CN105552024B - 阵列基板及其制作方法、显示装置 - Google Patents
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- 239000010409 thin film Substances 0.000 claims description 42
- 238000002161 passivation Methods 0.000 claims description 27
- 238000009413 insulation Methods 0.000 claims description 26
- 239000002184 metal Substances 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 26
- 239000011347 resin Substances 0.000 claims description 24
- 229920005989 resin Polymers 0.000 claims description 24
- 238000000059 patterning Methods 0.000 claims description 23
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- 238000005530 etching Methods 0.000 claims description 19
- 239000010408 film Substances 0.000 claims description 14
- 239000004020 conductor Substances 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 7
- 229920001940 conductive polymer Polymers 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims 1
- 238000009792 diffusion process Methods 0.000 abstract description 11
- 230000000694 effects Effects 0.000 abstract description 9
- 239000012528 membrane Substances 0.000 abstract description 9
- 230000004888 barrier function Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 8
- 230000005611 electricity Effects 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
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- 239000002305 electric material Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
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- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
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- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
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Abstract
本发明提供了一种阵列基板及其制作方法、显示装置,属于显示技术领域。其中,阵列基板,包括第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,所述过孔内形成有与所述第一导电图形和第二导电图形连接的导电柱。本发明的技术方案能够解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
Description
技术领域
本发明涉及显示技术领域,特别是指一种阵列基板及其制作方法、显示装置。
背景技术
现有阵列基板中,为了将位于不同膜层的图形导通,需要制作过孔,过孔包括将像素电极和薄膜晶体管的漏极连接起来的像素电极导通过孔,还包括将公共电极与公共电极连接线连接起来的公共电极导通过孔,这些过孔一般都比较窄并且深,这样在过孔处容易出现凹陷,导致在阵列基板上涂覆配向膜时,配向膜容易在过孔处易发生扩散不均,导致最终的显示面板出现Mura(光斑)不良。
发明内容
本发明要解决的技术问题是提供一种阵列基板及其制作方法、显示装置,能够解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
为解决上述技术问题,本发明的实施例提供技术方案如下:
一方面,提供一种阵列基板,包括第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,所述过孔内形成有与所述第一导电图形和第二导电图形连接的导电柱。
进一步地,所述导电柱上表面的水平高度不低于所述绝缘层上表面的水平高度。
进一步地,所述导电柱上表面的水平高度与所述绝缘层上表面的水平高度一致。
进一步地,所述导电柱为采用有机导电聚合物或金属制成。
进一步地,所述导电柱由树脂柱状物和包裹所述树脂柱状物的导电材料组成。
本发明实施例还提供了一种显示装置,包括如上所述的阵列基板。
本发明实施例还提供了一种阵列基板的制作方法,包括形成第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,所述方法包括:
在形成所述第二导电图形之前,在所述过孔内形成与所述第一导电图形连接的导电柱;
形成与所述导电柱连接的第二导电图形。
进一步地,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上形成薄膜晶体管的栅极;
形成栅绝缘层;
形成有源层的图形;
通过一次构图工艺同时形成薄膜晶体管的源极、漏极和所述导电柱,所述导电柱与所述漏极连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
进一步地,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,形成所述导电柱包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极和所述导电柱;
形成栅绝缘层;
形成有源层的图形,并对所述栅绝缘层和有源层进行刻蚀暴露出所述导电柱;
形成薄膜晶体管的源极和漏极,所述漏极与所述导电柱连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
进一步地,所述第一导电图形为公共电极线,所述第二导电图形为公共电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极、公共电极线和所述导电柱,所述导电柱与所述公共电极线连接;
形成栅绝缘层;
形成有源层的图形;
形成薄膜晶体管的源极和漏极;
形成钝化层,并对所述栅绝缘层和所述钝化层进行刻蚀暴露出所述导电柱;
形成公共电极,所述公共电极与所述导电柱连接。
本发明的实施例具有以下有益效果:
上述方案中,在绝缘层内的过孔处制作一个导电柱,该导电柱分别与位于不同膜层的第一导电图形和第二导电图形连接,从而通过该导电柱将第一导电图形和第二导电图形导通,由于该导电柱能够对过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
附图说明
图1为现有阵列基板中像素电极过孔的示意图;
图2为现有阵列基板中公共电极过孔的示意图;
图3为本发明实施例三阵列基板的结构示意图;
图4为本发明实施例三阵列基板的制作方法的流程示意图;
图5为本发明实施例四阵列基板的结构示意图;
图6为本发明实施例四阵列基板的制作方法的流程示意图;
图7为本发明实施例五阵列基板的结构示意图;
图8为本发明实施例五阵列基板的制作方法的流程示意图。
附图标记
1衬底基板 2栅金属层 3栅绝缘层 4源漏金属层
5钝化层 6像素电极 7像素电极过孔 8公共电极
9公共电极过孔 10导电柱
具体实施方式
为使本发明的实施例要解决的技术问题、技术方案和优点更加清楚,下面将结合附图及具体实施例进行详细描述。
本发明的实施例针对现有技术中过孔处容易出现凹陷,导致在阵列基板上涂覆配向膜时,配向膜容易在过孔处易发生扩散不均的问题,提供一种阵列基板及其制作方法、显示装置,能够解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
实施例一
如图1和图2所示,现有阵列基板中,为了将位于不同膜层的图形导通,需要制作过孔,过孔包括将像素电极6和薄膜晶体管的漏极连接起来的像素电极过孔7,还包括将公共电极8与公共电极连接线连接起来的公共电极过孔9,过孔的尺寸一般为7μm*7μm,这些过孔一般都比较窄并且深,这样在过孔处容易出现凹陷,导致在阵列基板上涂覆配向膜时,配向膜容易在过孔处易发生扩散不均,导致最终的显示面板出现Mura不良。
为了解决上述问题,本实施例提供一种阵列基板,包括第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,所述过孔内形成有与所述第一导电图形和第二导电图形连接的导电柱。
本实施例在绝缘层内的过孔处制作一个导电柱,该导电柱分别与位于不同膜层的第一导电图形和第二导电图形连接,从而通过该导电柱将第一导电图形和第二导电图形导通,由于该导电柱能够对过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
优选地,导电柱上表面的水平高度不低于绝缘层上表面的水平高度,这样可以避免过孔处出现凹陷。
优选地,导电柱上表面的水平高度与绝缘层上表面的水平高度一致,这样能够使得过孔处平坦。
具体实施例中,导电柱可以采用有机导电聚合物或金属制成。
另一具体实施例中,导电柱的主体可以为树脂柱状物,在树脂柱状物外包裹有导电材料。
实施例二
本实施例提供了一种阵列基板的制作方法,包括形成第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,所述方法包括:
在形成所述第二导电图形之前,在所述过孔内形成与所述第一导电图形连接的导电柱;
形成与所述导电柱连接的第二导电图形。
本实施例中,在形成绝缘层上的第二导电图形之前,在绝缘层内的过孔处制作一个导电柱,该导电柱与绝缘层下的第一导电图形连接,从而通过该导电柱将第一导电图形和第二导电图形导通,由于该导电柱能够对过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
进一步地,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上形成薄膜晶体管的栅极;
形成栅绝缘层;
形成有源层的图形;
通过一次构图工艺同时形成薄膜晶体管的源极、漏极和所述导电柱,所述导电柱与所述漏极连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
上述步骤中,导电柱和薄膜晶体管的源极、漏极通过一次构图工艺同时形成,可以在不增加构图工艺次数的前提下形成导电柱,简化阵列基板的制作工艺。
进一步地,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,形成所述导电柱包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极和所述导电柱;
形成栅绝缘层;
形成有源层的图形,并对所述栅绝缘层和有源层进行刻蚀暴露出所述导电柱;
形成薄膜晶体管的源极和漏极,所述漏极与所述导电柱连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
上述步骤中,导电柱和薄膜晶体管的栅极通过一次构图工艺同时形成,可以在不增加构图工艺次数的前提下形成导电柱,简化阵列基板的制作工艺。
进一步地,所述第一导电图形为公共电极线,所述第二导电图形为公共电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极、公共电极线和所述导电柱,所述导电柱与所述公共电极线连接;
形成栅绝缘层;
形成有源层的图形;
形成薄膜晶体管的源极和漏极;
形成钝化层,并对所述栅绝缘层和所述钝化层进行刻蚀暴露出所述导电柱;
形成公共电极,所述公共电极与所述导电柱连接。
上述步骤中,导电柱和薄膜晶体管的栅极、公共电极线通过一次构图工艺同时形成,可以在不增加构图工艺次数的前提下形成导电柱,简化阵列基板的制作工艺。
实施例三
本实施例提供了一种阵列基板的制作方法,如图4所示,本实施例包括以下步骤:
步骤31:提供一衬底基板1,在衬底基板1上形成导电柱10以及由栅金属层2形成的栅线、公共电极线、栅极,导电柱10与公共电极线连接;
其中,衬底基板1可为玻璃基板或石英基板。导电柱10可以采用与栅金属层同样的材料,这样导电柱10可以与栅线、公共电极线、栅极通过一次构图工艺同时形成;导电柱10还可以采用有机导电聚合物制成。
或者导电柱10的主体可以为树脂柱状物,在树脂柱状物外包裹有导电材料,此时,导电柱10与栅线、公共电极线、薄膜晶体管的栅极通过不同构图工艺形成。在导电柱10的主体为树脂柱状物时,可以在预设位置事先制作树脂柱状物,然后在后续形成栅金属层或源漏金属层时,保留树脂柱状物上的栅金属层或源漏金属层作为包裹树脂柱状物的导电材料。
步骤32:在经过步骤31的衬底基板1上形成栅绝缘层3和有源层的图形,对栅绝缘层3进行刻蚀,暴露出导体柱10;
步骤33:在经过步骤32的衬底基板1上形成由源漏金属层4组成的薄膜晶体管的漏极、源极和数据线;
步骤34、在经过步骤33的衬底基板1上形成钝化层5,对钝化层5进行刻蚀暴露出导电柱10;
进一步地,在步骤32中也可以先不对栅绝缘层3进行刻蚀,而在形成钝化层5之后对栅绝缘层3和钝化层5一起进行刻蚀,暴露出导电柱10;
步骤35、在经过步骤34的衬底基板1上形成公共电极8,公共电极8与导电柱10连接,形成如图3所示的结构。
本实施例中,由于导电柱10能够对连接公共电极与公共电极线的过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
实施例四
本实施例提供了一种阵列基板的制作方法,如图6所示,本实施例包括以下步骤:
步骤41:提供一衬底基板1,在衬底基板1上形成导电柱10以及由栅金属层组成的栅线、薄膜晶体管的栅极;
其中,衬底基板1可为玻璃基板或石英基板。导电柱10可以采用与栅金属层同样的材料,这样导电柱10可以与栅线、薄膜晶体管的栅极通过一次构图工艺同时形成;导电柱10还可以采用有机导电聚合物制成。
或者导电柱10的主体可以为树脂柱状物,在树脂柱状物外包裹有导电材料,此时,导电柱10与栅线、薄膜晶体管的栅极通过不同构图工艺形成。在导电柱10的主体为树脂柱状物时,可以在预设位置事先制作树脂柱状物,然后在后续形成栅金属层或源漏金属层时,保留树脂柱状物上的栅金属层或源漏金属层作为包裹树脂柱状物的导电材料。
步骤42:在经过步骤41的衬底基板1上形成栅绝缘层3和有源层的图形,对栅绝缘层3进行刻蚀,暴露出导体柱10;
步骤43:在经过步骤42的衬底基板1上形成由源漏金属层4组成的薄膜晶体管的漏极、源极和数据线,薄膜晶体管的漏极与导电柱10连接;
