IN2014DN08371A - - Google Patents

Info

Publication number
IN2014DN08371A
IN2014DN08371A IN8371DEN2014A IN2014DN08371A IN 2014DN08371 A IN2014DN08371 A IN 2014DN08371A IN 8371DEN2014 A IN8371DEN2014 A IN 8371DEN2014A IN 2014DN08371 A IN2014DN08371 A IN 2014DN08371A
Authority
IN
India
Application number
Inventor
Laurent Dorel
Original Assignee
Siemens Vai Metals Tech Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Vai Metals Tech Gmbh filed Critical Siemens Vai Metals Tech Gmbh
Publication of IN2014DN08371A publication Critical patent/IN2014DN08371A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/86Investigating moving sheets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2522Projection by scanning of the object the position of the object changing and being recorded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918Metal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/02Mechanical
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IN8371DEN2014 2012-04-04 2014-10-08 IN2014DN08371A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP20120290121 EP2647949A1 (en) 2012-04-04 2012-04-04 Method and device for measuring the flatness of a metal product
PCT/EP2013/057035 WO2013150075A1 (en) 2012-04-04 2013-04-03 Method and device for measuring the flatness of a metal product

Publications (1)

Publication Number Publication Date
IN2014DN08371A true IN2014DN08371A (en) 2015-05-08

Family

ID=48045479

Family Applications (1)

Application Number Title Priority Date Filing Date
IN8371DEN2014 IN2014DN08371A (en) 2012-04-04 2014-10-08

Country Status (10)

Country Link
US (1) US9488473B2 (en)
EP (2) EP2647949A1 (en)
KR (1) KR102027617B1 (en)
CN (1) CN104246426B (en)
BR (1) BR112014024756B1 (en)
DK (1) DK2834594T3 (en)
ES (1) ES2813371T3 (en)
IN (1) IN2014DN08371A (en)
PL (1) PL2834594T3 (en)
WO (2) WO2013149875A1 (en)

Families Citing this family (14)

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DE102014002454A1 (en) 2014-02-25 2015-08-27 Vdeh-Betriebsforschungsinstitut Gmbh Apparatus and method for determining flatness deviations when treating a strip-shaped Guts
CN107533014A (en) * 2016-04-12 2018-01-02 新日铁住金株式会社 Inspected body camera device, inspected body image capture method, surface examining device and surface inspecting method
JP6883969B2 (en) * 2016-10-07 2021-06-09 トピー工業株式会社 Defect detection system for rolled materials
CA3040586A1 (en) * 2016-10-18 2018-04-26 Reifenhauser Gmbh & Co. Kg Maschinenfabrik Measuring device and method of measurement / inline pattern recognition of a two or three-dimensional filmtopography
JP6780533B2 (en) * 2017-02-17 2020-11-04 日本製鉄株式会社 Shape measurement system and shape measurement method
FI3724622T3 (en) * 2017-12-11 2024-03-13 Tata Steel Ijmuiden Bv Method and system for measuring the temperature of a moving metal strip
WO2019171474A1 (en) * 2018-03-06 2019-09-12 日本製鉄株式会社 Surface property inspection device, surface property inspection method, and program
JP6954209B2 (en) * 2018-03-30 2021-10-27 日本製鉄株式会社 Surface defect inspection method and surface defect inspection device for steel sheets
CN109001111A (en) * 2018-08-01 2018-12-14 宁国市挚友合金钢材料有限公司 A kind of alloy iron and steel sheet and plate table flatness quality inspection device
CN214407428U (en) * 2021-01-27 2021-10-15 京东方科技集团股份有限公司 Flatness detection equipment and system
CN113305170B (en) * 2021-07-28 2021-10-08 佛山市腾华自动化机械有限公司 Traction machine
EP4151325A1 (en) 2021-09-16 2023-03-22 Primetals Technologies Germany GmbH Level detection in a flat rolling stock
CN114505252B (en) * 2022-01-18 2023-03-17 北新集团建材股份有限公司 Flatness detection system of gypsum board
DE102022128499B3 (en) 2022-10-27 2023-11-16 Thyssenkrupp Steel Europe Ag Method and device for determining the flatness of a metal strip

