CN1051642C - 半导体器件及其制造方法 - Google Patents

半导体器件及其制造方法 Download PDF

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Publication number
CN1051642C
CN1051642C CN95105165A CN95105165A CN1051642C CN 1051642 C CN1051642 C CN 1051642C CN 95105165 A CN95105165 A CN 95105165A CN 95105165 A CN95105165 A CN 95105165A CN 1051642 C CN1051642 C CN 1051642C
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CN
China
Prior art keywords
film
region
semiconductor device
conductive
element region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN95105165A
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English (en)
Chinese (zh)
Other versions
CN1120738A (zh
Inventor
木村幸治
中岛雄一
川本浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
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Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of CN1120738A publication Critical patent/CN1120738A/zh
Application granted granted Critical
Publication of CN1051642C publication Critical patent/CN1051642C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0107—Integrating at least one component covered by H10D12/00 or H10D30/00 with at least one component covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating IGFETs with BJTs
    • H10D84/0109—Integrating at least one component covered by H10D12/00 or H10D30/00 with at least one component covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating IGFETs with BJTs the at least one component covered by H10D12/00 or H10D30/00 being a MOS device
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/02—Manufacture or treatment characterised by using material-based technologies
    • H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
    • H10D84/401—Combinations of FETs or IGBTs with BJTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/01—Manufacture or treatment
    • H10W20/031—Manufacture or treatment of conductive parts of the interconnections
    • H10W20/0698—Local interconnections

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
CN95105165A 1994-04-15 1995-04-14 半导体器件及其制造方法 Expired - Fee Related CN1051642C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP101832/94 1994-04-15
JP101832/1994 1994-04-15
JP10183294 1994-04-15

Publications (2)

Publication Number Publication Date
CN1120738A CN1120738A (zh) 1996-04-17
CN1051642C true CN1051642C (zh) 2000-04-19

Family

ID=14311070

Family Applications (1)

Application Number Title Priority Date Filing Date
CN95105165A Expired - Fee Related CN1051642C (zh) 1994-04-15 1995-04-14 半导体器件及其制造方法

Country Status (7)

Country Link
US (1) US5604371A (enExample)
EP (1) EP0681319B1 (enExample)
KR (1) KR0147510B1 (enExample)
CN (1) CN1051642C (enExample)
DE (1) DE69528683T2 (enExample)
MY (1) MY118940A (enExample)
TW (1) TW289157B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100352015C (zh) * 2003-12-25 2007-11-28 三洋电机株式会社 半导体装置的制造方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5781445A (en) * 1996-08-22 1998-07-14 Taiwan Semiconductor Manufacturing Company, Ltd. Plasma damage monitor
US6440750B1 (en) 1997-06-10 2002-08-27 Agere Systems Guardian Corporation Method of making integrated circuit having a micromagnetic device
US6118351A (en) * 1997-06-10 2000-09-12 Lucent Technologies Inc. Micromagnetic device for power processing applications and method of manufacture therefor
JP2000124336A (ja) * 1998-10-12 2000-04-28 Sony Corp 半導体装置及び半導体装置の製造方法
JP4149095B2 (ja) * 1999-04-26 2008-09-10 株式会社ルネサステクノロジ 半導体集積回路装置の製造方法
US6255714B1 (en) 1999-06-22 2001-07-03 Agere Systems Guardian Corporation Integrated circuit having a micromagnetic device including a ferromagnetic core and method of manufacture therefor
JP3612525B2 (ja) * 2002-06-04 2005-01-19 Ｎｅｃ液晶テクノロジー株式会社 薄膜半導体装置の製造方法及びそのレジストパターン形成方法
DE102010038933A1 (de) * 2009-08-18 2011-02-24 Denso Corporation, Kariya-City Halbleitervorrichtung mit Halbleiterchip und Metallplatte und Verfahren zu deren Fertigung
CN103187254B (zh) * 2011-12-28 2015-12-02 北大方正集团有限公司 一种双多晶硅栅的制造方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612805A (en) * 1984-12-24 1986-09-23 International Business Machines Corporation Adhesion characterization test site

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3999213A (en) * 1972-04-14 1976-12-21 U.S. Philips Corporation Semiconductor device and method of manufacturing the device
US4299024A (en) * 1980-02-25 1981-11-10 Harris Corporation Fabrication of complementary bipolar transistors and CMOS devices with poly gates
NL8005995A (nl) * 1980-11-03 1982-06-01 Philips Nv Halfgeleiderinrichting.
JPS5825264A (ja) * 1981-08-07 1983-02-15 Hitachi Ltd 絶縁ゲート型半導体装置
GB2164790A (en) * 1984-09-19 1986-03-26 Philips Electronic Associated Merged bipolar and field effect transistors
FR2581248B1 (fr) * 1985-04-26 1987-05-29 Efcis Procede de fabrication de transistors a effet de champ et transistors bipolaires lateraux sur un meme substrat
GB2190539A (en) * 1986-05-16 1987-11-18 Philips Electronic Associated Semiconductor devices
US5119162A (en) * 1989-02-10 1992-06-02 Texas Instruments Incorporated Integrated power DMOS circuit with protection diode
JPH0348457A (ja) * 1989-04-14 1991-03-01 Toshiba Corp 半導体装置およびその製造方法
KR930006735B1 (ko) * 1991-02-28 1993-07-23 삼성전자 주식회사 바이씨모스장치의 제조방법
WO1993016494A1 (en) * 1992-01-31 1993-08-19 Analog Devices, Inc. Complementary bipolar polysilicon emitter devices

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612805A (en) * 1984-12-24 1986-09-23 International Business Machines Corporation Adhesion characterization test site

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100352015C (zh) * 2003-12-25 2007-11-28 三洋电机株式会社 半导体装置的制造方法

Also Published As

Publication number Publication date
CN1120738A (zh) 1996-04-17
KR0147510B1 (ko) 1998-08-01
DE69528683T2 (de) 2003-06-12
EP0681319A3 (en) 1997-01-22
EP0681319B1 (en) 2002-10-30
MY118940A (en) 2005-02-28
EP0681319A2 (en) 1995-11-08
KR950030343A (ko) 1995-11-24
TW289157B (enExample) 1996-10-21
US5604371A (en) 1997-02-18
DE69528683D1 (de) 2002-12-05

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C14 Grant of patent or utility model
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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20000419

Termination date: 20130414