CN107199183A - Electronic unit test separator - Google Patents
Electronic unit test separator Download PDFInfo
- Publication number
- CN107199183A CN107199183A CN201710102266.0A CN201710102266A CN107199183A CN 107199183 A CN107199183 A CN 107199183A CN 201710102266 A CN201710102266 A CN 201710102266A CN 107199183 A CN107199183 A CN 107199183A
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- mentioned
- test
- loading
- pallet
- electronic unit
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- 238000012360 testing method Methods 0.000 title claims abstract description 148
- 239000000872 buffer Substances 0.000 claims abstract description 93
- 238000011084 recovery Methods 0.000 claims abstract description 53
- 238000013102 re-test Methods 0.000 claims description 32
- 238000000034 method Methods 0.000 description 22
- 239000012160 loading buffer Substances 0.000 description 14
- 230000003139 buffering effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 239000008186 active pharmaceutical agent Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000007726 management method Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000011010 flushing procedure Methods 0.000 description 1
- 238000013095 identification testing Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3412—Sorting according to other particular properties according to a code applied to the object which indicates a property of the object, e.g. quality class, contents or incorrect indication
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/06009—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
- G06K19/06018—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding
- G06K19/06028—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding using bar codes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10009—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K2007/10485—Arrangement of optical elements
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Environmental & Geological Engineering (AREA)
- Electromagnetism (AREA)
- General Health & Medical Sciences (AREA)
- Artificial Intelligence (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention relates to electronic unit test separator.The electronic unit test of the present invention is included with separator：Loading device, for multiple electronic units to be tested to be loaded onto into test pallet with pallet from supply；Attachment means, for making the multiple electronic units for being loaded into above-mentioned test pallet be electrically connected with tester；Discharge mechanism, for unloading the multiple electronic units for completing to test from test pallet and making electronic unit be moved to recovery with pallet；And buffer unit, with the buffer table that can be moved between the working region of above-mentioned loading device and the working region of above-mentioned discharge mechanism.And, as needed, buffer unit makes above-mentioned buffer table be moved between the working region of above-mentioned loading device and the working region of above-mentioned discharge mechanism, so that above-mentioned buffer table is flexibly applied to the loading work carried out by above-mentioned loading device and the unloaded operation carried out by above-mentioned discharge mechanism.
Description
Technical field
The present invention relates to the separator (handler) of the electrical characteristics for testing the electronic unit produced.Especially, it is related to
The mobile technology of the electronic unit carried out in separator.
Background technology
Multiple electronic units such as semiconductor element or module storage after manufacture, are delivered after electrical characteristics are tested.This
When, it is necessary to use the separator for electrically connecting electronic unit to be tested with tester.
In general, separator includes test pallet, the first piler, loading device, attachment means, discharge mechanism and the
Two pilers.
Test pallet is along the circulation that loading position is then connected to after loading position, test position and unloading position
Path and circulate.
First piler, which is used to store, loads multiple multiple supply pallets for having an electronic unit to be tested.By successively
The supply for being accommodated in this first piler is supplied to supply position with pallet, everything goes well with your work for the loading for making by loading device
Carry out.
Loading device is used to being loaded onto multiple electronic units to be tested into the survey positioned at loading position with pallet from supply
Try pallet.
Attachment means are when the test pallet arrival test position for making to complete multiple electronic units loading by loading device
When putting, the multiple electronic units for being loaded into test pallet are made to be electrically connected with tester.
Discharge mechanism is used for after the test that test position completes to the multiple electronic units being loaded, and position is unloaded from reaching
The test pallet put unloads multiple electronic units, is classified according to test result and is moved to recovery with pallet.
Second piler is used to store the multiple recovery pallets for reclaiming the multiple electronic units for completing test.
This multiple recovery, by supplying successively to recovery position, make to be smoothed out by the unloaded operation of discharge mechanism with pallet.
But, such as KR published patent the 10-2009-0063542nd completes to be categorized as re-test after once testing
Multiple electronic units, supplying again to separator needs by secondary re-test (Retest) process.Now, recovery is loaded into use
The multiple electronic units for being categorized as re-test of pallet are manually fed to separator by operator.
Therefore, the operating of separator once between test and secondary re-test is terminated, and this makes the operation ratio of separator
Decline.
On the other hand, such as KR published patent the 10-2009-0008062nd, to help by the suitable of loading device
When loading work, buffer table is set in separator.
In general, buffer table is by closing of the test jack positioned at tester etc., have when can be loaded in loading temporarily
The electronic unit that necessity is removed temporarily.Thus, loading work becomes smooth, and loading velocity is improved.Wherein, close to extinguish
(OUT) test jack, for fc-specific test FC socket whether be close object, can be changed according to the intention of designer.For example,
In the case that improper judgement more than setting number of times occurs in fc-specific test FC socket, it may be set to close the test jack.Moreover,
In the case of the test jack with closing, the ministry of electronics industry is not loaded on the position of the corresponding test jack of test pallet
Part, but will wait that the electronic unit for being loaded into the position is gathered, set to it is a certain amount of when remove to test pallet.The present invention
It is related to the flexible Application of this buffer table.
The content of the invention
The technical problem to be solved
It is a first object of the present invention to provide making loading work, unloaded operation and again by flexible Application buffer table
Test jobs are smoothed out.
It is a second object of the invention to provide correctly holding flexible Application buffer table by recognizing electronic unit individually
Electronic unit flow technology.
