的前侧表面的几乎整个区域上。透明导电层20和24各自具有透明性和导电性。透明导电层20和24各自由例如In2O3、ZnO、SnO2或TiO2的金属氧化物构成。这些金属氧化物可掺杂有例如Sn、Zn、W、Sb、Ti、Ce、Zr、Mo、Al或Ga的掺杂剂。
后侧集电极22和前侧集电极26例如利用导电胶通过丝网印刷包含大量指状部分和数量少于指状部分的汇流条(busbar)部分的图案而形成。与前侧集电极26相比,后侧集电极22优选地形成为更大的面积,并且后侧集电极22的指状部分的数量优选形成为比前侧集电极26的指状部分更多。这里,由于电极的结构没有特别限定,所以例如,可由在透明导电层的几乎整个面积上形成的金属层构成后表面侧集电极。
假定太阳能电池100从n型非晶硅层18侧接收光,但是太阳能电池也可从p型非晶硅层14侧接收光。此外,太阳能电池可从p型非晶硅层14侧和n型非晶硅层18侧两者同时接收光。
此外,在硅基板10的表面上,设置纹理。纹理是指用于抑制表面反射以增加硅基板10的光吸收量的表面的凹凸结构。该纹理例如仅形成在光入射表面上,或者同时在光入射表面和后表面两者上。
可通过应用酸蚀刻或碱蚀刻以蚀刻硅基板10的表面来形成纹理结构。酸蚀刻可通过使用含有例如氢氟酸和氧化剂(硝酸或铬酸)的水溶液来进行。碱蚀刻可通过使用含有例如肼(NH)、氢氧化钠(NaOH)和氢氧化钾(KOH)的水溶液进行。
例如,在硅基板10在进行蚀刻处理之前的阶段中是具有(100)面的表面的单晶硅基板的情况下,通过应用各向异性蚀刻,形成具有金字塔形状的凹凸结构的纹理,金字塔形状的(111)面成为其倾斜表面。纹理的高度为例如1μm至10μm。
在纹理形成在单晶硅基板上之后,当使用硝基氟酸(氢氟酸和硝酸的混合酸)进一步处理硅基板时,可圆化纹理的底部。通过使纹理的尖端部分和底部圆化,当太阳能电池受到冲击时,能够抑制太阳能电池的纹理的尖端部分的碎裂和其底部的开裂。
在本实施方式中,如图2的放大截面图所示,在纹理的凹凸结构中,底部的曲率半径R1形成为比峰部的曲率半径R2大。这里,底部是指纹理中的谷部的尖端部分,峰部是指纹理中的脊部的尖端部分。也就是说,在本实施方式中,在纹理的凹凸结构中,使底部具有比峰部更温和的形状。底部的曲率半径R1的上限值没有特别限定,但是可适当地设定为不显著降低纹理的光学作用的值。
如图2所示,硅基板10具有低掺杂区域10a和第二主表面侧高掺杂区域10b。低掺杂区域10a被掺杂为n型。此外,第二主表面侧高掺杂区域10b设置在低掺杂区域10a与第二i型非晶硅层16之间,成为光入射表面侧。第二主表面侧高掺杂区域10b为n+区域,这里n型掺杂剂掺杂的量比低掺杂区域10a中的量高。也就是说,第二主表面侧高掺杂区域10b比低掺杂区域10a具有更高的n型掺杂剂浓度。第二主表面侧高掺杂区域10b设置在低掺杂区域10a的n型非晶硅层18侧的整个表面上。
第二主表面侧高掺杂区域10b通过使用离子注入方法、热扩散方法、等离子体掺杂方法或外延生长方法形成。作为n型掺杂剂,使用P(磷)、As(砷)、Sb(锑)等,特别地,适当地使用P。
例如,在通过在表面上利用混合的POCl3气体进行热处理而抑制了缺陷生成的状态下,可在形成有纹理的硅基板10的表面上掺杂P(磷)。此外,在使用离子注入方法的情况下,为了减少在离子注入中生成的缺陷,优选组合使用高温退火或RTA(快速热退火)。此外,可通过湿式工艺在硅基板上形成扩散源,然后通过热处理将P(磷)等扩散至硅基板的表面来形成第二主表面侧高掺杂区域10b。
