CN105594003A - 光电组件以及用于紧固所述光电组件的方法 - Google Patents

光电组件以及用于紧固所述光电组件的方法 Download PDF

Info

Publication number
CN105594003A
CN105594003A CN201480055655.7A CN201480055655A CN105594003A CN 105594003 A CN105594003 A CN 105594003A CN 201480055655 A CN201480055655 A CN 201480055655A CN 105594003 A CN105594003 A CN 105594003A
Authority
CN
China
Prior art keywords
bonding agent
agent material
containment device
photoelectric subassembly
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201480055655.7A
Other languages
English (en)
Other versions
CN105594003B (zh
Inventor
U.弗赖
S.格雷奇
N.赫夫纳
K-J.朗
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams Osram International GmbH
Original Assignee
Osram Opto Semiconductors GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors GmbH filed Critical Osram Opto Semiconductors GmbH
Publication of CN105594003A publication Critical patent/CN105594003A/zh
Application granted granted Critical
Publication of CN105594003B publication Critical patent/CN105594003B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/62Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L24/80 - H01L24/90
    • H01L24/92Specific sequence of method steps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • H01L33/486Containers adapted for surface mounting
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/0212Auxiliary members for bonding areas, e.g. spacers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/0401Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05553Shape in top view being rectangular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/1134Stud bumping, i.e. using a wire-bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1405Shape
    • H01L2224/14051Bump connectors having different shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/145Material
    • H01L2224/14505Bump connectors having different materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/17Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
    • H01L2224/1751Function
    • H01L2224/17515Bump connectors having different functions
    • H01L2224/17517Bump connectors having different functions including bump connectors providing primarily mechanical support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/731Location prior to the connecting process
    • H01L2224/73151Location prior to the connecting process on different surfaces
    • H01L2224/73153Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8112Aligning
    • H01L2224/81136Aligning involving guiding structures, e.g. spacers or supporting members
    • H01L2224/81138Aligning involving guiding structures, e.g. spacers or supporting members the guiding structures being at least partially left in the finished device
    • H01L2224/81139Guiding structures on the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8119Arrangement of the bump connectors prior to mounting
    • H01L2224/81192Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/818Bonding techniques
    • H01L2224/81801Soldering or alloying
    • H01L2224/81815Reflow soldering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/81905Combinations of bonding methods provided for in at least two different groups from H01L2224/818 - H01L2224/81904
    • H01L2224/81906Specific sequence of method steps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • H01L2224/83191Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • H01L2224/83855Hardening the adhesive by curing, i.e. thermosetting
    • H01L2224/83874Ultraviolet [UV] curing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/921Connecting a surface with connectors of different types
    • H01L2224/9212Sequential connecting processes
    • H01L2224/92122Sequential connecting processes the first connecting process involving a bump connector
    • H01L2224/92125Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12041LED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0066Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10106Light emitting diode [LED]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/04Soldering or other types of metallurgic bonding
    • H05K2203/048Self-alignment during soldering; Terminals, pads or shape of solder adapted therefor
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • H05K3/305Affixing by adhesive
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3494Heating methods for reflowing of solder
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Led Device Packages (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

本发明涉及一种光电组件(101、301、501、801),其包括发光二极管(113)以及容纳器件(115),在所述容纳器件(115)上容纳所述发光二极管(113),所述容纳器件(115)包括紧固器件(119;125、505、803),其具有粘接剂(803),以允许所述容纳器件(115)粘接到支承所述容纳器件(115)的载体。本发明还涉及一种用于处理光电组件的方法、一种用于利用光电组件装配载体的方法以及一种用于容纳光电组件的器件。

Description

光电组件以及用于紧固所述光电组件的方法
技术领域
本发明涉及光电组件以及用于处理光电组件的方法。本发明更进一步地涉及用于利用光电组件装配载体的方法以及用于容纳光电组件的器件。
背景技术
本专利申请要求德国专利申请DE102013220302.0的优先权,其公开内容被通过引用包括到此。
为了允许它们针对光学系统有效率地工作,LED必须一般地被与光器件有关地或与用于光器件的基准标记有关地非常精确地对准或放置在电路板上。这通常要求关于例如用于钻探小孔、焊料焊盘、焊料抗蚀剂掩模的电路板上的容限的相当多的努力,但还要求在加工处理自身上的努力。此外,LED可能在焊接处理期间变得倾斜,这可能导致光学故障和机械故障这两者或更差的焊接连接。
因此存在对包括能够在焊接处理期间不发生组件的任何移位或倾斜的情况下紧固地放置在电路板上的发光二极管的光电组件的需要。
发明内容
本发明所基于的目的可以因此认为是如下目的:提供克服之前提到的缺点并且允许载体上的可靠固定的改进的光电组件。
本发明所基于的目的也可以认为是如下的目的:提供用于处理光电组件的对应的方法。
本发明所基于的目的可以更进一步地认为是如下的目的:提供用于利用根据本发明的光电组件装配载体的对应的方法。
本发明所基于的目的也可以认为是如下的目的:提供允许无困难存储和/或无困难运送的用于容纳根据本发明的光电组件的器件。
借助于独立权利要求的相应的主题内容来实现这些目的。有利的改良是相应地从属的子权利要求的主题。
根据一个方面,提供一种光电组件,包括:发光二极管;容纳器件,在该容纳器件处容纳所述发光二极管,其中,所述容纳器件具有固定器件,其中,所述固定器件包括粘接剂物质,以便能够将所述容纳器件粘接地附接到承载所述容纳器件的载体。
根据另一方面,提供一种用于处理光电组件的方法,包括以下步骤:提供光电组件,其中,所述组件具有发光二极管和容纳器件,在所述容纳器件处容纳所述发光二极管;以及将固定器件应用于所述容纳器件,其中,所述固定器件具有粘接剂物质,以便能够将所述容纳器件粘接地附接到承载所述容纳器件的载体。
根据进一步的方面,提供一种用于利用根据本发明的光电组件装配载体的方法,包括步骤:将所述光电组件布置在所述载体上,并且借助于粘接剂物质利用所述载体固定所述组件。
根据另一方面,提供一种用于容纳根据本发明的光电组件的器件,包括:条带,具有很多个容器,其中,所述容器被设计用于分别容纳光电组件,其中,所述容器分别具有净空,其中,所述净空被设计用于无接触地容纳所述固定器件的粘接剂物质。
本发明因此特别是包括如下的思想:为容纳所述发光二极管的容纳器件提供粘接剂物质。因此,所述光电组件有利地被设计并且优化为能够被粘接地附接到载体。因此不要求进一步的附加措施(例如载体上的粘接剂物质)来引起所述光电组件在所述载体上的紧固固定。特别是,因此可以有利地避免当组件被布置在所述载体上时所述组件的倾斜。特别是,如果在粘接剂粘合之后所述光电组件被焊接到所述载体,则避免所述组件关于所述载体的这样的倾斜或移位。
根据本发明,提供一种对于粘接剂附接操作或粘接剂附接处理而言已经被优化的光电组件。
特别是实现以下技术效果和优点:
提供粘接剂创建在载体上固定光电组件的容易的可能方式。
因此,有利地不存在针对一般地引起组件有关于载体的固定(例如,因为它们将组件保持在预先确定的位置中)的特殊机器而开展任何附加的努力的需要。
更进一步地,有利地减少或避免组件有关于载体的倾斜。
提供包括分别具有净空的各容器的用于容纳光电组件的器件(其中,净空被设计用于无接触地容纳固定器件的粘接剂物质)有利地引起如下的效果:可以可靠地并且紧固地存储并且运送光电组件。这是因为,因为形成可以无接触地容纳固定器件的粘接剂物质的净空,所以组件不会变为黏着在容器中。这因此意味着,特别是,粘接剂物质没有与净空的任何接触。这因此意味着,特别是,粘接剂物质没有与容器的内壁的任何接触,并且因此也没有与净空的任何接触。
为了本发明的目的,粘接剂物质特别是提及用于粘接剂附接的处理材料。根据DINEN923,粘接剂物质定义为能够通过表面粘合和内部强度连结组件的非金属物质。特别是,这种定义也用作用于在此所使用的术语“粘接剂物质”的基础。
特别是,术语“粘接剂物质”在此用作广义术语。特别是,其覆盖广义类型的所有粘接剂物质。因此也可能使用不同类型的粘接剂物质。特别是,这应用于光电组件。这因此意味着,特别是,固定器件可以具有很多个不同类型的粘接剂物质。
根据一个实施例,可以提供的是:载体被形成为电路板。特别是,电路板可以被提及为印刷电路板。电路板或印刷电路板优选地具有钻探小孔和/或焊料焊盘和/或焊料抗蚀剂掩模以及金属化和/或电接触。
根据一个实施例,可以提供的是:固定器件具有间隔物,其通过第一端紧固到容纳器件,并且其中,粘接剂物质已经被布置在与第一端相对的第二端处。
