CN104752444A - 显示基板及其制备方法、显示面板和显示装置 - Google Patents
显示基板及其制备方法、显示面板和显示装置 Download PDFInfo
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- CN104752444A CN104752444A CN201510205166.1A CN201510205166A CN104752444A CN 104752444 A CN104752444 A CN 104752444A CN 201510205166 A CN201510205166 A CN 201510205166A CN 104752444 A CN104752444 A CN 104752444A
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- 238000002360 preparation method Methods 0.000 title claims abstract description 51
- 239000000758 substrate Substances 0.000 title claims abstract description 37
- 239000002184 metal Substances 0.000 claims abstract description 88
- 229910052751 metal Inorganic materials 0.000 claims abstract description 88
- 239000010409 thin film Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 claims abstract description 20
- 230000008569 process Effects 0.000 claims abstract description 18
- 230000004888 barrier function Effects 0.000 claims description 41
- 239000010408 film Substances 0.000 claims description 33
- 238000002310 reflectometry Methods 0.000 claims description 13
- 229910016006 MoSi Inorganic materials 0.000 claims description 7
- 238000001259 photo etching Methods 0.000 claims description 7
- 208000034699 Vitreous floaters Diseases 0.000 claims 3
- 239000011159 matrix material Substances 0.000 abstract description 47
- 238000004519 manufacturing process Methods 0.000 abstract description 20
- 239000010410 layer Substances 0.000 description 107
- 230000000694 effects Effects 0.000 description 15
- 238000010586 diagram Methods 0.000 description 13
- 239000000463 material Substances 0.000 description 10
- 238000005516 engineering process Methods 0.000 description 7
- 238000009413 insulation Methods 0.000 description 7
- 229910001092 metal group alloy Inorganic materials 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 230000008054 signal transmission Effects 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000009931 harmful effect Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910004205 SiNX Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78633—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a light shield
