CN104246426B - 用于测量金属产品平坦度的方法和装置 - Google Patents

用于测量金属产品平坦度的方法和装置 Download PDF

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Publication number
CN104246426B
CN104246426B CN201380018128.4A CN201380018128A CN104246426B CN 104246426 B CN104246426 B CN 104246426B CN 201380018128 A CN201380018128 A CN 201380018128A CN 104246426 B CN104246426 B CN 104246426B
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product
flatness
segment
intensity
measuring
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CN104246426A (zh
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劳伦特·多雷尔
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Clecim SAS
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Siemens VAI Metals Technologies GmbH Austria
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201380018128.4A 2012-04-04 2013-04-03 用于测量金属产品平坦度的方法和装置 Active CN104246426B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20120290121 EP2647949A1 (fr) 2012-04-04 2012-04-04 Méthode et dispositif de mesure de planéité d'un produit métallique
EP12290121.8 2012-04-04
PCT/EP2013/057035 WO2013150075A1 (fr) 2012-04-04 2013-04-03 Méthode et dispositif de mesure de planéité d'un produit métallique

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CN104246426A CN104246426A (zh) 2014-12-24
CN104246426B true CN104246426B (zh) 2018-05-29

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US (1) US9488473B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (2) EP2647949A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR (1) KR102027617B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN104246426B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
BR (1) BR112014024756B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DK (1) DK2834594T3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
ES (1) ES2813371T3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IN (1) IN2014DN08371A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
PL (1) PL2834594T3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (2) WO2013149875A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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DE102014002454A1 (de) 2014-02-25 2015-08-27 Vdeh-Betriebsforschungsinstitut Gmbh Vorrichtung und Verfahren zum Ermitteln von Planheitsabweichungen beim Behandeln eines bandförmigen Guts
WO2017179243A1 (ja) * 2016-04-12 2017-10-19 新日鐵住金株式会社 被検査体撮像装置、被検査体撮像方法、表面検査装置及び表面検査方法
JP6883969B2 (ja) * 2016-10-07 2021-06-09 トピー工業株式会社 圧延材の疵検出システム
BR112019007654A2 (pt) * 2016-10-18 2019-07-02 Reifenhäuser GmbH & Co. KG Maschinenfabrik dispositivo de medição e método de medição / reconhecimento de padrões em linha em topografia de filme bidimensional ou tridimensional
JP6780533B2 (ja) * 2017-02-17 2020-11-04 日本製鉄株式会社 形状測定システム及び形状測定方法
FI3724622T3 (fi) * 2017-12-11 2024-03-13 Tata Steel Ijmuiden Bv Menetelmä ja järjestelmä liikkuvan metallinauhan lämpötilan mittaamiseksi
WO2019171474A1 (ja) * 2018-03-06 2019-09-12 日本製鉄株式会社 表面性状検査装置、表面性状検査方法及びプログラム
JP6954209B2 (ja) * 2018-03-30 2021-10-27 日本製鉄株式会社 鋼板の表面疵検査方法および表面疵検査装置
CN109001111A (zh) * 2018-08-01 2018-12-14 宁国市挚友合金钢材料有限公司 一种合金钢铁板材表平整度质检装置
DE102020000570A1 (de) 2020-01-29 2021-07-29 Siempelkamp Maschinen- Und Anlagenbau Gmbh Verfahren zur Überwachung eines Stahlbandes in einer kontinuierlichen Presse und kontinuierliche Presse
CN214407428U (zh) * 2021-01-27 2021-10-15 京东方科技集团股份有限公司 平面度检测设备及系统
CN113305170B (zh) * 2021-07-28 2021-10-08 佛山市腾华自动化机械有限公司 一种牵引机
EP4151325A1 (de) 2021-09-16 2023-03-22 Primetals Technologies Germany GmbH Planheitserkennung bei einem flachem walzgut
CN114505252B (zh) * 2022-01-18 2023-03-17 北新集团建材股份有限公司 一种石膏板的平整度检测系统
DE102022128499B3 (de) 2022-10-27 2023-11-16 Thyssenkrupp Steel Europe Ag Verfahren und Vorrichtung zur Bestimmung der Planheit eines Metallbandes

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WO2004063664A1 (de) * 2003-01-16 2004-07-29 Parsytec Computer Gmbh Optisches verfahren und vorrichtung zur oberflächenkontrolle
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CN1982869A (zh) * 2005-12-16 2007-06-20 西门子Vai金属技术股份公司 用于自动缺陷检测系统的具有发光二极管的灯和系统
CN101226158A (zh) * 2007-01-16 2008-07-23 富士胶片株式会社 透光性材料的缺陷检测装置及方法
EP1890134B1 (de) * 2006-08-17 2010-09-01 Massen Machine Vision Systems GmbH Überwachung der Qualität von gemusterten, insbesondere räumlich gekrümmten Oberflächen
CN102223959A (zh) * 2008-10-31 2011-10-19 西门子公司 检测金属带的平直度的方法和装置

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WO2004063664A1 (de) * 2003-01-16 2004-07-29 Parsytec Computer Gmbh Optisches verfahren und vorrichtung zur oberflächenkontrolle
CN1696672A (zh) * 2004-05-10 2005-11-16 富士通株式会社 表面检测装置和表面检测方法
CN1982869A (zh) * 2005-12-16 2007-06-20 西门子Vai金属技术股份公司 用于自动缺陷检测系统的具有发光二极管的灯和系统
EP1890134B1 (de) * 2006-08-17 2010-09-01 Massen Machine Vision Systems GmbH Überwachung der Qualität von gemusterten, insbesondere räumlich gekrümmten Oberflächen
CN101226158A (zh) * 2007-01-16 2008-07-23 富士胶片株式会社 透光性材料的缺陷检测装置及方法
CN102223959A (zh) * 2008-10-31 2011-10-19 西门子公司 检测金属带的平直度的方法和装置

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Publication number Publication date
KR20140141703A (ko) 2014-12-10
DK2834594T3 (da) 2020-08-03
BR112014024756B1 (pt) 2022-01-18
CN104246426A (zh) 2014-12-24
EP2834594A1 (fr) 2015-02-11
BR112014024756A2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2017-06-20
IN2014DN08371A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2015-05-08
ES2813371T3 (es) 2021-03-23
US9488473B2 (en) 2016-11-08
EP2647949A1 (fr) 2013-10-09
EP2834594B1 (fr) 2020-06-03
US20150116727A1 (en) 2015-04-30
KR102027617B1 (ko) 2019-10-01
WO2013150075A1 (fr) 2013-10-10
PL2834594T3 (pl) 2020-11-30
WO2013149875A1 (fr) 2013-10-10

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