CN106981456B - Tft基板的制作方法 - Google Patents
Tft基板的制作方法 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 80
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 39
- 239000004065 semiconductor Substances 0.000 claims abstract description 79
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 72
- 239000004020 conductor Substances 0.000 claims abstract description 50
- 238000000034 method Methods 0.000 claims abstract description 39
- 239000012774 insulation material Substances 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 10
- 238000005516 engineering process Methods 0.000 claims description 9
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 5
- 238000005530 etching Methods 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 3
- 229910052733 gallium Inorganic materials 0.000 claims description 3
- 229910052738 indium Inorganic materials 0.000 claims description 3
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 2
- 238000009413 insulation Methods 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical group N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 239000011787 zinc oxide Substances 0.000 claims description 2
- GRPQBOKWXNIQMF-UHFFFAOYSA-N indium(3+) oxygen(2-) tin(4+) Chemical group [Sn+4].[O-2].[In+3] GRPQBOKWXNIQMF-UHFFFAOYSA-N 0.000 claims 1
- 239000000377 silicon dioxide Substances 0.000 claims 1
- 238000000151 deposition Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 5
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- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
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- 238000004380 ashing Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical group O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
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Abstract
本发明提供了一种TFT基板的制作方法。该制作方法包括以下步骤:利用第一道光罩工艺,在基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;利用第三道光罩工艺,在第二绝缘层以及第二半导体层上形成第一光阻层,在第一绝缘层上形成第二光阻层,对第一半导体层导体化以形成第一导体层,在基板上形成第二导体层,在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极。该方案工艺步骤简单,可提高生产效率,降低生产成本。
Description
技术领域
本发明涉及液晶面板制作领域,特别是涉及一种TFT基板的制作方法。
背景技术
在信息社会的当代,作为可视信息传输媒介的显示器的重要性在进一步加强,为了在未来占据主导地位,显示器正朝着更轻、更薄、更低能耗、更低成本以及更好图像质量的趋势发展。
在液晶面板工业中,通过TFT基板来控制液晶的排列,从而实现不同灰度光线的显示,TFT基板为液晶面板中的重要部分,其生产也属于液晶面板制造过程中的重要工艺。