这里,将描述第二主表面侧高掺杂区域10b的掺杂概况。在掺杂剂扩散至硅基板10的情况下,可根据面方向获得不同的掺杂概况。在本实施方式中,在硅基板10中掺杂P(磷)的情况下,与扩散到(111)面中相比,P(磷)更容易扩散到(100)面中,并且在相同的热扩散条件(例如,850℃,1小时)下,与(111)面相比,(100)面给出更长的掺杂剂扩散长度和更高的掺杂剂浓度。
在本实施方式中,在硅基板10的凹凸结构中,形成纹理,使得底部的曲率半径R1变得大于峰部的曲率半径R2。纹理的倾斜表面为(111)面,并且在具有更大曲率半径R1的凹凸结构的底部中,具有接近(100)面的面方向的区域比其它区域延伸更多。因此,与其它区域相比,在掺杂时间期间,通过热扩散,掺杂剂更容易在纹理的底部的深度方向上扩散。也就是说,第二主表面侧高掺杂区域10b在底部变厚并且掺杂剂浓度变高。
例如,在第二主表面侧高掺杂区域10b的层厚度在底部以外的区域中为约50nm的情况下,第二主表面侧高掺杂区域10b的层厚度在底部区域中可为约100nm。
然而,第二主表面侧高掺杂区域10b的层厚度的关系不限于此,只要第二主表面侧高掺杂区域10b的层厚度在靠近纹理的底部的区域中比其它区域更大即可。第二主表面侧高掺杂区域10b的层厚度可通过掺杂方法、掺杂条件等进行适当地调节。
如上所述,通过在纹理形成之后通过处理形成底部使得底部的曲率半径变大,并且增加第二主表面侧高掺杂区域10b中在底部中的掺杂剂的量,纹理的峰部中产生的载流子被有效地分离,并且可抑制载流子的重新组合。
此外,低掺杂区域10a中P(磷)的平均掺杂浓度优选为约1×1014至1×1016cm-3,最优选为1×1014至1×1015cm-3。相比之下,第二主表面侧高掺杂区域10b中的P(磷)的平均浓度适当地为约1×1018cm-3。在使用热扩散方法或等离子体掺杂方法形成第二主表面侧高掺杂区域10b的情况下,形成如下浓度梯度,随着第二主表面侧高掺杂区域10b中的区域与低掺杂区域10a间隔越远,浓度逐渐变高。此时,第二主表面侧高掺杂区域10b的掺杂剂浓度的平均值在底部区域中比在其它区域中更高。
这里,虽然低掺杂区域10a的掺杂浓度已经确定为1×1014至1×1016cm-3,并且第二主表面侧高掺杂区域10b的掺杂浓度已经确定为1×1018cm-3或更高,但是这些区域的掺杂浓度不限于此。也就是说,只要第二主表面侧高掺杂区域10b的掺杂浓度高于低掺杂区域10a的掺杂浓度即可。特别地,第二主表面侧高掺杂区域10b的掺杂浓度优选为低掺杂区域10a的掺杂浓度的约100倍至1000倍。
与常规太阳能电池相比,根据本实施方式的太阳能电池100可实现提高的发电效率。这推测是由于以下作用。
如图3所示,进入硅基板10的光在凹凸结构的峰部(图中阴影所示的纹理的尖端部分)折射并汇聚。因此,纹理的峰部中产生的载流子的密度比其它区域高。在根据本实施方式的太阳能电池100中,设置在硅基板10与第二i型非晶硅层16之间的第二主表面侧高掺杂区域10b形成得更厚,并且在纹理的底部中比其它区域中具有更高的掺杂浓度。由于掺杂浓度高的区域具有高导电性,所以通过光的进入产生的载流子容易流向底部,从而便于载流子扩散。因此,可使产生的载流子集中的纹理的峰部中的载流子重新组合的可能性降低,以提高载流子的寿命,从而提高太阳能电池的发电效率。
