CN104181095B - 评价基板、环境试验装置和试样的评价方法 - Google Patents

评价基板、环境试验装置和试样的评价方法 Download PDF

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Publication number
CN104181095B
CN104181095B CN201410221848.7A CN201410221848A CN104181095B CN 104181095 B CN104181095 B CN 104181095B CN 201410221848 A CN201410221848 A CN 201410221848A CN 104181095 B CN104181095 B CN 104181095B
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China
Prior art keywords
substrate
sample
evaluation
main body
heater
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CN201410221848.7A
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Chinese (zh)
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CN104181095A (zh
Inventor
田中秀树
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Espec Corp
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Espec Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Environmental Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Ecology (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
CN201410221848.7A 2013-05-24 2014-05-23 评价基板、环境试验装置和试样的评价方法 Active CN104181095B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-109866 2013-05-24
JP2013109866A JP5882944B2 (ja) 2013-05-24 2013-05-24 環境試験装置、供試体の評価方法、並びに、試験装置

Publications (2)

Publication Number Publication Date
CN104181095A CN104181095A (zh) 2014-12-03
CN104181095B true CN104181095B (zh) 2018-05-15

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ID=51962320

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CN201410221848.7A Active CN104181095B (zh) 2013-05-24 2014-05-23 评价基板、环境试验装置和试样的评价方法

Country Status (4)

Country Link
JP (1) JP5882944B2 (ko)
KR (1) KR101639588B1 (ko)
CN (1) CN104181095B (ko)
TW (1) TWI598576B (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111771120B (zh) * 2018-02-22 2023-09-05 国立大学法人大阪大学 基板评价用芯片和基板评价装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01316675A (ja) * 1988-03-15 1989-12-21 Furukawa Electric Co Ltd:The 電子部品テスト用積層板
JPH0244271A (ja) * 1988-08-04 1990-02-14 Yamaichi Electric Mfg Co Ltd 卓上型電子部品加熱試験用ボックス
US4978914A (en) * 1988-03-15 1990-12-18 Furukawa Denki Kogyo Kabushiki Kaisha Laminated board for testing electronic components
JPH10115658A (ja) * 1996-10-14 1998-05-06 Orion Mach Co Ltd 温度試験装置
JPH11231943A (ja) * 1998-02-09 1999-08-27 Tabai Espec Corp 環境装置の送風装置
CN1568433A (zh) * 2001-08-13 2005-01-19 霍尼韦尔国际公司 执行电子器件的晶片级老化的方法
JP2011209303A (ja) * 2011-07-15 2011-10-20 Espec Corp 環境試験装置
CN102830315A (zh) * 2012-09-05 2012-12-19 清华大学 一种模拟航天航空环境电子器件失效的装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002033364A (ja) * 2000-07-19 2002-01-31 Mitsubishi Electric Corp バーンイン装置及びバーンイン方法
TWM401777U (en) * 2010-10-13 2011-04-11 Advanced Electronics Co Ltd High-power electronic device tester capable of providing constant temperature and humidity testing environment
CN102110387B (zh) * 2011-01-26 2013-04-17 浙江大学 测量微管对流传热系数的教学实验装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01316675A (ja) * 1988-03-15 1989-12-21 Furukawa Electric Co Ltd:The 電子部品テスト用積層板
US4978914A (en) * 1988-03-15 1990-12-18 Furukawa Denki Kogyo Kabushiki Kaisha Laminated board for testing electronic components
JPH0244271A (ja) * 1988-08-04 1990-02-14 Yamaichi Electric Mfg Co Ltd 卓上型電子部品加熱試験用ボックス
JPH10115658A (ja) * 1996-10-14 1998-05-06 Orion Mach Co Ltd 温度試験装置
JPH11231943A (ja) * 1998-02-09 1999-08-27 Tabai Espec Corp 環境装置の送風装置
CN1568433A (zh) * 2001-08-13 2005-01-19 霍尼韦尔国际公司 执行电子器件的晶片级老化的方法
JP2011209303A (ja) * 2011-07-15 2011-10-20 Espec Corp 環境試験装置
JP5047384B2 (ja) * 2011-07-15 2012-10-10 エスペック株式会社 環境試験装置
CN102830315A (zh) * 2012-09-05 2012-12-19 清华大学 一种模拟航天航空环境电子器件失效的装置及方法

Also Published As

Publication number Publication date
TWI598576B (zh) 2017-09-11
TW201447264A (zh) 2014-12-16
JP5882944B2 (ja) 2016-03-09
KR20140138024A (ko) 2014-12-03
JP2014228463A (ja) 2014-12-08
KR101639588B1 (ko) 2016-07-14
CN104181095A (zh) 2014-12-03

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