CN104169704B - 用于测量光学组件的几何结构的方法和工具 - Google Patents

用于测量光学组件的几何结构的方法和工具 Download PDF

Info

Publication number
CN104169704B
CN104169704B CN201380013373.6A CN201380013373A CN104169704B CN 104169704 B CN104169704 B CN 104169704B CN 201380013373 A CN201380013373 A CN 201380013373A CN 104169704 B CN104169704 B CN 104169704B
Authority
CN
China
Prior art keywords
signal
measurement
measuring
measurements
conversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201380013373.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN104169704A (zh
Inventor
斯泰凡·古厄
尼库拉斯·拉维隆尼厄
法比恩·穆拉多雷
阿斯马·拉克豪埃
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EssilorLuxottica SA
Original Assignee
Essilor International Compagnie Generale dOptique SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Essilor International Compagnie Generale dOptique SA filed Critical Essilor International Compagnie Generale dOptique SA
Publication of CN104169704A publication Critical patent/CN104169704A/zh
Application granted granted Critical
Publication of CN104169704B publication Critical patent/CN104169704B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN201380013373.6A 2012-03-09 2013-03-08 用于测量光学组件的几何结构的方法和工具 Active CN104169704B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP12290084.8A EP2637011A1 (fr) 2012-03-09 2012-03-09 Procédé et appareil de mesure de la structure géométrique d'un composant optique
EP12290084.8 2012-03-09
PCT/EP2013/054751 WO2013132072A1 (fr) 2012-03-09 2013-03-08 Procede et appareil de mesure de la structure geometrique d'un composant optique

Publications (2)

Publication Number Publication Date
CN104169704A CN104169704A (zh) 2014-11-26
CN104169704B true CN104169704B (zh) 2018-04-24

Family

ID=47846012

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380013373.6A Active CN104169704B (zh) 2012-03-09 2013-03-08 用于测量光学组件的几何结构的方法和工具

Country Status (14)

Country Link
US (1) US9109976B2 (enExample)
EP (2) EP2637011A1 (enExample)
JP (1) JP6223368B2 (enExample)
KR (1) KR102022888B1 (enExample)
CN (1) CN104169704B (enExample)
AU (1) AU2013229379B2 (enExample)
BR (1) BR112014022264B1 (enExample)
CA (1) CA2864866C (enExample)
IN (1) IN2014DN07627A (enExample)
MX (1) MX338853B (enExample)
NZ (1) NZ628795A (enExample)
RU (1) RU2618746C2 (enExample)
WO (1) WO2013132072A1 (enExample)
ZA (1) ZA201406182B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014115336A1 (de) * 2014-10-21 2016-04-21 Isra Surface Vision Gmbh Verfahren zur Bestimmung eines lokalen Brechwerts und Vorrichtung hierfür
US9818021B2 (en) 2014-10-21 2017-11-14 Isra Surface Vision Gmbh Method for determining a local refractive power and device therefor
RU2650857C1 (ru) * 2017-04-06 2018-04-17 Федеральное государственное бюджетное образовательное учреждение высшего образования "Кубанский государственный технологический университет" (ФГБОУ ВО "КубГТУ") Система определения геометрических параметров трехмерных объектов

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001227908A (ja) * 2000-02-18 2001-08-24 Canon Inc 光学測定装置
US20030112426A1 (en) * 2000-08-22 2003-06-19 Pierre Devie Method and apparatus for transmission measurement of the geometrical structure of an optical component
DE102004047531B4 (de) * 2004-09-30 2006-07-13 Kemper, Björn, Dr.rer.nat. Interferometrisches Verfahren und interferometrische Vorrichtung zum Ermitteln einer Topographie und einer Brechungsindexverteilung eines Objekts
CN101915554A (zh) * 2009-03-11 2010-12-15 富士能株式会社 三维形状测量方法及装置
US20110134438A1 (en) * 2009-12-07 2011-06-09 Canon Kabushiki Kaisha Refractive index distribution measuring method and refractive index distribution measuring apparatus
US20120013916A1 (en) * 2010-07-15 2012-01-19 Canon Kabushiki Kaisha Measurement method for measuring shape of test surface, measurement apparatus, and method for manufacturing optical element