根据进一步的实施例,可以提供的是:固定器件具有间隔物,其通过第一端紧固到容纳器件,并且其中,粘接剂物质被布置在与第一端相对的第二端处。
提供间隔物有利地引起如下的效果:当容纳器件被布置在载体上时,关于容纳器件形成距载体的间距。距载体的该预先确定的间距允许焊料的更好的除气。特别是,可以以这种方式防止焊剂被捕集。结果,有利地改进焊接处理。特别是,间隔物可以被提及为脚部,特别是,被提及为小脚部。
可以优选地提供的是:间隔物通过第一端紧固到容纳器件,其中,粘接剂物质随后被布置在第二端上。这因此意味着,特别是,间隔物初始地在第二端处没有任何粘接剂物质。特别是,其在间隔物已经被布置在容纳器件上之后被布置在第二端上。
根据一个实施例,可以提供的是:间隔物具有彼此平行延伸的两个腿部,其被布置为彼此间隔开。连接两个腿部的部分优选地与两个腿部有关地垂直延伸。在此,一个腿部形成第一端。另一腿部形成第二端。例如,间隔物可以具有H的形状、C的形状或U的形状。
根据一个实施例,可以提供的是:由粘接剂物质形成间隔物。特别是,这应用于形成为陶瓷衬底或包括这样的衬底的容纳器件的情况。
根据进一步的实施例,可以提供的是:与容纳器件集成地形成间隔物。这因此意味着,特别是,间隔物和容纳器件形成公共组件。因此,可以例如在生产容纳器件期间直接连同容纳器件一起有利地形成间隔物。在该实施例中,可以提供的是:在生产具有间隔物的容纳器件之后,粘接剂物质被布置在第二端上。
根据一个实施例,可以提供的是:粘接剂物质被借助于传递焊盘应用到间隔物的第二端。这例如借助于焊盘印刷处理而发生。特别是,这发生在装配之前,特别是,直接在利用组件装配载体(特别是,电路板或印刷电路板)之前。
根据一个实施例,可以提供的是:在处理或生产光电组件期间,粘接剂物质已经应用到间隔物的第二端。
根据一个实施例,可以提供的是:已经或者正由双侧粘接剂条带形成(特别是冲压)间隔物。这因此有利地允许例如间隔物通过其第一端容易地粘接地附接到容纳器件。
提供间隔物一般有利地引起如下效果:组件可以被挤压到印刷电路板或电路板的焊料膏床中,从而当第二端与粘接剂物质成为接触时,组件可以被固定到载体(特别是电路板或印刷电路板)。
间隔物的高度优选地在此设置为这样的:不仅存在用于(例如具有大约120μm的厚度的)印刷焊料膏的空间,而且熔化的焊料也仍与印刷电路板和焊料焊盘的铜接触。
根据一个实施例,可以提供很多个间隔物。可以例如相同地或特别是不同地形成间隔物。这因此意味着,特别是,由粘接剂物质形成一个或很多个间隔物,并且同时与容纳器件集成地形成一个或很多个间隔物。
根据一个实施例,可以提供的是:间隔物被布置在容纳器件的每个角部处;特别是,如果容纳器件包括外壳,则在外壳的角部处。
根据进一步的实施例,可以提供的是:容纳器件包括外壳。外壳可以例如具有多边形形状(特别是矩形形状)。发光二极管优选地被布置在外壳中,也就是说,优选地被其容纳。
根据一个实施例,可以提供的是:容纳器件包括载体组件,在所述载体组件上布置发光二极管。特别是,载体组件可以具有多边形形状(特别是矩形形状)。
根据一个实施例,可以提供的是例如可以相同地或优选地不同地形成的很多个发光二极管。
根据一个实施例,可以提供的是:固定器件包括粘接剂物质的小滴。小滴可以优选地被布置在容纳器件的净空中。
根据一个实施例,可以提供的是:在应用固定器件之前容纳器件被提供有净空,其中,粘接剂物质的小滴随后被布置在净空中。
这因此意味着,特别是,粘接剂物质小滴(也就是说,粘接剂物质的小滴)已经或正被引入到容纳器件的净空中。这有利地引起如下效果:组件可以例如被挤压到焊料膏床中,并且可以在粘接剂物质小滴与电路板(一般地,载体)成为接触时被固定。小滴的高度和/或量和/或直径被或者已经被设置为这样的:不仅存在用于(例如具有大约120μm的厚度的)印刷焊料膏的空间,而且熔化的焊料也仍与印刷电路板和焊料焊盘的铜接触。
根据一个实施例,可以提供的是:很多个净空被或者已经被形成。净空可以例如被形成为相同的或特别是被不同地形成。
根据一个实施例,净空可以具有弧形的形状(特别是,圆形的弧形的形状)。因此,粘接剂物质的小滴可以特别良好地配合到净空中,并且因此特别可靠地停留于此。
根据一个实施例,很多个粘接剂物质的小滴可以被或者已经被提供。特别是,小滴可以被形成为相同的或优选地被不同地形成。
根据进一步的实施例,很多个小滴可以被或者已经被布置在净空中。这引起容纳器件在载体(特别是,电路板)上的特别可靠的固定。
如果提供很多个净空,则特别是,每净空的粘接剂物质的小滴的相应的数目可以是不同的或优选地相同的。
根据一个实施例,一个或多个净空可以被或者已经被形成在容纳器件(特别是,载体组件或外壳)的角部中。
根据一个实施例,粘接剂物质可以被分配到净空中,从而作为结果小滴可以形成。