这里,在本实施方式中,描述了在低掺杂区域10a的n型非晶硅层18侧的整个表面上设置第二主表面侧高掺杂区域10b的示例。然而,第二主表面侧高掺杂区域10b可设置在低掺杂区域的n型非晶硅层18侧的表面的一部分上。第二主表面侧高掺杂区域10b例如可仅设置在与厚度方向近似正交的方向的两端部上,也可仅设置在近似正交的方向的中央部。
此外,尽管已经描述了使用第二主表面侧,即n型非晶硅层18侧作为光入射表面,但是允许使用第一主表面侧,即p型非晶硅层14侧作为光入射表面。在这种情况下,只要在硅基板10的第一主表面侧形成纹理,并且在第一主表面侧设置掺杂n型掺杂剂的高掺杂区域10b即可。此时,通过形成纹理,使得在硅基板10的凹凸结构中,底部的曲率半径R1变得大于峰部的曲率半径R2,可使底部中的高掺杂区域10b的层厚度比峰部中的高掺杂区域10b的层厚度更大。
此外,可在第一主表面侧和第二主表面侧同时形成纹理,并且可在第一主表面侧和第二主表面侧的两个表面上同时设置掺杂n型掺杂剂的高掺杂区域10b。
这里,在上述实施方式中,已经描述了第一和第二i型非晶硅层12和16优选为i型氢化非晶硅层(i型a-Si:H),p型非晶硅层14优选为p型氢化非晶硅层(p型a-Si:H),n型非晶硅层18优选为n型氢化非晶硅层(n型a-Si:H)。然而,这些层(12、16、14和18)的材料不受限制,只要它们能够抑制硅基板10的表面上的重新组合并且通过光照射分离在硅基板10中产生的导电载流子。
例如,在硅基板10的表面上形成的层为单层的情况下,代替i型a-Si:H,可使用p型或n型a-Si:H,或i型或p型或n型a-SiC:H。在如上述实施方式中层叠多个层的情况下,在硅基板10附近的一侧,设置i型a-Si:H或i型a-SiC:H,或由p型或n型a-Si:H或a-SiC:H组成的低浓度层。在i型层或低浓度层上,可层叠高浓度p型或n型a-Si:H或p型μc-Si:H等。这里,虽然在本文中举例说明了氢化材料,但是材料可以不是氢化的。
此外,构成太阳能电池100的每一层的层厚度当然可适当变化。例如,硅基板10的厚度可为50μm至300μm。此外,可使硅基板10的第一和第二主表面侧的重新组合抑制层的厚度为1nm至50nm,优选为2nm至15nm。
此外,在本实施方式中,已经描述了在硅基板10的第一和第二主表面侧的重新组合抑制层上没有形成保护层的示例。然而,在硅基板10的第一和第二主表面侧的重新组合抑制层的至少一个上,可形成保护层。保护层具有例如抑制对于重新组合抑制层的损害和抑制光的反射的功能。保护层优选由具有高透光率的材料构成,并且适当地由氧化硅(SiO2)、氮化硅(SiN)、氮氧化硅(SiON)等构成。
如上所述,本发明的一个方面是一种太阳能电池,具有:第一导电型晶体硅基板(硅基板10),在其表面上设置有纹理;和非晶硅层(第一i型非晶硅层12或第二i型非晶硅层16),位于硅基板的表面侧,其中,纹理的底部的曲率半径R1大于峰部的曲率半径R2,并且硅基板(硅基板10)具有在表层中掺杂第一导电型掺杂剂的第一导电型掺杂区域(第一主表面侧高掺杂区域10b)。