The technical scheme solved the problems, such as
According to the first embodiment of the invention electronic unit test is included with separator：Test pallet, along process
The circulating path of loading position is then connected to after loading position, test position and unloading position and is circulated；Loading device, is used for
Multiple electronic units to be tested are loaded onto the above-mentioned test pallet positioned at above-mentioned loading position from supply with pallet；Connection dress
Put, when making the test pallet that multiple electronic units are completed with loading reach above-mentioned test position by above-mentioned loading device, make
The multiple electronic units for being loaded into above-mentioned test pallet are electrically connected with tester；Discharge mechanism, in the completion pair of above-mentioned test position
After the test for the multiple electronic units being loaded, multiple ministrys of electronics industry are unloaded from the above-mentioned test pallet for reaching above-mentioned unloading position
Part, is classified according to test result and is moved to recovery with pallet；And buffer unit, with can be in above-mentioned loading device
Working region and above-mentioned discharge mechanism working region between the buffer table that moves, as needed, above-mentioned buffer unit makes
State buffer table the working region of above-mentioned loading device and above-mentioned discharge mechanism make moved between region so that above-mentioned buffering
Platform is flexibly applied to the loading work carried out by above-mentioned loading device and the unloaded operation carried out by above-mentioned discharge mechanism.
The specific electronic components being categorized as by test result re-test are loaded into and unloaded positioned at above-mentioned by above-mentioned discharge mechanism
The above-mentioned buffer table for the working region put is carried, above-mentioned loading device makes from the working region of above-mentioned discharge mechanism to above-mentioned loading
Specific electronic components on the above-mentioned buffer table of the working region movement of device are moved to the test pallet positioned at above-mentioned loading position
It is dynamic.
Above-mentioned electronic unit test separator also includes：First piler, multiple electricity to be tested are mounted with for storing
Multiple supply pallets of subassembly；And second piler, the multiple electronic units for completing test are returned for storing
The multiple recovery pallets received, above-mentioned second piler, including：Lifting frame, can be in the way of mutually leaving predetermined distance
Multiple recovery pallets are loaded along above-below direction；Lifter, for lifting above-mentioned lifting frame；And multiple advance and retreat devices,
The multiple recovery for being loaded into above-mentioned lifting frame is optionally retreated with pallet, reclaimed so that multiple recovery are located at pallet
Position is retracted into reception position.
Electronic unit test second embodiment of the invention is included with separator：Test pallet, along process
Circulating path circulation is then connected to after loading position, test position and unloading position；Loading device, for will be to be tested many
Individual electronic unit is loaded onto the above-mentioned test pallet positioned at above-mentioned loading position from supply with pallet；Attachment means, when by upper
State loading device make to multiple electronic units complete loading test pallet reach above-mentioned test position when, make to be loaded into above-mentioned survey
Multiple electronic units of examination pallet are electrically connected with tester；Discharge mechanism, completes multiple to what is be loaded in above-mentioned test position
After the test of electronic unit, multiple electronic units are unloaded from the above-mentioned test pallet for reaching above-mentioned unloading position, are tied according to test
Fruit is classified and moved to recovery with pallet；And identifying device, it is located at for recognizing to be loaded onto by above-mentioned loading device
Multiple electronic units of the above-mentioned test pallet of above-mentioned loading position, above-mentioned loading device will make multiple electronic units for being held
By above-mentioned identifying device to the above-mentioned test pallet movement positioned at above-mentioned loading position, enabling by above-mentioned identifying device
Multiple electronic units that identification is held, above-mentioned identifying device, including：Camera, the bar of electronic unit is printed in for shooting
Shape code；And reader, for reading the bar code on the picture shot by above-mentioned camera.
Above-mentioned identifying device also includes speculum, corresponding with above-mentioned camera, will be printed in the bar code of electronic unit
Reflex to above-mentioned camera.
Above-mentioned loading device recognizes bar code in the state of electronic unit is held.
Above-mentioned identifying device also includes foreign matter removal mechanism, the foreign matter for removing electronic unit.
Above-mentioned loading device can hold multiple electronic units, and above-mentioned identifying device is used to recognize with being in by above-mentioned loading
The bar code of multiple electronic units in the state of device holding.
Above-mentioned reader also reads the loading side of above-mentioned electronic unit in the lump by the picture shot by above-mentioned camera
To.
The identification that bar code is together carried out by above-mentioned identifying device loads the reading in direction with electronic unit.
The beneficial effect of invention
According to the present invention as described above, have the following effects that.
Firstth, due to buffer table to be flexibly applied to loading work, unloaded operation and re-test operation so that with minimum
Additional structure carrys out the mobile flow of optimization of electronic part, so that the effect with the operation ratio for being finally greatly improved separator
Really.
Secondth, electronic unit is recognized by using identifying device individually, so as to support the ministry of electronics industry using buffer table
The mobile flow of part.
3rd, identifying device is by the additional identification function for recognizing electronic unit, to obtain the loading direction of electronic unit
Read functions and electronic unit foreign matter remove function, so that the effective utilization and design of identifying device can be realized.
Brief description of the drawings
Fig. 1 is the conceptual top view of the electronic unit test separator according to one embodiment of the invention.
Fig. 2 and Fig. 3 is the accompanying drawing for illustrating the identifying device of the separator suitable for Fig. 1.
Fig. 4 is that the example related to electronic unit to be tested is regarded.
Fig. 5 is the schematic top related to the buffer unit of the separator suitable for Fig. 1.
Fig. 6 is the loading buffer board/between unloading buffer board and buffer table for illustrating the separator suitable for Fig. 1
Difference in height accompanying drawing.
Fig. 7 and Fig. 8 is for illustrating to make recovery pallet be located at recovery position in the second piler suitable for separator
Technology accompanying drawing.
