CN104659011A - 一种igbt模块的芯片焊接结构 - Google Patents

一种igbt模块的芯片焊接结构 Download PDF

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CN104659011A
CN104659011A CN201310593383.3A CN201310593383A CN104659011A CN 104659011 A CN104659011 A CN 104659011A CN 201310593383 A CN201310593383 A CN 201310593383A CN 104659011 A CN104659011 A CN 104659011A
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chip
dbc substrate
welding
solder side
chips
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马晋
吴磊
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CRRC Xian Yongdian Electric Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8338Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/83385Shape, e.g. interlocking features
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

一种IGBT模块的芯片焊接结构,包括芯片和DBC基板,所述芯片设置于所述DBC基板之上,所述DBC基板具有用于与所述芯片进行焊接的焊接面,所述芯片通过焊料焊接于所述DBC基板的焊接面上,所述焊接面为非平面,所述焊接面与所述焊料的接触面的横截面为连续的多点接触。本发明所揭示的IGBT模块的芯片焊接结构,通过将所述DBC基板的焊接面设计成非平面,使得所述焊接面与所述焊料的接触面的横截面形成连续的多点接触,如此设置,在焊接过程中,焊料受高温的影响融化,从而填满所述DBC基板的焊接面上凹槽中,增大了所述芯片和所述DBC基板之间的接触面积,提高了所述芯片的焊接效果。

Description

一种IGBT模块的芯片焊接结构
技术领域
本发明涉及电力半导体器件,尤其涉及一种IGBT模块的芯片焊接结构。
背景技术
IGBT(Insulated Gate Bipolar Transistor),绝缘栅双极型晶体管,是由BJT(双极型三极管)和MOS(绝缘栅型场效应管)组成的复合全控型电压驱动式功率半导体器件,兼有MOSFET的高输入阻抗和GTR的低导通压降两方面的优点。GTR饱和压降低,载流密度大,但驱动电流较大;MOSFET驱动功率很小,开关速度快,但导通压降大,载流密度小。IGBT综合了以上两种器件的优点,驱动功率小而饱和压降低,非常适合应用于直流电压为600V及以上的变流系统如交流电机、变频器、开关电源、照明电路、牵引传动等领域。
但是,现有的IGBT模块中,IGBT芯片或二极管芯片与DBC基板的固定方式如图1所示,由于IGBT芯片1′和二极管芯片2′的上下表面都是水平的,且DBC基板3′的表面平面度也是非常高的,当IGBT芯片1′和二极管芯片2′通过焊料焊接在DBC板3′上时,其焊接面积仅仅局限于IGBT芯片1′和二极管芯片2′的大小,芯片面积越小,焊接效果就越不牢固。实际使用中,IGBT芯片1′和二极管芯片2′很可能在这有限的面积上固定不牢固,在后期的工艺中被破坏,从而影响产品质量。
综上所述,需要设计一种更为安全可靠的IGBT模块的芯片焊接结构。
发明内容
本发明解决的问题是提供一种安全可靠的IGBT模块的芯片焊接结构。
为解决上述问题,本发明揭示了一种IGBT模块的芯片焊接结构,包括芯片和DBC基板,所述芯片设置于所述DBC基板之上,所述DBC基板具有用于与所述芯片进行焊接的焊接面,所述芯片通过焊料焊接于所述DBC基板的焊接面上,所述焊接面为非平面,所述焊接面与所述焊料的接触面的横截面为连续的多点接触。
优选地,所述焊接面的横截面为波浪状。
优选地,所述焊接面的横截面为连续的齿状。
优选地,所述焊接面的横截面为连续的椭圆顶状。
优选地,所述芯片为IGBT芯片、二极管芯片。
与现有技术相比,本发明具有以下优点:本发明所揭示的IGBT模块的芯片焊接结构,包括芯片和DBC基板,所述芯片设置于所述DBC基板之上,所述DBC基板具有用于与所述芯片进行焊接的焊接面,所述芯片通过焊料焊接于所述DBC基板的焊接面上,所述焊接面为非平面,所述焊接面与所述焊料的接触面的横截面为连续的多点接触。本发明所揭示的IGBT模块的芯片焊接结构,通过将所述DBC基板的焊接面设计成非平面,使得所述焊接面与所述焊料的接触面的横截面形成连续的多点接触,如此设置,在焊接过程中,焊料受高温的影响融化,从而填满所述DBC基板的焊接面上凹槽中,增大了所述芯片和所述DBC基板之间的接触面积,提高了所述芯片的焊接效果。
附图说明
图1是现有的IGBT模块的芯片焊接结构示意图;
图2是本发明优选实施例中DBC基板的焊接面的横截面为波浪状的结构示意图;
图3是本发明优选实施例中DBC基板的焊接面的横截面为连续的齿状的结构示意图。
具体实施方式
现有IGBT模块中,IGBT芯片或二极管芯片与DBC基板的固定方式如图1所示,由于IGBT芯片1′和二极管芯片2′的上下表面都是水平的,且DBC基板3′的表面平面度也是非常高的,当IGBT芯片1′和二极管芯片2′通过焊料焊接在DBC板3′上时,其焊接面积仅仅局限于IGBT芯片1′和二极管芯片2′的大小,芯片面积越小,焊接效果就越不牢固。实际使用中,IGBT芯片1′和二极管芯片2′很可能在这有限的面积上固定不牢固,在后期的工艺中被破坏,从而影响产品质量。
鉴于现有技术中存在的上述问题,本发明揭示了一种IGBT模块的芯片焊接结构,包括芯片和DBC基板,所述芯片设置于所述DBC基板之上,所述DBC基板具有用于与所述芯片进行焊接的焊接面,所述芯片通过焊料焊接于所述DBC基板的焊接面上,所述焊接面为非平面,所述焊接面与所述焊料的接触面的横截面为连续的多点接触。
优选地,所述焊接面的横截面为波浪状。
优选地,所述焊接面的横截面为连续的齿状。
优选地,所述焊接面的横截面为连续的椭圆顶状。
优选地,所述芯片为IGBT芯片、二极管芯片。
本发明所揭示的IGBT模块的芯片焊接结构,通过将所述DBC基板的焊接面设计成非平面,使得所述焊接面与所述焊料的接触面的横截面形成连续的多点接触,如此设置,在焊接过程中,焊料受高温的影响融化,从而填满所述DBC基板的焊接面上凹槽中,增大了所述芯片和所述DBC基板之间的接触面积,提高了所述芯片的焊接效果。
下面结合附图对本发明实施例中的技术方案进行详细地描述。
如图2所示,本发明揭示了一种IGBT模块的芯片焊接结构,包括IGBT芯片11、二极管芯片12和DBC基板13,IGBT芯片11、二极管芯片12设置于DBC基板13之上,DBC基板13具有用于与IGBT芯片11、二极管芯片12进行焊接的焊接面131,IGBT芯片11、二极管芯片12通过焊料焊接于DBC基板13的焊接面131上,图中阴影部分为焊料。在本发明优选实施例中,焊接面131为非平面,焊接面131与焊料的接触面的横截面为连续的多点接触。
具体地,焊接面131的横截面为波浪状,如此设置,焊接面131与IGBT芯片11、二极管芯片12之间形成多个凹槽,在焊接过程中,焊料受高温的影响融化,从而填满焊接面131上的凹槽中,增大了IGBT芯片11、二极管芯片12和DBC基板13之间的接触面积,提高了IGBT芯片11、二极管芯片12的焊接效果,增大了芯片的牢固程度。
同理,如图3所示,焊接面131的横截面为连续的齿状,焊接效果与当焊接面131的横截面为波浪状时的焊接效果相同。当然,焊接面131的横截面还可以为连续的椭圆顶状,或者变形为连续的梯形状或连续的矩形状,均能达到同样的技术效果,在此不再赘述。
本发明所揭示的IGBT模块的芯片焊接结构,通过将DBC基板13的焊接面设计成非平面,使得焊接面131与焊料的接触面的横截面形成连续的多点接触,如此设置,在焊接过程中,焊料受高温的影响融化,从而填满DBC基板13的焊接面131上凹槽中,增大了芯片和DBC基板13之间的接触面积,提高了芯片的焊接效果,增大焊接的牢固程度,提高了产品的可靠性和稳定性。同时,本发明所揭示的IGBT模块的芯片焊接结构,结构与加工工艺简单,无需增加产品成本。
对所公开的实施例的上述说明,使本领域专业技术人员能够实现或使用本发明。对这些实施例的多种修改对本领域的专业技术人员来说将是显而易见的,本文中所定义的一般原理可以在不脱离本发明的精神或范围的情况下,在其它实施例中实现。因此,本发明将不会被限制于本文所示的这些实施例,而是要符合与本文所公开的原理和新颖特点相一致的最宽的范围。

