CN106564852A - Packaging structure for high-impact MEMS inertial sensor chip - Google Patents

Packaging structure for high-impact MEMS inertial sensor chip Download PDF

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Publication number
CN106564852A
CN106564852A CN201610911703.9A CN201610911703A CN106564852A CN 106564852 A CN106564852 A CN 106564852A CN 201610911703 A CN201610911703 A CN 201610911703A CN 106564852 A CN106564852 A CN 106564852A
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CN
China
Prior art keywords
inertial sensor
sensor chip
mems inertial
metal
tube shell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610911703.9A
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Chinese (zh)
Inventor
陈璞
郭群英
郑宇�
王文靖
陈博
黄斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
North Electronic Research Institute Anhui Co., Ltd.
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North Electronic Research Institute Anhui Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by North Electronic Research Institute Anhui Co., Ltd. filed Critical North Electronic Research Institute Anhui Co., Ltd.
Priority to CN201610911703.9A priority Critical patent/CN106564852A/en
Publication of CN106564852A publication Critical patent/CN106564852A/en
Pending legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/0032Packages or encapsulation
    • B81B7/007Interconnections between the MEMS and external electrical signals

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Pressure Sensors (AREA)

Abstract

The invention discloses a packaging structure for a high-impact MEMS inertial sensor chip. The packaging structure comprises a sealed metal tube shell and a metal cover plate, wherein an MEMS inertial sensor chip is attached to the inner side of the metal tube shell; a switch-over PCB plate is further attached to the inner side of the metal tube shell; the switch-over PCB plate is arranged on one sides of metal PADs of the MEMS inertial sensor chip; a group of metal bars are distributed on the panel of the switch-over PCB plate at intervals; the metal bars are one-to-one correspondingto the metal PADs of the MEMS inertia sensor chip; the metal PADs of the MEMS inertial sensor chip are respectively welded with one ends of corresponding metal strips via gold ball bonding; the other ends of the metal strips are respectively welded with leads wrapped up with insulation layers; the other ends of the leads extend out of the side wall of the metal tube shell; gold wires on the metal PADs of the MEMS inertial sensor chip can be introduced out of the metal tube shell via the metal strips and the leads via the switch-over PCB plate, so pins carried by the metal tube shell can be cancelled and impact-resisting capacity and reliability of the packaging structure can be enhanced.

