CN104067105B - 用于通过光散射测量颗粒尺寸分布的设备和方法 - Google Patents

用于通过光散射测量颗粒尺寸分布的设备和方法 Download PDF

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Publication number
CN104067105B
CN104067105B CN201280042740.0A CN201280042740A CN104067105B CN 104067105 B CN104067105 B CN 104067105B CN 201280042740 A CN201280042740 A CN 201280042740A CN 104067105 B CN104067105 B CN 104067105B
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detector
light beam
light
output signal
sample
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CN104067105A (zh
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大卫·斯普里格斯
邓肯·斯帝芬森
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Malvern Panalytical Ltd
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Malvern Instruments Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201280042740.0A 2011-09-14 2012-09-11 用于通过光散射测量颗粒尺寸分布的设备和方法 Active CN104067105B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161534851P 2011-09-14 2011-09-14
US61/534,851 2011-09-14
GB1208181.6A GB2494733A (en) 2011-09-14 2012-05-10 Measuring particle size distribution by light scattering
GB1208181.6 2012-05-10
PCT/GB2012/052229 WO2013038160A1 (en) 2011-09-14 2012-09-11 Apparatus and method for measuring particle size distribution by light scattering

Publications (2)

Publication Number Publication Date
CN104067105A CN104067105A (zh) 2014-09-24
CN104067105B true CN104067105B (zh) 2018-04-10

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Country Link
US (1) US9869625B2 (https=)
EP (1) EP2756283B1 (https=)
JP (1) JP6154812B2 (https=)
CN (1) CN104067105B (https=)
GB (1) GB2494733A (https=)
WO (1) WO2013038160A1 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6121319B2 (ja) * 2013-03-29 2017-04-26 シスメックス株式会社 粒子測定装置、照射光学系および照射位置調整方法
US9513206B2 (en) 2013-03-29 2016-12-06 Sysmex Corporation Particle measuring apparatus
JP2015094737A (ja) * 2013-11-14 2015-05-18 ソニー株式会社 光照射装置、粒子分析装置および光照射方法
CN105092429A (zh) * 2014-05-13 2015-11-25 河北联合大学 双色激光磨矿粒度在线分析仪
JP6367351B2 (ja) * 2014-10-22 2018-08-08 株式会社日立ハイテクノロジーズ 細胞計測機構及びそれを有する細胞培養装置並びに細胞計測方法
CN107735667B (zh) * 2015-06-12 2021-06-15 皇家飞利浦有限公司 光学颗粒传感器和感测方法
EP3279635B1 (en) * 2016-08-04 2022-06-01 Malvern Panalytical Limited Method, processor and machine-readable, non-transient storage medium for characterising particles suspended in a fluid dispersant
WO2018047441A1 (ja) * 2016-09-09 2018-03-15 ソニー株式会社 微小粒子測定装置及び微小粒子測定方法
US10648909B2 (en) 2017-05-25 2020-05-12 Abbott Laboratories Methods and systems for assessing flow cell cleanliness
KR102153640B1 (ko) * 2018-01-09 2020-09-08 채규욱 광학식 미세먼지 센서
EP3870616B1 (en) 2018-10-25 2023-10-11 DuPont Industrial Biosciences USA, LLC Alpha-1,3-glucan graft copolymers
US11841311B2 (en) 2018-11-19 2023-12-12 Samsung Electronics Co., Ltd. Multimodal dust sensor
KR102158927B1 (ko) * 2019-01-09 2020-09-22 인천대학교 산학협력단 입자 측정 장치
CN116359085A (zh) * 2023-04-28 2023-06-30 河北工业大学 一种共轴双光源和双探测器阵列同步采集的激光粒度仪

