CN105486687B - 触摸面板检查装置和方法 - Google Patents

触摸面板检查装置和方法 Download PDF

Info

Publication number
CN105486687B
CN105486687B CN201510644460.2A CN201510644460A CN105486687B CN 105486687 B CN105486687 B CN 105486687B CN 201510644460 A CN201510644460 A CN 201510644460A CN 105486687 B CN105486687 B CN 105486687B
Authority
CN
China
Prior art keywords
image
inspection
unit
touch panel
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510644460.2A
Other languages
English (en)
Chinese (zh)
Other versions
CN105486687A (zh
Inventor
洪昇均
金东均
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongwoo Fine Chem Co Ltd
Original Assignee
Dongwoo Fine Chem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongwoo Fine Chem Co Ltd filed Critical Dongwoo Fine Chem Co Ltd
Publication of CN105486687A publication Critical patent/CN105486687A/zh
Application granted granted Critical
Publication of CN105486687B publication Critical patent/CN105486687B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30196—Human being; Person
    • G06T2207/30201—Face

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Position Input By Displaying (AREA)
CN201510644460.2A 2014-10-07 2015-10-08 触摸面板检查装置和方法 Active CN105486687B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020140134956A KR101687163B1 (ko) 2014-10-07 2014-10-07 터치 패널 검사 장치 및 방법
KR10-2014-0134956 2014-10-07

Publications (2)

Publication Number Publication Date
CN105486687A CN105486687A (zh) 2016-04-13
CN105486687B true CN105486687B (zh) 2020-05-15

Family

ID=55673809

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510644460.2A Active CN105486687B (zh) 2014-10-07 2015-10-08 触摸面板检查装置和方法

Country Status (4)

Country Link
JP (1) JP6619194B2 (ko)
KR (1) KR101687163B1 (ko)
CN (1) CN105486687B (ko)
TW (1) TW201621584A (ko)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102584696B1 (ko) * 2016-04-26 2023-10-06 삼성디스플레이 주식회사 표시 패널의 광학 검사 방법
CN105928952B (zh) * 2016-06-27 2019-06-28 昆山国显光电有限公司 Aoi控制系统及其控制方法
CN107091800A (zh) * 2017-06-06 2017-08-25 深圳小孚医疗科技有限公司 用于显微成像粒子分析的聚焦系统和聚焦方法
JP6557300B2 (ja) 2017-08-15 2019-08-07 ファナック株式会社 タッチパネルの検査装置、及びタッチパネルの検査方法
CN108333805B (zh) * 2018-02-26 2020-11-03 京东方科技集团股份有限公司 不良点坐标自动检测方法和装置、设备和存储介质
CN108362712B (zh) * 2018-03-14 2022-09-30 京东方科技集团股份有限公司 一种基板母板及其检测方法
CN108469437B (zh) * 2018-03-16 2021-06-11 河北视窗玻璃有限公司 浮法玻璃的缺陷检测方法及装置
CN108627527A (zh) * 2018-05-09 2018-10-09 昆山国显光电有限公司 一种开槽区裂纹检测装置及检测方法
CN108872273A (zh) * 2018-05-09 2018-11-23 昆山国显光电有限公司 一种开槽区裂纹检测系统及检测方法
CN108921861A (zh) * 2018-05-15 2018-11-30 佛山市南海区广工大数控装备协同创新研究院 一种基于机器视觉的便携式电脑触摸板边缘检测方法
KR102158823B1 (ko) * 2018-08-13 2020-09-22 강구만 유리 외관 촬영장치 및 유리 외관 검사시스템
KR20200044252A (ko) * 2018-10-18 2020-04-29 삼성디스플레이 주식회사 표시 패널 검사 시스템, 표시 패널 검사 방법 및 이를 이용한 표시 패널.
KR102650554B1 (ko) 2018-10-30 2024-03-22 삼성디스플레이 주식회사 표시 장치의 검사 장치 및 그 검사 방법
CN111325707B (zh) * 2018-12-13 2021-11-30 深圳中科飞测科技股份有限公司 一种图像处理方法和系统、检测方法和系统
JP7495276B2 (ja) 2020-06-01 2024-06-04 住友重機械工業株式会社 印刷用データ生成装置及びインク塗布装置の制御装置
CN111693533B (zh) * 2020-06-11 2023-01-20 南通通富微电子有限公司 工件表面质量的检测方法及检测装置、外观机
CN112485031B (zh) * 2020-11-13 2023-07-14 上海伟世通汽车电子系统有限公司 汽车中控屏功能检测系统及方法
CN115185113B (zh) * 2022-06-21 2023-11-24 广州国显科技有限公司 一种显示面板的测试方法及系统

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1493870A (zh) * 2002-09-26 2004-05-05 株式会社日立国际电气 图形缺陷检查装置及图形缺陷检查方法
CN101512323A (zh) * 2006-09-08 2009-08-19 大日本印刷株式会社 污染性评价方法、污染性评价装置、光学部件的制造方法、光学叠层体以及显示器产品
JP2012185140A (ja) * 2011-03-08 2012-09-27 Toppan Printing Co Ltd 自動欠陥検査装置
CN102981094A (zh) * 2012-11-23 2013-03-20 深圳莱宝高科技股份有限公司 一种面板测试装置
CN103076344A (zh) * 2012-12-27 2013-05-01 深圳市华星光电技术有限公司 显示面板的缺陷检测方法及其检测装置
TW201339573A (zh) * 2012-03-30 2013-10-01 Intekplus Co Ltd 平面基板之自動光學檢測方法及其裝置
CN103718142A (zh) * 2011-06-20 2014-04-09 株式会社Tmay 静电容量式触摸面板的制造方法及由此制造的触摸面板

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3536884B2 (ja) * 1995-10-09 2004-06-14 株式会社神戸製鋼所 半導体ウエハの欠陥分類方法及びその装置
JP2004077495A (ja) 2003-10-21 2004-03-11 Ckd Corp 外観検査装置
JP2007225645A (ja) * 2006-02-21 2007-09-06 Epson Imaging Devices Corp 電気光学パネルの製造方法
US7847929B2 (en) * 2006-08-23 2010-12-07 Applied Materials Israel, Ltd. Methods and apparatus for inspecting a plurality of dies
JP5114943B2 (ja) 2006-12-25 2013-01-09 ソニー株式会社 欠陥修正装置及び欠陥修正方法
KR20110020437A (ko) 2009-08-24 2011-03-03 주식회사 동부하이텍 패턴이 형성된 웨이퍼의 결함 검사 방법
JP2012079148A (ja) * 2010-10-04 2012-04-19 Toppan Printing Co Ltd 静電容量式透過型タッチパネルの電極層パターン欠陥検査修正システム
KR101261016B1 (ko) * 2011-03-15 2013-05-06 (주) 인텍플러스 평판패널 기판의 자동광학검사 방법 및 그 장치
JP2013092469A (ja) * 2011-10-26 2013-05-16 Nippon Filcon Co Ltd ワーク検査システム

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1493870A (zh) * 2002-09-26 2004-05-05 株式会社日立国际电气 图形缺陷检查装置及图形缺陷检查方法
CN101512323A (zh) * 2006-09-08 2009-08-19 大日本印刷株式会社 污染性评价方法、污染性评价装置、光学部件的制造方法、光学叠层体以及显示器产品
JP2012185140A (ja) * 2011-03-08 2012-09-27 Toppan Printing Co Ltd 自動欠陥検査装置
CN103718142A (zh) * 2011-06-20 2014-04-09 株式会社Tmay 静电容量式触摸面板的制造方法及由此制造的触摸面板
TW201339573A (zh) * 2012-03-30 2013-10-01 Intekplus Co Ltd 平面基板之自動光學檢測方法及其裝置
CN102981094A (zh) * 2012-11-23 2013-03-20 深圳莱宝高科技股份有限公司 一种面板测试装置
CN103076344A (zh) * 2012-12-27 2013-05-01 深圳市华星光电技术有限公司 显示面板的缺陷检测方法及其检测装置

Also Published As

Publication number Publication date
TW201621584A (zh) 2016-06-16
CN105486687A (zh) 2016-04-13
KR101687163B1 (ko) 2016-12-16
KR20160041313A (ko) 2016-04-18
JP6619194B2 (ja) 2019-12-11
JP2016076214A (ja) 2016-05-12

Similar Documents

Publication Publication Date Title
CN105486687B (zh) 触摸面板检查装置和方法
TWI787296B (zh) 光學檢測方法、光學檢測裝置及光學檢測系統
US11029255B2 (en) Defect inspection device, defect inspection method, and program
US10401227B2 (en) Colorimetry device and colorimetry method
JP2013148361A (ja) はんだ検査のための検査基準登録方法およびその方法を用いた基板検査装置
JP2010271055A (ja) 目視検査装置と目視検査方法
CN103135855A (zh) 光学触控装置与触控影像处理方法
JP2013025650A5 (ko)
KR20170011791A (ko) 터치스크린 패널에서 강화유리의 광학적 불량과 ito패턴의 불량을 검출하기 위한 장치 및 그 방법
JP2007064642A (ja) 目視検査装置
KR20180061528A (ko) Lab 컬러 모델을 이용한 이물질 검사 시스템 및 방법
KR101604528B1 (ko) 구멍 검사 장치
KR20160095381A (ko) 투명전극 필름의 광학 검사방법
KR20210131695A (ko) Led 패널 결함 검출을 위한 데이터 생성 장치 및 방법
US8897540B2 (en) Optical inspection method
JP2018091771A (ja) 検査方法、事前画像選別装置及び検査システム
CN107727654B (zh) 膜层检测方法、装置及膜层检测系统
KR101409568B1 (ko) 표시패널 검사장치 및 그 검사방법
JP5855961B2 (ja) 画像処理装置及び画像処理方法
TWI596334B (zh) 用以評估多晶太陽能晶圓上之晶粒大小之方法與系統
CN112213081A (zh) 一种屏体检测设备
JP2009236593A (ja) 外観検査支援装置
JP2022070392A (ja) 画像認識方法、画像認識装置、検査方法、検査装置、プログラム、記録媒体
JP2013188773A (ja) ワークの位置ずれ検出装置、ワークの位置ずれ検出方法、及びコンピュータプログラム
KR20190042180A (ko) 커버 글라스 분석 방법

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant