CN107004625B - 小型制造装置和生产线上的装置间输送系统 - Google Patents

小型制造装置和生产线上的装置间输送系统 Download PDF

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CN107004625B
CN107004625B CN201580065469.6A CN201580065469A CN107004625B CN 107004625 B CN107004625 B CN 107004625B CN 201580065469 A CN201580065469 A CN 201580065469A CN 107004625 B CN107004625 B CN 107004625B
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原史朗
前川仁
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National Institute of Advanced Industrial Science and Technology AIST
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Abstract

本发明涉及小型制造装置和生产线上的装置间输送系统。在由多个半导体制造装置等小型制造装置构成的生产线上,在这些小型制造装置之间自动地输送晶圆输送容器。在本发明中,生产线(1)构成为,三个小型的半导体制造装置(2)在地面(16)上并列设置在一条直线上。各半导体制造装置(2)分别具有大致长方体状的壳体(3),在壳体(3)的内部配设有处理室(5)和装置前室(6)。在壳体(3)的前部,在装置前室(6)的上方形成有凹部(7)。在凹部(7)设置有容器载置台(9)和暂置托盘(8),并且一体地设有容器输送单元(12)。由此,能够在三个半导体制造装置(2)之间自动地输送晶圆输送容器(10)。其结果是,能够高效地进行对半导体晶圆实施的一系列的制造工艺。

Description

小型制造装置和生产线上的装置间输送系统
技术领域
本发明涉及一种特别是用于制造直径为20mm以下的小口径半导体晶圆的半导体制造装置等小型制造装置。
背景技术
以往,在半导体制造技术中,通过晶圆的大口径化来谋求降低芯片制造单价。因此,在一系列的制造工艺中使用的半导体制造装置不断变大、价格变高,使得制造工厂的规模变大、建设和运营成本变高。这样的大规模制造系统在少品种大量生产中有助于降低芯片的制造单价,但难以满足少量多品种生产的要求,难以与市场状况相应地调整生产量,并且中小企业难以参与生产。
为了解决这些问题,期待一种能够使用小口径(例如直径20mm以下)的半导体晶圆以低成本制造半导体芯片的小型的半导体制造装置。在使用这样的小型的半导体制造装置构筑生产线的情况下,在地面上将多个半导体制造装置并列设置在一条直线上,在对半导体晶圆实施的一系列的制造工艺中,在该多个半导体制造装置之间,以将半导体晶圆收容在晶圆输送容器中的状态输送该半导体晶圆(例如参照专利文献1、2)。
在这样的由多个半导体制造装置构成的生产线中,为了高效地进行对半导体晶圆实施的一系列的制造工艺,需要在多个半导体制造装置之间自动地输送晶圆输送容器。为此,可以考虑例如在该生产线的附近遍及生产线全长地配置1套输送轨,利用该输送轨在多个半导体制造装置之间输送晶圆输送容器。
现有技术文献
专利文献
专利文献1:日本特开2014—110358号公报
专利文献2:日本特开2014—110359号公报
发明内容
发明要解决的问题
但是,在上述的使用1套输送轨的方法中,存在以下的问题点。
第1,由于输送轨和半导体制造装置之间的位置调整(特别是与输送轨垂直的方向上的位置调整)较难,因此,输送系统变得复杂、精密、不稳定。即,由于输送轨非常长,因此,基本上相对于多个半导体制造装置设置1套输送轨,并且该输送轨固定于顶棚、地面,因此,输送轨的位置基本上没有机动性(灵活性)。因此,配置于地面的半导体制造装置即使稍微错位,也易于引起输送失误。此外,若用于配置半导体制造装置的地面不是非常平坦,则半导体制造装置与输送轨之间容易错位,需要耗费功夫调整。
