CN104007163B - 串联质谱仪和质谱法 - Google Patents

串联质谱仪和质谱法 Download PDF

Info

Publication number
CN104007163B
CN104007163B CN201410067755.3A CN201410067755A CN104007163B CN 104007163 B CN104007163 B CN 104007163B CN 201410067755 A CN201410067755 A CN 201410067755A CN 104007163 B CN104007163 B CN 104007163B
Authority
CN
China
Prior art keywords
ion
mass
unit
ions
dissociation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201410067755.3A
Other languages
English (en)
Chinese (zh)
Other versions
CN104007163A (zh
Inventor
奥村大辅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN104007163A publication Critical patent/CN104007163A/zh
Application granted granted Critical
Publication of CN104007163B publication Critical patent/CN104007163B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201410067755.3A 2013-02-26 2014-02-26 串联质谱仪和质谱法 Expired - Fee Related CN104007163B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013-035707 2013-02-26
JP2013035707A JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置

Publications (2)

Publication Number Publication Date
CN104007163A CN104007163A (zh) 2014-08-27
CN104007163B true CN104007163B (zh) 2016-09-28

Family

ID=51367917

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410067755.3A Expired - Fee Related CN104007163B (zh) 2013-02-26 2014-02-26 串联质谱仪和质谱法

Country Status (3)

Country Link
US (1) US8866074B2 (https=)
JP (1) JP6044385B2 (https=)
CN (1) CN104007163B (https=)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3098599A4 (en) * 2014-01-20 2017-01-25 Shimadzu Corporation Tandem mass spectrometry data processing device
WO2015193946A1 (ja) * 2014-06-16 2015-12-23 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析方法及びｍｓ／ｍｓ型質量分析装置
GB201509209D0 (en) * 2015-05-28 2015-07-15 Micromass Ltd Echo cancellation for time of flight analogue to digital converter
US10332733B2 (en) 2015-07-28 2019-06-25 Shimadzu Corporation Tandem mass spectrometer
WO2017025892A1 (en) * 2015-08-13 2017-02-16 Dh Technologies Development Pte. Ltd. Deconvolution of mixed spectra
CN108139357B (zh) * 2015-10-07 2020-10-27 株式会社岛津制作所 串联型质谱分析装置
EP3425383A4 (en) * 2016-01-18 2019-12-11 Shimadzu Corporation ION CASE SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD USING THE SAID DEVICE
CN108780062B (zh) * 2016-02-29 2021-03-19 株式会社岛津制作所 质谱分析装置
CN106169411B (zh) * 2016-07-13 2018-03-27 中国计量科学研究院 新型串并联质谱装置系统及其参数调节方法和使用方法
EP3576131A4 (en) 2017-01-25 2020-01-22 Shimadzu Corporation Time-of
CN108878253B (zh) * 2017-05-15 2020-06-23 株式会社岛津制作所 质谱数据采集方法
US11232941B2 (en) 2018-01-12 2022-01-25 The Trustees Of Indiana University Electrostatic linear ion trap design for charge detection mass spectrometry
CN110082422B (zh) * 2018-07-18 2021-11-12 东华理工大学 一种测定电喷雾电离和电喷雾萃取电离所获一价正离子内能差异的方法
CN112640031B (zh) * 2018-08-13 2023-10-03 塞莫费雪科学（不来梅）有限公司 同位素质谱法
US11081333B2 (en) 2018-08-31 2021-08-03 Shimadzu Corporation Power connector for mass spectrometer
CA3118567A1 (en) 2018-12-03 2020-06-11 The Trustees Of Indiana University Apparatus and method for simultaneously analyzing multiple ions with an electrostatic linear ion trap
WO2020219527A1 (en) 2019-04-23 2020-10-29 The Trustees Of Indiana University Identification of sample subspecies based on particle charge behavior under structural change-inducing sample conditions
EP3977628A4 (en) 2019-05-31 2023-06-28 DH Technologies Development Pte. Ltd. Method for real time encoding of scanning swath data and probabilistic framework for precursor inference
CA3156003A1 (en) 2019-09-25 2021-04-01 The Trustees Of Indiana University Apparatus and method for pulsed mode charge detection mass spectrometry
KR102849777B1 (ko) 2019-10-10 2025-08-22 더 트러스티즈 오브 인디애나 유니버시티 입자들을 식별, 선택 및 정제하기 위한 시스템 및 방법
JP7690209B2 (ja) * 2019-12-18 2025-06-10 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 電荷測定装置を有する質量分析計
CN113948365B (zh) * 2020-07-15 2025-02-07 宁波大学 一种复合式质谱仪
CN113406182B (zh) * 2021-06-30 2024-10-11 昆山禾信质谱技术有限公司 串联质谱设备和质谱检测系统
CN116344323B (zh) * 2021-12-17 2026-03-06 昆山禾信质谱技术有限公司 串级质谱系统及质谱设备

