CN104904025A - 发光装置的制造方法和发光装置 - Google Patents

发光装置的制造方法和发光装置 Download PDF

Info

Publication number
CN104904025A
CN104904025A CN201380069511.2A CN201380069511A CN104904025A CN 104904025 A CN104904025 A CN 104904025A CN 201380069511 A CN201380069511 A CN 201380069511A CN 104904025 A CN104904025 A CN 104904025A
Authority
CN
China
Prior art keywords
light
wire
emitting component
emitting
framework
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201380069511.2A
Other languages
English (en)
Other versions
CN104904025B (zh
Inventor
玉置和雄
太田将之
山口真司
栗田贤一
辰巳正毅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of CN104904025A publication Critical patent/CN104904025A/zh
Application granted granted Critical
Publication of CN104904025B publication Critical patent/CN104904025B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • H01L33/486Containers adapted for surface mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/62Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04042Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/06102Disposition the bonding areas being at different heights
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/32257Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic the layer connector connecting to a bonding area disposed in a recess of the surface of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48257Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48475Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
    • H01L2224/48476Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
    • H01L2224/48477Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding)
    • H01L2224/48478Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball
    • H01L2224/48479Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48475Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
    • H01L2224/48476Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
    • H01L2224/48477Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding)
    • H01L2224/48478Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball
    • H01L2224/4848Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball outside the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4899Auxiliary members for wire connectors, e.g. flow-barriers, reinforcing structures, spacers, alignment aids
    • H01L2224/48996Auxiliary members for wire connectors, e.g. flow-barriers, reinforcing structures, spacers, alignment aids being formed on an item to be connected not being a semiconductor or solid-state body
    • H01L2224/48997Reinforcing structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49107Connecting at different heights on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49109Connecting at different heights outside the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/494Connecting portions
    • H01L2224/4945Wire connectors having connecting portions of different types on the semiconductor or solid-state body, e.g. regular and reverse stitches
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • H01L2224/85051Forming additional members, e.g. for "wedge-on-ball", "ball-on-wedge", "ball-on-ball" connections
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85186Translational movements connecting first outside the semiconductor or solid-state body, i.e. off-chip, reverse stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85986Specific sequence of steps, e.g. repetition of manufacturing steps, time sequence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/922Connecting different surfaces of the semiconductor or solid-state body with connectors of different types
    • H01L2224/9222Sequential connecting processes
    • H01L2224/92242Sequential connecting processes the first connecting process involving a layer connector
    • H01L2224/92247Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12041LED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0016Processes relating to electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0066Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Led Device Packages (AREA)
  • Wire Bonding (AREA)

Abstract

发光装置(1)的制造方法具有:框体形成工序,形成框体(2),该框体(2)具有装载发光元件(20)的装置基板(4)和与装置基板(4)分离而通过导线(6a)与发光元件(20)电连接的端子部(5),并且,从端子部(5)的与导线(6a)连接的连接面至框体(2)的上缘(2a)为止的高度(H1)低于从发光元件(20)的上表面至框体(2)的上缘(2a)为止的高度(H2);在导线(6a)连接的发光元件(20)的电极形成凸块(32)的凸块形成工序;首先将导线(6a)的一端与端子部(5)接合的第一接合工序;然后将导线(6a)的另一端与凸块(32)接合的第二接合工序;和在框体(2)的内部填充密封材料(7)而将发光元件(20)密封的密封工序。