第2,输送系统变得大型化且高成本。即,若半导体制造装置和输送轨分离,则半导体制造装置的定位相应地变得困难,必须扩大用于定位输送容器的偏差的容许范围。并且,由于半导体制造装置和输送轨分离,从顶棚悬吊输送容器并使输送容器降下、从远处利用机器人输送输送容器,将该输送容器输送到半导体制造装置,因此,输送系统变得复杂。这导致半导体制造装置和输送系统的大型化,导致精度变差。此外,在半导体制造装置和输送轨上还需要用于在输送轨上运输输送容器的移动运输机。
特别是在像微型晶圆厂那样的超小型系统中,系统整体的小型化是必须的,将输送轨设置于工厂的顶棚的话,从半导体制造装置尺寸和晶圆尺寸、容器尺寸的观点来看,输送轨位于非常远的位置,输送轨和半导体制造装置之间的输送容器的移动距离相对过长,高成本的问题突出化。
第3,晶圆输送容器的输送花费1分钟~10分钟左右的时间。即,输送轨是固定的,即使制造方向切换机也不能配置无数个,因此,不能进行半导体制造装置和半导体制造装置之间的最短输送。由于这与人进行输送的系统在本质上是不同的,因此,不能得到人输送的输送路径自由度。
本发明鉴于这样的情况,目的在于提供这样的技术,即,在由多个半导体制造装置等小型制造装置构成的生产线上,能够在不发生上述各种问题点的情况下在这些小型制造装置之间自动地输送晶圆输送容器。
用于解决问题的方案
为了达成这样的目的,技术方案1所述的发明是一种小型制造装置,其中,在壳体的内部配设有处理室和装置前室,在所述壳体设有用于载置收容有所述处理基板的基板输送容器的容器载置台,在处理所述处理基板时,该处理基板从所述容器载置台被输送进去,经由所述装置前室被向所述处理室输送,在该处理室进行处理之后,从该处理室经由所述装置前室返回所述容器载置台,然后被输送出来,所述小型制造装置的特征在于,在所述壳体设有容器输送单元,该容器输送单元与所述壳体形成为一体,在并列设置有多个所述小型制造装置时,以贯通该多个小型制造装置的方式形成沿该多个小型制造装置的并列设置方向延伸的容器输送路径,沿该容器输送路径向相邻的小型制造装置传送所述基板输送容器,或者从相邻的小型制造装置接收所述基板输送容器,并且,所述容器输送单元构成为在该多个小型制造装置中通用。
此外,在技术方案1所述的技术特征的基础上,技术方案2所述的发明的特征在于,所述容器输送单元相对于所述壳体装卸自如地设置。
此外,在技术方案1或2所述的技术特征的基础上,技术方案3所述的发明的特征在于,在所述壳体中,在所述装置前室的上方形成形成有凹部,该凹部的前表面侧和侧面侧开放,从前表面向深度方向凹陷,在所述凹部设有所述容器载置台和所述容器输送单元。
此外,在技术方案1~3中任一项所述的技术特征的基础上,技术方案4所述的发明的特征在于,在所述壳体设有用于暂时保持所述基板输送容器的暂置托盘,所述容器输送单元构成为,在所述容器载置台和所述暂置托盘之间输送所述基板输送容器,并且,在并列设置有多个所述小型制造装置时,能够在任意的小型制造装置的所述容器载置台和与该任意的小型制造装置相邻的小型制造装置的所述暂置托盘之间输送所述基板输送容器。
此外,在技术方案4所述的技术特征的基础上,技术方案5所述的发明的特征在于,所述暂置托盘设置为,在并列设置有多个所述小型制造装置时,所述暂置托盘位于任意的小型制造装置的所述容器载置台和与该任意的小型制造装置相邻的小型制造装置的所述容器载置台之间。
此外,在技术方案1~5中任一项所述的技术特征的基础上,技术方案6所述的发明的特征在于,所述容器输送单元具有用于沿所述容器输送路径输送所述基板输送容器的输送轨。
此外,在技术方案3~5中任一项所述的技术特征的基础上,技术方案7所述的发明的特征在于,所述容器输送单元在其不使用时,以不会从所述壳体的外形线向外部突出的状态收纳于所述凹部。
此外,在技术方案1~7中任一项所述的技术特征的基础上,技术方案8所述的发明的特征在于,所述容器输送单元构成为,在其使用时不会从所述壳体的外形线向前方突出。
发明的效果
采用本发明,在由多个半导体制造装置等小型制造装置构成的生产线上,能够在这些小型制造装置之间自动地输送晶圆输送容器。其结果是,能够高效地进行对半导体晶圆等处理基板实施的一系列的制造工艺。
并且,能够避免产生在生产线的附近配置1套输送轨这样的以往的技术所导致的问题点于未然。即,由于小型制造装置之间的输送是在相邻的小型制造装置之间进行的,因此,容器输送单元的空间位置能够仅由该相邻的小型制造装置来决定。此外,由于输送距离成为小型制造装置之间的间隔,因此,输送路径成为最短,小型制造装置之间的输送变得非常快(例如5秒左右)。并且,由于容器输送单元是能够装卸的盒式,因此,在发生故障时、需要自由的输送时,即在为了输送到所需要的小型制造装置之间的位置时,也能够随时切换为手动的输送,构筑没有容器输送单元的生产线。此外,若有暂置托盘,则能够在该暂置托盘附加定位功能,因此,输送机器人不必具有定位机构,能够弥补小型制造装置之间的位置精度的不良。
附图说明
图1是表示本发明的实施方式1的生产线的图,(a)是其主视图,(b)是其左视图。
具体实施方式
以下,说明本发明的实施方式。
发明的实施方式1
在图1中表示本发明的实施方式1。另外,在图1的(a)中省略中央的半导体制造装置的容器输送单元的图示。
如图1所示,实施方式1的生产线1构成为,在该实施方式1中,三个小型的半导体制造装置(小型制造装置)2在地面16上并列设置在一条直线上。这三个半导体制造装置2(右侧的半导体制造装置2A、中央的半导体制造装置2B、左侧的半导体制造装置2C)相互隔着预定间隔(例如6mm)的间隙横向相对。
如图1所示,各半导体制造装置2分别具有预定的大小(例如,宽度30cm、深度45cm、高度144cm)的大致长方体状的壳体3,在壳体3的内部配设有处理室5和装置前室6。
此外,在壳体3的前部,如图1所示,在装置前室6的上方形成有凹部7。该凹部7的前表面侧和侧面侧开放,从前表面向深度方向凹陷。在该凹部7设置有容器载置台9,该容器载置台9用于载置以密闭状态收容有小口径(例如直径20mm以下)的半导体晶圆的晶圆输送容器(基板输送容器)10,并且在该凹部7设置有用于暂时保持该晶圆输送容器10的暂置托盘8。在此,如图1的(a)所示,暂置托盘8设置为,在并列设置有多个半导体制造装置2时,该暂置托盘8位于任意的半导体制造装置2的容器载置台9和与所述任意的半导体制造装置2相邻的半导体制造装置2的容器载置台9之间。此外,在任意的半导体制造装置2中,高精度地规定容器载置台9和暂置托盘8之间的位置关系(壳体的宽度方向、深度方向以及高度方向)。
此外,在并列设置有多个半导体制造装置2时,以贯通多个半导体制造装置2的凹部7的方式形成沿该多个半导体制造装置2的并列设置方向(图1的(a)的左右方向)延伸的容器输送路径14。
此外,在壳体3一体地设有能够装卸的盒式的容器输送单元12,容器输送单元12具有沿容器输送路径14输送晶圆输送容器10的输送轨12a。该容器输送单元12构成为能够在其所在的半导体制造装置2的暂置托盘8和容器载置台9之间往返输送晶圆输送容器10,并且能够在其所在的半导体制造装置2的容器载置台9和相邻的半导体制造装置2的暂置托盘8之间往返输送晶圆输送容器10。
另外,如图1所示,容器输送单元12在其不使用时,以既不会从其所在的半导体制造装置2的壳体3的长方体状的外形线LN向前方(图1的(b)的右方)突出也不会向左右方向(图1的(a)的左右方向)突出的状态收纳于凹部7。此外,如图1所示,容器输送单元12在其使用时(输送晶圆输送容器10时),不会从其所在的半导体制造装置2和相邻的半导体制造装置2的壳体3的长方体状的外形线LN向前方(图1的(b)右方)突出。
由于生产线1具有以上这样的结构,因此,在该生产线1上对半导体晶圆实施一系列的制造工艺时,例如,像以下说明的那样,按照从右侧的半导体制造装置2A经由中央的半导体制造装置2B向左侧的半导体制造装置2C的顺序依次输送晶圆输送容器10,并且,对收容在该晶圆输送容器10内的半导体晶圆实施一系列的制造工艺。
首先,在第1处理工序中,在右侧的半导体制造装置2A中,半导体晶圆从容器载置台9被输送进去,经由装置前室6被向处理室5输送,在处理室5实施了预定的处理之后,从处理室5经由装置前室6返回容器载置台9,然后被输送出来。
接着,进入到第1输送工序,右侧的半导体制造装置2A的容器输送单元12和中央的半导体制造装置2B的容器输送单元12相互协作,在晶圆输送容器10从右侧的半导体制造装置2A的容器载置台9被暂时放置于中央的半导体制造装置2B的暂置托盘8之后,该晶圆输送容器10从中央的半导体制造装置2B的暂置托盘8被向中央的半导体制造装置2B的容器载置台9输送并被载置于该中央的半导体制造装置2B的容器载置台9。
然后,进入到第2处理工序,在中央的半导体制造装置2B中,半导体晶圆从容器载置台9被输送进去,经由装置前室6被向处理室5输送,在处理室5实施了预定的处理之后,从处理室5经由装置前室6返回容器载置台9,然后被输送出来。
接着,进入到第2输送工序,中央的半导体制造装置2B的容器输送单元12和左侧的半导体制造装置2C的容器输送单元12相互协作,在晶圆输送容器10从中央的半导体制造装置2B的容器载置台9被暂时放置于左侧的半导体制造装置2C的暂置托盘8之后,该晶圆输送容器10从左侧的半导体制造装置2C的暂置托盘8被向左侧的半导体制造装置2C的容器载置台9输送并被载置于该左侧的半导体制造装置2C的容器载置台9。
最后,进入到第3处理工序,在左侧的半导体制造装置2C中,半导体晶圆从容器载置台9被输送进去,经由装置前室6被向处理室5输送,在处理室5实施了预定的处理之后,从处理室5经由装置前室6返回容器载置台9,然后被输送出来。
在此,对半导体晶圆实施的一系列的制造工艺结束。
另外,能够考虑到各种晶圆输送容器10的具体的输送方式。作为第1输送方式,不是晶圆输送容器10在输送轨12a上行进的方式,而是如下的方式,即,形成为在输送轨12a的顶端以能够装卸的方式保持晶圆输送容器10的机构,通过输送轨12a伸长/缩短或者改变角度,将晶圆输送容器10向相邻的半导体制造装置2输送。第2输送方式如下:晶圆输送容器10在输送轨12a上行进,将晶圆输送容器10向相邻的半导体制造装置2的输送轨12a传送。第3输送方式如下:输送机器人(未图示)将晶圆输送容器10向相邻的半导体制造装置2输送。这时,输送机器人相互之间不直接接收晶圆输送容器10,而是将该晶圆输送容器10暂时放置于暂置托盘8,通过该暂置托盘8,相邻的半导体制造装置2的输送机器人取得晶圆输送容器10然后输送。
此外,在上述一系列的制造工艺中,说明了按照从右侧的半导体制造装置2A经由中央的半导体制造装置2B向左侧的半导体制造装置2C的顺序依次输送晶圆输送容器10并且对半导体晶圆实施一系列的制造工艺的情况下的步骤,但除该顺序之外,能够按任意顺序输送晶圆输送容器10并且对半导体晶圆实施一系列的制造工艺。
例如,在生产线1中,也能够利用与上述顺序相反的顺序,按照从左侧的半导体制造装置2C经由中央的半导体制造装置2B向右侧的半导体制造装置2A的顺序逆向输送晶圆输送容器10并且对半导体晶圆实施一系列的制造工艺。
此外,在生产线1中,也能够按照左侧的半导体制造装置2C、右侧的半导体制造装置2A、中央的半导体制造装置2B的顺序输送晶圆输送容器10并且半导体晶圆实施一系列的制造工艺。在该情况下,在从左侧的半导体制造装置2C向右侧的半导体制造装置2A输送晶圆输送容器10时,既可以从左侧的半导体制造装置2C经由中央的半导体制造装置2B向右侧的半导体制造装置2A输送晶圆输送容器10,也可以从左侧的半导体制造装置2C直接(也就是说,不经由中央的半导体制造装置2B)向右侧的半导体制造装置2A输送晶圆输送容器10。
这样,在按照各种顺序输送晶圆输送容器10并且对半导体晶圆实施一系列的制造工艺时,将该半导体晶圆的处理信息(使用三个半导体制造装置2中的哪个半导体制造装置2、以什么样的顺序进行处理的信息)设为RFID、条形码等标签并使半导体晶圆或者晶圆输送容器10带有该半导体晶圆的处理信息,从而能够顺畅地进行一系列的制造工艺。或者,也可以是,替代半导体晶圆的处理信息而使半导体晶圆或者晶圆输送容器10只带有ID,并且以与该ID相关联的形式将半导体晶圆的处理信息存储在预定的工序管理用电脑(未图示)中。
像以上说明的那样,在对半导体晶圆实施的一系列的制造工艺中,通过构成生产线1的三个半导体制造装置2的容器输送单元12相互协作,在这些半导体制造装置2之间输送晶圆输送容器10。其结果是,能够在三个半导体制造装置2之间自动地输送晶圆输送容器10,能够高效地进行对半导体晶圆实施的一系列的制造工艺。此外,由于在各半导体制造装置2中分别设有暂置托盘8,因此,在生产线1上连续处理多个半导体晶圆的情况下,通过在对各半导体晶圆实施的一系列的制造工艺的中途将晶圆输送容器10暂置于暂置托盘8,能够缩短容器输送单元12的待机时间,进而能够缩短对所有半导体晶圆实施一系列的制造工艺的整体的所需时间。