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU642768B2 (en) * 1990-10-02 1993-10-28 Ciba-Geigy Ag A method of surface-cleaning and/or sterilising optical components, especially contact lenses
DE69402281T2 (de) * 1993-09-17 1997-09-04 Essilor Int Verfahren und Gerät zur absoluten Messung der geometrischen oder optischen Struktur eines optischen Bestandteiles
US6072570A (en) * 1997-07-24 2000-06-06 Innotech Image quality mapper for progressive eyeglasses
FR2783938B1 (fr) * 1998-09-28 2000-11-17 Essilor Int Lentilles ophtalmiques toriques
US6256098B1 (en) * 1998-11-23 2001-07-03 Inray Ltd. Method for determining and designing optical elements
US7034949B2 (en) * 2001-12-10 2006-04-25 Ophthonix, Inc. Systems and methods for wavefront measurement
JP2003269952A (ja) * 2002-03-13 2003-09-25 Canon Inc ３次元形状測定装置および方法
KR100947521B1 (ko) * 2002-05-31 2010-03-12 크로스보우즈 옵티컬 리미티드 누진 다초점 굴절력 렌즈
DE10337894A1 (de) * 2003-08-18 2005-03-17 Robert Bosch Gmbh Optisches Messsystem zum Erfassen von Geometriedaten von Oberflächen
US7623251B2 (en) * 2006-04-07 2009-11-24 Amo Wavefront Sciences, Llc. Geometric measurement system and method of measuring a geometric characteristic of an object
US7573643B2 (en) * 2006-08-16 2009-08-11 Technion Research & Development Foundation Ltd. Method and apparatus for designing transmissive optical surfaces
EP2136178A1 (en) * 2007-04-05 2009-12-23 Nikon Corporation Geometry measurement instrument and method for measuring geometry
JP2010085335A (ja) * 2008-10-01 2010-04-15 Fujinon Corp 光波干渉測定装置
FR2938934B1 (fr) * 2008-11-25 2017-07-07 Essilor Int - Cie Generale D'optique Verre de lunettes procurant une vision ophtalmique et une vision supplementaire
JP5591063B2 (ja) * 2009-11-12 2014-09-17 キヤノン株式会社 測定方法及び測定装置
JP5618727B2 (ja) 2010-09-21 2014-11-05 キヤノン株式会社 形状測定法及び形状計測装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001227908A (ja) * 2000-02-18 2001-08-24 Canon Inc 光学測定装置
US20030112426A1 (en) * 2000-08-22 2003-06-19 Pierre Devie Method and apparatus for transmission measurement of the geometrical structure of an optical component
DE102004047531B4 (de) * 2004-09-30 2006-07-13 Kemper, Björn, Dr.rer.nat. Interferometrisches Verfahren und interferometrische Vorrichtung zum Ermitteln einer Topographie und einer Brechungsindexverteilung eines Objekts
CN101915554A (zh) * 2009-03-11 2010-12-15 富士能株式会社 三维形状测量方法及装置
US20110134438A1 (en) * 2009-12-07 2011-06-09 Canon Kabushiki Kaisha Refractive index distribution measuring method and refractive index distribution measuring apparatus
US20120013916A1 (en) * 2010-07-15 2012-01-19 Canon Kabushiki Kaisha Measurement method for measuring shape of test surface, measurement apparatus, and method for manufacturing optical element

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
用于微结构几何量测量的数字全息方法;赵洁等;《红外与激光工程》;20080430;第37卷;第173-176页 *

Also Published As

Publication number Publication date
MX2014010784A (es) 2015-04-17
CA2864866C (fr) 2020-07-07
BR112014022264A8 (pt) 2018-08-14
AU2013229379B2 (en) 2016-11-24
US20150055126A1 (en) 2015-02-26
RU2618746C2 (ru) 2017-05-11
CN104169704A (zh) 2014-11-26
IN2014DN07627A (enExample) 2015-05-15
NZ628795A (en) 2016-11-25
BR112014022264A2 (enExample) 2017-06-20
EP2637011A1 (fr) 2013-09-11
WO2013132072A1 (fr) 2013-09-12
AU2013229379A1 (en) 2014-09-04
RU2014140808A (ru) 2016-05-10
US9109976B2 (en) 2015-08-18
KR102022888B1 (ko) 2019-11-25
MX338853B (es) 2016-05-02
EP2823279A1 (fr) 2015-01-14
CA2864866A1 (fr) 2013-09-12
BR112014022264B1 (pt) 2020-11-10
JP2015509599A (ja) 2015-03-30
EP2823279B1 (fr) 2019-12-25
ZA201406182B (en) 2016-02-24
JP6223368B2 (ja) 2017-11-01
KR20140132725A (ko) 2014-11-18

Similar Documents

Publication Publication Date Title
US5581347A (en) Optimization method and device for direct measurement of an optical component
CN105783775B (zh) 一种镜面及类镜面物体表面形貌测量装置与方法
EP0470816A1 (en) Field shift moire system
CN102183213A (zh) 一种基于相位测量偏折术的非球面镜检测方法
US11099100B2 (en) Method and device for measuring an optical lens for individual wearing situations by a user
CN102183214A (zh) 一种大口径非球面镜结构光检测方法
CN101545760A (zh) 光学透射球面检测装置
CN102506759A (zh) 一种大口径非球面朗奇检测方法
CN108426539A (zh) 一种基于双频正交光栅投影检测反射元件面形的方法
CN104169704B (zh) 用于测量光学组件的几何结构的方法和工具
US6741362B2 (en) Method, system, and computer program product for determining refractive index distribution
KR20110065365A (ko) 비구면체 측정 방법 및 장치
Weckenmann et al. Model and simulation of fringe projection measurements as part of an assistance system for multi-component fringe projection sensors
Li et al. Simultaneous dual-surface profile determination of transparent objects using orthogonal grating transmissive phase deflectometry
JP2006126103A (ja) 非球面形状測定方法
Petz et al. Three-dimensional shape measurement of aspheric refractive optics by pattern transmission photogrammetry
JPH11311600A (ja) 屈折率分布測定方法及び測定装置
KR102057153B1 (ko) 렌즈의 양면 곡률 형상과 굴절률 분포의 동시 측정방법 및 측정장치
Drouin et al. 3D imaging systems for optical metrology
Ramirez-Andrade et al. (PAPER 2) HEIGHT RECONSTRUCTIONS FROM GEOMETRIC WAVEFRONTS USING VISION RAY METROLOGY
Ramirez-Andrade et al. Height reconstructions from geometric wavefronts using vision ray metrology
Sharifani Task-Specific Uncertainty for Point Cloud Measurements
Zhang et al. Combined image block and DBSCAN processing for large field of view structured light point cloud denoising
Seong et al. Surface reconstruction based on transmission interferometric testing
Dong Absolute surface reconstruction by slope metrology and photogrammetry

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20180522

Address after: France Sharon - basil

Patentee after: Essilor International Ltd.

Address before: France Sarah.

Patentee before: Essilor International (Compagnie Generale D'Optique)

TR01 Transfer of patent right