Description

发光装置的制造方法和发光装置
技术领域
本发明涉及发光装置的制造方法和使用该方法制造的发光装置。
背景技术
历来已知使用例如LED(Light Emitting Diode:发光二极管)芯片等的发光元件的发光装置。使用了LED芯片的发光装置中,为了保护LED芯片自身和与LED芯片电连接的导线,为了提高LED芯片照射的光的取出效率,以及为了使荧光体分散,利用由透明树脂构成的密封材料覆盖LED芯片。LED芯片照射的光透过密封材料的内部从密封材料的表面(光取出面)被向外部放出。在专利文献1中记载有这种现有的发光装置。
专利文献1中记载的发光装置(发光元件封装件)中,在框体(主体)的底部配置的基板(反光杯)上装载发光元件,发光元件通过导线与跟发光元件分离的其它基板电连接。在将导线的两端与发光元件和基板接合时,通常进行如下接合工序:首先将导线的一端与发光元件接合(第一接合),然后将导线的另一端与跟发光元件分离的基板接合(第二接合)。
现有技术文献
专利文献
专利文献1:日本特开2011-254080号公报
发明内容
发明所要解决的问题
此处,已知在导线的第一接合中,导线的接合处正上方的颈部会再结晶。而且已知在导线的再结晶区域金属变脆、容易断裂。
另一方面,覆盖发光元件的密封材料有时使用热膨胀率比较大的材料。而且,可以认为发光装置会由于外部环境和发光元件的点亮、熄灭等而受到温度变化或温度变化的反复。如果密封材料由于该温度变化而反复进行膨胀收缩,则有对导线施加反复应力的可能性。担心该反复应力对导线的再结晶区域产生不利影响,导线更加容易断裂。
也担心这样的问题会由于与发光装置的大型化相伴而来的密封材料的量变多、导线的长度变长而更加显著。
本发明是鉴于上述的问题而完成的发明,其目的在于提供能够尽量抑制与发光元件接合的导线的断裂的发光装置的制造方法和使用该方法制造的发光装置。
解决问题的手段
为了解决上述问题,本发明的发光装置的制造方法的特征在于,具有:框体形成工序,形成框体,该框体具有装载发光元件的装置基板和与上述装置基板分离而通过导线与上述发光元件电连接的端子部,并且,从上述端子部的与上述导线连接的连接面至上述框体的上缘为止的高度低于从上述发光元件的上表面至上述框体的上缘为止的高度;
在上述导线连接的上述发光元件的电极形成凸块的凸块形成工序;
首先将上述导线的一端与上述端子部接合的第一接合工序;
然后将上述导线的另一端与上述凸块接合的第二接合工序;和
在上述框体的内部填充密封材料而将上述发光元件密封的密封工序。
根据该结构,导线的第一接合之处的上方的密封材料的厚度比导线的第二接合之处的上方的密封材料的厚度薄。因此,导线的第一接合之处、即导线的再结晶区域受到的密封材料的膨胀收缩的影响降低。
此外,上述结构的发光装置的制造方法的特征在于:上述凸块形成工序中,在上述发光元件的n电极形成上述凸块。
此外,为了解决上述问题,本发明提供一种发光装置,其特征在于使用上述方法制造。
发明的效果
根据本发明的结构,能够提供能够尽量抑制与发光元件接合的导线的断裂的发光装置的制造方法和使用该方法制造的发光装置。
附图说明
图1是本发明的实施方式的发光装置的截面图。
图2是本发明的实施方式的发光装置的发光元件的截面图。
图3是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图4是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图5是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图6是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图7是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图8是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图9是用于说明本发明的实施例1的发光装置的制造方法的截面图。
图10是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图11是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图12是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图13是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图14是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图15是用于说明本发明的实施例2的发光装置的制造方法的截面图。
图16是用于说明本发明的实施例3的发光装置的制造方法的截面图。
具体实施方式
以下,根据图1~图16对本发明的实施方式进行说明。
首先,使用图1和图2说明本发明的实施方式的发光装置的结构。图1是发光装置的截面图,图2是发光装置的发光元件的截面图。
如图1所示,发光装置1包括装载于框体2的发光元件20。发光元件20是使用例如半导体形成的LED芯片。构成LED芯片的半导体的种类根据例如所期望的LED芯片的出射光的波长等适当地决定。例如,LED芯片可以使用紫外、蓝、绿、红、红外的任意波长的LED芯片。
如图2所示,发光元件20例如在由蓝宝石构成的元件基板21的上表面上结晶生长出多个半导体层。在该元件基板21上依次叠层缓冲层22、n型半导体层23、作为发光层的活性层24、p型半导体层25。在p型半导体层25上设置有p电极26。