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DE3345198A1 (en) * 1983-12-14 1985-06-27 Kabel- Und Lackdrahtfabriken Gmbh, 6800 Mannheim Device for detecting surface defects of strand-shaped products
CA1229392A (en) * 1984-02-28 1987-11-17 Hirosato Yamane Method and apparatus for detection of surface defects of hot metal body
FR2595815B1 (en) * 1986-03-17 1991-04-26 Clecim Sa METHOD AND DEVICE FOR TRACKING FLAT DEFECTS ON A SHEET
FR2710145B1 (en) * 1993-09-17 1995-11-17 Gts Ind Method for measuring the shape and / or the flatness of a moving material, and device for its implementation.
EP0738382B1 (en) 1994-01-07 1999-04-28 Honeywell Ag Process for measuring the roughness of a material surface
FR2725512B1 (en) * 1994-10-07 1996-10-31 Lorraine Laminage DEVICE FOR EVALUATING THE PLANEITY OF A RUNNING PRODUCT
JPH08132773A (en) * 1994-11-10 1996-05-28 Fuji Xerox Co Ltd Manuscript reader and image forming apparatus having the same
JPH09311109A (en) * 1996-05-22 1997-12-02 Matsushita Electric Ind Co Ltd Defect inspection method and device utilizing light
FI20001568A (en) * 2000-06-30 2001-12-31 Thermo Radiometrie Oy Determination of the shapes of a surface
US7324681B2 (en) * 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
DE10301379A1 (en) * 2003-01-16 2004-07-29 Parsytec Computer Gmbh Method and device for surface control
DE102004002047A1 (en) * 2004-01-15 2005-08-04 Saurer Gmbh & Co. Kg Method and device for optical monitoring of a running fiber strand
JP4018071B2 (en) * 2004-03-30 2007-12-05 富士フイルム株式会社 Optical fiber defect detection apparatus and method
GB0409691D0 (en) * 2004-04-30 2004-06-02 Titech Visionsort As Apparatus and method
JP2005321319A (en) * 2004-05-10 2005-11-17 Fujitsu Ltd Apparatus and method for inspecting surface
US7801333B2 (en) * 2005-06-02 2010-09-21 Institut National D'optique Vision system and a method for scanning a traveling surface to detect surface defects thereof
FR2893519B1 (en) * 2005-11-23 2008-07-04 Vai Clecim Soc Par Actions Sim OPTICAL METHOD AND DEVICE FOR DETECTING SURFACE DEFECTS AND STRUCTURE OF A HOT PRODUCT THROUGHOUT
FR2895084B1 (en) * 2005-12-16 2008-02-08 Vai Clecim Soc Par Actions Sim POWER LIGHT EMITTING DIODE LIGHT RAIL AND METHOD FOR AN AUTOMATIC DEFECT DETECTION SYSTEM
FR2895688B1 (en) * 2005-12-30 2010-08-27 Pellenc Selective Technologies AUTOMATIC METHOD AND MACHINE FOR INSPECTING AND SORTING NON-METALLIC OBJECTS
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DE102006051538B4 (en) * 2006-10-27 2009-04-09 Schott Ag Method and device for determining the waviness of glass panes
JP5024935B2 (en) * 2007-01-16 2012-09-12 富士フイルム株式会社 Device and method for detecting defect of light transmitting member
EP2344286B1 (en) 2008-10-31 2013-11-20 Siemens Aktiengesellschaft Method and device for determining a flatness of a metal strip
JP5277414B2 (en) * 2008-12-26 2013-08-28 株式会社Sumco Detection device and detection method for colored foreign substances contained in quartz powder raw material
JP5263126B2 (en) 2009-11-09 2013-08-14 新日鐵住金株式会社 Method and apparatus for measuring optical shape of plate material
US8334986B2 (en) * 2010-02-25 2012-12-18 Corning Incorporated Methods and apparatus for the measurement of film thickness

Also Published As

Publication number Publication date
WO2013150075A1 (en) 2013-10-10
KR102027617B1 (en) 2019-10-01
US20150116727A1 (en) 2015-04-30
ES2813371T3 (en) 2021-03-23
EP2834594B1 (en) 2020-06-03
DK2834594T3 (en) 2020-08-03
EP2647949A1 (en) 2013-10-09
PL2834594T3 (en) 2020-11-30
EP2834594A1 (en) 2015-02-11
CN104246426A (en) 2014-12-24
US9488473B2 (en) 2016-11-08
WO2013149875A1 (en) 2013-10-10
BR112014024756B1 (en) 2022-01-18
CN104246426B (en) 2018-05-29
KR20140141703A (en) 2014-12-10
BR112014024756A2 (en) 2017-06-20

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