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206508A (en) * 1990-10-18 1993-04-27 Unisearch Limited Tandem mass spectrometry systems based on time-of-flight analyzer
EP0551999A1 (en) * 1992-01-16 1993-07-21 Kratos Analytical Limited Mass spectrometry systems
JP2003525515A (ja) * 1999-06-11 2003-08-26 パーセプティブ バイオシステムズ，インコーポレイテッド 衝突室中での減衰を伴うタンデム飛行時間型質量分析計およびその使用のための方法
CN1922711A (zh) * 2004-02-24 2007-02-28 岛津欧州研究所 离子阱和在离子阱中解离离子的方法
CN101151705A (zh) * 2005-03-29 2008-03-26 萨默费尼根有限公司 关于质谱仪的改进
CN1833300B (zh) * 2003-03-19 2010-05-12 萨默费尼根有限公司 在离子总体中获取多个母离子的串联质谱分析数据
CN102308361A (zh) * 2009-02-05 2012-01-04 株式会社岛津制作所 Ms/ms型质谱分析装置

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5696376A (en) * 1996-05-20 1997-12-09 The Johns Hopkins University Method and apparatus for isolating ions in an ion trap with increased resolving power
JP3300602B2 (ja) * 1996-06-20 2002-07-08 株式会社日立製作所 大気圧イオン化イオントラップ質量分析方法及び装置
GB9717926D0 (en) * 1997-08-22 1997-10-29 Micromass Ltd Methods and apparatus for tandem mass spectrometry
CA2318855C (en) * 1998-01-23 2006-07-11 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guide
JP2002502086A (ja) * 1998-01-23 2002-01-22 アナリティカ オブ ブランフォード インコーポレーテッド 表面からの質量分光測定
CA2255122C (en) * 1998-12-04 2007-10-09 Mds Inc. Improvements in ms/ms methods for a quadrupole/time of flight tandem mass spectrometer
US6507019B2 (en) * 1999-05-21 2003-01-14 Mds Inc. MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer
CA2340150C (en) 2000-06-09 2005-11-22 Micromass Limited Methods and apparatus for mass spectrometry
JP2002313276A (ja) * 2001-04-17 2002-10-25 Hitachi Ltd イオントラップ型質量分析装置及び方法
US7034292B1 (en) * 2002-05-31 2006-04-25 Analytica Of Branford, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
GB0305796D0 (en) * 2002-07-24 2003-04-16 Micromass Ltd Method of mass spectrometry and a mass spectrometer
JP5322385B2 (ja) * 2003-01-24 2013-10-23 サーモ フィニガン リミテッド ライアビリティ カンパニー 質量分析器におけるイオン集団の制御
EP1623351B1 (en) * 2003-04-28 2012-04-18 Cerno Bioscience LLC Computational method and system for mass spectral analysis
US6992283B2 (en) * 2003-06-06 2006-01-31 Micromass Uk Limited Mass spectrometer
US7473892B2 (en) * 2003-08-13 2009-01-06 Hitachi High-Technologies Corporation Mass spectrometer system
US20060043285A1 (en) * 2004-08-26 2006-03-02 Battelle Memorial Institute Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis
US7348553B2 (en) * 2004-10-28 2008-03-25 Cerno Bioscience Llc Aspects of mass spectral calibration
US7544931B2 (en) * 2004-11-02 2009-06-09 Shimadzu Corporation Mass-analyzing method
GB0427632D0 (en) * 2004-12-17 2005-01-19 Micromass Ltd Mass spectrometer
GB2432712B (en) * 2005-11-23 2007-12-27 Micromass Ltd Mass spectrometer
GB0526245D0 (en) * 2005-12-22 2006-02-01 Shimadzu Res Lab Europe Ltd A mass spectrometer using a dynamic pressure ion source
US7812305B2 (en) * 2006-06-29 2010-10-12 Sionex Corporation Tandem differential mobility spectrometers and mass spectrometer for enhanced analysis
US8119982B2 (en) * 2007-04-04 2012-02-21 Shimadzu Corporation Method and system for mass spectrometry data analysis
US7838824B2 (en) * 2007-05-01 2010-11-23 Virgin Instruments Corporation TOF-TOF with high resolution precursor selection and multiplexed MS-MS
US7919745B2 (en) * 2007-09-10 2011-04-05 Dh Technologies Development Pte. Ltd. Methods and systems for background correction in tandem mass spectrometry based quantitation
JP2009068981A (ja) * 2007-09-13 2009-04-02 Hitachi High-Technologies Corp 質量分析システム及び質量分析方法
JP5124293B2 (ja) * 2008-01-11 2013-01-23 株式会社日立ハイテクノロジーズ 質量分析計および質量分析方法
WO2009095952A1 (ja) * 2008-01-30 2009-08-06 Shimadzu Corporation Ｍｓ／ｍｓ型質量分析装置
EP2304767B1 (en) * 2008-05-30 2020-02-26 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University A radio-frequency-free hybrid electrostatic/magnetostatic cell for transporting, trapping, and dissociating ions in mass spectrometers
CN102169791B (zh) * 2010-02-05 2015-11-25 岛津分析技术研发（上海）有限公司 一种串级质谱分析装置及质谱分析方法
JP5408107B2 (ja) * 2010-11-10 2014-02-05 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置及び同装置用プログラム