这里,第一导电型掺杂区域(第一主表面侧高掺杂区域10b)在纹理的底部适当地具有比其峰部的层厚度更大的层厚度。
此外,本发明的另一方面是一种用于制造太阳能电池的方法,包括:第一步骤,在第一导电型晶体硅基板(硅基板10)的表面上形成纹理;第二步骤,将第一导电型掺杂剂扩散至形成有纹理的硅基板(硅基板10)的表面;以及第三步骤,在形成有纹理的硅基板(硅基板10)的表面侧形成非晶硅层(第一i型非晶硅层12或第二i型非晶硅层16),其中,在第一步骤中,形成纹理,使得其底部具有比其峰部的曲率半径R2更大的曲率半径R1。
此外,第一导电型适当地为n型,并且掺杂剂适当地为磷。
这里,本发明的应用范围不限于上述实施方式。也就是说,只要太阳能电池具有如下结构:在基板表面上形成纹理的凹凸结构,并且在基板表面上设置高掺杂层,就可应用本发明。
Claims (7)
1.一种太阳能电池,包括:具有前表面和后表面的第一导电型的晶体硅基板;以及设置于所述晶体硅基板的所述前表面上的第一导电型的第一非晶硅层,
所述太阳能电池的特征在于:
所述晶体硅基板包括第一导电型的低掺杂区域和掺杂浓度为所述低掺杂区域的100倍~1000倍的第一导电型的高掺杂区域,所述第一导电型的高掺杂区域形成于所述低掺杂区域与所述第一非晶硅层之间,
所述晶体硅基板在其前表面上具有纹理结构,所述纹理的底部的曲率半径比所述纹理的峰部的曲率半径更大,
关于所述第一导电型的高掺杂区域的沿所述晶体硅基板的厚度方向的厚度,在所述纹理的底部的厚度大于在所述纹理的峰部的厚度。
2.根据权利要求1所述的太阳能电池,其特征在于,还包括:
设置于所述晶体硅基板的所述后表面的第二非晶硅层;
设置在所述第一非晶硅层上的第一电极;和
设置在所述第二非晶硅层上的第二电极,
所述第二非晶硅层为与所述第一导电型不同的第二导电型,
所述第一电极的形成面积大于所述第二电极的形成面积。
3.根据权利要求1所述的太阳能电池,其中,所述第一导电型为n型,并且所述掺杂剂为磷。
4.根据权利要求1至3中任一项所述的太阳能电池,其中,所述第一导电型的高掺杂区域设置于所述晶体硅基板的光入射表面侧。
5.根据权利要求1至3中任一项所述的太阳能电池,其中,所述第一导电型的高掺杂区域设置于所述晶体硅基板的后表面侧。
6.一种用于制造太阳能电池的方法,包括:
第一步骤,在具有前表面和后表面的第一导电型的晶体硅基板的所述前表面上形成纹理;
第二步骤,在形成了所述前表面上扩散第一导电型掺杂剂,使得所述晶体硅基板包括第一导电型的低掺杂区域和掺杂浓度为所述低掺杂区域的100倍~1000倍的第一导电型的高掺杂区域;以及
第三步骤,在形成了所述前表面上形成第一非晶硅层,
其中,在所述第一步骤中,所述纹理形成为使得所述纹理的底部具有比所述纹理的峰部的曲率半径更大的曲率半径,
所述第一导电型的高掺杂区域形成于所述低掺杂区域与所述第一非晶硅层之间,
关于所述第一导电型的高掺杂区域的沿所述晶体硅基板的厚度方向的厚度,在所述纹理的底部的厚度大于在所述纹理的峰部的厚度。
7.根据权利要求6所述的用于制造太阳能电池的方法,其中,所述第一导电型为n型,并且所述掺杂剂为磷。
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