Fig. 9 to Figure 11 is the example for showing the bar code for shooting electronic unit.
The explanation of reference
100：Electronic unit test separator
TT：Test pallet
120：Loading device
130：Loading buffer board
140：Identifying device
150：Attachment means
160：Discharge mechanism
170：Unloading buffer board
190：Buffer unit
191：Buffer table
192：Shifter
Embodiment
As described above, illustrated according to multiple preferred embodiments of the present invention by referring to accompanying drawing, but it is succinct for what is illustrated
Property, omit or compress as far as possible the explanation repeated.
Fig. 1 is the (hereinafter referred to as " sorting of electronic unit test separator 100 according to one embodiment of the invention
Machine ") conceptual top view.
Fig. 1 separator include test pallet TT, the first piler 110, loading device 120, loading with buffer board 130,
Identifying device 140, attachment means 150, discharge mechanism 160, unloading buffer board 170, the second piler 181,182,183 and slow
Flushing device 190.
Test pallet TT, is loaded along LP is then connected to after loading position LP, test position TP and unloading position UP
The circulating path C of position and circulate.This test pallet TT is used to connect loading position LP, test position TP and unloading position UP
Electronic unit movement.That is, multiple electronic units in loading position LP to be loaded into test pallet TT state, by test
After the TP of position, unloading position UP is moved to.
In the first piler 110, the multiple supply pallet ST for loading multiple electronic units to be tested are accommodated with.Store
In this first piler 110 multiple supplies with pallet ST by supplying successively to supply position SP, can make by loading dress
Put 120 loading everything goes well with your work carry out.The knot that this first piler 110 directly can be loaded supply pallet ST by operator
Structure is constituted, and can be also made up of multiple supplies with the pallet ST structures for housing the chassis loaded.
As reference, waited in supply position SP upside or supply with pallet ST before supply position SP is entered etc.
Time position WP upside is settable camera CM.In the case, due to can in advance confirm to be loaded into confession by camera CM
To multiple electronic unit D with pallet ST loading whether (" loaded " position or quantity), can suitable control loading device 120.When
So, because supply position SP belongs to the working region of loading device 120, it is preferable that such as the present embodiment, waiting the upper of position WP
Side sets camera CM.
Loading device 120 makes multiple electronic units to be tested be loaded onto position with pallet ST from the supply positioned at supply position SP
In loading position LP test pallets TT.
Loading is used to load multiple electronic units to be tested temporarily with buffer board 130 according to demand.This loading buffering
Plate 130 is to be fixedly installed.Therefore, above-mentioned loading device 120 performs following operation according to control situation, i.e. by the multiple of holding
Electronic unit is loaded into loading buffer board 130, or will be loaded into loading and be moved to position with multiple electronic units of buffer board 130
In loading position LP test pallet TT.
Identifying device 140 is used to recognize to be under gripping state by loading device 120, and from supply position, ST is moved to
Multiple electronic units of loading position LP process.As long as this identifying device 140 can recognize multiple electronic units individually
.Therefore, it can be made up of bar code reader or camera, can be by this case it is necessary to be printed with electronic unit
Bar code or the identification code of camera identification.Moreover, when plane is overlooked, loading device 120 is with by multiple ministrys of electronics industry of holding
Mode control of the part by being moved to the test pallet TT positioned at loading position LP after the identification position RP for being provided with identifying device 140
System so that recognize electronic unit by identifying device 140.Also, when being necessary for this, can hold loading device 120 is more
Individual electronic unit temporarily stops at identification position RP, and then, more or less retreated multiple electronic units in identification position RP, so that
The electronic unit correctly recognized by identifying device 140.
Figure 2 illustrates one relevant with identifying device 140.Identifying device 140 is by four bar code reader BR structures
Into four bar code reader BR are separated at predetermined intervals.This bar code reader BR can be camera, and with by anti-
Mirror M is penetrated to shoot bar code B structure.Certainly, loading device 120 can hold four ministrys of electronics industry simultaneously with state spaced apart from each other
Part D, electronic unit D side needs printed bar code.In Fig. 2 example, loading device 120 can be by four ministrys of electronics industry of holding
Part D temporarily declines, and is correct identification bar code as shown in figure 3, multiple electronic unit D are positioned over after multiple speculum M, will
Advance and retreat in front-rear direction more or less multiple electronic unit D, make multiple bar code reader BR recognize multiple electronic unit D's
Bar code.Certainly, when completing the identification bar code by multiple bar code reader BR, reader DA is read by bar code
The bar code on picture that reader BR is shot.In the case where the bar code reader BR of such as the present embodiment is camera, read
Take whether device DA can reflect picture to confirm electronic unit D loading direction by bar code, also can be whole by flexible Application
Body picture reads the form (Fig. 4 direction flute profile state etc.) in the region beyond bar code, so as to confirm electronic unit D loading
Direction.
Also, it is formed with the stream L for being blown into wind to electronic unit D in identifying device 140.Therefore, because can pass through
Stream L is blown into wind to electronic unit D, can out of electronic unit D foreign matter.That is, stream L has as removing electronic unit
The function of the foreign matter removal mechanism of D foreign matter.It is of course also possible to using attracting or stroke structure structure of the tool (brush) out of foreign matter
Into.Moreover, it is necessary to set the space of trapping foreign matter in addition in the case of attraction.
In the present embodiment, identifying device 140 can recognize four electronic unit D simultaneously, and loading device 120 also can be by simultaneously
Mobile four electronic unit D structure is constituted, although quantity or mobile quantity can be recognized according to implementing to increase or decrease.