n型半导体层23的一部分、活性层24和p型半导体层25被蚀刻成台状,n型半导体层23的一部分在上方露出。在该露出的n型半导体层23上设置有n电极27。在发光元件20的几乎整个上表面以p电极26和n电极27露出的方式设置有保护膜28。
如图1所示,框体2的外形形成为大致长方体形状,包括凹部3。凹部3具有以从框体2的内部向图1的框体2的上表面方向去成为广口的方式倾斜的侧面,框体2的上表面成为开口。发光元件20配置在该凹部3的内底部。
发光元件20照射的光的一部分在凹部3的倾斜的侧面被反射。为了提高发光装置1的光的取出效率,期望框体2为反射率较高的材料,可以使用例如聚邻苯二甲酰胺树脂或聚对苯二甲酸乙二醇酯树脂等硬质的白色树脂,或者由氧化铝(Al2O3)的烧结体构成的陶瓷。
在框体2设置有装置基板4和端子部5。装置基板4和端子部5详细而言以作为正负电极发挥作用的方式成对地构成,隔着作为框体2的一部分的绝缘部2a而相互分离。装置基板4和端子部5均以它们的一个端部位于凹部3的内底部的方式设置。另外,装置基板4和端子部5也可以与框体2一体地形成。
发光元件20在装置基板4的图1中的上表面上载置于框体2的水平方向的大致中央部。发光元件20通过导线6a、6b与端子部5和装置基板4电连接。此处,装置基板4和端子部5以从端子部5的与导线6a连接的连接面至框体2的上缘2b为止的高度H1低于从发光元件20的上表面至框体2的上缘2b为止的高度H2的方式形成。
发光元件20和导线6a、6b的周围被密封材料7覆盖。密封材料7以充满框体2的凹部3的方式填充于凹部3。发光元件20照射的光从光取出面7a射出,该光取出面7a为从凹部3露出于外部的密封材料7的表面,即图1中的上表面。密封材料7例如由热固化性的环氧树脂或硅树脂构成。由此,密封材料7的可靠性和透明性高,能够提高发光装置1的光的取出效率。此外,也可以在密封材料7中混入例如荧光体和分散剂等添加物。
实施例1
接着,使用图3~图9对发光装置1的制造方法的实施例1进行说明。图3~图9是用于说明发光装置1的制造方法的截面图。另外,在实施例1的说明中有时适当参照图1和图2。
在实施例1的发光装置1的制造方法中,首先在图3所示的框体形成工序中例如通过嵌入成型将框体2与装置基板4以及端子部5一体地形成。装置基板4与端子部5隔着绝缘部2a相互分离。装置基板4和端子部5如图3和图4所示那样以从端子部5的与导线6a(参照图1)连接的连接面至框体2的上缘2b为止的高度H1低于从发光元件20的上表面至框体2的上缘2b为止的高度H2的方式形成。
接着,在图4所示的元件装载工序中,对在框体2的凹部3的内底部露出的装置基板4的表面供给管芯焊接材料31,在其上装载发光元件20。由此,发光元件20被紧固于装置基板4的表面。
接着,在图5所示的凸块形成工序中,在发光元件20的n电极27(参照图2)上形成凸块32。该凸块32是为了从发光元件20向隔着绝缘部2a分离的端子部5延伸的导线6a而设置的凸块。
接着,执行如图6所示那样将跨越发光元件20与端子部5之间用于将它们电连接的导线6a接合的接合工序。在导线6a的接合工序中执行:首先将导线6a的一端形成例如球部33而与端子部5接合的第一接合工序;和然后将导线6a的另一端与发光元件20的凸块32接合的第二接合工序。
接着,在图7和图8所示的接合工序中,将用于将发光元件20的p电极26(参照图2)和装置基板4电连接的导线6b分别与该发光元件20的p电极26(参照图2)和该装置基板4接合。在导线6b的接合工序中,首先将导线6b的一端形成例如球部34而与发光元件20的p电极26接合,然后将导线6b的另一端形成例如球部35而与装置基板4接合。
接着,在图9所示的密封工序中,将密封材料7填充于框体2的内部的凹部3。密封材料7例如利用分配器等向发光元件20滴下规定量。由此,发光元件20被密封材料7密封。
实施例2
接着,使用图10~图15对发光装置1的制造方法的实施例2进行说明。图10~图15是用于说明发光装置1的制造方法的截面图。该实施例的基本结构与使用图3~图9说明的上述实施例1相同,因此对与实施例1共同的构成要素标注与上述相同的附图标记,有时省略逐个工序的附图的记载。
实施例2的发光装置1如图15所示那样在装置基板4装载两个发光元件20A、20B。两个发光元件20A、20B在装置基板4与端子部5之间使用导线6a、6b、6c串联电连接。
在实施例2的发光装置1的制造方法中,首先在框体形成工序中将框体2利用例如嵌入成型与装置基板4以及端子部5一体地形成(参照图10)。装置基板4与端子部5隔着绝缘部2a相互分离。装置基板4和端子部5如图10所示那样以从端子部5的与导线6a(参照图11)连接的连接面至框体2的上缘2b为止的高度H1低于从发光元件20A、20B的上表面至框体2的上缘2b为止的高度H2的方式形成。
接着,在元件装载工序中,对在框体2的凹部3的内底部露出的装置基板4的表面供给管芯焊接材料31,在其上装载2个发光元件20A、20B(参照图10)。由此,发光元件20A、20B被紧固于装置基板4的表面。
接着,在第一凸块形成工序中,在靠近端子部5一侧的发光元件20A的n电极27(参照图2)上形成凸块32(参照图10)。该凸块32是为了从发光元件20A向隔着绝缘部2a分离的端子部5延伸的导线6a而设置的凸块。
接着,执行将如图11所示那样跨越发光元件20A与端子部5之间用于将它们电连接的导线6a接合的接合工序。在导线6a的接合工序中执行:首先将导线6a的一端形成例如球部33而与端子部5接合的第一接合工序;和然后将导线6a的另一端与发光元件20A的凸块32接合的第二接合工序。