在另一实施例中,已经准备好的粘接剂物质的小滴可以被引入到净空中。
例如,当组件处于条带中时,小滴可以仅被应用到容纳器件,也就是说,进入净空中。为此,条带(特别是,容器)可以具有很多个净空,粘接剂物质可以通过净空分配到组件上,也就是说,分配到净空中。
根据一个实施例,条带的容器分别具有一个或很多个小孔或净空,粘接剂物质可以通过一个或很多个小孔或净空被带到容纳器件上。特别是,一个或多个小孔被形成在容器的净空中。
根据一个实施例,可以提供的是:净空被或者已经被形成在容纳器件的角部处。
根据一个实施例,可以提供的是:粘接剂物质为非固化粘接剂物质。特别是,当提供粘接剂物质的小滴时,这是特别有利的。
根据一个实施例,可以提供的是:在容纳器件的钻探小孔中容纳粘接剂物质,其中,粘接剂物质被设计为在第一温度具有聚结的固态并且在大于第一温度的第二温度转为聚结的液态。
根据一个实施例,可以提供的是:在应用固定器件之前,容纳器件被提供有钻探小孔,粘接剂物质被引入到其中,其中,粘接剂物质被设计为在第一温度具有聚结的固态并且在大于第一温度的第二温度转为聚结的液态。
这因此意味着,特别是,粘接剂物质初始地在第一温度是固体,并且可以仅在暖化到第二温度之后液化。因此,由于尚未引起借助于粘接剂物质进行的固定,因此组件可以在第一温度被布置在载体上,并且仍然被移位(如果需要的话)。这样是因为,其在第一温度仍为固体。一旦然后已经到达组件在载体上的目标位置,粘接剂物质就被暖化到第二温度。这有利地引起如下的效果:粘接剂物质脱出钻探小孔,并且建立与载体的接触。同时,粘接剂物质仍与容纳器件接触,从而粘接剂物质接触容纳器件和载体两者。粘接剂物质优选地随后固化。这有利地引起如下效果:其如果暖化得超过第二温度,则不能再一次变为液体,由此其将然后丧失其粘接力。这可以在焊接处理期间发生在例如焊接炉中。
第一温度可以例如处于0°C与30°C之间。第二温度可以例如处于50°C与200°C之间。粘接剂物质优选地根据DIN1343在正常条件下(也就是说,在273.15K的温度以及131325Pa的压强下)是固体。
可以例如借助于具有蓝色(波长:380nm至480nm)光和/或紫外(波长:100nm至380nm)光的辐射来固化粘接剂物质。特别是,用于固化的确切波长取决于粘接剂物质的化学性质。对应地固化的粘接剂或对应地固化的粘接剂物质因此有利地在焊接处理期间(特别是,在回流焊接期间)将组件相关于载体保持到位。
根据一个实施例,可以提供的是:钻探小孔为圆锥形钻探小孔。也就是说,因此,特别是,钻探小孔被形成为圆锥形地延伸。
根据一个实施例,可以提供的是:借助于红外辐射(波长:780nm至1mm)执行暖化。因此,可以有利地引起关于粘接剂物质的仅局部暖化(仅粘接剂物质暖化,而不是其周围也一样,或者仅非显著地暖化),而焊料膏并非随之同时暖化,这将导致焊剂运动。特别是,也可以借助于暴露于激光束和/或一个或多个激光脉冲而引起暖化。
根据一个实施例,容器具有底部部分,容纳器件可以被置于或放在其上。在此,底部部分是这样的大小:容纳器件的外围区域不置于底部部分上,其中,外围区域包括粘接剂物质。外围区域由于其处于空气中因此悬置,并且因此在不接触的情况下或无接触地容纳于容器中。为此,底部部分可以转为净空(还有容器净空),其可以例如具有台阶形状。台阶形成粘接剂物质布置于其中的空间。
根据一个实施例,容器可以例如被形成为相同地或优选地被不同地形成。
附图说明
与相关于附图而更详细地解释的示例性实施例的以下描述有关地,以上所描述的本发明的性质、特征和优点以及实现它们的方式变得更清楚并且被更清楚地理解,其中:
图1示出电路板和光电组件,
图2示出装配有根据图1的光电组件的电路板,
图3示出从上方的在倾斜的平面图下的进一步的光电组件,
图4示出从下方的在倾斜的平面图下的根据图3的光电组件,
图5示出电路板和进一步的光电组件,
图6示出装配有根据图5的光电组件的电路板,
图7示出用于容纳光电组件的两个器件,
图8至图10分别示出用于利用光电组件装配载体的方法的在不同时间点被利用光电组件进行装配的电路板的图,
图11示出用于处理光电组件的方法的流程图,以及
图12示出用于利用光电组件装配载体的方法的流程图。
具体实施方式
在以下文本中,相同参考标号可以被用于相同的特征。
图1示出光电组件101和电路板103。
在截面图(上部附图)中并且在从下方的图(下部附图)中在左侧上示出电路板103。
在平面图或从上方的图(上部附图)、截面图(中间附图)以及从下方的图(下部附图)中在右侧上示出光电组件101。