As reference, in the present embodiment, read using the bar code reader BR being made up of camera with speculum M
The bar code of electronic unit and the loading direction for confirming electronic unit, but can be by the way that two functions are divided into according to specific implementation
Mutually different structure is performed.For example, being formed with multiple directions groove DS in electronic unit D as shown in Figure 4.It is this multiple
Direction groove DS can be used in the loading direction for reading electronic unit D.That is, by using light-emitting component and photo detector, by hair
Just no being recognized by photo detector of optical element direction groove DS irradiations, to read electronic unit D loading direction.And
And, electronic unit D bar code can be recognized by camera or reader.
When completing the test pallet TT arrival test position TP for loading multiple electronic units by loading device 120, even
Connection device 150 electrically connects the multiple electronic units for being loaded into test pallet TT with tester.
Discharge mechanism 160 is unloaded after the loading test position TP multiple electronic units loaded complete test from reaching
Position UP test pallet TT unloads multiple electronic units, and it is classified according to test result, and is moved to positioned at recovery position
DP1To DP3Recovery pallet DT1To DT3。
Unloading buffer board 170 is used to load the multiple electronic units for completing test temporarily according to demand.This unloading is used
Buffer board 170 is to be fixedly installed.Therefore, above-mentioned discharge mechanism 160 performs following operation according to control situation, i.e. will be in unloading
Position UP or recovery position DP1To DP3The multiple electronic units held are loaded into unloading buffer board 170, or will be loaded into unloading
It is moved to multiple electronic units of buffer board 170 positioned at recovery position DP1To DP3Recovery pallet DT1To DT3。
Second piler 181,182,183 stores multiple recovery support for reclaiming the multiple electronic units for completing test
Disk DT1To DT3.Pallet DT is used in this multiple recovery1To DT3By supplying successively to recovery position DP1To DP3So that by unloading
Carry and put 160 unloaded operation and be smoothed out.Wherein, as shown in fig. 7, being stored in reference is 181 the second piler
The recovery pallet DTb for being judged as bad electronic unit is mounted with, or stores the electronic unit for being mounted with and being judged as re-test
Recovery pallet DTa.Moreover, being judged as well in 182 and 183 the second piler, storage is mounted with reference
Electronic unit recovery pallet DT2And DT3。
Buffer unit 190 is used to help the appropriate movement of the electronic unit by loading device 120 and discharge mechanism 160,
As shown in figure 5, including buffer table 191, shifter 192 and guide rail 193.
Buffer table 191 can be moved between the working region A of loading device 120 and the working region B of discharge mechanism 160.
Electronic unit to be tested, or the interim multiple electronics for loading completion test can be loaded temporarily in this buffer table 191 according to demand
It is classified as the electronic unit in test in part.That is, buffer table 191 is due to the alternative work for being located at loading device 120
Region A and discharge mechanism 160 working region B, can prevent the interference of loading device 120 and discharge mechanism 160, and according to demand
It is flexibly applied to the loading work by loading device 120 and the unloaded operation by discharge mechanism 160.Certainly, flexibly should
In the case of loading procedure, buffer table 191 is moved to the side of loading device 120, is being flexibly applied to the feelings of uninstall process
Under condition, buffer table 191 is moved to the side of discharge mechanism 160.In addition, design loading device 120 and discharge mechanism can be taken into full account
The 160 mutual shared communal spaces, instead of buffer table 191 is fixed on into the corresponding communal space or the corresponding communal space is stopped at,
Pass through the work of accurate controlled loading device 120 and discharge mechanism 160 so that do not collide with each other interference in the communal space.
Shifter 192 makes buffer table 191 be selectively located at the working region A of loading device 120 and the work of discharge mechanism 160
Make region B.That is, shifter 192 is to avoid loading device 120 with the mutual work of discharge mechanism 160 to interfere, and can fill loading
120 working region A is put to separate with the working region B of discharge mechanism 160.Certainly, although Basic Design policy is according to work
Mistake prevents the interference between loading device 120 and discharge mechanism 160, but as described above, according to circumstances makes loading device 120
With the mutually shared working region of discharge mechanism 160, the buffer table 191 for being fixed on corresponding shared region can be set, in the case,
The interference that conflicts of loading device 120 and discharge mechanism 160 can be prevented by control.
On the other hand, buffer table 191 is as shown in Fig. 6 in side observation, positioned at compared to loading buffer board 130 and unloading
With the position of the top of buffer board 170.Therefore, when overlooking, buffer table 191 can be buffered with loading buffer board 130 or unloading
Plate 170 is overlapping.Because, can be by minimizing the operating distance of loading device 120 and discharge mechanism 160, to have the effect of driving
Forthright and stability.That is, because buffer table 191 can be located above compared to loading buffer board 130 and unloading buffer board 170
Position, therefore the overlapping of the working region for preventing loading device 120 and discharge mechanism 160 can be easily designed, it can also minimize
By the displacement of loading device 120 and the electronic unit of discharge mechanism 160.
Guide rail 193 is used to guide moving left and right for buffer table 191.
With continued reference to Fig. 1, it is known that the first piler 110 is located in front of left side, the second piler 181,182,183 is configured at
The right side and front of first piler 110.Moreover, in the first piler 110 and the second piler 181,182,183 and loading position
Put and buffer area BZ is configured between LP and unloading position UP.This buffer area BZ includes loading buffer board 130, unloading and used
Buffer board 170 and buffer table 191.Moreover, being provided with identifying device 140 with the left side of buffer board 130 in loading.
Hereinafter, illustrated for separator 100 as described above.
