CN106908449A - 一种通过测量液晶玻璃板缺陷深度寻找产生缺陷的工段的方法 - Google Patents
一种通过测量液晶玻璃板缺陷深度寻找产生缺陷的工段的方法 Download PDFInfo
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- CN106908449A CN106908449A CN201710087364.1A CN201710087364A CN106908449A CN 106908449 A CN106908449 A CN 106908449A CN 201710087364 A CN201710087364 A CN 201710087364A CN 106908449 A CN106908449 A CN 106908449A
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- 230000007547 defect Effects 0.000 title claims abstract description 143
- 239000011521 glass Substances 0.000 title claims abstract description 122
- 238000000034 method Methods 0.000 title claims abstract description 35
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims abstract description 22
- 230000002950 deficient Effects 0.000 claims abstract description 16
- 229910052697 platinum Inorganic materials 0.000 claims abstract description 11
- 238000000746 purification Methods 0.000 claims abstract description 10
- 238000007493 shaping process Methods 0.000 claims abstract description 9
- 230000008018 melting Effects 0.000 claims abstract description 6
- 238000002844 melting Methods 0.000 claims abstract description 6
- 238000007711 solidification Methods 0.000 claims abstract description 6
- 230000008023 solidification Effects 0.000 claims abstract description 6
- 238000004519 manufacturing process Methods 0.000 description 14
- 230000000007 visual effect Effects 0.000 description 10
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 230000002159 abnormal effect Effects 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 5
- 230000007717 exclusion Effects 0.000 description 4
- 238000011835 investigation Methods 0.000 description 4
- 239000005355 lead glass Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005816 glass manufacturing process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
- G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Liquid Crystal (AREA)
Abstract
Description
初始良品率 | 改进良品率 | |
实施例1 | 70% | 93% |
实施例2 | 50% | 95% |
实施例3 | 65% | 93% |
对比例 | 65% | 88% |
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201710087364.1A CN106908449B (zh) | 2017-02-17 | 2017-02-17 | 一种通过测量液晶玻璃板缺陷深度寻找产生缺陷的工段的方法 |
Applications Claiming Priority (1)
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CN201710087364.1A CN106908449B (zh) | 2017-02-17 | 2017-02-17 | 一种通过测量液晶玻璃板缺陷深度寻找产生缺陷的工段的方法 |
Publications (2)
Publication Number | Publication Date |
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CN106908449A true CN106908449A (zh) | 2017-06-30 |
CN106908449B CN106908449B (zh) | 2019-09-06 |
Family
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Family Applications (1)
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CN201710087364.1A Active CN106908449B (zh) | 2017-02-17 | 2017-02-17 | 一种通过测量液晶玻璃板缺陷深度寻找产生缺陷的工段的方法 |
Country Status (1)
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CN (1) | CN106908449B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108061736A (zh) * | 2017-11-14 | 2018-05-22 | 东旭科技集团有限公司 | 使用反射电子探针对玻璃缺陷进行分析的方法 |
CN110998298A (zh) * | 2017-08-24 | 2020-04-10 | 日本电气硝子株式会社 | 板状玻璃的制造方法 |
CN113837528A (zh) * | 2021-08-04 | 2021-12-24 | 山西光兴光电科技有限公司 | 用于判定造成基板玻璃表面缺陷的工位位置的方法 |
Citations (6)
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---|---|---|---|---|
CN1573319A (zh) * | 2003-05-31 | 2005-02-02 | 三星康宁精密琉璃株式会社 | 玻璃基板内缺陷的深度方向位置检测方法 |
CN1321445C (zh) * | 2004-03-29 | 2007-06-13 | 力晶半导体股份有限公司 | 缺陷原因分析的方法 |
KR20080077829A (ko) * | 2007-02-21 | 2008-08-26 | 엘지디스플레이 주식회사 | 액정표시장치의 불량 판별 장치 및 방법 |
CN102928432A (zh) * | 2011-08-09 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | 模仁成型面检测方法 |
CN104903262A (zh) * | 2013-03-21 | 2015-09-09 | 日本电气硝子株式会社 | 玻璃基板生产管理系统以及玻璃基板生产管理方法 |
KR20160095515A (ko) * | 2015-02-03 | 2016-08-11 | 연세대학교 산학협력단 | 결함 분포 3차원 광 계측 장치 및 방법 |
-
2017
- 2017-02-17 CN CN201710087364.1A patent/CN106908449B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1573319A (zh) * | 2003-05-31 | 2005-02-02 | 三星康宁精密琉璃株式会社 | 玻璃基板内缺陷的深度方向位置检测方法 |
CN1321445C (zh) * | 2004-03-29 | 2007-06-13 | 力晶半导体股份有限公司 | 缺陷原因分析的方法 |
KR20080077829A (ko) * | 2007-02-21 | 2008-08-26 | 엘지디스플레이 주식회사 | 액정표시장치의 불량 판별 장치 및 방법 |
CN102928432A (zh) * | 2011-08-09 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | 模仁成型面检测方法 |
CN104903262A (zh) * | 2013-03-21 | 2015-09-09 | 日本电气硝子株式会社 | 玻璃基板生产管理系统以及玻璃基板生产管理方法 |
KR20160095515A (ko) * | 2015-02-03 | 2016-08-11 | 연세대학교 산학협력단 | 결함 분포 3차원 광 계측 장치 및 방법 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110998298A (zh) * | 2017-08-24 | 2020-04-10 | 日本电气硝子株式会社 | 板状玻璃的制造方法 |
CN110998298B (zh) * | 2017-08-24 | 2023-01-06 | 日本电气硝子株式会社 | 板状玻璃的制造方法 |
CN108061736A (zh) * | 2017-11-14 | 2018-05-22 | 东旭科技集团有限公司 | 使用反射电子探针对玻璃缺陷进行分析的方法 |
CN113837528A (zh) * | 2021-08-04 | 2021-12-24 | 山西光兴光电科技有限公司 | 用于判定造成基板玻璃表面缺陷的工位位置的方法 |
CN113837528B (zh) * | 2021-08-04 | 2024-03-22 | 山西光兴光电科技有限公司 | 用于判定造成基板玻璃表面缺陷的工位位置的方法 |
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CN106908449B (zh) | 2019-09-06 |
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Effective date of registration: 20230518 Address after: 350000 section 072, room 109, supervision building, processing trade zone, Fuzhou free trade port, Fujian Province (No. 9, Xinjiang road, Xincuo Town, Fuqing City) (in the pilot Free Trade Zone) Patentee after: FUZHOU DONGXU OPTOELECTRONICS TECHNOLOGY CO.,LTD. Patentee after: Dongxu (Beijing) Industrial Technology Co.,Ltd. Patentee after: Beijing Yuanda Xinda Technology Co.,Ltd. Address before: 350000 section 072, room 109, supervision building, processing trade zone, Fuzhou free trade port, Fujian Province (No. 9, Xinjiang road, Xincuo Town, Fuqing City) (in the pilot Free Trade Zone) Patentee before: FUZHOU DONGXU OPTOELECTRONICS TECHNOLOGY CO.,LTD. Patentee before: ZHENGZHOU XUFEI OPTOELECTRONIC TECHNOLOGY Co.,Ltd. Patentee before: DONGXU OPTOELECTRONIC TECHNOLOGY Co.,Ltd. Patentee before: TUNGHSU GROUP Co.,Ltd. |