CN105468027A - 具有超高真空度的样品调整控制器 - Google Patents
具有超高真空度的样品调整控制器 Download PDFInfo
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- CN105468027A CN105468027A CN201410459462.XA CN201410459462A CN105468027A CN 105468027 A CN105468027 A CN 105468027A CN 201410459462 A CN201410459462 A CN 201410459462A CN 105468027 A CN105468027 A CN 105468027A
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- sample
- corrugated tube
- adjustment controller
- specimen holder
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Abstract
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Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201410459462.XA CN105468027B (zh) | 2014-09-10 | 2014-09-10 | 具有超高真空度的样品调整控制器 |
Applications Claiming Priority (1)
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CN201410459462.XA CN105468027B (zh) | 2014-09-10 | 2014-09-10 | 具有超高真空度的样品调整控制器 |
Publications (2)
Publication Number | Publication Date |
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CN105468027A true CN105468027A (zh) | 2016-04-06 |
CN105468027B CN105468027B (zh) | 2018-03-23 |
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CN201410459462.XA Expired - Fee Related CN105468027B (zh) | 2014-09-10 | 2014-09-10 | 具有超高真空度的样品调整控制器 |
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CN (1) | CN105468027B (zh) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2403016Y (zh) * | 1999-12-24 | 2000-10-25 | 中国科学院沈阳科学仪器研制中心 | 高精密五维微调样品架 |
CN2496827Y (zh) * | 2001-07-06 | 2002-06-26 | 中国科学院等离子体物理研究所 | 超高真空下运送机构 |
US20070210249A1 (en) * | 2003-10-07 | 2007-09-13 | Stmicroelectronics S.R.I | Electron Spectroscope With Emission Induced By A Monochromatic Electron Beam |
CN201107035Y (zh) * | 2007-10-17 | 2008-08-27 | 深圳市新三思材料检测有限公司 | 变形测量装置 |
CN201159722Y (zh) * | 2008-02-02 | 2008-12-03 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
-
2014
- 2014-09-10 CN CN201410459462.XA patent/CN105468027B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2403016Y (zh) * | 1999-12-24 | 2000-10-25 | 中国科学院沈阳科学仪器研制中心 | 高精密五维微调样品架 |
CN2496827Y (zh) * | 2001-07-06 | 2002-06-26 | 中国科学院等离子体物理研究所 | 超高真空下运送机构 |
US20070210249A1 (en) * | 2003-10-07 | 2007-09-13 | Stmicroelectronics S.R.I | Electron Spectroscope With Emission Induced By A Monochromatic Electron Beam |
CN201107035Y (zh) * | 2007-10-17 | 2008-08-27 | 深圳市新三思材料检测有限公司 | 变形测量装置 |
CN201159722Y (zh) * | 2008-02-02 | 2008-12-03 | 丹东方圆仪器有限公司 | X射线衍射仪用多功能样品架 |
Also Published As
Publication number | Publication date |
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CN105468027B (zh) | 2018-03-23 |
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Address after: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant after: GUANYAN (SHANGHAI) PATENT TECHNOLOGY CO.,LTD. Address before: 200233 Shanghai city 7 Xuhui District Guiqin Road No. 3 Building 5 floor Applicant before: GAINIA (SHANGHAI) INTELLECTUAL ASSET SERVICES, Inc. |
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Effective date of registration: 20210907 Address after: Room 219 hall 53 Industrial Research Institute No 195 section 4 Zhongxing Road Zhudong Town Hsinchu County Taiwan China Patentee after: GAINIA INTELLECTUAL ASSET SERVICES, Inc. Address before: 200233 floor 5, building 3, No. 7, GuiJing Road, Xuhui District, Shanghai Patentee before: GUANYAN (SHANGHAI) PATENT TECHNOLOGY Co.,Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180323 |
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CF01 | Termination of patent right due to non-payment of annual fee |