而且,能够避免产生在生产线1的附近配置1套输送轨这样的以往的技术所导致的问题点于未然。即,由于半导体制造装置2之间的输送是在相邻的半导体制造装置2之间进行的,因此,容器输送单元12的空间位置能够仅由该相邻的半导体制造装置2来决定。即,该半导体制造装置2之间的输送与相距较远的半导体制造装置2无关,即使工厂厂房由于随着时间变化、天灾等变形,也几乎不会对输送产生影响。此外,由于半导体晶圆(晶圆输送容器10)的输送距离成为半导体制造装置2之间的间隔,因此,输送路径成为最短,半导体制造装置2之间的输送变得非常快(5秒左右)。并且,由于容器输送单元12是能够装卸的盒式,因此,在发生故障时、需要自由的输送时,即在为了输送到所需要的半导体制造装置2之间的位置时,也能够随时切换为手动的输送,构筑没有容器输送单元12的生产线1。此外,若有暂置托盘8,则能够在该暂置托盘8附加定位功能,因此,输送机器人不必具有定位机构,能够弥补半导体制造装置2之间的位置精度的不良。
并且,在生产线1中,如图1的(a)所示,由于暂置托盘8位于相邻的两个半导体制造装置2的容器载置台9之间,因此,这与在容器载置台9之间直接(不经由暂置托盘8)输送晶圆输送容器10的情况不同,能够补偿容器输送单元12的可动范围,能够降低容器输送单元12的机构设计和制作上的制约。即,容器输送单元12的可动范围设为到相邻的半导体制造装置2的暂置托盘8为止即可,不必到达相邻的半导体制造装置2的容器载置台9。
此外,像上述那样,容器输送单元12在其不使用时,以既不会从其所在的半导体制造装置2的壳体3的长方体状的外形线LN向前方突出也不会向左右方向突出的状态收纳于凹部7,因此,在并列设置三个半导体制造装置2地构筑生产线1时,能够顺畅地进行这些半导体制造装置2的安装作业、替换作业。
并且,像上述那样,容器输送单元12在使用时,不会从其所在的半导体制造装置2和相邻的半导体制造装置2的壳体3的长方体状的外形线LN向前方突出,因此,在使用容器输送单元12在半导体制造装置2之间输送晶圆输送容器10时,能够避免该容器输送单元12成为操作人员的障碍。
此外,在晶圆输送容器10的输送过程中,半导体晶圆始终以密闭状态收容在晶圆输送容器10内,因此,不会产生空气中的细颗粒进入到晶圆输送容器10内并附着在半导体晶圆上的担忧。因此,不必将生产线1整体密闭,能够廉价地构筑生产线1。
发明的其他实施方式
另外,在上述实施方式1中,说明了由三个半导体制造装置2构成的生产线1,但构成生产线1的半导体制造装置2的个数并不限定于三个,只要是多个(两个以上),则多少个都可以。
此外,在上述实施方式1中,说明了将本发明应用于小口径的半导体晶圆的情况,但本发明也同样能够应用于8英寸、12英寸等大口径的半导体晶圆等。
并且,在上述实施方式1中,以使用半导体晶圆的半导体制造装置2为例进行了说明,但本发明也同样能够应用于其他种类的基板(例如蓝宝石基板等绝缘性基板、铝基板等导电性基板)、由非圆盘形状(例如矩形)的处理基板来进行制造的制造装置。
产业上的可利用性
本发明不仅能够应用于半导体制造装置,还能够在多个领域中广泛应用于进行多品种少量生产的生产线。
附图标记说明
1、生产线;2、半导体制造装置(小型制造装置);3、壳体;5、处理室;6、装置前室;7、凹部;8、暂置托盘;9、容器载置台;10、晶圆输送容器(基板输送容器);12、容器输送单元;12a、输送轨;14、容器输送路径;16、地面;LN、壳体的外形线。

Claims (7)

1.一种小型制造装置,其中,
在壳体的内部配设有处理室和装置前室,
在所述壳体设有用于载置收容有处理基板的基板输送容器的容器载置台,
在处理所述处理基板时,该处理基板从所述容器载置台被输送进去,经由所述装置前室被向所述处理室输送,在该处理室进行处理之后,从该处理室经由所述装置前室返回所述容器载置台,然后被输送出来,
该小型制造装置的特征在于,
在所述壳体设有容器输送单元,该容器输送单元与所述壳体形成为一体,
在所述壳体中,在所述装置前室的上方形成有凹部,该凹部的前表面侧和侧面侧开放,从前表面向深度方向凹陷,
在所述凹部设有所述容器载置台和所述容器输送单元,
所述小型制造装置构成为俯视时呈大致四边形形状,
在沿并列设置方向并列设置有多个所述小型制造装置时,构成为以具有所述容器输送单元这一侧的所述前表面位于与相邻的小型制造装置的所述前表面大致同一平面上的方式并列设置,
沿该多个小型制造装置的所述并列设置方向配设并形成容器输送路径,所述容器输送路径形成为以大致一直线状贯通该多个小型制造装置的所述凹部,
沿该容器输送路径直接向所述相邻的小型制造装置传送所述基板输送容器,或者直接从所述相邻的小型制造装置接收所述基板输送容器,
所述小型制造装置的所述容器输送单元直接向所述相邻的小型制造装置的所述容器载置台传送所述基板输送容器,或者直接从所述相邻的小型制造装置的所述容器载置台接收所述基板输送容器,
所述容器输送单元构成为在该多个小型制造装置中通用。
2.根据权利要求1所述的小型制造装置,其特征在于,
所述容器输送单元相对于所述壳体装卸自如地设置。
3.根据权利要求1所述的小型制造装置,其特征在于,
在所述壳体设有用于暂时保持所述基板输送容器的暂置托盘,
所述容器输送单元构成为,在所述容器载置台和所述暂置托盘之间输送所述基板输送容器,并且,在并列设置有多个所述小型制造装置时,能够在任意的小型制造装置的所述容器载置台和与该任意的小型制造装置相邻的小型制造装置的所述暂置托盘之间输送所述基板输送容器。
4.根据权利要求3所述的小型制造装置,其特征在于,
所述暂置托盘设置为,在并列设置有多个所述小型制造装置时,所述暂置托盘位于任意的小型制造装置的所述容器载置台和与该任意的小型制造装置相邻的小型制造装置的所述容器载置台之间。
5.根据权利要求1~4中任一项所述的小型制造装置,其特征在于,
所述容器输送单元具有用于沿所述容器输送路径输送所述基板输送容器的输送轨。
6.根据权利要求1~4中任一项所述的小型制造装置,其特征在于,
所述容器输送单元在其不使用时,以不会从所述壳体的外形线向外部突出的状态收纳于所述凹部。
7.根据权利要求1~4中任一项所述的小型制造装置,其特征在于,
所述容器输送单元构成为,在其使用时不会从所述壳体的外形线向前方突出。
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012054414A (ja) * 2010-09-01 2012-03-15 National Institute Of Advanced Industrial & Technology デバイス製造装置および方法
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Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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US20020154977A1 (en) 2001-04-19 2002-10-24 Yoo Woo Sik Wafer transport system and method
US7153079B2 (en) * 2001-09-18 2006-12-26 Murata Kikai Kabushiki Kaisha Automated guided vehicle
CN102470985B (zh) * 2009-11-27 2015-07-22 株式会社大福 顶棚输送车
WO2012008756A2 (en) * 2010-07-13 2012-01-19 Lg Electronics Inc. Refrigerator and cooling apparatus
CN104838481B (zh) * 2012-12-04 2017-06-13 独立行政法人产业技术综合研究所 基板输送前室机构
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JP6295024B2 (ja) 2012-12-04 2018-03-14 国立研究開発法人産業技術総合研究所 ミニマル製造装置と生産ラインと生産ラインの組み替え方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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