Groundwork
To successively it be supplied with pallet ST to supply position SP positioned at multiple supplies of the first piler 110.
Loading device 120 is held after four electronic units at the same time, by multiple electronic units of holding by identification position
RP is moved to the test pallet TT positioned at loading position LP.In the process, when electronic unit is located at identification position RP, pass through
Stream L is blown into wind to the two sides of electronic unit to be come after foreign matter, by bar code reader BR for the institute of loading device 120
The multiple electronic units held are recognized individually.Certainly, the loading direction of multiple electronic units is also judged while identification.
Wherein, out of foreign matter the operation that operation, identification operation and the judgement sequence of operation relevant with loading direction is carried out can be according to need
Random conversion is asked, operation can also be identified simultaneously and operation is judged.On the other hand, in the process, loading device 120 is in handle
Hold in the state of four electronic units, recognize bar code and judge the loading direction of electronic unit.If with by multiple electronic units
It is placed on and recognizes that the structure of bar code is constituted after other pallet or shuttle, though then readable bar code, due to that can confirm to load
The partial insertion in direction is difficult to confirm to load direction in pallet or shuttle.Also, even in the shape for being loaded into pallet or shuttle
Loading direction is able to confirm that under state to a certain extent, its premise is necessary for electronic unit and is correctly inserted on pallet or shuttle.
That is, electronic unit is installed relative to pallet or the inclined mode of shuttle or, amesiality mode is installed, or is being not fully inserted into
In the case of, therefore bar code recognition position or loading walking direction position, reduce its correctness each time with change.Moreover,
It can need to confirm improper loading condition, the problem of handling corresponding mistake etc..Therefore, in the present embodiment, loading device
120 in the state of electronic unit is held, and bar code is identified and the operation in the loading direction of electronic unit is judged.
And then, in the present embodiment, the bar code for the electronic unit that loading device 120 is held not is recognized one by one, and
It is while recognizing four (at least two) electronic units.That is, in the state of it can hold two or more excess electron part,
Bar code is identified by identifying device 140 simultaneously and the loading direction of electronic unit is judged.
On the other hand, analyze identifier that the data of identified bar code are used to confirming pressing electronic unit and with corresponding electricity
The relevant information of subassembly.Therefore, it can confirm corresponding electronic unit is raw under which kind of working condition according to the information inputted
Production.
As reference, by the identifier and the information transmission relevant with electronic unit of electronic unit to tester side,
Tester side is stored by the way that the test result of specific electronic components is connected with the identifier of specific electronic components.And
And, tester is by the information transmission relevant with the test result of particular semiconductor element to separator 100.Thus, separator leads to
The information relevant with test result for transmitting tester is crossed to be connected to record and store with the identifier of specific electronic components.
Thus, separator can the multiple electronic units of individual management.Certainly, the ministry of electronics industry can be flexibly applied to when the information for recording and storing
The re-test of part, in the case where carrying out re-test, can also serve as re-test result in resume to manage.
, can be for corresponding electronic unit, by being provided previously by by recognizing multiple electronic units individually as reference
The test result of corresponding electronic unit is bundled in resume to record.Therefore, indivedual record managements of each electronic unit can be achieved.
When completing to load multiple electronic units on the test pallet TT positioned at loading position LP, using positioned at loading position
The laser and camera for putting LP sides confirm the loading condition of multiple electronic units.Moreover, being surveyed by transfer device (not shown)
Examination pallet TT is transferred to test position TP from loading position LP.
In test position TP, test pallet TT multiple electronic units are loaded into by attachment means 150 and tester
Electrical connection, carries out the electrical characteristics test of multiple electronic units carried out by tester afterwards.
After the multiple electronic units test being loaded terminates, test pallet TT is by transfer device (not shown) from test
Position TP is transferred to unloading position UP.
Discharge mechanism 160 is unloaded the multiple electronic units for being loaded into the test pallet TT for being located at unloading position UP,
And be moved to according to test result classification positioned at recovery position DP1To DP3Recovery pallet DT.Certainly, positioned at the second piler
181st, 182,183 recovery is also supplied to recovery position DP successively with pallet DT1To DP3。
When terminate above-mentioned first it is basic when, carry out the worked as the re-test of flexible Application buffer table 191 described later
Two work.
The loading buffer board 130 that next it will be described for contributing during loading procedure, uninstall process and re-test, unload
Carry the function with buffer board 170 and buffer table 191.
Loading procedure
Loading can be used with buffer board 130 and buffer table 191 in loading procedure.
For example, being mounted with 50 electronic units with pallet ST in supply, four electronics can be held simultaneously in loading device 120
In the case of part, when being moved to test pallet TT with pallet ST 48 electronic units positioned at supply, only two electronics
Part stays in supply pallet ST.In the case, loading device 120 is by holding remaining two electronic units come by identification
Test pallet TT is moved to after process, but in the present embodiment, for increase operating efficiency, remaining two electronic units are loaded into
Loading is moved with the supply for after buffer board 130, being first carried out newly supplying in supply position SP pallet ST multiple electronic units
Move to the operation of the test pallet TT positioned at loading position LP.With this, enter to be about in remaining two electronic units of specified period
The operation of loading buffer board 130 is loaded into, multiple electronic units of loading buffer board 130 are being loaded into for more than four
When, using four as one group come perform together identification bar code, be moved to test pallet TT operation.Moreover, being located at
In the case that the test jack of tester is closed situations such as (socket-off), also it can load what is be retained as loading
The purposes of electronic unit carrys out flexible Application loading buffer board 130.Certainly, loading device 120 can it is hereafter necessary afterwards, pass through
Hold four test pallets loading being loaded into and be moved to multiple electronic units of buffer board 130 positioned at loading position LP
TT.In the process, the order of multiple electronic units can be changed, but due to multiple by the individual management of identifying device 140
Electronic unit, therefore the change of the order without the concern for multiple electronic units.
