CN104900509A - 金刚石线切割硅片的表面处理方法及制绒方法 - Google Patents
金刚石线切割硅片的表面处理方法及制绒方法 Download PDFInfo
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- CN104900509A CN104900509A CN201510306801.5A CN201510306801A CN104900509A CN 104900509 A CN104900509 A CN 104900509A CN 201510306801 A CN201510306801 A CN 201510306801A CN 104900509 A CN104900509 A CN 104900509A
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- silicon chip
- diamond wire
- wire saw
- etching
- cleaning
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 167
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 166
- 239000010703 silicon Substances 0.000 title claims abstract description 166
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 104
- 239000010432 diamond Substances 0.000 title claims abstract description 104
- 238000000034 method Methods 0.000 title claims abstract description 64
- 238000005520 cutting process Methods 0.000 title claims abstract description 23
- 238000004381 surface treatment Methods 0.000 title claims abstract description 19
- 235000012431 wafers Nutrition 0.000 title abstract 12
- 238000005530 etching Methods 0.000 claims abstract description 63
- 238000004140 cleaning Methods 0.000 claims abstract description 49
- 239000012530 fluid Substances 0.000 claims abstract description 22
- 229910021645 metal ion Inorganic materials 0.000 claims abstract description 22
- 230000008569 process Effects 0.000 claims abstract description 21
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 17
- 238000006243 chemical reaction Methods 0.000 claims abstract description 14
- 230000003647 oxidation Effects 0.000 claims abstract description 14
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 14
- 238000003486 chemical etching Methods 0.000 claims abstract description 13
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 11
- 239000008367 deionised water Substances 0.000 claims abstract description 11
- 239000007800 oxidant agent Substances 0.000 claims abstract description 11
- 239000000126 substance Substances 0.000 claims abstract description 10
- 230000003197 catalytic effect Effects 0.000 claims abstract description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910021641 deionized water Inorganic materials 0.000 claims abstract description 6
- 239000011259 mixed solution Substances 0.000 claims abstract description 5
- 239000000243 solution Substances 0.000 claims description 36
- 235000008216 herbs Nutrition 0.000 claims description 17
- 210000002268 wool Anatomy 0.000 claims description 17
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 16
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 12
- 230000001590 oxidative effect Effects 0.000 claims description 10
- 230000002000 scavenging effect Effects 0.000 claims description 9
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 8
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 7
- 239000002362 mulch Substances 0.000 claims description 7
- 229920005591 polysilicon Polymers 0.000 claims description 7
- -1 gold ion Chemical class 0.000 claims description 6
- 239000003054 catalyst Substances 0.000 claims description 5
- 238000004506 ultrasonic cleaning Methods 0.000 claims description 5
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 claims description 3
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 claims description 3
- 229910001431 copper ion Inorganic materials 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229930002839 ionone Natural products 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 3
- 230000035484 reaction time Effects 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 4
- 239000002923 metal particle Substances 0.000 abstract description 4
