CN105738283B - 光学分析器 - Google Patents

光学分析器 Download PDF

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Publication number
CN105738283B
CN105738283B CN201510990649.7A CN201510990649A CN105738283B CN 105738283 B CN105738283 B CN 105738283B CN 201510990649 A CN201510990649 A CN 201510990649A CN 105738283 B CN105738283 B CN 105738283B
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China
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light
wavelength
optical
peak value
filter
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Chinese (zh)
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CN105738283A (zh
Inventor
长井悠佑
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0624—Compensating variation in output of LED source

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  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
CN201510990649.7A 2014-12-25 2015-12-24 光学分析器 Active CN105738283B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014261503A JP6413759B2 (ja) 2014-12-25 2014-12-25 光学分析装置
JP2014-261503 2014-12-25

Publications (2)

Publication Number Publication Date
CN105738283A CN105738283A (zh) 2016-07-06
CN105738283B true CN105738283B (zh) 2019-07-30

Family

ID=56163799

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510990649.7A Active CN105738283B (zh) 2014-12-25 2015-12-24 光学分析器

Country Status (3)

Country Link
US (1) US9797826B2 (enExample)
JP (1) JP6413759B2 (enExample)
CN (1) CN105738283B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6500474B2 (ja) * 2015-02-09 2019-04-17 株式会社島津製作所 光学分析装置
JP6595204B2 (ja) * 2015-04-24 2019-10-23 株式会社島津製作所 光学分析装置
US10274369B2 (en) * 2017-07-14 2019-04-30 Phoseon Technology, Inc. Systems and methods for an absorbance detector with optical reference
CN111323380B (zh) * 2018-12-17 2021-12-24 中国科学院深圳先进技术研究院 分光光度计检测系统及其检测方法
JPWO2021117530A1 (enExample) 2019-12-10 2021-06-17
CN112362625A (zh) * 2020-11-09 2021-02-12 中国南方电网有限责任公司超高压输电公司柳州局 一种二氧化硫检测装置及二氧化硫检测方法
CN114460026B (zh) * 2022-02-14 2023-09-15 赛德检测技术(浙江)有限公司 一种便捷式紫外可见分光光度计

Citations (5)

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Publication number Priority date Publication date Assignee Title
EP0462901A1 (fr) * 1990-06-21 1991-12-27 Commissariat A L'energie Atomique Procédé d'exploitation des signaux fournis par un pyromètre et pyromètre en faisant application
JP2005072141A (ja) * 2003-08-21 2005-03-17 Harison Toshiba Lighting Corp 発光装置、発光素子、発光素子の製造方法
JP2007309840A (ja) * 2006-05-19 2007-11-29 Olympus Corp 光源装置及び分析装置
CN102089644A (zh) * 2008-07-30 2011-06-08 株式会社日立高新技术 试样分析装置
JP5331198B2 (ja) * 2009-04-08 2013-10-30 株式会社日立ハイテクノロジーズ 光源装置及びそれを用いた分析装置

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US3820901A (en) * 1973-03-06 1974-06-28 Bell Telephone Labor Inc Measurement of concentrations of components of a gaseous mixture
US4269509A (en) * 1978-05-26 1981-05-26 Allied Chemical Corporation Photoacoustic Raman spectroscopy
US4594511A (en) * 1985-03-29 1986-06-10 Sri International Method and apparatus for double modulation spectroscopy
CA1332204C (en) * 1987-10-26 1994-10-04 Kenneth W. Busch Infrared emission detection
US4937448A (en) * 1988-05-26 1990-06-26 Spectra-Physics, Inc. Self-normalizing single-beam laser spectrometer
US4998043A (en) * 1989-05-01 1991-03-05 Fujikura Ltd. LED stabilizing light source device
US5317156A (en) * 1992-01-29 1994-05-31 Sri International Diagnostic tests using near-infrared laser absorption spectroscopy
US5703365A (en) * 1994-03-25 1997-12-30 Nippon Sanso Corporation Infrared spectroscopic analysis method for gases and device employing the method therein
US5572031A (en) * 1994-11-23 1996-11-05 Sri International Pressure- and temperature-compensating oxygen sensor
JP2740135B2 (ja) * 1995-02-17 1998-04-15 大成化工株式会社 簡易吸光度測定器
JPH08250767A (ja) * 1995-03-13 1996-09-27 Nichia Chem Ind Ltd 窒化物半導体ｌｅｄ
JPH09304272A (ja) * 1996-05-10 1997-11-28 Fuji Electric Co Ltd 液体の吸光度測定装置
US6728026B2 (en) * 1998-07-14 2004-04-27 Novera Optics, Inc. Dynamically tunable optical amplifier and fiber optic light source
FR2785050B1 (fr) * 1998-10-23 2001-01-19 Aerospatiale Systeme de detection et de mesure d'un ou de plusieurs gaz d'un melange gazeux
JP3960282B2 (ja) * 2003-08-29 2007-08-15 松下電器産業株式会社 紙幣識別装置
JP6108361B2 (ja) * 2012-02-28 2017-04-05 国立大学法人京都大学 固体の空準位測定方法及び装置
GB201209738D0 (en) * 2012-05-31 2012-07-18 Ge Healthcare Bio Sciences Ab Methods and apparatus for measuring the concentration of a substance in a solution

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0462901A1 (fr) * 1990-06-21 1991-12-27 Commissariat A L'energie Atomique Procédé d'exploitation des signaux fournis par un pyromètre et pyromètre en faisant application
JP2005072141A (ja) * 2003-08-21 2005-03-17 Harison Toshiba Lighting Corp 発光装置、発光素子、発光素子の製造方法
JP2007309840A (ja) * 2006-05-19 2007-11-29 Olympus Corp 光源装置及び分析装置
CN102089644A (zh) * 2008-07-30 2011-06-08 株式会社日立高新技术 试样分析装置
JP5331198B2 (ja) * 2009-04-08 2013-10-30 株式会社日立ハイテクノロジーズ 光源装置及びそれを用いた分析装置

Also Published As

Publication number Publication date
US20160187250A1 (en) 2016-06-30
JP2016121926A (ja) 2016-07-07
JP6413759B2 (ja) 2018-10-31
CN105738283A (zh) 2016-07-06
US9797826B2 (en) 2017-10-24

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