接着,在图12所示的第二凸块形成工序中,在靠近端子部5一侧的发光元件20A的p电极26(参照图2)上形成凸块34。该凸块34是为了将一起装载在装置基板4的发光元件20A与发光元件20B电连接的导线6b而设置的凸块。
接着,执行如图13所示那样将用于电连接发光元件20A与发光元件20B的导线6b接合的接合工序。在导线6b的接合工序中,首先将导线6b的一端形成例如球部35而与发光元件20B的n电极27(参照图2)接合,然后将导线6b的另一端与发光元件20A的p电极26的凸块34接合。
接着,在图14所示的接合工序中,将用于将离端子部5远的一侧的发光元件20B的p电极26(参照图2)与装置基板4电连接的导线6c与该离端子部5远的一侧的发光元件20B的p电极26(参照图2)以及该装置基板4接合。在导线6c的接合工序中,首先将导线6c的一端形成例如球部36而与发光元件20的p电极26接合,然后将导线6c的另一端形成例如球部37而与装置基板4接合。
接着,在图15所示的密封工序中,将密封材料7填充于框体2的内部的凹部3。密封材料7例如利用分配器等向发光元件20A、20B滴下规定量。由此,发光元件20A、20B被密封材料7密封。
实施例3
接着,使用图16对发光装置1的制造方法的实施例3进行说明。图16是用于说明发光装置1的制造方法的截面图。该实施例的基本的结构与使用图3~图9说明的上述实施例1和使用图10~图15说明的上述实施例2相同,因此对与这些实施例共同的构成要素标注与上述相同的附图标记,省略逐个工序的附图的记载。
实施例3的发光装置1如图16所示那样在装置基板4装载两个发光元件20。两个发光元件20分别在装置基板4与端子部5之间使用导线6a、6b串联电连接。
在实施例3的发光装置1的制造方法中,首先在框体形成工序中,以设置在图16的左右的两个装置基板4与设置在图16的左右方向中央的端子部5分别隔着绝缘部2a相互分离的方式形成框体2。两个装置基板4和端子部5以从端子部5的与导线6a连接的连接面至框体2的上缘2b为止的高度H1低于从发光元件20的上表面至框体2的上缘2b为止的高度H2的方式形成。
接着,在元件装载工序中,对在框体2的凹部3的内底部露出的两个装置基板4各自的表面供给管芯焊接材料31,将两个发光元件20分别装载于其上。由此,两个发光元件20被分别紧固于2个装置基板4各自的表面。
接着,在凸块形成工序中,在两个发光元件20各自的n电极27(参照图2)上形成凸块32。该凸块32是为了分别从两个发光元件20向隔着绝缘部2a分离的端子部5延伸的导线6a而设置的凸块。
接着,执行将跨越两个发光元件20中的各个发光元件与端子部5之间用于将它们分别电连接的两个导线6a接合的接合工序。在导线6a的接合工序中执行:首先将导线6a的一端形成例如球部33而与端子部5接合的第一接合工序;和然后将导线6a的另一端与发光元件20的凸块32接合的第二接合工序。接着,在接合工序中,将用于将两个发光元件20各自的p电极26(参照图2)和两个装置基板4分别电连接的导线6b与该两个发光元件20各自的p电极26(参照图2)和该两个装置基板4接合。
接着,在密封工序中,将密封材料7填充于框体2的内部的凹部3。密封材料7例如利用分配器等向发光元件20滴下规定量。由此,两个发光元件20分别被密封材料7密封。
如上所述,发光装置1的制造方法具有:框体形成工序,形成框体2,该框体2具有装载发光元件20的装置基板4和与装置基板4分离而通过导线6a与发光元件20电连接的端子部5,并且,从端子部5的与导线6a连接的连接面至框体2的上缘2a为止的高度H1低于从发光元件20的上表面至框体2的上缘2a为止的高度H2;在导线6a连接的发光元件20的电极形成凸块32的凸块形成工序;首先将导线6a的一端与端子部5接合的第一接合工序;然后将导线6a的另一端与凸块32接合的第二接合工序;和在框体2的内部填充密封材料7而将发光元件20密封的密封工序。由此,导线6a的第一接合之处的上方的密封材料7的厚度(H1)比导线6a的第二接合之处的上方的密封材料7的厚度(H2)薄。因此,能够将导线6a的第一接合之处、即导线6a的再结晶区域所受到的密封材料7的膨胀收缩的影响降低。
此外,对导线6a的第二接合之处在凸块32的形成时和第二接合的执行时施加共两次的负荷,在多层结构上形成的p电极26的情况下,担心其下方有可能发生破损。于是,在发光装置1的制造方法中,在凸块形成工序中,在发光元件20的n电极27上形成了凸块32。由此,能够防止发光元件20的破损。
进一步,发光装置1使用上述方法制造,因此能够获得导线6a的再结晶区域受到的密封材料7的膨胀收缩的影响降低了的发光装置1。由此,提高发光装置1受到由外部环境和自发热引起的温度变化或温度变化的反复时的耐性。因此,即使使得密封材料7的量比较多也能够抑制导线6a的断裂,能够实现发光装置1的大型化。
这样,根据本发明的上述实施方式的结构,能够提供能够尽量抑制与发光元件20接合的导线6a的断裂的发光装置1的制造方法和使用该方法制造的发光装置1。
以上,对本发明的实施方式进行了说明,但是本发明的范围并不限定于此,能够在不脱离发明的主旨的范围内增加各种变更而实施。
工业上的可利用性
本发明能够在构成为利用密封材料覆盖发光元件的周围的发光装置的制造方法和使用该方法制造的发光装置中加以利用。
附图标记的说明
1   发光装置
2   框体
2a  绝缘部
2b  上缘
3   凹部
4   装置基板
5   端子部
6a  导线
7   密封材料
7a  光取出面
20  发光元件
26  p电极
27  n电极
32  凸块