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206508A (en) * 1990-10-18 1993-04-27 Unisearch Limited Tandem mass spectrometry systems based on time-of-flight analyzer
EP0551999A1 (en) * 1992-01-16 1993-07-21 Kratos Analytical Limited Mass spectrometry systems
JP2003525515A (ja) * 1999-06-11 2003-08-26 パーセプティブ バイオシステムズ，インコーポレイテッド 衝突室中での減衰を伴うタンデム飛行時間型質量分析計およびその使用のための方法
CN1833300B (zh) * 2003-03-19 2010-05-12 萨默费尼根有限公司 在离子总体中获取多个母离子的串联质谱分析数据
CN1922711A (zh) * 2004-02-24 2007-02-28 岛津欧州研究所 离子阱和在离子阱中解离离子的方法
CN101151705A (zh) * 2005-03-29 2008-03-26 萨默费尼根有限公司 关于质谱仪的改进
CN102308361A (zh) * 2009-02-05 2012-01-04 株式会社岛津制作所 Ms/ms型质谱分析装置

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
"A novel high-capacity ion trap-quadrupole tandem mass spectrometer";Andrew N. Krutchinsky 等;《International Journal of Mass Spectrometry》;20070626;第268卷;第93-105页 *
"Collision induced dissociation in a flowing afterglow-tandem mass spectrometer for the selective detection of C5 unsaturated alcohols and isoprene";Juliette Rimetz-Planchona 等;《International Journal of Mass Spectrometry》;20090926;第289卷;第30-38页 *
"串联质谱技术的应用研究";李明;《中国博士学位论文全文数据库 工程科技Ⅰ辑》;20071015(第4期);第1-40页 *
"台式离子阱质谱仪的串联质谱技术及应用";祝立群;《上海计量测试》;20021231;第29卷(第2期);第35-36页 *

Also Published As

Publication number Publication date
CN104007163A (zh) 2014-08-27
JP2014165053A (ja) 2014-09-08
US20140239170A1 (en) 2014-08-28
JP6044385B2 (ja) 2016-12-14
US8866074B2 (en) 2014-10-21

Similar Documents

Publication Publication Date Title
CN104007163B (zh) 串联质谱仪和质谱法
JP5860958B2 (ja) タンデム質量分析のためのターゲット分析
US10541120B2 (en) Method of tandem mass spectrometry
CN102918625B (zh) 具有编码频繁脉冲的静电质谱仪
JP3971958B2 (ja) 質量分析装置
CA2772677C (en) Method, system and apparatus for filtering ions in a mass spectrometer
CN113495112B (zh) 质谱分析方法和质谱系统
US20050133712A1 (en) Scan pipelining for sensitivity improvement of orthogonal time-of-flight mass spectrometers
JP6090479B2 (ja) 質量分析装置
JP2018522211A (ja) オーバーサンプル型飛行時間質量分析
US9576780B2 (en) Mass spectrometer with timing determination based on a signal intensity in a chromatogram
US8263932B2 (en) Mass-analyzing method
WO2017017787A1 (ja) タンデム型質量分析装置
US20050253059A1 (en) Tandem-in-time and-in-space mass spectrometer and associated method for tandem mass spectrometry
US8624181B1 (en) Controlling ion flux into time-of-flight mass spectrometers
CN119495550A (zh) 离子迁移率-质荷比数据的采集
CN118658770A (zh) 飞行时间质量分析仪中的碰撞截面测量
CN110291614B (zh) 基于四极杆线性离子阱串联质谱仪器的离子分离检测方法
CN112654865B (zh) 离子过滤装置
JP4450717B2 (ja) 質量分析装置
WO2022249291A1 (ja) 探針エレクトロスプレーイオン化質量分析装置
WO2019211918A1 (ja) 直交加速飛行時間型質量分析装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160928

Termination date: 20200226

CF01 Termination of patent right due to non-payment of annual fee