On the other hand, in loading work, loading buffer board 130 retains the electronic unit more than quantity that can be housed
In the case of, flexible Application buffer table 191.Therefore, when loading in buffer board 130 with full electronic unit is filled, buffer table is passed through
191 are moved to the working region A of loading device 120 to help the loading work by loading device 120.
As reference, when the test pallet TT positioned at loading position LP completes loading electronic unit, it can carry out using sharp
Light and camera confirm whether electronic unit is suitably loaded into test pallet TT process.
Uninstall process
Unloading can be used with buffer board 170 and buffer table 191 in uninstall process.
It is judged as good multiple electricity from the test pallet TT positioned at unloading position UP for example, being held in discharge mechanism 160
In the case of subassembly, multiple electronic units are moved to positioned at the second recovery position DP2Or the 3rd recovery position DP3Recovery
Use pallet DT.But, for example, in multiple electronic units of holding one be it is bad judge, one be re-test judge, two
In the case of for good judgement, it will be deemed as a bad electronic unit and be loaded into unloading buffer board 170, be judged as surveying again
One electronic unit of examination is loaded into after buffer table 191, be will be deemed as two good electronic units and is moved to positioned at second time
Receive position DP2Or the 3rd recovery position DP3Recovery pallet DT.
Below to illustrate the processing method of re-test quantity carried out in uninstall process.
It is judged as the few situation of the quantity of re-test
When because the quantity for being judged as re-test is few and when the quantity of whole re-tests can be loaded in buffer table 191, in knot
After once test relevant with multiple electronic units Shu Suoyou, by positioned at the existing buffer table for carrying the working region A for putting 160
191 are moved to the working region B of loading device 120.Moreover, by the work of loading device 120, by re-test quantity from buffering
Platform 191 is moved to the test pallet TT positioned at loading position LP.Certainly, test pallet TT is moved to again positioned at loading position LP
Multiple electronic units together moved with test pallet TT, and pass through re-test process.Therefore, buffer area BZ can be named as by
It is judged as that the electronic unit of re-test is moved to loading position LP return area (return zone) by buffer table 191 again.
It is judged as the situation more than the quantity of re-test
When in a test process, because be judged as the quantity of re-test compared to buffer table 191 struck capacity more than make
Buffer table 191 is filled full, or in view of the relation of interdependence between buffer table 191 and loading device 120, fills buffer table
During fixed percentage (%) of 191 useful load, discharge mechanism 160 will be deemed as multiple electronic units of re-test from buffer table
191 are moved to and are supplied to the first recovery position DP now1Recovery pallet DT.Moreover, being hereafter loaded into recovery pallet DT
Re-test quantity moved to by discharge mechanism 160 after unloading buffer board 170, then be moved to buffer table 191, filled by loading
Put 120 and sequentially pass through loading with the test pallet TT being moved to again after buffer board 130 and buffer table 191 positioned at loading position LP.
Certainly, in the mobile flow of this re-test quantity, loading buffering is omitted according to the degree of re-test quantity alternative
The use of plate 130 or unloading buffer board 170.
On the other hand, it is the appropriate mobile flow of re-test quantity, it is preferable that in the first recovery position DP1Selectivity is set
Put for the recovery for loading re-test quantity with pallet DT and for the recovery of improper stowage quantity pallet DT.For example, such as Fig. 7
And shown in Fig. 8 side view, the second piler 181 includes lifter 181a, lifting frame 181b, multiple advance and retreat device 181c.
Lifter 181a is used to lift lifting frame 181b.
Multiple recovery pallets are vertically loaded in the lifting frame 181b modes that can be spaced from each other constant spacing
DTa、DTb。
Multiple advance and retreat device 181c make multiple recovery selectively be retreated in front-rear direction with pallet DT, so that multiple reclaim is used
Pallet DTa, DTb are located at recovery position DP1Or it is retracted into reception position.
Therefore, because multiple recovery of the second piler 181 are lifted and are selectively moved to first time with pallet DTa, DTb
Receive position DP1, for loading the recovery of re-test quantity with pallet DTa and for the recovery of improper stowage quantity pallet DTb
Alternative is located at recovery position DP1。
As described above, although observed during loading procedure, uninstall process and re-test loading buffer board 130,
The effect of unloading buffer board 170 and buffer table 191, but this is only simple part illustration.That is, according to how controlled loading
Device 120, discharge mechanism 160, buffer unit 190 make the mobile flow of electronic unit become various, loading buffer board
130th, unloading buffer board 170 and buffer table 191 can also be changed for the contribution of the mobile flow of electronic unit.
Recognize a variety of examples of Structure of Bar-code
In above-mentioned example, it is by the situation act that bar code is printed with the one side of electronic unit (forward face or rear)
Example, but as shown in figure 9, bar code B can print the forward face and rear in electronic unit D.In the case, it is necessary to read
Whole bar code B positioned at electronic unit D two sides.Thus, two bar code reader BR are set between two electronic unit D
(can be camera).
On the other hand, Figure 10 is that two speculum M are set between two electronic unit D, so that with a camera CM
The example for the bar code B for being respectively printed at electronic unit D both sides is shot simultaneously.In this Figure 10 structure, bar code B is reflected
Adjacent two speculum M to camera CM sides is corresponding with a camera CM, therefore, and corresponding camera CM is shot simultaneously
Two bar code B for being printed in adjacent electronic unit D of two speculum M reflections.