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- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
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- G02F1/136222—Colour filters incorporated in the active matrix substrate
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
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- G02F1/136286—Wiring, e.g. gate line, drain line
- G02F1/13629—Multilayer wirings
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- G—PHYSICS
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
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- G02F1/136286—Wiring, e.g. gate line, drain line
- G02F1/136295—Materials; Compositions; Manufacture processes
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
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Abstract
本发明涉及一种显示基板及其制备方法、显示面板和显示装置。所述显示基板包括多个像素,每个像素具有一个显示区,多个像素的显示区之间为非显示区,所述显示基板还包括保护金属层,所述保护金属层覆盖所述非显示区。在上述显示基板中,保护金属层将显示基板的非显示区覆盖,将显示基板上的薄膜晶体管和各信号线等结构遮蔽,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
Description
技术领域
本发明涉及显示技术领域,具体地,涉及一种显示基板及其制备方法、显示面板和显示装置。
背景技术
薄膜晶体管液晶显示器(Thin Film Transistor Liquid CrystalDisplay,以下简称为TFT LCD)包括对盒在一起的第一基板和第二基板,以及位于第一基板和第二基板之间的液晶层。
在已有的一种TFT LCD中,第一基板上制备有薄膜晶体管,所述薄膜晶体管用作驱动开关;第二基板上制备有彩膜和黑矩阵,所述彩膜用于实现彩色显示,所述黑矩阵用于遮蔽薄膜晶体管和各信号线。在该种TFT LCD中,第一基板和第二基板对盒时不可避免地会存在对盒偏差,因此,黑矩阵的宽度必须设置地较大,以便在存在对盒偏差的情况下,能够将薄膜晶体管和各信号线遮蔽;而黑矩阵的宽度增大,会降低显示面板的开口率,进而影响显示面板的亮度和画面品质。
在已有的另一种TFT LCD中,将薄膜晶体管、彩膜和黑矩阵制备在一张基板上,即COA技术(Color filter On Array,彩膜制备在阵列基板上),该TFT LCD的显示面板的结构如图1所示。具体地,该TFT LCD的显示面板包括第一基板1、第二基板2、液晶层3;第一基板1和第二基板2之间设有隔垫物4,以维持第一基板1和第二基板2之间的距离,即液晶层3的厚度;第一基板1上设置有薄膜晶体管10、第一绝缘层11、黑矩阵12、彩膜13、平坦化层14、像素电极15、第二绝缘层16、公共电极17;薄膜晶体管10包括栅极100、栅绝缘层101、有源层102、源极103、漏极104。其中,第一绝缘层11、第二绝缘层16一般由硅的氮化物(SiNx)制成。而上述各结构的位置连接关系如图3所示,在此不再赘述。
在上述TFT LCD中,薄膜晶体管10、彩膜13和黑矩阵12制备在第一基板1上,这样可以避免第一基板1和第二基板2的对盒偏差影响黑矩阵12遮蔽薄膜晶体管10和各信号线,使黑矩阵12的宽度无需设置地较大,从而,与上一种TFT LCD相比,该TFT LCD可以提升开口率,进而提升显示面板的亮度和画面品质。