- 229910021419 crystalline silicon Inorganic materials 0.000 abstract description 2
- 239000000377 silicon dioxide Substances 0.000 abstract description 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- 239000002245 particle Substances 0.000 description 17
- 239000004570 mortar (masonry) Substances 0.000 description 13
- 238000005516 engineering process Methods 0.000 description 11
- 239000010949 copper Substances 0.000 description 10
- 230000006872 improvement Effects 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 241000208340 Araliaceae Species 0.000 description 5
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 5
- 235000003140 Panax quinquefolius Nutrition 0.000 description 5
- 235000008434 ginseng Nutrition 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 229910010271 silicon carbide Inorganic materials 0.000 description 4
- 239000002253 acid Substances 0.000 description 3
- 239000003513 alkali Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 3
- 239000002002 slurry Substances 0.000 description 3
- 238000012876 topography Methods 0.000 description 3
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000012809 cooling fluid Substances 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000033001 locomotion Effects 0.000 description 2
- 238000000992 sputter etching Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 239000002585 base Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 235000013312 flour Nutrition 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000007704 wet chemistry method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
- H01L31/182—Special manufacturing methods for polycrystalline Si, e.g. Si ribbon, poly Si ingots, thin films of polycrystalline Si
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/546—Polycrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Photovoltaic Devices (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Weting (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201510306801.5A CN104900509B (zh) | 2015-06-04 | 2015-06-04 | 金刚石线切割硅片的表面处理方法及制绒方法 |
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CN201510306801.5A CN104900509B (zh) | 2015-06-04 | 2015-06-04 | 金刚石线切割硅片的表面处理方法及制绒方法 |
Publications (2)
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CN104900509A true CN104900509A (zh) | 2015-09-09 |
CN104900509B CN104900509B (zh) | 2017-10-24 |
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CN201510306801.5A Active CN104900509B (zh) | 2015-06-04 | 2015-06-04 | 金刚石线切割硅片的表面处理方法及制绒方法 |
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Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105304734A (zh) * | 2015-11-03 | 2016-02-03 | 苏州旭环光伏科技有限公司 | 一种多晶硅片制绒辅助剂及其应用方法 |
CN105463583A (zh) * | 2015-12-11 | 2016-04-06 | 奥特斯维能源(太仓)有限公司 | 一种金刚线切割多晶硅片的制绒方法 |
CN105543979A (zh) * | 2015-12-11 | 2016-05-04 | 奥特斯维能源(太仓)有限公司 | 一种金属催化金刚线切割多晶硅片的湿法制绒工艺 |
CN105576080A (zh) * | 2016-01-29 | 2016-05-11 | 江西赛维Ldk太阳能高科技有限公司 | 一种金刚线切割多晶硅片的单面制绒方法及单面制绒的金刚线切割多晶硅片 |
CN105679882A (zh) * | 2016-03-29 | 2016-06-15 | 盐城阿特斯协鑫阳光电力科技有限公司 | 一种金刚线切割的多晶硅片的制绒方法 |
CN105887206A (zh) * | 2016-06-26 | 2016-08-24 | 河南盛达光伏科技有限公司 | 单晶硅线切割碎片清洗处理方法 |
CN106505113A (zh) * | 2016-11-11 | 2017-03-15 | 苏州晶牧光材料科技有限公司 | 晶体硅太阳电池的绒面制备方法 |
CN106498502A (zh) * | 2016-12-06 | 2017-03-15 | 南京理工大学 | 一种利用金属辅助刻蚀具有木材反向结构硅表面的方法 |
CN106625076A (zh) * | 2017-01-22 | 2017-05-10 | 朱胜利 | 一种金刚石线切割硅片的表面处理装置及表面处理方法 |
CN107452610A (zh) * | 2016-04-29 | 2017-12-08 | 英飞凌科技股份有限公司 | 用于处理半导体区域的方法 |
CN107546285A (zh) * | 2017-08-24 | 2018-01-05 | 嘉兴尚能光伏材料科技有限公司 | 一种晶体硅太阳能电池表面微纳米结构的制备方法 |
CN107749402A (zh) * | 2017-10-25 | 2018-03-02 | 中国科学院物理研究所 | 直拉单晶硅片的结构缺陷检测方法 |
CN107887458A (zh) * | 2017-10-11 | 2018-04-06 | 昆明理工大学 | 一种铜催化刻蚀硅制备形貌可控绒面的方法 |