As described above, a variety of bar code recognition structures are used for the present invention in the state of being held by loading device 120, together
The identification of bar code related to multiple electronic units Shi Zhihang.For example, when electronic unit by traverse, bar code to in-plane
During exposure, multiple bar codes can be simultaneously recognized with a camera, but in loading device 120 such as of the invention with standing state
In the case of holding multiple electronic units, it is impossible to recognize multiple bar codes simultaneously with a camera.If recognizing bar shaped one by one
Code, then make processing become complicated, processing time also can be elongated, accordingly, it would be desirable to a variety of bar code recognition structures as described above.
Certainly, as shown in figure 11, it can also take into full account by making multiple electronic unit D bar code B incline with fixed angle
Oblique mode configures multiple camera CM, so as to recognize relevant with the multiple electronic units held by loading device 120 simultaneously
Multiple bar codes structure.
As described above, although the present invention is illustrated by referring to the embodiment of accompanying drawing, above-described embodiment is only
Preference for illustrating the present invention, therefore, the present invention are not limited to above-described embodiment, and scope is claimed in invention of the invention
Scope and its equivalents are claimed in the invention for being interpreted as the present invention.
Claims (10)
1. a kind of electronic unit test separator, it is characterised in that
Including：
Test pallet, along the circulating path that loading position is then connected to after loading position, test position and unloading position
Circulation；
Loading device, for multiple electronic units to be tested to be loaded onto positioned at above-mentioned loading position from supply with pallet
State test pallet；
Attachment means, when the above-mentioned test of test pallet arrival for making to complete multiple electronic units loading by above-mentioned loading device
During position, the multiple electronic units for being loaded into above-mentioned test pallet are made to be electrically connected with tester；
Discharge mechanism, after the test that above-mentioned test position completes to the multiple electronic units being loaded, from the above-mentioned unloading of arrival
The above-mentioned test pallet of position unloads multiple electronic units, is classified according to test result and is moved to recovery with pallet；With
And
Buffer unit, with can be moved between the working region of above-mentioned loading device and the working region of above-mentioned discharge mechanism
Buffer table,
As needed, above-mentioned buffer unit makes above-mentioned buffer table in the working region of above-mentioned loading device and above-mentioned discharge mechanism
Make to move between region so that above-mentioned buffer table be flexibly applied to by above-mentioned loading device carry out loading work and by
The unloaded operation that above-mentioned discharge mechanism is carried out.
2. electronic unit test separator according to claim 1, it is characterised in that
The specific electronic components classified by test result re-test are loaded into positioned at above-mentioned discharge mechanism by above-mentioned discharge mechanism
Working region above-mentioned buffer table,
Above-mentioned loading device makes from the working region of above-mentioned discharge mechanism to the above-mentioned of the working region of above-mentioned loading device movement
Specific electronic components on buffer table are moved to the test pallet positioned at above-mentioned loading position.
3. electronic unit test separator according to claim 1, it is characterised in that
Also include：
First piler, multiple supply pallets of multiple electronic units to be tested are mounted with for storing；And
Second piler, for storing the multiple recovery pallets reclaimed to the multiple electronic units for completing test,
Above-mentioned second piler, including：
Lifting frame, can be in the way of leaving predetermined distance along the multiple recovery pallets of above-below direction loading mutually；
Lifter, for lifting above-mentioned lifting frame；And
Multiple advance and retreat devices, make the multiple recovery for being loaded into above-mentioned lifting frame optionally be retreated with pallet, so that multiple times
Receipts pallet is located at recovery position or is retracted into reception position.
4. a kind of electronic unit test separator, it is characterised in that
Including：
Test pallet, along the circulating path that loading position is then connected to after loading position, test position and unloading position
Circulation；
Loading device, for multiple electronic units to be tested to be loaded onto positioned at above-mentioned loading position from supply with pallet
State test pallet；
Attachment means, when the above-mentioned test of test pallet arrival for making to complete multiple electronic units loading by above-mentioned loading device
During position, the multiple electronic units for being loaded into above-mentioned test pallet are made to be electrically connected with tester；
Discharge mechanism, after the test that above-mentioned test position completes to the multiple electronic units being loaded, from the above-mentioned unloading of arrival
The above-mentioned test pallet of position unloads multiple electronic units, is classified according to test result and is moved to recovery with pallet；With
And
Identifying device, many of above-mentioned test pallet positioned at above-mentioned loading position are loaded onto by above-mentioned loading device for recognizing
Individual electronic unit,
Above-mentioned loading device makes the multiple electronic units held by above-mentioned identifying device to positioned at the upper of above-mentioned loading position
State test pallet movement, enabling the multiple electronic units held are recognized by above-mentioned identifying device,
Above-mentioned identifying device, including：
Camera, the bar code of electronic unit is printed in for shooting；And
Reader, for reading the bar code on the picture shot by above-mentioned camera.
5. electronic unit test separator according to claim 4, it is characterised in that above-mentioned identifying device also includes anti-
Mirror is penetrated, it is corresponding with above-mentioned camera, the bar code for being printed in electronic unit is reflexed into above-mentioned camera.
6. electronic unit test separator according to claim 4, it is characterised in that above-mentioned identifying device also includes different
Thing removal mechanism, the foreign matter for removing electronic unit.
7. electronic unit test separator according to claim 4, it is characterised in that held in above-mentioned loading device
Bar code is recognized in the state of electronic unit.