但在上述采用COA技术的TFT LCD中,在第一绝缘层11上形成黑矩阵12的图形具有较大的难度,具体表现为:基于现有的制备黑矩阵12的材料的特性,难以满足显示面板高分辨率的要求;黑矩阵12的材料与第一绝缘层11的材料(SiNx等)之间的粘附力不足,从而会导致显示面板的结构不稳定;在形成黑矩阵12图形的光刻工艺的显影步骤后,第一绝缘层11的表面容易残留黑矩阵材料,从而会导致显示不良。
发明内容
本发明旨在至少解决现有技术中存在的技术问题之一,提出了一种显示基板及其制备方法、显示面板和显示装置,其可以避免黑矩阵制备过程中的技术难点和黑矩阵制备过程中存在的问题,从而减少显示基板制备过程中的工艺难点。
为实现本发明的目的而提供一种显示基板,其包括多个像素,每个像素具有一个显示区,多个像素的显示区之间为非显示区,所述显示基板还包括保护金属层,所述保护金属层覆盖所述非显示区。
其中,所述保护金属层的反射率不大于20%。
其中,所述保护金属层由MoNbO、MoNbON、MoTiO、MoTiON、MoSi中的至少一种制成。
其中,所述显示基板包括公共电极,且所述公共电极由ITO、ITZO、IGZO、IZO中的至少一种制成。
其中,所述保护金属层与所述公共电极接触。
其中,所述显示基板还包括薄膜晶体管、彩膜、像素电极和公共电极。
其中,所述薄膜晶体管设置在衬底基板上,且所述薄膜晶体管上设有第一绝缘层;所述彩膜设置在所述第一绝缘层上,且所述彩膜上设有平坦化层;所述像素电极设置在所述平坦化层上,且所述像素电极上设有第二绝缘层;所述保护金属层设置在所述第二绝缘层上,且所述保护金属层上设有所述公共电极。
作为另一个技术方案,本发明还提供一种显示基板的制备方法,所述显示基板的制备方法用于制备本发明提供的上述显示基板;所述显示基板的制备方法包括:在显示基板的非显示区形成保护金属层的步骤。
其中,通过光刻工艺制备所述保护金属层。
其中,所述显示基板的制备方法还包括:
在衬底基板上形成薄膜晶体管的步骤;
在薄膜晶体管上形成第一绝缘层的步骤;
在第一绝缘层上形成彩膜的步骤;
在所述彩膜上形成平坦化层的步骤;
在所述平坦化层上形成像素电极的步骤;
在所述像素电极上形成第二绝缘层的步骤;所述保护金属层形成在所述第二绝缘层上;
在所述保护金属层上形成公共电极的步骤。
作为另一个技术方案,本发明还提供一种显示面板,所述显示面板包括本发明提供的上述显示基板。
作为另一个技术方案,本发明还提供一种显示装置,所述显示装置包括本发明提供的上述显示面板。
本发明具有以下有益效果:
本发明提供的显示基板,其保护金属层将显示基板的非显示区覆盖,将显示基板上的薄膜晶体管和各信号线等结构遮蔽,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
本发明提供的显示基板的制备方法,在显示基板的非显示区形成保护金属层,该保护金属层会将显示基板上的薄膜晶体管和各信号线等结构遮蔽,避免对显示造成不良影响,从而可以保证较好的显示效果。同时,由于保护金属层会将薄膜晶体管和各信号线等结构遮蔽,在制备显示基板时就无需再制备黑矩阵,从而可以减少制备显示基板的工艺流程,提高生产效率,以及降低生产成本,而且,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
本发明提供的显示面板,其采用本发明提供的上述显示基板,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
本发明提供的显示装置,其采用本发明提供的上述显示面板,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
附图说明
附图是用来提供对本发明的进一步理解,并且构成说明书的一部分,与下面的具体实施方式一起用于解释本发明,但并不构成对本发明的限制。在附图中:
图1为现有采用COA技术的显示面板的示意图;
图2为本发明实施方式提供的显示基板的示意图;
图3为图2所示显示基板的A-A剖视图;
图4为保护金属层的另一种结构的示意图;
图5为本发明实施方式提供的显示基板的制备方法的流程图;
图6为薄膜晶体管制备完成后的显示基板的示意图;
图7为栅极制备完成后的显示基板的示意图;
图8为第一绝缘层制备完成后的显示基板的示意图;
图9为彩膜制备完成后的显示基板的示意图;
图10为平坦化层制备完成后的显示基板的示意图;
图11为像素电极制备完成后的显示基板的示意图;
图12为第二绝缘层制备完成后的显示基板的示意图;
图13为保护金属层制备完成后的显示基板的示意图;
图14为公共电极制备完成后的显示基板的示意图。
其中,附图标记:
1:第一基板/显示基板;2:第二基板/对盒基板;3:液晶层;4:隔垫物;10:薄膜晶体管;11:第一绝缘层;12:黑矩阵;13:彩膜;14:平坦化层;15:像素电极;16:第二绝缘层;17:公共电极;18:保护金属层;100:栅极;101:栅绝缘层;102:有源层;103:源极;104:漏极;180:保护金属层的第一层结构;181:保护金属层的第二层结构。
具体实施方式
以下结合附图对本发明的具体实施方式进行详细说明。应当理解的是,此处所描述的具体实施方式仅用于说明和解释本发明,并不用于限制本发明。
本发明提供一种显示基板的实施方式,图2为本发明实施方式提供的显示基板的示意图。如图2所示,在本实施方式中,所述显示基板1包括多个像素,每个像素具有一个显示区a,多个像素的显示区a之间为非显示区,所述显示基板1还包括保护金属层18,所述保护金属层18覆盖所述非显示区。
具体地,每个像素的所述显示区a一般为该像素内的像素电极所在区域,非显示区一般为设置薄膜晶体管和各种信号线的区域。现有技术中,一般在非显示区设置黑矩阵,用于将薄膜晶体管和各信号线遮蔽;但部分情况下,黑矩阵也可以将像素电极的边缘区域遮蔽,从而使像素电极的边缘区域也为非显示区。
可以理解,保护金属层18由金属制成,其本身具有不透光的特性。本实施方式中,在非显示区设置保护金属层18,且所述保护金属层18覆盖所述非显示区,使保护金属层18可以遮蔽薄膜晶体管和各信号线等,即:保护金属层18可以实现现有技术中黑矩阵的作用,从而在本实施方式的显示基板中,可以省去黑矩阵,这样就可以减少生产工艺的流程,提高生产效率,以及,降低生产成本;同时,与现有技术相比,这样就不存在:黑矩阵材料特性难以满足显示面板高分辨率的要求,黑矩阵材料与第一绝缘层的材料之间的粘附力不足,以及在在显影步骤后,第一绝缘层的表面容易残留黑矩阵材料等问题,从而可以减少显示基板制备过程中的工艺难度。
所述保护金属层18优选采用低反射率的金属制成,这样可以减少环境光照射至保护金属层18上产生的反射,降低保护金属层18上的反射对显示效果造成的影响。具体地,所述保护金属层的反射率优选为不大于20%。
进一步地,所述保护金属层18可以由以下具有较低反射率的金属或金属合金中的至少一种制成:MoNbO、MoNbON、MoTiO、MoTiON、MoSi,以使保护金属层18具有较低的反射率,保证显示效果。
如图3所示,显示基板1包括薄膜晶体管10、彩膜13、像素电极15和公共电极17;其中,薄膜晶体管10制备在衬底基板S上,且所述薄膜晶体管10上设有第一绝缘层11;所述彩膜13设置在所述第一绝缘层11上,且所述彩膜13上设有平坦化层14;所述像素电极15设置在所述平坦化层14上,且所述像素电极15上设有第二绝缘层16;所述保护金属层18设置在所述第二绝缘层16上,且所述保护金属层18上设有所述公共电极17。
其中,薄膜晶体管10包括栅极100、栅绝缘层101、有源层102、源极103和漏极104。如图3所示,所述栅极100直接制备在衬底基板S上,所述栅绝缘层101设置在所述栅极100上,所述有源层102设置在所述栅绝缘层101上,所述源极103和漏极104制备在所述有源层102上。
需要说明的是,在本实施方式中,薄膜晶体管10内栅极100、栅绝缘层101、有源层102、源极103和漏极104等各层的位置并不限于图3所示,其还可以为其他任何可以实现薄膜晶体管功能的结构,如顶栅型结构,即栅极100位于有源层102上方的情形。同样地,在本实施方式中,薄膜晶体管10、彩膜13、像素电极15、公共电极17、保护金属层18等各层的结构也不限于图3所示,其还可以为其他任何可以实现显示功能,且保护金属层18覆盖非显示区的结构。
在本实施方式中,所述公共电极17可以由ITO、ITZO、IGZO、IZO中的至少一种制成。在此情况下,优选地,所述保护金属层18与所述公共电极17接触,如图3所示。已知的是,金属,如铜、铁、银、金等材料的电阻率小于上述ITO、ITZO、IGZO、IZO的电阻率,因此,当保护金属层18采用上述金属材料制备时,其与公共电极17接触,可以降低公共电极线上信号传输的电阻,从而有助于保证公共电极线上信号的一致性,提高显示效果。
此外,对于MoNbO、MoNbON、MoTiO、MoTiON、MoSi等低反射率的金属合金材料,在其中掺杂的O、N等的含量较小的情况下,其电阻率也小于上述ITO、ITZO、IGZO、IZO的电阻率,因此,当保护金属层18采用上述O、N含量较小的低反射率材料时,在如图3所示的结构中,其与公共电极17接触,可以降低公共电极线上信号传输的电阻,从而有助于保证公共电极线上信号的一致性,提高显示效果。