电路板103具有衬底105,其也可以被提及为载体衬底或电路板衬底。这样是因为如下这样:电路板103的衬底105一般以本身已知的方式承载金属化和/或电引线和/或电接触。因此,在这种程度上,很多个焊料抗蚀剂掩模107被形成得在衬底105上彼此间隔开。各焊料抗蚀剂掩模107之间所形成的是焊料焊盘109(它们中的两个)。焊料膏111已经被分别应用到或被布置在两个焊料焊盘(109)上。
在此关于焊料抗蚀剂掩模107、焊料焊盘109和焊料膏111所示的配置仅被看作示例。取决于应用,其它配置也是可能的。
光电组件101具有一个发光二极管113,其被容纳器件115容纳。容纳器件115形成为外壳,其中布置发光二极管113。容纳器件115具有矩形形状。
容纳器件115的下侧上所形成的是两个区域117,其包括具有焊料焊盘的金属化。有利地通过这两个区域117的方式可能地进行发光二极管113的电接触。
在容纳器件115的下侧上,间隔物119分别被布置或紧固在容纳器件115的下侧的四个角部中。在此,间隔物119分别具有第一端121和与第一端121相对的第二端123。间隔物119在容纳器件115上被第一端121紧固。粘接剂物质已经被应用到或被布置在背对容纳器件115的第二端123的表面上。该粘接剂物质象征性地由标号125标识(其中,为了清楚,并非间隔物119的所有第二端123具有该标号),以象征性地澄清在此提供粘接剂物质。间隔物119和粘接剂物质125形成固定器件。
在根据图1所示的示例性实施例中,间隔物119具有矩形形状。各种其它几何形状是可能的。例如,可以提供圆形形状。
可以与容纳器件115集成地形成间隔物119。间隔物119可以例如形成为关于容纳器件115的分离组件。在此情况下,间隔物119然后粘接地附接到容纳器件115或以某种其它方式按它们的第一端121来被紧固到容纳器件115,也就是说到其下侧。
其中在图1中具体地示出其配置的光电组件101仅被看作示例。取决于应用,可以提供关于两个区域117的进一步可能的配置。另外,可以提供很多个发光二极管113。替代外壳,例如,也可以提供其上布置发光二极管113的载体组件。
图2示出利用光电组件101装配的电路板103。
在左侧上,示出在焊接处理之前的所装配的电路板103。在右侧上,示出在焊接处理之后的所装配的电路板103。根据图2的上部附图示出截面图。位于其下方的附图示出平面图或从上方的图。
对于装配而言,光电组件101被设置在焊料膏111下面,由此第二端123通过它们的粘接剂物质125进行与焊料抗蚀剂掩模107的接触。结果,因而引起借助于粘接剂物质125的固定。这是在焊接处理之前。
由于基于粘接剂物质125的这种固定,光电组件101在焊接处理期间不会变得倾斜和/或移位。这由图2中的右边的附图示出。
图3示出从上方的在倾斜的平面图中的进一步的光电组件301。
光电组件301包括两个发光二极管113,其被容纳器件115容纳。容纳器件115形成为其上布置两个发光二极管113的载体组件。
提供有标号119,以示意性指示的方式示出三个间隔物119。然而,它们在倾斜平面图中通常不可见,并且因此仅是为了清楚而被描绘。
这样是因为:三个间隔物119被布置在容纳器件115的下侧上。这由图4示出。
三个间隔物119形成等腰三角形。在此,两个间隔物119被布置在容纳器件115的两个相对角部中。然后在与这两个角部相对的容纳器件115的一侧上对应地提供第三间隔物。
通过三个间隔物119的这种三点布置,在焊接处理期间,有利地当光电组件301已经被安装在电路板上时使光电组件301的倾斜更困难或甚至被完全避免。
虽然未明确示出,但三个间隔物119还具有在其背对容纳器件115的侧上的粘接剂物质。具有粘接剂物质的间隔物119形成固定器件。
图5示出电路板103和另一光电组件501。
电路板103和光电组件501的图和结构实质上类似于图1所示的示例性实施例。可以参照对应的叙述。
作为不同之处,在其下侧上,光电组件501的容纳器件115分别在四个角部中具有净空503,其具有弧形的形状(特别是,圆形的形状)。粘接剂物质的小滴505分别被布置或已经被引入到这些弓形的净空503中。粘接剂物质优选地是非固化粘接剂物质。小滴505形成固定器件。
净空503形成在容纳器件115的下侧的四个角部处。
图6示出类似于根据图2的图的图。可以参照对应的叙述。
可以清楚地看到的是,当光电组件501被向下设置在电路板103上时,粘接剂物质的四个小滴505接触焊料抗蚀剂掩模107,并且因此粘接地将容纳器件115粘合到焊料抗蚀剂掩模107。
在左侧上,示出在焊接处理之前的所装配的电路板103。在右侧上,示出在焊接处理之后的所装配的电路板103。
由于基于粘接剂物质的四个小滴505的四点布置,有利地有效地防止在焊接处理期间光电组件501的倾斜。
图7在切断图中示出用于容纳根据本发明的光电组件的两个器件701和703。图7中的上部附图示出器件701和703的平面图。位于其下面的附图示出器件701和703的截面图。