CN109580635A (zh) * | 2018-12-03 | 2019-04-05 | 高佳太阳能股份有限公司 | 一种金刚石切割硅片片厚不均原因快速确定方法 |
CN109686818A (zh) * | 2018-12-25 | 2019-04-26 | 浙江晶科能源有限公司 | 一种制备单晶硅倒金字塔绒面的方法 |
CN110137078A (zh) * | 2018-02-09 | 2019-08-16 | 株式会社东芝 | 蚀刻方法、半导体芯片的制造方法及物品的制造方法 |
JP2021002689A (ja) * | 2018-02-09 | 2021-01-07 | 株式会社東芝 | エッチング方法、半導体チップの製造方法及び物品の製造方法 |
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US5386796A (en) * | 1991-03-14 | 1995-02-07 | Shin-Etsu Handotai Co., Ltd. | Method for testing quality of silicon wafer |
US5534112A (en) * | 1990-11-22 | 1996-07-09 | Shin-Etsu Handotai Co., Ltd. | Method for testing electrical properties of silicon single crystal |
CN104505437A (zh) * | 2014-12-30 | 2015-04-08 | 江西赛维Ldk太阳能高科技有限公司 | 一种金刚线切割多晶硅片的制绒预处理液、制绒预处理方法和制绒预处理硅片及其应用 |
CN104576353A (zh) * | 2014-12-10 | 2015-04-29 | 昆明理工大学 | 一种Cu纳米颗粒两步辅助刻蚀制备纳米多孔硅的方法 |
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2015
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Patent Citations (4)
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US5534112A (en) * | 1990-11-22 | 1996-07-09 | Shin-Etsu Handotai Co., Ltd. | Method for testing electrical properties of silicon single crystal |
US5386796A (en) * | 1991-03-14 | 1995-02-07 | Shin-Etsu Handotai Co., Ltd. | Method for testing quality of silicon wafer |
CN104576353A (zh) * | 2014-12-10 | 2015-04-29 | 昆明理工大学 | 一种Cu纳米颗粒两步辅助刻蚀制备纳米多孔硅的方法 |
CN104505437A (zh) * | 2014-12-30 | 2015-04-08 | 江西赛维Ldk太阳能高科技有限公司 | 一种金刚线切割多晶硅片的制绒预处理液、制绒预处理方法和制绒预处理硅片及其应用 |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105304734A (zh) * | 2015-11-03 | 2016-02-03 | 苏州旭环光伏科技有限公司 | 一种多晶硅片制绒辅助剂及其应用方法 |
CN105463583A (zh) * | 2015-12-11 | 2016-04-06 | 奥特斯维能源(太仓)有限公司 | 一种金刚线切割多晶硅片的制绒方法 |
CN105543979A (zh) * | 2015-12-11 | 2016-05-04 | 奥特斯维能源(太仓)有限公司 | 一种金属催化金刚线切割多晶硅片的湿法制绒工艺 |
CN105576080A (zh) * | 2016-01-29 | 2016-05-11 | 江西赛维Ldk太阳能高科技有限公司 | 一种金刚线切割多晶硅片的单面制绒方法及单面制绒的金刚线切割多晶硅片 |
CN105679882A (zh) * | 2016-03-29 | 2016-06-15 | 盐城阿特斯协鑫阳光电力科技有限公司 | 一种金刚线切割的多晶硅片的制绒方法 |
CN107452610A (zh) * | 2016-04-29 | 2017-12-08 | 英飞凌科技股份有限公司 | 用于处理半导体区域的方法 |
CN107452610B (zh) * | 2016-04-29 | 2021-01-15 | 英飞凌科技股份有限公司 | 用于处理半导体区域的方法 |
CN105887206B (zh) * | 2016-06-26 | 2018-10-23 | 河南盛达光伏科技有限公司 | 单晶硅线切割碎片清洗处理方法 |
CN105887206A (zh) * | 2016-06-26 | 2016-08-24 | 河南盛达光伏科技有限公司 | 单晶硅线切割碎片清洗处理方法 |
CN106505113A (zh) * | 2016-11-11 | 2017-03-15 | 苏州晶牧光材料科技有限公司 | 晶体硅太阳电池的绒面制备方法 |
CN106505113B (zh) * | 2016-11-11 | 2018-08-24 | 苏州晶牧光材料科技有限公司 | 晶体硅太阳电池的绒面制备方法 |
CN106498502A (zh) * | 2016-12-06 | 2017-03-15 | 南京理工大学 | 一种利用金属辅助刻蚀具有木材反向结构硅表面的方法 |
CN106625076A (zh) * | 2017-01-22 | 2017-05-10 | 朱胜利 | 一种金刚石线切割硅片的表面处理装置及表面处理方法 |
CN107546285A (zh) * | 2017-08-24 | 2018-01-05 | 嘉兴尚能光伏材料科技有限公司 | 一种晶体硅太阳能电池表面微纳米结构的制备方法 |
CN107887458A (zh) * | 2017-10-11 | 2018-04-06 | 昆明理工大学 | 一种铜催化刻蚀硅制备形貌可控绒面的方法 |
CN107749402B (zh) * | 2017-10-25 | 2020-03-20 | 中国科学院物理研究所 | 直拉单晶硅片的结构缺陷检测方法 |
CN107749402A (zh) * | 2017-10-25 | 2018-03-02 | 中国科学院物理研究所 | 直拉单晶硅片的结构缺陷检测方法 |
CN110137078A (zh) * | 2018-02-09 | 2019-08-16 | 株式会社东芝 | 蚀刻方法、半导体芯片的制造方法及物品的制造方法 |
JP2019140225A (ja) * | 2018-02-09 | 2019-08-22 | 株式会社東芝 | エッチング方法、半導体チップの製造方法及び物品の製造方法 |
US10854466B2 (en) | 2018-02-09 | 2020-12-01 | Kabushiki Kaisha Toshiba | Etching method, method of manufacturing semiconductor chip, and method of manufacturing article |
JP2021002689A (ja) * | 2018-02-09 | 2021-01-07 | 株式会社東芝 | エッチング方法、半導体チップの製造方法及び物品の製造方法 |
CN110137078B (zh) * | 2018-02-09 | 2024-01-12 | 株式会社东芝 | 蚀刻方法、半导体芯片的制造方法及物品的制造方法 |
CN109580635A (zh) * | 2018-12-03 | 2019-04-05 | 高佳太阳能股份有限公司 | 一种金刚石切割硅片片厚不均原因快速确定方法 |
CN109686818A (zh) * | 2018-12-25 | 2019-04-26 | 浙江晶科能源有限公司 | 一种制备单晶硅倒金字塔绒面的方法 |
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