而在上述MoNbO、MoNbON、MoTiO、MoTiON、MoSi等低反射率的金属合金材料中掺杂的O、N等的含量较高时,其电阻率较高,可以理解,若仅采用上述低反射率材料制备保护金属层18,在保护金属层18与公共电极17接触时,无法有效降低公共电极线上信号传输的电阻。在此情况下,保护金属层18可以包括多层结构,如图4所示,保护金属层18包括位于下方的第一层结构180,以及位于第一层结构180上方的第二层结构181;所述第一层结构180的电阻率较低,具体地,所述第一层结构180可以包括依次设置的MoNb层、AlNd层和MoNb层,如图4所示;所述第二层结构181采用上述掺杂的O、N等的含量较高的MoNbO、MoNbON、MoTiO、MoTiON、MoSi等低反射率的金属合金材料;并且,保护金属层18位于公共电极17的上方;在图4所示保护金属层18中,与公共电极17接触的为保护金属层18的低电阻率部分,这样可以降低公共电极线上信号传输的电阻,从而有助于保证公共电极线上信号的一致性,提高显示效果;而位于上方的则为具有低反射率部分,这样可以避免光线照射在保护金属层18上,引起较强的反光,影响显示效果。当然,需要指出的是,第一层结构180并不限于图4所示的多层结构,其也可以为由Cu、Al、Mo、Ag等低电阻率金属形成的单层结构,这样可以减少保护金属层18的厚度,有助于显示基板的轻薄化。
本发明实施方式提供的显示基板,其保护金属层18将显示基板的非显示区覆盖,将显示基板上的薄膜晶体管和各信号线等结构遮蔽,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
本发明还提供一种显示基板的制备方法的实施方式,在本实施方式中,所述显示基板的制备方法用于本发明上述实施方式提供的显示基板;具体地,所述显示基板的制备方法包括:在显示基板的非显示区形成保护金属层的步骤。
在显示基板的非显示区形成保护金属层后,该保护金属层会将显示基板上的薄膜晶体管和各信号线等结构遮蔽,避免对显示造成不良影响,从而可以保证较好的显示效果。同时,由于保护金属层会将薄膜晶体管和各信号线等结构遮蔽,在制备显示基板时就无需再制备黑矩阵,从而可以减少制备显示基板的工艺流程,提高生产效率,以及降低生产成本,而且,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
具体地,可以通过光刻工艺制备所述保护金属层。所述光刻工艺包括以下步骤:沉积→涂覆光刻胶→曝光→显影→刻蚀→除胶。
在本实施方式的一个实施例中,除制备保护金属层的步骤外,如图5所示,所述显示基板的制备方法可以还包括以下步骤S1~S6,以及S8:
S1,在衬底基板上形成薄膜晶体管10;薄膜晶体管10制备完成后的显示基板的结构可以如图6所示。
具体地,在步骤S1中,通过多次光刻工艺制备栅极100,栅绝缘层101,有源层102,源极103和漏极104,获得薄膜晶体管结构。其中,制备完成的栅极100可以如图7所示。
S2,在薄膜晶体管10上形成第一绝缘层11;第一绝缘层11制备完成后的显示基板如图8所示。
具体地,步骤S2中制备所述第一绝缘层11的材料可以为硅的氮化物(SiNx)和/或硅的氧化物(SiOx)。
S3,在第一绝缘层11上形成彩膜13;彩膜13制备完成后的显示基板的结构如图9所示。
具体地,步骤S3中,可以通过三次光刻工艺依次形成红色滤光片、绿色滤光片和蓝色滤光片;需要说明的是,由于红色滤光片、绿色滤光片和蓝色滤光片的结构是已知的,因此在图9中,未将红色滤光片、绿色滤光片和蓝色滤光片区分。同时,应当理解,由于在图9中未将红色滤光片、绿色滤光片和蓝色滤光片区分,图9中所示的彩膜13制备完成后的平坦表面并不反映彩膜13制备完成后的表面的真实情形;实际中,彩膜13制备完成后的表面是不平坦的表面。
S4,在所述彩膜13上形成平坦化层14;平坦化层14制备完成后的显示基板的结构如图10所示。
由于彩膜13制备完成后形成的是不平坦的表面,在步骤S4中,制备平坦化层14,可以将使显示基板具有平坦的表面,以便于制备后续的其他结构。
S5,在所述平坦化层14上形成像素电极15;像素电极15制备完成后的显示基板的结构如图11所示。
S6,在所述像素电极15上形成第二绝缘层16;第二绝缘层16制备完成后的显示基板的结构如图12所示。
具体地,步骤S6中制备所述第二绝缘层16的材料可以为硅的氮化物(SiNx)和/或硅的氧化物(SiOx)。
在步骤S6之后,进行步骤S7;在步骤S7中,在第二绝缘层16上制备保护金属层18;保护金属层18制备完成后的显示基板的结构如图13所示。优选地,所述保护金属层18采用低反射率的金属或金属合金制备,这样可以减少环境光照射至保护金属层18上产生的反射,降低保护金属层18上的反射对显示效果造成的影响。具体地,所述保护金属层18采用以下金属或金属合金中的至少一种制成:MoNbO、MoNbON、MoTiO、MoTiON、MoSi。
S8,在所述保护金属层18上形成公共电极17;公共电极17形成后的显示基板的结构如图14所示。
具体地,步骤S8中,采用ITO、ITZO、IGZO、IZO等材料制备公共电极17。
根据上述步骤S1~S8,在一个显示基板上制备了薄膜晶体管10和彩膜13,以及像素电极15和公共电极17,即所述显示基板为采用COA技术的显示基板,该显示基板可以提高开口率,进而提高显示的亮度和显示效果。
在上述实施例中,包括形成保护金属层18的步骤,而不包括形成黑矩阵的步骤,但所形成的保护金属层18覆盖显示基板的非显示区,可以实现黑矩阵的作用,使省去形成黑矩阵的步骤不会对制备完成后的显示基板的显示效果造成影响。同时,省去形成黑矩阵的步骤可以减少制备显示基板的工艺流程,提高生产效率,以及降低生产成本,同时,还可以避免制备黑矩阵的工艺过程中的工艺难点。
此外,在上述实施例中,保护金属层18与公共电极17接触;而由于金属的电阻率低于ITO、ITZO、IGZO、IZO等的电阻率,可以理解,上述将保护金属层18与公共电极17接触的设置可以降低公共电极线上信号传输的电阻,从而有助于保证公共电极线上信号的一致性,提高显示效果。
本发明还提供一种显示面板的实施方式,在本实施方式中,所述显示面板包括本发明上述实施方式提供的显示基板。
本发明实施方式提供的显示面板,其采用本发明上述实施方式提供的显示基板,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
本发明还提供一种显示装置的实施方式,在本实施方式中,所述显示装置包括本发明上述实施方式提供的显示面板。
本发明实施方式提供的显示装置,其采用本发明上述实施方式提供的显示面板,可以省去黑矩阵,从而可以减少生产工艺流程,提高生产效率,降低生产成本;同时,还可以省去黑矩阵制备过程中的技术难点,从而有助于减少显示基板制备过程中的工艺难点。
可以理解的是,以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式,然而本发明并不局限于此。对于本领域内的普通技术人员而言,在不脱离本发明的精神和实质的情况下,可以做出各种变型和改进,这些变型和改进也视为本发明的保护范围。
Claims (12)
1.一种显示基板,包括多个像素,每个像素具有一个显示区,多个像素的显示区之间为非显示区,其特征在于,所述显示基板还包括保护金属层,所述保护金属层覆盖所述非显示区。
2.根据权利要求1所述的显示基板,其特征在于,所述保护金属层的反射率不大于20%。
3.根据权利要求2所述的显示基板,其特征在于,所述保护金属层由MoNbO、MoNbON、MoTiO、MoTiON、MoSi中的至少一种制成。
4.根据权利要求1所述的显示基板,其特征在于,所述显示基板包括公共电极,且所述公共电极由ITO、ITZO、IGZO、IZO中的至少一种制成。
5.根据权利要求4所述的显示基板,其特征在于,所述保护金属层与所述公共电极接触。
6.根据权利要求1所述的显示基板,其特征在于,所述显示基板还包括薄膜晶体管、彩膜、像素电极和公共电极。
7.根据权利要求6所述的显示基板,其特征在于,所述薄膜晶体管设置在衬底基板上,且所述薄膜晶体管上设有第一绝缘层;
所述彩膜设置在所述第一绝缘层上,且所述彩膜上设有平坦化层;
所述像素电极设置在所述平坦化层上,且所述像素电极上设有第二绝缘层;
所述保护金属层设置在所述第二绝缘层上,且所述保护金属层上设有所述公共电极。
8.一种显示基板的制备方法,其特征在于,所述显示基板的制备方法用于制备权利要求1~7任意一项所述的显示基板;所述显示基板的制备方法包括:
在显示基板的非显示区形成保护金属层的步骤。
9.根据权利要求8所述的显示基板的制备方法,其特征在于,通过光刻工艺制备所述保护金属层。
10.根据权利要求8所述的显示基板的制备方法,其特征在于,所述显示基板的制备方法还包括:
在衬底基板上形成薄膜晶体管的步骤;
在薄膜晶体管上形成第一绝缘层的步骤;
在第一绝缘层上形成彩膜的步骤;
在所述彩膜上形成平坦化层的步骤;
在所述平坦化层上形成像素电极的步骤;
在所述像素电极上形成第二绝缘层的步骤;所述保护金属层形成在所述第二绝缘层上;
在所述保护金属层上形成公共电极的步骤。
11.一种显示面板,其特征在于,所述显示面板包括权利要求1~7任意一项所述的显示基板。
12.一种显示装置,其特征在于,所述显示装置包括权利要求11所述的显示面板。
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