随着TFT技术的发展,制程Mask(光罩)需求从5/6Mask降到现在主流的4Mask。每减少一道Mask,机器物料时间成本都会下降较多,大大提高产品竞争力。3Mask TFT因其节约一道Mask,较大幅度降低成本,相关技术较热门。
相关技术中采用环形栅极结构的TFT基板,因其性能优越,越来越受到人们的重视。然而,该环形栅极结构的TFT基板运用于量产时,其工艺步骤较复杂繁琐,导致制作成本较高。
因此,现有技术存在缺陷,急需改进。
发明内容
本发明的目的在于提供一种改进的TFT基板的制作方法。
为解决上述问题,本发明提供的技术方案如下:
本发明提供一种TFT基板的制作方法,包括以下步骤:
提供一基板;
利用第一道光罩工艺,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;其中,数据线与源极电连接,第二扫描线与栅极电连接,栅极呈玦状且环绕源极设置;
利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;
在该基板上涂布光阻,利用第三道光罩工艺,对位于第一半导体层上的光阻全曝光,以使第一半导体层露出;对位于第二绝缘层以及第二半导体层上的光阻半曝光,以在第二绝缘层以及第二半导体层上形成第一光阻层,并将位于第一绝缘层上的未曝光光阻作为第二光阻层;
对第一半导体层导体化以形成第一导体层,然后去除第一光阻层;
在基板上形成第二导体层后去除第二光阻层,以在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极,其中,电连接部通过第一导体层使得第一扫描线与第二扫描线连接。
在一些实施例中,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极的步骤,包括:
在该基板上形成缓冲层;
在缓冲层上涂布光阻;
通过黄光工艺和蚀刻工艺,形成第一扫描区域、第二扫描区域、栅极区域、数据线区域以及源极区域;
在该基板上沉积金属层后剥离光阻,以在第一扫描区域形成第一扫描线、第二扫描区域形成第二扫描线、栅极区域形成栅极、数据线区域形成数据线,以及在源极区域形成源极。
在一些实施例中,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层的步骤,包括:
在该基板上形成绝缘材料层;
对该绝缘材料层进行图形化处理,以使第一扫描线、第二扫描线以及源极露出,在缓冲层、栅极上形成第一绝缘层,以及在数据线上形成第二绝缘层;
在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层。
在一些实施例中,对该绝缘材料层进行图形化处理的步骤,包括:
在该基板上涂布光阻;
通过黄光工艺,对位于第一扫描线、第二扫描线以及源极上的绝缘材料层上的光阻全曝光,以使位于第一扫描线、第二扫描线以及源极上的绝缘材料层露出;
通过刻蚀工艺,对位于第一扫描线、第二扫描线以及源极上的绝缘材料层进行刻蚀。
在一些实施例中,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层的步骤,包括:
通过物理气相沉积法,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层。
在一些实施例中,对第一半导体层导体化以形成第一导体层,然后去除第一光阻层的步骤,包括:
对第一半导体层导体化以形成第一导体层;
对光阻进行灰化,以去除第一光阻层。
在一些实施例中,在基板上形成第二导体层后去除第二光阻层的步骤,包括:
通过物理气相沉积法,在基板上形成第二导体层;
通过光阻剥离工艺,去除第二光阻层。
在一些实施例中,第一半导体层、第二半导体层的材料为铟镓锌氧化物。
在一些实施例中,第二导体层的材料为氧化铟锡。
在一些实施例中,缓冲层为氮化硅层、氧化硅层或氧化铝层。
相较于现有的TFT基板的制作方法,本发明利用第一道光罩工艺,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;其中,数据线与源极电连接,第二扫描线与栅极电连接,栅极呈玦状且环绕源极设置;利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;在该基板上涂布光阻,利用第三道光罩工艺,对位于第一半导体层上的光阻全曝光,以使第一半导体层露出;对位于第二绝缘层以及第二半导体层上的光阻半曝光,以在第二绝缘层以及第二半导体层上形成第一光阻层,在第一绝缘层上形成第二光阻层;对第一半导体层导体化以形成第一导体层,然后去除第一光阻层;在基板上形成第二导体层后去除第二光阻层,以在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极,其中,电连接部通过第一导体层使得第一扫描线与第二扫描线连接。该方案通过三道光罩工艺,使露出的第一半导体导体化,工艺步骤较简单,提高了生产效率,同时降低了生产成本。
附图说明
图1为本发明优选实施例中TFT基板的制作方法的流程示意图。
图2A-2E为图1所示TFT基板的制作方法中第一道光罩工艺对应形成基板的结构示意图。
图3A-3E为图1所示TFT基板的制作方法中第二道光罩工艺对应基板的结构示意图。
图4A-4F为图1所示TFT基板的制作方法中第三道光罩工艺对应基板的结构示意图。
具体实施方式
以下各实施例的说明是参考附加的图式,用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语,例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本发明,而非用以限制本发明。
在附图中,结构相似的模块是以相同标号表示。
此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本发明的描述中,除非另有说明,“多个”的含义是两个或两个以上。另外,术语“包括”及其任何变形,意图在于覆盖不排他的包含。
参阅图1,图1为本发明优选实施例提供的TFT基板的制作方法的流程示意图。如图1所示,本优选实施例的TFT的制作方法,包括以下步骤:
S101、提供一基板,利用第一道光罩工艺,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;其中,数据线与源极电连接,第二扫描线与栅极电连接,栅极呈玦状且环绕源极设置;
S102、利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;
S103、在该基板上涂布光阻,利用第三道光罩工艺,对位于第一半导体层上的光阻全曝光,以使第一半导体层露出;对位于第二绝缘层以及第二半导体层上的光阻半曝光,以在第二绝缘层以及第二半导体层上形成第一光阻层,在第一绝缘层上形成第二光阻层;
S104、对第一半导体层导体化以形成第一导体层,然后去除第一光阻层;
S105、在基板上形成第二导体层后去除第二光阻层,以在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极,其中,电连接部通过第一导体层使得第一扫描线与第二扫描线连接。
在一些实施方式中,步骤S101,请参考图2A-2E。图2A-2E为图1所示TFT基板的制作方法中第一道光罩工艺对应形成基板的结构示意图。其中,图2D为阵列基板的俯视图,图2E为阵列基板沿P1-P1方向的剖面图。
如图2A所示,提供一基板11,在该基板11上形成缓冲层12,然后,在缓冲层12上涂布光阻13。
随后,如图2B所示,通过半曝光和全曝光工艺、蚀刻工艺以及光阻灰化处理,形成第一扫描区域131、第二扫描区域132、栅极区域133A、栅极区域133B、数据线区域121以及源极区域122。
接着,如图2C所示,通过物理气相沉积法,在该基板11上形成金属层14,以覆盖第一扫描区域131、第二扫描区域132、栅极区域133A、栅极区域133B、数据线区域121以及源极区域122。其中,该金属层14的材料可以为铜/钼,铝/钼,钛化钼/铜等。
最后,参考图2D、图2E,通过剥离工艺,去除光阻13以及位于光阻13上的金属层14,以在第一扫描区域131形成第一扫描线101、第二扫描区域132形成第二扫描线102、栅极区域133A和栅极区域133B形成栅极103、数据线区域134形成数据线104,以及在源极区域122形成源极105。其中,数据线104与源极105电连接,第二扫描线102与栅极103电连接,栅极103呈玦状且环绕源极105设置。
在一些实施方式中,步骤S102,请参考图3A-3E。图3A-3E为图1所示TFT基板的制作方法中第二道光罩工艺对应形成基板的结构示意图。
如图3A所示,通过化学气相沉积法,在该基板上形成绝缘材料层15。
随后,对该绝缘材料层15进行图形化处理。参考图3B和图3C,在该基板上涂布光阻16;通过黄光工艺,对位于第一扫描线101、第二扫描线102以及源极105上的绝缘材料层15上的光阻16全曝光,以使第一扫描线101、第二扫描线102以及源极105上的绝缘材料层15露出;通过刻蚀工艺,对位于第一扫描线101、第二扫描线102以及源极105上的绝缘材料层15进行刻蚀,以在缓冲层12、栅极103上形成第一绝缘层151,以及在数据线104上形成第二绝缘层152。
接着,参考图3D。通过物理气相沉积法,在基板上整面沉积半导体材料层17,以覆盖第一扫描线101、第二扫描线102以及源极105。其中,半导体材料层17的材料为铟镓锌氧化物。
最后,参考图3E。通过剥离工艺,去除光阻层16上的半导体层17,以在第一扫描线101、第二扫描线102上形成第一半导体层171A,在源极105上形成第二半导体层172。
在一些实施方式中,步骤S103-S105,请参考图4A-4F。图4A-4F为图1所示TFT基板的制作方法中第三道光罩工艺对应形成基板的结构示意图。其中,图4E为阵列基板的俯视图,图4F为阵列基板沿P2-P2方向的剖面图。
如图4A所示,在该基板上涂布光阻18。
随后,参考图4B。通过半曝光工艺,对位于第一半导体层171A上的光阻全曝光,以使第一半导体层171A露出。对位于第二绝缘层152以及第二半导体层172上的光阻半曝光,以在第二绝缘层152以及第二半导体层172上(即半曝光区域)形成第一光阻层181,在第一绝缘层151上(未曝光区域)形成第二光阻层182。其中,第二光阻层182的厚度大于第一光阻层181的厚度。
接着,参考图4C。通过使用氩气、氮气以及氨气对露出的第一半导体层171A导体化处理,以形成第一导体层171B。然后,通入氧气对光阻18进行灰化处理,使光阻18整体减薄。其中,半曝光区域的光阻全部反应掉,以去除第一光阻层181。
然后,参考图4D。通过物理气相沉积法,在基板上整面沉积第二导体层19。其中,第二导体层19的材料为氧化铟锡。
最后,参考图4E和4F。通过光阻剥离工艺,去除第二光阻层182,以在第一导体层171B以及第二绝缘层152上形成电连接部191、在第二半导体层172上形成漏极192,同时形成像素电极Q。其中,电连接部191通过第一导体层171B使得第一扫描线101与第二扫描线102连接。
由上可知,本发明实施例提供的TFT基板的制作方法,利用第一道光罩工艺,在基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;利用第三道光罩工艺,在第二绝缘层以及第二半导体层上形成第一光阻层,在第一绝缘层上形成第二光阻层,对第一半导体层导体化以形成第一导体层,在基板上形成第二导体层,在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极。该方案通过三道光罩工艺,使露出的第一半导体导体化,工艺步骤较简单,提高了生产效率,同时降低了生产成本。
综上所述,虽然本发明已以优选实施例揭露如上,但上述优选实施例并非用以限制本发明,本领域的普通技术人员,在不脱离本发明的精神和范围内,均可作各种更动与润饰,因此本发明的保护范围以权利要求界定的范围为准。
Claims (10)
1.一种TFT基板的制作方法,其特征在于,包括以下步骤:
提供一基板;
利用第一道光罩工艺,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极;其中,数据线与源极电连接,第二扫描线与栅极电连接,栅极呈玦状且环绕源极设置;
利用第二道光罩工艺,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层;
在该基板上涂布光阻,利用第三道光罩工艺,对位于第一半导体层上的光阻全曝光,以使第一半导体层露出;对位于第二绝缘层以及第二半导体层上的光阻半曝光,以在第二绝缘层以及第二半导体层上形成第一光阻层,并将位于第一绝缘层上的未曝光光阻作为第二光阻层;
对第一半导体层导体化以形成第一导体层,然后去除第一光阻层;
在基板上形成第二导体层后去除第二光阻层,以在第一导体层以及第二绝缘层上形成电连接部、在第二半导体层上形成漏极,其中,电连接部通过第一导体层使得第一扫描线与第二扫描线连接。
2.如权利要求1所述的TFT基板的制作方法,其特征在于,在该基板上形成缓冲层、数据线以及源极,并在该缓冲层上设置第一扫描线、第二扫描线以及栅极的步骤,包括:
在该基板上形成缓冲层;
在缓冲层上涂布光阻;
通过黄光工艺和蚀刻工艺,形成第一扫描区域、第二扫描区域、栅极区域、数据线区域以及源极区域;
在该基板上沉积金属层后剥离光阻,以在第一扫描区域形成第一扫描线、第二扫描区域形成第二扫描线、栅极区域形成栅极、数据线区域形成数据线,以及在源极区域形成源极。
3.如权利要求1所述的TFT基板的制作方法,其特征在于,在缓冲层、栅极上形成第一绝缘层,在数据线上形成第二绝缘层,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层的步骤,包括:
在该基板上形成绝缘材料层;
对该绝缘材料层进行图形化处理,以使第一扫描线、第二扫描线以及源极露出,在缓冲层、栅极上形成第一绝缘层,以及在数据线上形成第二绝缘层;
在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层。
4.如权利要求3所述的TFT基板的制作方法,其特征在于,对该绝缘材料层进行图形化处理的步骤,包括:
在该基板上涂布光阻;
通过黄光工艺,对位于第一扫描线、第二扫描线以及源极上的绝缘材料层上的光阻全曝光,以使位于第一扫描线、第二扫描线以及源极上的绝缘材料层露出;
通过刻蚀工艺,对位于第一扫描线、第二扫描线以及源极上的绝缘材料层进行刻蚀。
5.如权利要求4所述的TFT基板的制作方法,其特征在于,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层的步骤,包括:
通过物理气相沉积法,在第一扫描线、第二扫描线上形成第一半导体层,在源极上形成第二半导体层。
6.如权利要求1所述的TFT基板的制作方法,其特征在于,对第一半导体层导体化以形成第一导体层,然后去除第一光阻层的步骤,包括:
对第一半导体层导体化以形成第一导体层;
对光阻进行灰化,以去除第一光阻层。
7.如权利要求1所述的TFT基板的制作方法,其特征在于,在基板上形成第二导体层后去除第二光阻层的步骤,包括:
通过物理气相沉积法,在基板上形成第二导体层;
通过光阻剥离工艺,去除第二光阻层。
8.如权利要求1所述的TFT基板的制作方法,其特征在于,第一半导体层、第二半导体层的材料为铟镓锌氧化物。
9.如权利要求1所述的TFT基板的制作方法,其特征在于,第二导体层的材料为氧化铟锡。
10.如权利要求1所述的TFT基板的制作方法,其特征在于,缓冲层为氮化硅层、氧化硅层或氧化铝层。
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