CN107014786A - 驻波干涉显微镜 - Google Patents

驻波干涉显微镜 Download PDF

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Publication number
CN107014786A
CN107014786A CN201610863720.XA CN201610863720A CN107014786A CN 107014786 A CN107014786 A CN 107014786A CN 201610863720 A CN201610863720 A CN 201610863720A CN 107014786 A CN107014786 A CN 107014786A
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CN
China
Prior art keywords
optical
pair
sample
standing wave
analysis position
Prior art date
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Pending
Application number
CN201610863720.XA
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English (en)
Chinese (zh)
Inventor
R.道姆
X.韦格勒
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FEI Co
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FEI Co
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Publication of CN107014786A publication Critical patent/CN107014786A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/088—Condensers for both incident illumination and transillumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/364—Projection microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201610863720.XA 2015-10-21 2016-09-29 驻波干涉显微镜 Pending CN107014786A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP15190749.0A EP3159728A1 (de) 2015-10-21 2015-10-21 Interferometrisches stehwellenmikroskop
EP15190749.0 2015-10-21

Publications (1)

Publication Number Publication Date
CN107014786A true CN107014786A (zh) 2017-08-04

Family

ID=54337677

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610863720.XA Pending CN107014786A (zh) 2015-10-21 2016-09-29 驻波干涉显微镜

Country Status (4)

Country Link
US (2) US9885660B2 (de)
EP (2) EP3159728A1 (de)
JP (1) JP2017078855A (de)
CN (1) CN107014786A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019134585A1 (zh) * 2018-01-03 2019-07-11 宁波纳美致生物科技有限公司 一种三通道荧光定位超分辨率生物显微系统及方法
CN112639448A (zh) * 2018-07-03 2021-04-09 美国卫生和人力服务部 利用光开关和驻波照射技术提高显微镜轴向分辨率的系统和方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3159728A1 (de) * 2015-10-21 2017-04-26 FEI Company Interferometrisches stehwellenmikroskop

Citations (14)

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US20050006597A1 (en) * 2003-07-11 2005-01-13 Carl Zeiss Jena Gmbh Arrangement for the optical detection of light radiation which is excited and/or backscattered in a specimen with a double-objective arrangement
US20060291043A1 (en) * 2001-01-05 2006-12-28 Leica Microsystems Heidelberg Gmbh Interference microscope, and method for operating an interference microscope
US20070292015A1 (en) * 2006-06-20 2007-12-20 Nec Corporation Method and apparatus for inspecting a pattern
US20080007248A1 (en) * 2003-08-22 2008-01-10 Centre National De La Recherche Scientifque-Cnrs Non-invasive electric-filed-detection device and method
US20080158551A1 (en) * 2006-12-21 2008-07-03 Hess Harald F Systems and methods for 3-dimensional interferometric microscopy
US20090263002A1 (en) * 2008-04-17 2009-10-22 Ruprecht-Karls-Universitat Heidelberg Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
WO2010065538A1 (en) * 2008-12-02 2010-06-10 The Regents Of The University Of California Imaging arrangement and microscope
US20100231922A1 (en) * 2006-12-21 2010-09-16 Howard Hughes Medical Institute Three-dimensional interferometric microscopy
CN103189778A (zh) * 2010-10-14 2013-07-03 株式会社尼康 结构化照明装置、结构化照明显微镜装置以及面形状测定装置
US20140050382A1 (en) * 2011-01-24 2014-02-20 The Board Of Trustees Of The University Of Illinois Computational Adaptive Optics for Interferometric Synthetic Aperture Microscopy and Other Interferometric Imaging
CN103874917A (zh) * 2011-10-12 2014-06-18 文塔纳医疗系统公司 多焦点干涉图像获取
JP5609729B2 (ja) * 2011-03-18 2014-10-22 横河電機株式会社 顕微鏡装置、観察方法および試料搭載機構
CN104541194A (zh) * 2012-08-16 2015-04-22 莱卡微系统Cms有限责任公司 光学装置和显微镜
US20150216407A1 (en) * 2014-01-31 2015-08-06 University Of Rochester Measurement of the lipid and aqueous layers of a tear film

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US5671085A (en) * 1995-02-03 1997-09-23 The Regents Of The University Of California Method and apparatus for three-dimensional microscopy with enhanced depth resolution
JPH09229861A (ja) * 1996-02-21 1997-09-05 Bunshi Bio Photonics Kenkyusho:Kk 蛍光顕微鏡
DE10250247B4 (de) * 2002-10-28 2006-06-01 Leica Microsystems Cms Gmbh Probenträger für die Mikroskopie und Verfahren zum Anfertigen eines Probenträgers
NL1027462C2 (nl) 2004-11-09 2006-05-10 Koninkl Philips Electronics Nv Werkwijze voor het lokaliseren van fluorescente markers.
US7599069B2 (en) * 2005-05-06 2009-10-06 The University Of Chicago Vector beam generator using a passively phase stable optical interferometer
US8319181B2 (en) 2011-01-30 2012-11-27 Fei Company System and method for localization of large numbers of fluorescent markers in biological samples
DE102011017046A1 (de) 2011-04-14 2012-10-18 Till Photonics Gmbh Umschaltbare Mikroskopanordnung mit mehreren Detektoren
US8237835B1 (en) * 2011-05-19 2012-08-07 Aeon Imaging, LLC Confocal imaging device using spatially modulated illumination with electronic rolling shutter detection
FR2978254B1 (fr) * 2011-07-21 2014-01-24 Imagine Optic Methode et dispositif optique pour la localisation d'une particule en super resolution
US20140333750A1 (en) * 2011-12-15 2014-11-13 President And Fellows Of Harvard College High resolution dual-objective microscopy
DE102012200344A1 (de) * 2012-01-11 2013-07-11 Carl Zeiss Microscopy Gmbh Mikroskopsystem und Verfahren für die 3-D hochauflösende Mikroskopie
WO2013146365A1 (ja) * 2012-03-29 2013-10-03 三洋電機株式会社 蛍光検出装置
US8872105B2 (en) 2013-02-19 2014-10-28 Fei Company In situ reactivation of fluorescence marker
WO2014152739A2 (en) * 2013-03-14 2014-09-25 The Regents Of The University Of California Interferometric focusing of guide-stars for direct wavefront sensing
EP3159728A1 (de) * 2015-10-21 2017-04-26 FEI Company Interferometrisches stehwellenmikroskop

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060291043A1 (en) * 2001-01-05 2006-12-28 Leica Microsystems Heidelberg Gmbh Interference microscope, and method for operating an interference microscope
US20050006597A1 (en) * 2003-07-11 2005-01-13 Carl Zeiss Jena Gmbh Arrangement for the optical detection of light radiation which is excited and/or backscattered in a specimen with a double-objective arrangement
US20080007248A1 (en) * 2003-08-22 2008-01-10 Centre National De La Recherche Scientifque-Cnrs Non-invasive electric-filed-detection device and method
US20070292015A1 (en) * 2006-06-20 2007-12-20 Nec Corporation Method and apparatus for inspecting a pattern
US20100231922A1 (en) * 2006-12-21 2010-09-16 Howard Hughes Medical Institute Three-dimensional interferometric microscopy
US20080158551A1 (en) * 2006-12-21 2008-07-03 Hess Harald F Systems and methods for 3-dimensional interferometric microscopy
US20090263002A1 (en) * 2008-04-17 2009-10-22 Ruprecht-Karls-Universitat Heidelberg Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
WO2010065538A1 (en) * 2008-12-02 2010-06-10 The Regents Of The University Of California Imaging arrangement and microscope
CN103189778A (zh) * 2010-10-14 2013-07-03 株式会社尼康 结构化照明装置、结构化照明显微镜装置以及面形状测定装置
US20140050382A1 (en) * 2011-01-24 2014-02-20 The Board Of Trustees Of The University Of Illinois Computational Adaptive Optics for Interferometric Synthetic Aperture Microscopy and Other Interferometric Imaging
JP5609729B2 (ja) * 2011-03-18 2014-10-22 横河電機株式会社 顕微鏡装置、観察方法および試料搭載機構
CN103874917A (zh) * 2011-10-12 2014-06-18 文塔纳医疗系统公司 多焦点干涉图像获取
CN104541194A (zh) * 2012-08-16 2015-04-22 莱卡微系统Cms有限责任公司 光学装置和显微镜
US20150216407A1 (en) * 2014-01-31 2015-08-06 University Of Rochester Measurement of the lipid and aqueous layers of a tear film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019134585A1 (zh) * 2018-01-03 2019-07-11 宁波纳美致生物科技有限公司 一种三通道荧光定位超分辨率生物显微系统及方法
US10914680B2 (en) 2018-01-03 2021-02-09 Shenzhen Naguan Biotech Co., Ltd. Three-channel fluorescence localization super-resolution biological microscope system and method
CN112639448A (zh) * 2018-07-03 2021-04-09 美国卫生和人力服务部 利用光开关和驻波照射技术提高显微镜轴向分辨率的系统和方法

Also Published As

Publication number Publication date
US9885660B2 (en) 2018-02-06
US10401291B2 (en) 2019-09-03
US20180195962A1 (en) 2018-07-12
EP3159729A1 (de) 2017-04-26
US20170115224A1 (en) 2017-04-27
JP2017078855A (ja) 2017-04-27
EP3159729B1 (de) 2023-08-23
EP3159728A1 (de) 2017-04-26

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