Claims (3)

1.一种发光装置的制造方法,其特征在于,具有:
框体形成工序,形成框体,该框体具有装载发光元件的装置基板和与所述装置基板分离而通过导线与所述发光元件电连接的端子部,并且,从所述端子部的与所述导线连接的连接面至所述框体的上缘为止的高度低于从所述发光元件的上表面至所述框体的上缘为止的高度;
在所述导线连接的所述发光元件的电极形成凸块的凸块形成工序;
首先将所述导线的一端与所述端子部接合的第一接合工序;
然后将所述导线的另一端与所述凸块接合的第二接合工序;和
在所述框体的内部填充密封材料而将所述发光元件密封的密封工序。
2.如权利要求1所述的发光装置的制造方法,其特征在于:
所述凸块形成工序中,在所述发光元件的n电极形成所述凸块。
3.一种使用权利要求1或权利要求2所述的方法制造的发光装置。
CN201380069511.2A 2013-01-31 2013-12-13 发光装置的制造方法和发光装置 Expired - Fee Related CN104904025B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013-016554 2013-01-31
JP2013016554 2013-01-31
PCT/JP2013/083430 WO2014119146A1 (ja) 2013-01-31 2013-12-13 発光装置の製造方法及び発光装置

Publications (2)

Publication Number Publication Date
CN104904025A true CN104904025A (zh) 2015-09-09
CN104904025B CN104904025B (zh) 2018-04-03

Family

ID=51261873

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380069511.2A Expired - Fee Related CN104904025B (zh) 2013-01-31 2013-12-13 发光装置的制造方法和发光装置

Country Status (4)

Country Link
US (1) US20150357527A1 (zh)
JP (1) JP6105638B2 (zh)
CN (1) CN104904025B (zh)
WO (1) WO2014119146A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114335298A (zh) * 2021-11-27 2022-04-12 江西晶众腾光电科技有限公司 一种6050led封装支架及led灯珠