Claims (5)

1.一种IGBT模块的芯片焊接结构,包括芯片和DBC基板,所述芯片设置于所述DBC基板之上,所述DBC基板具有用于与所述芯片进行焊接的焊接面,所述芯片通过焊料焊接于所述DBC基板的焊接面上,其特征在于:所述焊接面为非平面,所述焊接面与所述焊料的接触面的横截面为连续的多点接触。
2.根据权利要求1所述的IGBT模块的芯片焊接结构,其特征在于:所述焊接面的横截面为波浪状。
3.根据权利要求1所述的IGBT模块的芯片焊接结构,其特征在于:所述焊接面的横截面为连续的齿状。
4.根据权利要求1所述的IGBT模块的芯片焊接结构,其特征在于:所述焊接面的横截面为连续的椭圆顶状。
5.根据1至4任一权利要求所述的IGBT模块的芯片焊接结构,其特征在于:所述芯片为IGBT芯片、二极管芯片。
CN201310593383.3A 2013-11-20 2013-11-20 一种igbt模块的芯片焊接结构 Pending CN104659011A (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107808879A (zh) * 2017-11-20 2018-03-16 深圳顺络电子股份有限公司 一种开关电源模组及其封装方法
CN111201683A (zh) * 2017-10-13 2020-05-26 库利克和索夫工业公司 导电端子、汇流条及其制造方法、以及组装相关的功率模块的方法
EP3940769A1 (de) * 2020-07-17 2022-01-19 Siemens Aktiengesellschaft Halbleitermodul mit zumindest einem halbleiterelement und einem substrat
CN115910933A (zh) * 2022-11-21 2023-04-04 无锡市博精电子有限公司 一种一体玻璃封装管座及其生产工艺

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111201683A (zh) * 2017-10-13 2020-05-26 库利克和索夫工业公司 导电端子、汇流条及其制造方法、以及组装相关的功率模块的方法
CN107808879A (zh) * 2017-11-20 2018-03-16 深圳顺络电子股份有限公司 一种开关电源模组及其封装方法
EP3940769A1 (de) * 2020-07-17 2022-01-19 Siemens Aktiengesellschaft Halbleitermodul mit zumindest einem halbleiterelement und einem substrat
CN115910933A (zh) * 2022-11-21 2023-04-04 无锡市博精电子有限公司 一种一体玻璃封装管座及其生产工艺

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