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361403A (en) * 1978-06-26 1982-11-30 Loos Hendricus G Multiple wavelength instrument for measurement of particle size distributions
US4938593A (en) * 1987-01-30 1990-07-03 The Regents Of The University Of Michigan Photothermal densitometer for reading electrophoresis gels
JP2642632B2 (ja) * 1987-07-03 1997-08-20 株式会社日立製作所 微粒子計測装置および微粒子計測方法
EP0361770A3 (en) * 1988-09-30 1991-03-20 Kowa Company Ltd. Particle measuring method and apparatus
US4881231A (en) * 1988-11-28 1989-11-14 Kantilal Jain Frequency-stabilized line-narrowed excimer laser source system for high resolution lithography
US4953978A (en) * 1989-03-03 1990-09-04 Coulter Electronics Of New England, Inc. Particle size analysis utilizing polarization intensity differential scattering
DE69129260T2 (de) * 1990-11-03 1998-11-19 Horiba Ltd Gerät zur Messung der Teilchengrössenverteilung
US6246892B1 (en) * 1991-01-24 2001-06-12 Non-Invasive Technology Phase modulation spectroscopy
JPH07501397A (ja) * 1991-09-06 1995-02-09 コモンウェルス　サイエンティフィック　アンド　インダストリアル　リサーチ　オーガナイゼイション 測定方法および装置
JP3145487B2 (ja) * 1992-06-12 2001-03-12 シスメックス株式会社 粒子分析装置
US5416580A (en) * 1993-07-07 1995-05-16 General Signal Corporation Methods and apparatus for determining small particle size distribution utilizing multiple light beams
US5475235A (en) * 1993-08-09 1995-12-12 Wyatt Technoloy Corporation Control of laser light power output for use in light scattering instruments by inducing mode hopping and averaging result
US5831730A (en) * 1996-12-06 1998-11-03 United Sciences, Inc. Method for monitoring particulates using beam-steered solid-state light source
GB9818351D0 (en) 1998-08-22 1998-10-14 Malvern Instr Ltd Improvements relating to the measurement of particle size distribution
GB2340936B (en) * 1998-08-22 2003-08-13 Malvern Instr Ltd Improvements relating to the measurement of particle size distribution
JP2000146814A (ja) 1998-11-13 2000-05-26 Horiba Ltd 粒径分布測定装置
GB9901406D0 (en) * 1999-01-23 1999-03-10 Harley Scient Limited Airborne particle detector
DE19926494C2 (de) * 1999-06-10 2001-07-26 Max Planck Gesellschaft Verfahren und Vorrichtung zur Abbildung von mikroskopisch kleinen Teilchen
WO2001029534A1 (en) * 1999-10-15 2001-04-26 The Administrators Of The Tulane Educational Fund Device for and method of simultaneously measuring light scatter from multiple liquid samples
US6858104B2 (en) * 2002-01-28 2005-02-22 Scimed Life Systems, Inc. Apparatus and method for closed-loop control of laser welder for welding polymeric catheter components
US7433053B2 (en) * 2002-08-08 2008-10-07 Applied Materials, Israel, Ltd. Laser inspection using diffractive elements for enhancement and suppression of surface features
EP1576355A2 (en) * 2002-09-30 2005-09-21 Applied Materials Israel Ltd. Illumination system for optical inspection
JP2005088512A (ja) * 2003-09-19 2005-04-07 Minolta Co Ltd 照明装置
JP2005316289A (ja) * 2004-04-30 2005-11-10 Olympus Corp 顕微鏡の照明装置
US7499809B2 (en) * 2004-08-30 2009-03-03 Horiba, Ltd. Particle size distribution analyzer
JP2006134534A (ja) * 2004-11-09 2006-05-25 Sharp Corp 光ピックアップ装置
US20090323061A1 (en) * 2006-02-28 2009-12-31 Lukas Novotny Multi-color hetereodyne interferometric apparatus and method for sizing nanoparticles
JP2008039539A (ja) * 2006-08-04 2008-02-21 Shimadzu Corp 光散乱検出装置
EP2522982B1 (en) * 2007-08-15 2015-09-16 Malvern Instruments Limited Broad-Range Spectrometer
DE102008064665B4 (de) * 2008-09-15 2016-06-09 Fritsch Gmbh Partikelgrößenmessgerät
JP5640420B2 (ja) * 2009-05-29 2014-12-17 株式会社リコー 投影型画像表示装置
WO2011162787A1 (en) * 2010-06-22 2011-12-29 President And Fellows Of Harvard College Systems and methods providing efficient detection of back-scattered illumination in modulation transfer microscopy or micro-spectroscopy
CN102175587A (zh) 2010-12-31 2011-09-07 深圳市美思康电子有限公司 用于血液细胞分析、流式细胞分析、体液分析的激光系统
CN201935855U (zh) * 2011-01-07 2011-08-17 深圳市美思康电子有限公司 双能激光系统
FR2979873B1 (fr) 2011-09-12 2013-10-04 Valeo Securite Habitacle Procede d'ouverture d'un ouvrant de vehicule automobile

Also Published As

Publication number Publication date
US9869625B2 (en) 2018-01-16
GB2494733A (en) 2013-03-20
JP6154812B2 (ja) 2017-06-28
EP2756283A1 (en) 2014-07-23
GB201208181D0 (en) 2012-06-20
JP2014530349A (ja) 2014-11-17
US20150138550A1 (en) 2015-05-21
WO2013038160A1 (en) 2013-03-21
EP2756283B1 (en) 2016-03-16
CN104067105A (zh) 2014-09-24

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