两个器件701和703具有实质上相同的结构。它们在每种情况下具有条带705,其分别具有穿孔706,由此条带705可以通过合适的运送机构而被运送或移动。这例如类似于在相机中运送的胶卷。
每个条带705具有很多个容器707,其中,例如,可以分别插入根据图1的光电组件101或根据图5的光电组件501。
为了说明,根据图1的组件101被插入在左边的器件701中。根据图5的组件501被插入在右边的器件703中。
为此,容器707分别具有净空709,其形成为这样的:它们可以无接触地容纳组件101、501的粘接剂物质。这因此意味着,特别是,当组件已经被容纳于容器707中时,粘接剂物质不与净空709或容器707的进一步的内壁成为接触。
特别是,净空709的实际形状取决于组件的固定器件的实际几何设计。为了允许更好的区分,净空709也可以被提及为容器净空。
因此,例如,器件701、703的容器707在底部区域中具有四个台阶形状的净空,其轮廓优选地是以与矩形间隔物119或小滴505近似对应的方式形成的。
图8示出电路板103上所安装的另一光电组件801。
容纳器件115具有圆锥形延伸的钻探小孔805,其中,已经引入粘接剂物质803。在正常条件(例如标准条件)下(特别是,在第一温度),粘接剂物质803是固体,也就是说,处于聚结的固态下。在第二温度,粘接剂物质803转为聚结的液态。
光电组件801然后在此程度上被在其位置上安装于电路板103上,如图8所示,并且被挤压到液体焊料膏111中。这有利地在电路板103与容纳器件115之间创建腔体807。
为了清楚,未示出包括用于容纳器件115的具有焊料焊盘的金属化的区域117。
在根据图9的图中,粘接剂物质803被暖化或加热到第二温度。特别是,这局部地发生,从而焊料膏111并不随之暖化或非显著地暖化,并且因此,焊料膏111的焊剂不会运动。可以例如借助于红外辐射来执行局部加热或暖化。粘接剂物质803对于红外辐射的这种暴露象征性地由具有标号901的箭头标识。在此,也可以利用激光执行红外辐射。
通过将粘接剂物质803暖化到粘接剂物质从聚结的固态转为聚结的液态的第二温度,粘接剂物质803运动到腔体807中。
运动的粘接剂物质803因此将容纳器件115和电路板103两者与衬底105和焊料焊盘109接触。
结果,借助于粘接剂附接而引起良好的固定。
一旦粘接剂物质803已经运动,粘接剂物质803就被固化。这例如通过紫外辐射或具有蓝色光的辐射而发生。特别是,确切的波长取决于所使用的粘接剂物质803。作为固化的结果,粘接剂物质803硬化,并且因此引起良好的固定。
具有短波长光的辐射(特别是,蓝色或紫外辐射)象征性地由标号1001标识。
图11示出用于处理光电组件的方法的流程图。
根据步骤1101,提供光电组件,其中,组件具有发光二极管和容纳器件,在所述容纳器件处容纳所述发光二极管。
在步骤1103中,固定器件被应用于容纳器件,其中,固定器件具有粘接剂物质,以便能够粘接地将容纳器件附接到承载容纳器件的载体。
图12示出用于利用根据图8的光电组件801装配载体(特别是,电路板)的方法的流程图。
在步骤1201中,光电组件801被布置在载体上(特别是,在电路板上)。在步骤1203中,在布置之后并且在固定之前,粘接剂物质被暖化到至少第二温度。这有利地引起如下的效果:粘接剂物质液化,并且脱出钻探小孔并且接触载体和容纳器件两者。
在步骤1205中,随后,也就是说,在粘接剂物质的运动之后,粘接剂物质被固化。
在未示出的进一步的示例性实施例中,可以例如提供的是:以此方式所装配的载体被进一步加工或被处理。特别是,可以提供焊接处理。为此,所装配的载体可以例如被通过回流炉。所固化的粘接剂物质803具有如下的效果:组件801被保持于其位置,并且不再由于焊料的润湿力而被使得浮动。
特别是,本发明可以应用于高功率LED、普通LED、特别是,如果在安装或装配中要求高精度,则光学传感器和红外LED。
虽然已经通过优选的示例性实施例更具体地详细图解并且描述了本发明,但本发明不受所公开的示例限制,并且在不脱离本发明的保护范围的情况下,本领域技术人员可以从所公开的示例得到其它变形。
标号列表
光电组件101,301,501,801
电路板103
衬底105
焊料抗蚀剂掩模107
焊料焊盘109
焊料膏111
发光二极管113
容纳器件115
具有焊料焊盘的金属化117
间隔物119
第一端121
第二端123
粘接剂物质125
净空503
粘接剂物质的小滴505
器件701,703
条带705
容器707
净空709
粘接剂物质803
锥形钻探小孔805
腔体807
IR辐射901
流动方向903
UV辐射1001
提供光电组件1101
应用固定器件1103
布置光电组件1201
暖化到至少第二温度1203
固化1205