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001284370A (ja) * 2000-03-30 2001-10-12 Sanyo Electric Co Ltd 半導体装置の製造方法
CN1722481A (zh) * 2004-06-22 2006-01-18 株式会社东芝 半导体发光元件的封装和半导体发光器件
CN101045860A (zh) * 2002-10-16 2007-10-03 日亚化学工业株式会社 氧氮化物荧光体及其制造方法以及使用该氧氮化物荧光体的发光装置
JP2009206222A (ja) * 2008-02-27 2009-09-10 Stanley Electric Co Ltd 半導体発光装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3762475B2 (ja) * 1995-04-10 2006-04-05 富士通株式会社 ワイヤボンディング方法及び半導体装置
JP2001015542A (ja) * 1999-07-02 2001-01-19 Sanken Electric Co Ltd 半導体装置及びその製造方法
MY149573A (en) * 2002-10-16 2013-09-13 Nichia Corp Oxynitride phosphor and production process thereof, and light-emitting device using oxynitride phosphor
JP4359195B2 (ja) * 2004-06-11 2009-11-04 株式会社東芝 半導体発光装置及びその製造方法並びに半導体発光ユニット
KR100723247B1 (ko) * 2006-01-10 2007-05-29 삼성전기주식회사 칩코팅형 led 패키지 및 그 제조방법
JP2008300573A (ja) * 2007-05-30 2008-12-11 Toshiba Corp 発光装置
US8258526B2 (en) * 2008-07-03 2012-09-04 Samsung Led Co., Ltd. Light emitting diode package including a lead frame with a cavity
KR101007131B1 (ko) * 2008-11-25 2011-01-10 엘지이노텍 주식회사 발광 소자 패키지
TW201133944A (en) * 2010-03-30 2011-10-01 Orbit Semicon Ltd Light-emitting diode chip and package structure thereof
JP5864851B2 (ja) * 2010-12-09 2016-02-17 シャープ株式会社 発光装置
JP2012234955A (ja) * 2011-04-28 2012-11-29 Toshiba Corp Ledパッケージ及びその製造方法
JP5817297B2 (ja) * 2011-06-03 2015-11-18 東芝ライテック株式会社 発光装置及び照明装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001284370A (ja) * 2000-03-30 2001-10-12 Sanyo Electric Co Ltd 半導体装置の製造方法
CN101045860A (zh) * 2002-10-16 2007-10-03 日亚化学工业株式会社 氧氮化物荧光体及其制造方法以及使用该氧氮化物荧光体的发光装置
CN1722481A (zh) * 2004-06-22 2006-01-18 株式会社东芝 半导体发光元件的封装和半导体发光器件
JP2009206222A (ja) * 2008-02-27 2009-09-10 Stanley Electric Co Ltd 半導体発光装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114335298A (zh) * 2021-11-27 2022-04-12 江西晶众腾光电科技有限公司 一种6050led封装支架及led灯珠

Also Published As

Publication number Publication date
CN104904025B (zh) 2018-04-03
US20150357527A1 (en) 2015-12-10
JPWO2014119146A1 (ja) 2017-01-26
JP6105638B2 (ja) 2017-03-29
WO2014119146A1 (ja) 2014-08-07

Similar Documents

Publication Publication Date Title
US10950769B2 (en) Light emitting diode (LED) components including multiple LED dies that are attached to lead frames
JP6149487B2 (ja) 発光装置の製造方法および発光装置
US10043951B2 (en) Light emitting device package and method of manufacturing the same
KR101974354B1 (ko) 발광소자 패키지 및 그 제조 방법
US20120193662A1 (en) Reflective mounting substrates for flip-chip mounted horizontal leds
US9214607B1 (en) Wire bonded light emitting diode (LED) components including reflective layer
TWI644454B (zh) Light-emitting diode structure
US8735933B2 (en) Light emitting diode package and method of manufacturing the same
US9806239B2 (en) Light emitting device
US20140134766A1 (en) Method of manufacturing light emitting device package
TWI406435B (zh) 發光二極體製造方法
KR20160037471A (ko) 발광 소자 패키지
US9831380B2 (en) Method of manufacturing semiconductor device package
KR20130101467A (ko) 발광 다이오드 패키지 및 그것을 제조하는 방법
CN104904025A (zh) 发光装置的制造方法和发光装置
TWI425613B (zh) Led燈條結構及其製造方法
KR20150042954A (ko) 측면발광 발광 장치 및 그 제조 방법
US9543487B2 (en) Light-emitting device and method of manufacturing the same
TW201421750A (zh) 發光二極體
KR20120064838A (ko) 발광다이오드 패키지 및 그 제조방법
US10193032B2 (en) Method for manufacturing light emitting device
US20190334068A1 (en) Light emitting device and method of manufacturing the light emitting device
JP2008258350A (ja) 発光装置
TWI509843B (zh) 發光二極體的封裝結構
KR101288911B1 (ko) 발광 모듈

Legal Events

Date Code Title Description
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20180403