CN106526449A - 一种芯片测试板及芯片测试的方法 - Google Patents
一种芯片测试板及芯片测试的方法 Download PDFInfo
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- CN106526449A CN106526449A CN201610948971.8A CN201610948971A CN106526449A CN 106526449 A CN106526449 A CN 106526449A CN 201610948971 A CN201610948971 A CN 201610948971A CN 106526449 A CN106526449 A CN 106526449A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
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CN106526449B CN106526449B (zh) | 2019-02-12 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107450009A (zh) * | 2016-05-31 | 2017-12-08 | 展讯通信(上海)有限公司 | 一种集成电路测试装置及采用其测试焊点的方法 |
CN111983435A (zh) * | 2020-08-26 | 2020-11-24 | 西安微电子技术研究所 | 一种用于混合集成电路寿命预计试验的测试芯片及应用 |
CN112904180A (zh) * | 2021-01-22 | 2021-06-04 | 长鑫存储技术有限公司 | 芯片测试板及芯片测试方法 |
CN113933683A (zh) * | 2021-09-23 | 2022-01-14 | 洛晶半导体(上海)有限公司 | 芯片测试系统及方法 |
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CN1121644A (zh) * | 1994-07-12 | 1996-05-01 | 现代电子产业株式会社 | 探测卡 |
JP2000352578A (ja) * | 1999-06-09 | 2000-12-19 | Advantest Corp | Ic試験装置のタイミング校正方法及びこのタイミング校正方法を用いたic試験装置 |
CN1916643A (zh) * | 2005-08-17 | 2007-02-21 | 段超毅 | 集成电路测试装置 |
CN201126463Y (zh) * | 2007-08-06 | 2008-10-01 | 陈涛 | 用于印刷线路板的测试装置 |
US20090224780A1 (en) * | 2008-03-07 | 2009-09-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer level test probe card |
CN103021985A (zh) * | 2011-09-21 | 2013-04-03 | 中国科学院上海微系统与信息技术研究所 | 待测传感器芯片的电学引出结构及其应用 |
CN104316859A (zh) * | 2014-11-06 | 2015-01-28 | 山东华芯半导体有限公司 | 一种具有高通用性的芯片测试设备 |
-
2016
- 2016-10-26 CN CN201610948971.8A patent/CN106526449B/zh active Active
Patent Citations (7)
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CN1121644A (zh) * | 1994-07-12 | 1996-05-01 | 现代电子产业株式会社 | 探测卡 |
JP2000352578A (ja) * | 1999-06-09 | 2000-12-19 | Advantest Corp | Ic試験装置のタイミング校正方法及びこのタイミング校正方法を用いたic試験装置 |
CN1916643A (zh) * | 2005-08-17 | 2007-02-21 | 段超毅 | 集成电路测试装置 |
CN201126463Y (zh) * | 2007-08-06 | 2008-10-01 | 陈涛 | 用于印刷线路板的测试装置 |
US20090224780A1 (en) * | 2008-03-07 | 2009-09-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer level test probe card |
CN103021985A (zh) * | 2011-09-21 | 2013-04-03 | 中国科学院上海微系统与信息技术研究所 | 待测传感器芯片的电学引出结构及其应用 |
CN104316859A (zh) * | 2014-11-06 | 2015-01-28 | 山东华芯半导体有限公司 | 一种具有高通用性的芯片测试设备 |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107450009A (zh) * | 2016-05-31 | 2017-12-08 | 展讯通信(上海)有限公司 | 一种集成电路测试装置及采用其测试焊点的方法 |
CN111983435A (zh) * | 2020-08-26 | 2020-11-24 | 西安微电子技术研究所 | 一种用于混合集成电路寿命预计试验的测试芯片及应用 |
CN111983435B (zh) * | 2020-08-26 | 2023-01-10 | 西安微电子技术研究所 | 一种用于混合集成电路寿命预计试验的测试芯片及应用 |
CN112904180A (zh) * | 2021-01-22 | 2021-06-04 | 长鑫存储技术有限公司 | 芯片测试板及芯片测试方法 |
CN112904180B (zh) * | 2021-01-22 | 2022-04-19 | 长鑫存储技术有限公司 | 芯片测试板及芯片测试方法 |
WO2022156132A1 (zh) * | 2021-01-22 | 2022-07-28 | 长鑫存储技术有限公司 | 芯片测试板及芯片测试方法 |
US11846670B2 (en) | 2021-01-22 | 2023-12-19 | Changxin Memory Technologies, Inc. | Chip testing board and chip testing method |
CN113933683A (zh) * | 2021-09-23 | 2022-01-14 | 洛晶半导体(上海)有限公司 | 芯片测试系统及方法 |
CN113933683B (zh) * | 2021-09-23 | 2024-04-23 | 洛晶半导体(上海)有限公司 | 芯片测试系统及方法 |
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CN106526449B (zh) | 2019-02-12 |
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Effective date of registration: 20191217 Address after: 211200 South Zone, Lishui Economic Development Zone, Jiangsu, Nanjing Patentee after: NANJING ZIQIANG RAILWAY VEHICLE PARTS CO.,LTD. Address before: 510000 unit 2414-2416, building, No. five, No. 371, Tianhe District, Guangdong, China Patentee before: GUANGDONG GAOHANG INTELLECTUAL PROPERTY OPERATION Co.,Ltd. Effective date of registration: 20191217 Address after: 510000 unit 2414-2416, building, No. five, No. 371, Tianhe District, Guangdong, China Patentee after: GUANGDONG GAOHANG INTELLECTUAL PROPERTY OPERATION Co.,Ltd. Address before: 518129 Bantian HUAWEI headquarters office building, Longgang District, Guangdong, Shenzhen Patentee before: HUAWEI TECHNOLOGIES Co.,Ltd. |
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Effective date of registration: 20220429 Address after: No. 622, Tianshengqiao Avenue, Lishui District, Nanjing, Jiangsu 210000 Patentee after: Nanjing Wuzheng Electric Technology Co.,Ltd. Address before: 211200 South Zone, Lishui Economic Development Zone, Jiangsu, Nanjing Patentee before: NANJING ZIQIANG RAILWAY VEHICLE PARTS CO.,LTD. |
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