8. electronic unit test separator according to claim 7, it is characterised in that
Above-mentioned loading device can hold multiple electronic units,
Above-mentioned identifying device is used for the bar code for recognizing the multiple electronic units being in the state of being held by above-mentioned loading device.
9. electronic unit test separator according to claim 4, it is characterised in that above-mentioned reader also by by
Picture that above-mentioned camera is shot reads the loading direction of above-mentioned electronic unit in the lump.
10. electronic unit test separator according to claim 9, it is characterised in that by above-mentioned identifying device one
The reading in direction is loaded with electronic unit with the identification for carrying out bar code.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910446858.3A CN110252685B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201910926484.5A CN110653174B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201910925100.8A CN110653173B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020160033011A KR102656451B1 (en) | 2016-03-18 | 2016-03-18 | Handler for testing electronic components |
| KR10-2016-0033011 | 2016-03-18 |
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| CN201910926484.5A Division CN110653174B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201910446858.3A Division CN110252685B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201910925100.8A Division CN110653173B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
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| CN107199183A true CN107199183A (en) | 2017-09-26 |
| CN107199183B CN107199183B (en) | 2019-12-10 |
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| CN201910446858.3A Active CN110252685B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201910925100.8A Active CN110653173B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
| CN201710102266.0A Active CN107199183B (en) | 2016-03-18 | 2017-02-24 | sorter for testing electronic components |
| CN201910926484.5A Active CN110653174B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201910925100.8A Active CN110653173B (en) | 2016-03-18 | 2017-02-24 | Sorter for testing electronic components |
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| KR (4) | KR102656451B1 (en) |
| CN (4) | CN110252685B (en) |
| TW (1) | TWI611195B (en) |
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2016
- 2016-03-18 KR KR1020160033011A patent/KR102656451B1/en active IP Right Grant
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2017
- 2017-02-24 CN CN201910446858.3A patent/CN110252685B/en active Active
- 2017-02-24 CN CN201910925100.8A patent/CN110653173B/en active Active
- 2017-02-24 CN CN201710102266.0A patent/CN107199183B/en active Active
- 2017-02-24 CN CN201910926484.5A patent/CN110653174B/en active Active
- 2017-03-06 TW TW106107197A patent/TWI611195B/en active
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2023
- 2023-03-28 KR KR1020230040717A patent/KR20230045002A/en active Application Filing
- 2023-03-28 KR KR1020230040722A patent/KR20230047989A/en not_active Application Discontinuation
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2024
- 2024-02-26 KR KR1020240027529A patent/KR20240031993A/en active Application Filing
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| CN110026355A (en) * | 2017-12-19 | 2019-07-19 | 菲韦斯内部物流单一股东股份公司 | Sorting machine |
| CN110363038A (en) * | 2018-04-09 | 2019-10-22 | 泰克元有限公司 | The electronic component processing bar code identifying device of sorting machine |
| CN110394315B (en) * | 2018-04-25 | 2021-12-24 | 泰克元有限公司 | Sorter for testing electronic components |
| CN110394315A (en) * | 2018-04-25 | 2019-11-01 | 泰克元有限公司 | Sorting machine is used in electronic component test |
| CN114522907A (en) * | 2018-04-25 | 2022-05-24 | 泰克元有限公司 | Sorting machine for testing electronic components |
| TWI702409B (en) * | 2018-07-12 | 2020-08-21 | 韓商泰克元股份有限公司 | Apparatus for relocating electronic components |
| CN111299188B (en) * | 2018-12-11 | 2022-03-01 | 泰克元有限公司 | Sorter for testing electronic components |
| CN111299188A (en) * | 2018-12-11 | 2020-06-19 | 泰克元有限公司 | Sorter for testing electronic components |
| CN112642752A (en) * | 2019-10-10 | 2021-04-13 | 泰克元有限公司 | Sorting machine for processing electronic parts |
| CN112642752B (en) * | 2019-10-10 | 2024-05-24 | 泰克元有限公司 | Sorting machine for electronic component processing |
| CN113798215A (en) * | 2020-06-17 | 2021-12-17 | 泰克元有限公司 | Sorting system for electronic component test and adapter for placing electronic component |
| CN113798215B (en) * | 2020-06-17 | 2024-01-16 | 泰克元有限公司 | Sorting system for electronic component test and electronic component mounting adapter |
| CN113960386A (en) * | 2020-07-21 | 2022-01-21 | 株式会社爱德万测试 | Electronic component handling apparatus and electronic component testing apparatus |
| CN114472191A (en) * | 2020-11-12 | 2022-05-13 | 泰克元有限公司 | Sorter for processing electronic parts and method for confirming whether insert has defect |
| TWI790092B (en) * | 2021-02-05 | 2023-01-11 | 韓商泰克元股份有限公司 | Handler for testing electronic components |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20230047989A (en) | 2023-04-10 |
| CN110653173B (en) | 2022-04-19 |
| KR20230046290A (en) | 2023-04-05 |
| TW201734482A (en) | 2017-10-01 |
| CN110653174B (en) | 2022-04-12 |
| CN110653174A (en) | 2020-01-07 |
| KR20170108703A (en) | 2017-09-27 |
| CN110252685A (en) | 2019-09-20 |
| CN110252685B (en) | 2021-09-28 |
| TWI611195B (en) | 2018-01-11 |
| KR20240031993A (en) | 2024-03-08 |
| CN107199183B (en) | 2019-12-10 |
| KR20230045002A (en) | 2023-04-04 |
| KR102656451B1 (en) | 2024-04-12 |
| CN110653173A (en) | 2020-01-07 |
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