步骤44、在经过步骤43的衬底基板1上形成钝化层5,对钝化层5进行刻蚀暴露出导电柱10;
步骤45、在经过步骤44的衬底基板1上形成像素电极6,像素电极6与导电柱10连接,形成如图5所示的结构,像素电极6通过导电柱10实现与薄膜晶体管的漏极的电连接。
本实施例中,由于导电柱10能够对连接像素电极与薄膜晶体管的漏极的过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
实施例五
本实施例提供了一种阵列基板的制作方法,如图8所示,本实施例包括以下步骤:
步骤51:提供一衬底基板1,在衬底基板1上形成由栅金属层2组成的栅线、栅极;
其中,衬底基板1可为玻璃基板或石英基板。
步骤52:在经过步骤51的衬底基板1上形成栅绝缘层3和有源层的图形;
步骤53:在经过步骤52的衬底基板1上形成导电柱10以及由源漏金属层4组成的薄膜晶体管的漏极、源极和数据线,薄膜晶体管的漏极与导电柱10连接;导电柱10可以采用与源漏金属层4同样的材料,这样导电柱10可以与薄膜晶体管的漏极、源极和数据线通过一次构图工艺同时形成;导电柱10还可以采用有机导电聚合物制成。
或者导电柱10的主体可以为树脂柱状物,在树脂柱状物外包裹有导电材料,此时,导电柱10与薄膜晶体管的漏极、源极和数据线通过不同构图工艺形成。在导电柱10的主体为树脂柱状物时,可以在预设位置事先制作树脂柱状物,然后在后续形成栅金属层或源漏金属层时,保留树脂柱状物上的栅金属层或源漏金属层作为包裹树脂柱状物的导电材料。
步骤54、在经过步骤53的衬底基板1上形成钝化层5,对钝化层5进行刻蚀暴露出导电柱10;
步骤55、在经过步骤54的衬底基板1上形成像素电极6,如图7所示,像素电极6与导电柱10连接,通过导电柱10实现与薄膜晶体管的漏极的电连接。
本实施例中,由于导电柱10能够对连接像素电极与薄膜晶体管的漏极的过孔进行填充,因此可以实现过孔处的平坦化,避免过孔处出现凹陷,从而解决过孔处配向膜扩散不均引起的Mura不良,改善显示装置的显示效果。
实施例六
本实施例提供了一种显示装置,包括如上所述的阵列基板。所述显示装置可以为:液晶电视、液晶显示器、数码相框、手机、平板电脑等任何具有显示功能的产品或部件,其中,所述显示装置还包括柔性电路板、印刷电路板和背板。
以上所述是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明所述原理的前提下,还可以作出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。
Claims (10)
1.一种阵列基板,包括第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,其特征在于,所述过孔内形成有与所述第一导电图形和第二导电图形连接的导电柱,所述导电柱与所述阵列基板的第一导电图形同层同材料设置或与阵列基板的薄膜晶体管的栅极同层同材料设置。
2.根据权利要求1所述的阵列基板,其特征在于,所述导电柱上表面的水平高度不低于所述绝缘层上表面的水平高度。
3.根据权利要求2所述的阵列基板,其特征在于,所述导电柱上表面的水平高度与所述绝缘层上表面的水平高度一致。
4.根据权利要求1所述的阵列基板,其特征在于,所述导电柱为采用有机导电聚合物或金属制成。
5.根据权利要求1所述的阵列基板,其特征在于,所述导电柱由树脂柱状物和包裹所述树脂柱状物的导电材料组成。
6.一种显示装置,其特征在于,包括如权利要求1-5中任一项所述的阵列基板。
7.一种阵列基板的制作方法,包括形成第一导电图形、覆盖所述第一导电图形的绝缘层、位于所述绝缘层上的第二导电图形,所述绝缘层包括有用以连接所述第一导电图形和所述第二导电图形的过孔,其特征在于,所述方法包括:
在形成所述第二导电图形之前,在所述过孔内形成与所述第一导电图形连接的导电柱,其中,通过一次构图工艺形成所述导电柱和所述第一导电图形;或通过一次构图工艺形成所述导电柱和阵列基板的薄膜晶体管的栅极;
形成与所述导电柱连接的第二导电图形。
8.根据权利要求7所述的阵列基板的制作方法,其特征在于,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上形成薄膜晶体管的栅极;
形成栅绝缘层;
形成有源层的图形;
通过一次构图工艺同时形成薄膜晶体管的源极、漏极和所述导电柱,所述导电柱与所述漏极连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
9.根据权利要求7所述的阵列基板的制作方法,其特征在于,所述第一导电图形为薄膜晶体管的漏极,所述第二导电图形为像素电极,形成所述导电柱包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极和所述导电柱;
形成栅绝缘层;
形成有源层的图形,并对所述栅绝缘层和有源层进行刻蚀暴露出所述导电柱;
形成薄膜晶体管的源极和漏极,所述漏极与所述导电柱连接;
形成钝化层,并对所述钝化层进行刻蚀暴露出所述导电柱;
形成像素电极,所述像素电极与所述导电柱连接。
10.根据权利要求7所述的阵列基板的制作方法,其特征在于,所述第一导电图形为公共电极线,所述第二导电图形为公共电极,所述制作方法具体包括:
提供一衬底基板;
在所述衬底基板上通过一次构图工艺同时形成薄膜晶体管的栅极、公共电极线和所述导电柱,所述导电柱与所述公共电极线连接;
形成栅绝缘层;
形成有源层的图形;
形成薄膜晶体管的源极和漏极;
形成钝化层,并对所述栅绝缘层和所述钝化层进行刻蚀暴露出所述导电柱;
形成公共电极,所述公共电极与所述导电柱连接。
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CN205910471U (zh) * | 2016-05-05 | 2017-01-25 | 京东方科技集团股份有限公司 | 阵列基板、液晶显示面板及显示装置 |
CN106876414B (zh) * | 2017-03-17 | 2019-06-04 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法 |
CN109407432A (zh) * | 2018-10-26 | 2019-03-01 | 京东方科技集团股份有限公司 | 一种显示基板的制作方法、显示基板及显示装置 |
CN110581141B (zh) * | 2019-08-22 | 2022-05-03 | 武汉华星光电技术有限公司 | 一种阵列基板及其制备方法 |
CN111696919B (zh) * | 2020-07-23 | 2022-08-12 | 厦门天马微电子有限公司 | 阵列基板及其制作方法、显示装置 |
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CN102548254A (zh) * | 2010-12-30 | 2012-07-04 | 北大方正集团有限公司 | 芯片载体的无核制作方法 |
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JP3649183B2 (ja) * | 2001-12-27 | 2005-05-18 | ソニー株式会社 | フィルタ回路装置及びその製造方法 |
US7141884B2 (en) * | 2003-07-03 | 2006-11-28 | Matsushita Electric Industrial Co., Ltd. | Module with a built-in semiconductor and method for producing the same |
US7765686B2 (en) * | 2005-03-14 | 2010-08-03 | Ricoh Company, Ltd. | Multilayer wiring structure and method of manufacturing the same |
WO2011114404A1 (ja) | 2010-03-19 | 2011-09-22 | シャープ株式会社 | アクティブマトリクス基板 |
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CN102637698B (zh) | 2011-04-20 | 2014-12-24 | 京东方科技集团股份有限公司 | 一种阵列基板及其制备方法 |
US20140120657A1 (en) * | 2012-10-30 | 2014-05-01 | Apple Inc. | Back Channel Etching Oxide Thin Film Transistor Process Architecture |
US20140151895A1 (en) * | 2012-12-05 | 2014-06-05 | Texas Instruments Incorporated | Die having through-substrate vias with deformation protected tips |
CN103383946B (zh) * | 2013-07-12 | 2016-05-25 | 京东方科技集团股份有限公司 | 一种阵列基板、显示装置及阵列基板的制备方法 |
CN105552024B (zh) | 2016-03-14 | 2018-07-06 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
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US20020047567A1 (en) * | 2000-09-06 | 2002-04-25 | Yoshimasa Fujita | Organic led display device of active matrix drive type and fabrication method therefor |
CN101159273A (zh) * | 2006-10-04 | 2008-04-09 | 三菱电机株式会社 | 显示装置及其制造方法 |
CN102548254A (zh) * | 2010-12-30 | 2012-07-04 | 北大方正集团有限公司 | 芯片载体的无核制作方法 |
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