Claims (15)

1.一种光电组件(101、301、501、801),包括:
-发光二极管(113),
-容纳器件(115),在所述容纳器件(115)处容纳所述发光二极管(113),其中,
-所述容纳器件(115)具有固定器件(119;125、505、803),其中,
-所述固定器件(119、125、505、803)包括粘接剂物质(803),以便能够将所述容纳器件(115)粘接地附接到承载所述容纳器件(115)的载体。
2.如权利要求1所述的光电组件(101、301、501、801),其中,所述固定器件(119;125、505、803)具有间隔物(119),所述间隔物(119)被通过第一端(121)紧固到所述容纳器件(115),并且其中,粘接剂物质(803)已经被布置在与所述第一端(121)相对的第二端(123)处。
3.如权利要求2所述的光电组件(101、301、501、801),其中,由所述粘接剂物质(803)形成所述间隔物(119)。
4.如权利要求2所述的光电组件(101、301、501、801),其中,与所述容纳器件(115)集成地形成所述间隔物(119)。
5.如前述权利要求之一所述的光电组件(101、301、501、801),其中,所述固定器件(119;125、505、803)包括粘接剂物质的小滴(505),其中,所述小滴被布置在所述容纳器件(115)的净空(503)中。
6.如前述权利要求之一所述的光电组件(101、301、501、801),其中,在所述容纳器件(115)的钻探小孔中容纳粘接剂物质(803),其中,所述粘接剂物质被设计为在第一温度具有聚结的固态并且在大于所述第一温度的第二温度转为聚结的液态。
7.如权利要求6所述的光电组件(101、301、501、801),其中,所述钻探小孔被形成为圆锥状地延伸(805)。
8.一种用于处理光电组件(101、301、501、801)的方法,包括以下步骤:
-提供(1101)光电组件(101、301、501、801),其中,所述组件具有发光二极管(113)和容纳器件(115),在所述容纳器件(115)处容纳所述发光二极管(113),以及
-将固定器件(119;125、505、803)应用(1103)于所述容纳器件(115),其中,所述固定器件(119;125、505、803)具有粘接剂物质(803),以便能够粘接地将所述容纳器件(115)附接到承载所述容纳器件(115)的载体。
9.如权利要求8所述的方法,其中,所述固定器件(119;125、505、803)具有间隔物(119),所述间隔物(119)被通过第一端(121)紧固到所述容纳器件(115),并且其中,粘接剂物质(803)被布置在与所述第一端(121)相对的第二端(123)处。
10.如权利要求8或9所述的方法,其中,在应用(1103)所述固定器件(119;125、505、803)之前,所述容纳器件(115)被提供有净空(503),其中,粘接剂物质的小滴(505)随后被布置在所述净空(503)中。
11.如权利要求8至10中的任一项所述的方法,其中,在应用(1103)所述固定器件(119;125、505、803)之前,所述容纳器件(115)被提供有钻探小孔,粘接剂物质(803)引入到所述钻探小孔中,其中,所述粘接剂物质(803)被设计为在第一温度具有聚结的固态并且在大于所述第一温度的第二温度转为聚结的液态。
12.一种用于利用如权利要求1至7之一所述的光电组件(101、301、501、801)装配载体的方法,包括步骤:
-在所述载体上布置(1201)所述光电组件(101、301、501、801);以及
-借助于所述粘接剂物质利用所述载体来固定所述组件。
13.如权利要求12所述的方法,并且关于引用回权利要求6所述的组件,其中,在所述布置(1201)之后并且在所述固定之前,所述粘接剂物质(803)被暖化到至少所述第二温度(1203),从而所述粘接剂物质(803)液化并且脱出所述钻探小孔并且接触所述载体和所述容纳器件(115)这两者,其中,所述粘接剂(803)随后被固化。
14.如权利要求13所述的方法,其中,借助于红外辐射(901)执行所述暖化。
15.一种用于容纳如权利要求1至7之一所述的光电组件(101、301、501、801)的器件(701,703),包括:
-条带(705),具有多个容器(707),
-其中,所述容器(707)被设计用于分别容纳光电组件(101、301、501、801),
-其中,所述容器(707)分别具有净空(709),
-其中,所述净空(709)被设计用于无接触地容纳所述固定器件(119;125、505、803)的所述粘接剂物质(803)。
CN201480055655.7A 2013-10-08 2014-10-07 光电组件以及用于紧固所述光电组件的方法 Active CN105594003B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102013220302.0 2013-10-08
DE102013220302.0A DE102013220302B4 (de) 2013-10-08 2013-10-08 Optoelektronisches Bauteil
PCT/EP2014/071400 WO2015052163A1 (de) 2013-10-08 2014-10-07 Optoelektronisches bauteil und befestigungsmethode

Publications (2)

Publication Number Publication Date
CN105594003A true CN105594003A (zh) 2016-05-18
CN105594003B CN105594003B (zh) 2019-06-14

Family

ID=51753196

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201480055655.7A Active CN105594003B (zh) 2013-10-08 2014-10-07 光电组件以及用于紧固所述光电组件的方法

Country Status (4)

Country Link
US (1) US20160254427A1 (zh)
CN (1) CN105594003B (zh)
DE (1) DE102013220302B4 (zh)
WO (1) WO2015052163A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10823355B2 (en) * 2016-01-27 2020-11-03 Lite-On Electronics (Guangzhou) Limited Light-emitting module for vehicle lamp
JP7022509B2 (ja) * 2017-02-14 2022-02-18 シチズン電子株式会社 発光装置、実装基板、発光体
WO2020021617A1 (ja) * 2018-07-24 2020-01-30 株式会社Fuji 部品実装方法、および作業システム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6392778B1 (en) * 1999-03-17 2002-05-21 Koninklijke Philips Electronics N.V. Opto-electronic element
US20110051032A1 (en) * 2009-08-26 2011-03-03 Chunghwa Picture Tubes, Ltd. Light bar structure, and backlight module and liquid crystal display applying the same
TW201203627A (en) * 2010-07-15 2012-01-16 Lextar Electronics Corp Light emitting diode and method for forming supporting frame thereof and improved structure of the supporting frame
CN102760822A (zh) * 2011-04-27 2012-10-31 展晶科技(深圳)有限公司 发光二极管封装结构及其制造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2588122B1 (fr) * 1985-10-01 1988-06-24 Radiotechnique Compelec Dispositif semi-conducteur de puissance pour montage en surface
US5942078A (en) 1997-07-17 1999-08-24 Mcms, Inc. Apparatus for calibrating surface mounting processes in printed circuit board assembly manufacturing
JP2002151532A (ja) * 2000-11-08 2002-05-24 Sharp Corp 電子部品、半導体装置の実装方法および半導体装置の実装構造
US20050056946A1 (en) * 2003-09-16 2005-03-17 Cookson Electronics, Inc. Electrical circuit assembly with improved shock resistance
US7221053B2 (en) * 2005-03-21 2007-05-22 Infineon Technologies Ag Integrated device and electronic system
KR100826394B1 (ko) * 2007-05-17 2008-05-02 삼성전기주식회사 반도체 패키지 제조방법
JP5310252B2 (ja) * 2009-05-19 2013-10-09 パナソニック株式会社 電子部品実装方法および電子部品実装構造
KR101766297B1 (ko) * 2011-02-16 2017-08-08 삼성전자 주식회사 발광소자 패키지 및 그 제조방법
US8486214B2 (en) * 2011-09-27 2013-07-16 Source Photonics, Inc. Ramped, variable power UV adhesive cure process for improved alignment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6392778B1 (en) * 1999-03-17 2002-05-21 Koninklijke Philips Electronics N.V. Opto-electronic element
US20110051032A1 (en) * 2009-08-26 2011-03-03 Chunghwa Picture Tubes, Ltd. Light bar structure, and backlight module and liquid crystal display applying the same
TW201203627A (en) * 2010-07-15 2012-01-16 Lextar Electronics Corp Light emitting diode and method for forming supporting frame thereof and improved structure of the supporting frame
CN102760822A (zh) * 2011-04-27 2012-10-31 展晶科技(深圳)有限公司 发光二极管封装结构及其制造方法

Also Published As

Publication number Publication date
DE102013220302A1 (de) 2015-04-09
WO2015052163A1 (de) 2015-04-16
US20160254427A1 (en) 2016-09-01
CN105594003B (zh) 2019-06-14
DE102013220302B4 (de) 2022-08-11

Similar Documents

Publication Publication Date Title
JP6898908B2 (ja) 位置安定的はんだ付け方法
US20050110161A1 (en) Method for mounting semiconductor chip and semiconductor chip-mounted board
JP4154397B2 (ja) 電子装置及びスタンドオフ部材及び電子装置の製造方法
JP5913284B2 (ja) 光学モジュール及び支持板を持つ装置
JP4246134B2 (ja) 半導体素子の実装方法、及び半導体素子実装基板
JP6131555B2 (ja) 発光装置の封止部材の取り外し方法および封止部材を取り外すことが可能な発光装置
KR20120048535A (ko) 발광 장치
US11127890B2 (en) Method for assembling a carrier with components, pigment for assembling a carrier with a component and method for producing a pigment
EP3560303B1 (en) Method for addressing misalignment of leds on a printed circuit board
CN105594003A (zh) 光电组件以及用于紧固所述光电组件的方法
JP6490223B2 (ja) はんだ箇所におけるボイドの低減方法
JP2007059652A (ja) 電子部品実装方法
US20190124776A1 (en) Method for addressing misalignment of leds on a printed circuit board
US10825975B2 (en) Semiconductor light-emitting device having gap between thermally-conductive film and metal core and method for producing same
US20170110434A1 (en) Hollow-cavity flip-chip package with reinforced interconnects and process for making the same
TWI742264B (zh) 具有減小對位公差之照明總成及提供照明總成之方法
JP2006339491A (ja) 半導体パッケージと回路基板のリフローハンダ付け方法および半導体装置
JP2005242242A (ja) 画像センサパッケージおよびカメラモジュール
US9999140B2 (en) Light emitting diode light engine
KR101607675B1 (ko) 패키지 결합 방법
JP5282981B2 (ja) 素子搭載基板の製造方法
JP5003651B2 (ja) 放熱構造体の製造方法
US11516923B2 (en) Electronic component mounting substrate and manufacturing method thereof
JP2007123780A (ja) 緩衝部を有する回路基板および製造方法
US20230156920A1 (en) Method Of Manufacturing An Augmented LED Array Assembly

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant