CN106461796B - 具有可具有高纵横比的光敏元件的辐射探测器 - Google Patents
具有可具有高纵横比的光敏元件的辐射探测器 Download PDFInfo
- Publication number
- CN106461796B CN106461796B CN201580020178.5A CN201580020178A CN106461796B CN 106461796 B CN106461796 B CN 106461796B CN 201580020178 A CN201580020178 A CN 201580020178A CN 106461796 B CN106461796 B CN 106461796B
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- Prior art keywords
- photosensitive
- radiation detector
- columns
- radiation
- array
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Nuclear Medicine (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14165094 | 2014-04-17 | ||
| EP14165094.5 | 2014-04-17 | ||
| PCT/EP2015/057935 WO2015158646A1 (en) | 2014-04-17 | 2015-04-13 | Radiation detector with photosensitive elements that can have high aspect ratios |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106461796A CN106461796A (zh) | 2017-02-22 |
| CN106461796B true CN106461796B (zh) | 2020-02-07 |
Family
ID=50488998
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201580020178.5A Expired - Fee Related CN106461796B (zh) | 2014-04-17 | 2015-04-13 | 具有可具有高纵横比的光敏元件的辐射探测器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9841510B2 (enExample) |
| EP (1) | EP3132286B1 (enExample) |
| JP (1) | JP6367969B2 (enExample) |
| CN (1) | CN106461796B (enExample) |
| WO (1) | WO2015158646A1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
| IN2014DN06514A (enExample) | 2012-02-03 | 2015-06-12 | Rapiscan Systems Inc | |
| US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
| WO2013122763A1 (en) * | 2012-02-14 | 2013-08-22 | American Science And Engineering, Inc. | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
| WO2020145999A1 (en) * | 2019-01-08 | 2020-07-16 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
| WO2016154044A1 (en) | 2015-03-20 | 2016-09-29 | Rapiscan Systems, Inc. | Hand-held portable backscatter inspection system |
| EP3362820B1 (de) | 2015-11-11 | 2022-03-16 | Siemens Healthcare GmbH | Detektorelement zur erfassung von einfallender röntgenstrahlung |
| WO2019036865A1 (en) | 2017-08-21 | 2019-02-28 | Shenzhen United Imaging Healthcare Co., Ltd. | METHOD AND APPARATUS FOR POSITRON EMISSION TOMOGRAPHY |
| WO2019245636A1 (en) | 2018-06-20 | 2019-12-26 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
| WO2020058566A1 (en) * | 2018-09-19 | 2020-03-26 | Sensinite Oy | An apparatus for detecting radiation |
| CN114026464B (zh) * | 2019-06-17 | 2025-06-27 | 检测技术公司 | 辐射检测器和用于制造辐射检测器的方法 |
| US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
| US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
| KR102567702B1 (ko) * | 2021-06-30 | 2023-08-18 | 한국원자력연구원 | 방사선 검출소자 및 이의 제조방법 |
| JP7641857B2 (ja) * | 2021-08-23 | 2025-03-07 | 富士フイルム株式会社 | 放射線検出器 |
| GB2624599A (en) | 2021-10-01 | 2024-05-22 | Rapiscan Holdings Inc | Methods and systems for the concurrent generation of multiple substantially similar X-ray beams |
| US12013503B2 (en) * | 2022-10-07 | 2024-06-18 | Cintilight, Llc | Lateral crystal photodiode readouts and switched diode networks for processing nuclear events |
| US12449554B2 (en) | 2023-10-05 | 2025-10-21 | Cintilight, Llc | Scintillator detectors and methods for positron emission tomography |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1735818A (zh) * | 2003-01-06 | 2006-02-15 | 皇家飞利浦电子股份有限公司 | 用于计算机断层摄影的具有被遮挡的电子装置的辐射探测器 |
| US20070272872A1 (en) * | 2006-05-24 | 2007-11-29 | Bruker Axs, Inc. | X-ray detector with photodetector embedded in scintillator |
| CN101903801A (zh) * | 2007-12-21 | 2010-12-01 | 皇家飞利浦电子股份有限公司 | 具有复合树脂中的闪烁体的辐射敏感探测器 |
| US20110133094A1 (en) * | 2003-10-15 | 2011-06-09 | Varian Medical Systems, Inc. | Multi-energy radiation detector |
| DE102012206180A1 (de) * | 2012-04-16 | 2013-10-17 | Siemens Aktiengesellschaft | Strahlungsdetektor und Verfahren zum Herstellen eines Strahlungsdetektors |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60187879A (ja) * | 1984-03-07 | 1985-09-25 | Matsushita Electric Ind Co Ltd | 放射線検出器アレイ |
| JPH0627843B2 (ja) * | 1985-10-17 | 1994-04-13 | 株式会社島津製作所 | 放射線アレイセンサ |
| JPH0627844B2 (ja) * | 1987-05-14 | 1994-04-13 | 浜松ホトニクス株式会社 | 放射線位置検出器 |
| US6175120B1 (en) * | 1998-05-08 | 2001-01-16 | The Regents Of The University Of Michigan | High-resolution ionization detector and array of such detectors |
| JP2002107457A (ja) * | 2000-10-02 | 2002-04-10 | Canon Inc | 蛍光体構造物及びそれを有する放射線撮像装置と放射線撮像システム |
| JP2003084066A (ja) * | 2001-04-11 | 2003-03-19 | Nippon Kessho Kogaku Kk | 放射線検出器用部品、放射線検出器および放射線検出装置 |
| US6921909B2 (en) * | 2002-08-27 | 2005-07-26 | Radiation Monitoring Devices, Inc. | Pixellated micro-columnar films scintillator |
| JP2004150932A (ja) * | 2002-10-30 | 2004-05-27 | Toshiba Corp | 放射線平面検出器 |
| US20040227091A1 (en) * | 2003-05-14 | 2004-11-18 | Leblanc James Walter | Methods and apparatus for radiation detecting and imaging using monolithic detectors |
| WO2006039494A2 (en) * | 2004-09-30 | 2006-04-13 | Stanford University | Semiconductor crystal high resolution imager |
| DE102004049677B3 (de) * | 2004-10-12 | 2006-06-14 | Siemens Ag | Detektoranordnung zur Verwendung in einem kombinierten Transmissions- / Emissions-Tomographiegerät |
| US7304309B2 (en) | 2005-03-14 | 2007-12-04 | Avraham Suhami | Radiation detectors |
| US20060289777A1 (en) * | 2005-06-29 | 2006-12-28 | Wen Li | Detector with electrically isolated pixels |
| JP2010503985A (ja) * | 2006-09-14 | 2010-02-04 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | シンチレーターに基づき空乏化した電子ドリフト領域を持つx線検出集積回路素子 |
| US7525170B2 (en) | 2006-10-04 | 2009-04-28 | International Business Machines Corporation | Pillar P-i-n semiconductor diodes |
| CN101542315B (zh) * | 2006-11-17 | 2013-03-20 | 皇家飞利浦电子股份有限公司 | 在敏感层上具有多个电极的辐射探测器 |
| TWI413243B (zh) | 2007-12-26 | 2013-10-21 | Unisantis Elect Singapore Pte | 固體攝像元件、固體攝像裝置及其製造方法 |
| US8022351B2 (en) | 2008-02-14 | 2011-09-20 | California Institute Of Technology | Single photon detection with self-quenching multiplication |
| KR20100075060A (ko) | 2008-12-24 | 2010-07-02 | 주식회사 동부하이텍 | 이미지 센서 및 이미지 센서의 제조 방법 |
| US8373132B2 (en) | 2009-02-06 | 2013-02-12 | Koninklijke Philips Electronics N. V. | Radiation detector with a stack of scintillator elements and photodiode arrays |
| CN102667525B (zh) | 2009-12-18 | 2015-05-20 | 株式会社东芝 | 放射线检测器及其制造方法 |
-
2015
- 2015-04-13 JP JP2016562810A patent/JP6367969B2/ja not_active Expired - Fee Related
- 2015-04-13 US US15/304,542 patent/US9841510B2/en active Active
- 2015-04-13 EP EP15716770.1A patent/EP3132286B1/en not_active Not-in-force
- 2015-04-13 CN CN201580020178.5A patent/CN106461796B/zh not_active Expired - Fee Related
- 2015-04-13 WO PCT/EP2015/057935 patent/WO2015158646A1/en not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1735818A (zh) * | 2003-01-06 | 2006-02-15 | 皇家飞利浦电子股份有限公司 | 用于计算机断层摄影的具有被遮挡的电子装置的辐射探测器 |
| US20110133094A1 (en) * | 2003-10-15 | 2011-06-09 | Varian Medical Systems, Inc. | Multi-energy radiation detector |
| US20070272872A1 (en) * | 2006-05-24 | 2007-11-29 | Bruker Axs, Inc. | X-ray detector with photodetector embedded in scintillator |
| CN101903801A (zh) * | 2007-12-21 | 2010-12-01 | 皇家飞利浦电子股份有限公司 | 具有复合树脂中的闪烁体的辐射敏感探测器 |
| DE102012206180A1 (de) * | 2012-04-16 | 2013-10-17 | Siemens Aktiengesellschaft | Strahlungsdetektor und Verfahren zum Herstellen eines Strahlungsdetektors |
Non-Patent Citations (1)
| Title |
|---|
| Particle Detector Applications in Medicine;Hartmut F.-W. Sadrozinski,et al.;《NIH Public Access》;20131221;第1-17页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3132286A1 (en) | 2017-02-22 |
| JP6367969B2 (ja) | 2018-08-01 |
| JP2017519186A (ja) | 2017-07-13 |
| US20170045630A1 (en) | 2017-02-16 |
| EP3132286B1 (en) | 2019-04-03 |
| US9841510B2 (en) | 2017-12-12 |
| CN106461796A (zh) | 2017-02-22 |
| WO2015158646A1 (en) | 2015-10-22 |
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| CF01 | Termination of patent right due to non-payment of annual fee |
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