Description

A kind of encapsulating structure for HI high impact MEMS inertial sensor chip
Technical field
The present invention relates to micro-electro-mechanical sensors technical field, specifically a kind of to be used for HI high impact MEMS inertial sensor chip Encapsulating structure.
Background technology
MEMS(Micro-electromechanical Systems)Inertial sensor is because of its small volume, lightweight, power consumption It is low, be subject to extensive concern both domestic and external the advantages of be easy to mass production, have broad application prospects in various fields.
Different from the MEMS inertial sensor being applied under normal impact environment, the MEMS being applied under HI high impact environment is used to Property sensor it is high to the anti-HI high impact ability and reliability requirement of device, need tolerate ten tens of thousands of more than g HI high impact, therefore The MEMS inertial sensor being used under HI high impact environment in actual applications would generally cause sensing due to anti-HI high impact ability The sensitive structure of device or encapsulating structure are damaged, so as to cause component failure.
In order to ensure the MEMS inertial sensor normal work being applied under HI high impact environment, its encapsulating structure just seems outstanding For important.The problems such as anti-HI high impact ability of encapsulating structure generally existing of existing MEMS inertial sensor, device reliability difference, The problems such as usually there is the glass insulator fragmentation that Can carries pin, wire breaking, therefore, in the urgent need to a kind of microcomputer Electric transducer encapsulating structure is ensureing the reliability that MEMS inertial sensor works under HI high impact environment.
The content of the invention
The present invention is to solve the anti-HI high impact ability of existing MEMS inertial sensor encapsulating structure, encapsulating structure reliability Property difference problem, there is provided a kind of encapsulating structure for HI high impact MEMS inertial sensor chip.
The technical solution adopted for the present invention to solve the technical problems is:
A kind of encapsulating structure for HI high impact MEMS inertial sensor chip, including the Can and metal cover board of sealing, MEMS inertial sensor die bonding is also bonded with switching pcb board in Can in Can, switching pcb board is located at The metal PAD sides of MEMS inertial sensor chip, the plate face of pcb board of transferring is intervally distributed with one group of bonding jumper, bonding jumper with The metal PAD of MEMS inertial sensor chip is corresponded;The metal PAD of MEMS inertial sensor chip respectively with corresponding gold One end of category bar is mutually welded by gold ball bonding, and the other end of bonding jumper is respectively welded the wire with parcel insulating barrier, wire The other end extends metal tube shell side wall.
Further, thickness of the thickness of the switching pcb board less than MEMS inertial sensor chip.
The invention has the beneficial effects as follows, by the spun gold transferred on metal PAD of the pcb board by MEMS inertial sensor chip The outside of Can is drawn out to by bonding jumper and wire, eliminate Can carries pin, is not in spun gold and gold Category pin pressure welding point come off, the glass insulator fragmentation of Can pin the problems such as, enhance the anti-HI high impact of encapsulating structure Ability and reliability.
Description of the drawings
With reference to the accompanying drawings and examples the present invention is further described:
Fig. 1 is the structural representation of the present invention;
Fig. 2 is the top view of the present invention, and metal cover board is not drawn into filling glue.
Specific embodiment
With reference to shown in Fig. 1 and Fig. 2, the present invention provides a kind of encapsulation for HI high impact MEMS inertial sensor chip and ties Structure, including the Can 1 of sealing and metal cover board 10, MEMS inertial sensor chip 3 is adhered to metal tube by bonded adhesives 2 In shell 1, switching pcb board 4 is also bonded with Can 1, pcb board 4 of transferring is located at the metal of MEMS inertial sensor chip 3 PAD5 sides, the plate face of pcb board 4 of transferring is intervally distributed with one group of bonding jumper 6, bonding jumper 6 and MEMS inertial sensor chip Metal PAD5 is corresponded, and insulating barrier 7 is equipped with every bonding jumper 6, and bonding jumper 6 can be turned with insulating barrier 7 by turmeric, figure The techniques such as shifting, plating make;Thickness of the thickness of the switching pcb board 4 less than MEMS inertial sensor chip 3;MEMS inertia The metal PAD5 of sensor chip is mutually welded respectively with one end of corresponding bonding jumper 6 by gold ball bonding, the connection of the one end of spun gold 8 Metal PAD5, other end connection bonding jumper 6;The other end of bonding jumper 6 is respectively welded the wire 9 with parcel insulating barrier, wire 9 The other end extends the side wall of Can 1;Filled with filling glue 11 between Can 1 and metal cover board 10.
The thickness of switching pcb board 4 can reduce arch during gold wire bonding less than the thickness of MEMS inertial sensor chip 3 Silk height, improves reliability;All bonding jumpers on switching pcb board 4 all using gold making, so can be reduced and bonding wire Contact resistance.
When carrying out bonding with switching pcb board 4 to MEMS inertial sensor chip 3, the consumption of bonded adhesives 2 should control to fit When, it is ensured that do not spill over the bottom of MEMS inertial sensor chip 3 and switching pcb board 4.
, preferably using the metal material that density is less, specific modulus is larger, its internal stress is less, so for Can 1 The stress that Can inside other materials is experienced is also less, plays and sensitive structure inside shell is protected under HI high impact environment Effect.
The filling glue that described the filling preferred elastic modelling quantity of glue 11 is larger, thermal coefficient of expansion and spun gold are close, can resist gold The effect of category shell vibration deformation so that the structure after encapsulation is more firm, is conducive to the lifting of anti-HI high impact ability.
The above, is only presently preferred embodiments of the present invention, and any pro forma restriction is not made to the present invention;Appoint What those of ordinary skill in the art, under without departing from technical solution of the present invention ambit, all using the side of the disclosure above Method and technology contents make many possible variations and modification, or the equivalent reality for being revised as equivalent variations to technical solution of the present invention Apply example.Therefore, every content without departing from technical solution of the present invention, is done according to the technical spirit of the present invention to above example Any simple modification, equivalent, equivalence changes and modification, still fall within the range of technical solution of the present invention protection.

Claims (2)

1. a kind of Can and crown cap of encapsulating structure for HI high impact MEMS inertial sensor chip, including sealing Plate, MEMS inertial sensor die bonding is in Can, it is characterised in that be also bonded with switching pcb board in Can, Switching pcb board be located at MEMS inertial sensor chip metal PAD sides, transfer pcb board plate face be intervally distributed with one group it is golden Category bar, bonding jumper is corresponded with the metal PAD of MEMS inertial sensor chip;The metal PAD of MEMS inertial sensor chip Mutually welded by gold ball bonding with one end of corresponding bonding jumper respectively, the other end of bonding jumper is respectively welded band parcel insulating barrier Wire, the other end of wire extends metal tube shell side wall.
2. a kind of encapsulating structure for HI high impact MEMS inertial sensor chip according to claim 1, its feature exists In the thickness of the switching pcb board is less than the thickness of MEMS inertial sensor chip.
CN201610911703.9A 2016-10-20 2016-10-20 Packaging structure for high-impact MEMS inertial sensor chip Pending CN106564852A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610911703.9A CN106564852A (en) 2016-10-20 2016-10-20 Packaging structure for high-impact MEMS inertial sensor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610911703.9A CN106564852A (en) 2016-10-20 2016-10-20 Packaging structure for high-impact MEMS inertial sensor chip

Publications (1)

Publication Number Publication Date
CN106564852A true CN106564852A (en) 2017-04-19

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CN (1) CN106564852A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107768323A (en) * 2017-11-24 2018-03-06 安徽北方芯动联科微系统技术有限公司 Anti high overload electron device package shell
CN109292727A (en) * 2018-11-13 2019-02-01 北方电子研究院安徽有限公司 A kind of two-piece type MEMS gyroscope with temperature compensation function
CN111422818A (en) * 2020-03-30 2020-07-17 歌尔微电子有限公司 Sensor packaging structure and packaging method
CN113443601A (en) * 2021-07-16 2021-09-28 湖南天羿领航科技有限公司 MEMS inertial sensor chip module and preparation method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040207096A1 (en) * 2000-11-20 2004-10-21 Lamson Michael A. Low capacitance coupling wire bonded semiconductor device
CN102259827A (en) * 2011-06-25 2011-11-30 中北大学 Method for encapsulating MEMS (micro electro mechanical system) high-range acceleration sensor
KR20130028243A (en) * 2011-09-09 2013-03-19 앰코 테크놀로지 코리아 주식회사 Semicounductor package having micro electronic mechnical system
CN203754411U (en) * 2014-01-27 2014-08-06 中国电子科技集团公司第四十三研究所 Dual-cavity MEMS (micro-electromechanical system) hybrid integrated metal packaging structure
CN104390637A (en) * 2014-11-18 2015-03-04 中国兵器工业集团第二一四研究所苏州研发中心 Small-sized anti-high-overload digital micro-electro-mechanical system (MEMS) gyroscope sensor

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040207096A1 (en) * 2000-11-20 2004-10-21 Lamson Michael A. Low capacitance coupling wire bonded semiconductor device
CN102259827A (en) * 2011-06-25 2011-11-30 中北大学 Method for encapsulating MEMS (micro electro mechanical system) high-range acceleration sensor
KR20130028243A (en) * 2011-09-09 2013-03-19 앰코 테크놀로지 코리아 주식회사 Semicounductor package having micro electronic mechnical system
CN203754411U (en) * 2014-01-27 2014-08-06 中国电子科技集团公司第四十三研究所 Dual-cavity MEMS (micro-electromechanical system) hybrid integrated metal packaging structure
CN104390637A (en) * 2014-11-18 2015-03-04 中国兵器工业集团第二一四研究所苏州研发中心 Small-sized anti-high-overload digital micro-electro-mechanical system (MEMS) gyroscope sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107768323A (en) * 2017-11-24 2018-03-06 安徽北方芯动联科微系统技术有限公司 Anti high overload electron device package shell
CN107768323B (en) * 2017-11-24 2023-12-05 安徽芯动联科微系统股份有限公司 High overload resistant electronic device packaging tube shell
CN109292727A (en) * 2018-11-13 2019-02-01 北方电子研究院安徽有限公司 A kind of two-piece type MEMS gyroscope with temperature compensation function
CN111422818A (en) * 2020-03-30 2020-07-17 歌尔微电子有限公司 Sensor packaging structure and packaging method
CN111422818B (en) * 2020-03-30 2024-01-23 歌尔微电子股份有限公司 Sensor packaging structure and packaging method
CN113443601A (en) * 2021-07-16 2021-09-28 湖南天羿领航科技有限公司 MEMS inertial sensor chip module and preparation method thereof

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Application publication date: 20170419