CN103771034B - 容量减小的运载器和使用方法 - Google Patents

容量减小的运载器和使用方法 Download PDF

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Publication number
CN103771034B
CN103771034B CN201310692043.6A CN201310692043A CN103771034B CN 103771034 B CN103771034 B CN 103771034B CN 201310692043 A CN201310692043 A CN 201310692043A CN 103771034 B CN103771034 B CN 103771034B
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CN
China
Prior art keywords
workpiece
carrier
vehicle
substrate
door
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN201310692043.6A
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English (en)
Chinese (zh)
Other versions
CN103771034A (zh
Inventor
G.乌利塞斯
M.L.布法诺
W.福斯奈特
C.霍夫梅斯特
G.M.弗里德曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Borucos Automation Usa Co ltd
Borukos Automation Holding Co ltd
Original Assignee
Brooks Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brooks Automation Inc filed Critical Brooks Automation Inc
Publication of CN103771034A publication Critical patent/CN103771034A/zh
Application granted granted Critical
Publication of CN103771034B publication Critical patent/CN103771034B/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/07Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H10P72/00
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/15Horizontal carrier comprising wall type elements whereby the substrates are vertically supported, e.g. comprising sidewalls
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1902Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers specially adapted for a single substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1911Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by materials, roughness, coatings or the like
    • H10P72/1912Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by materials, roughness, coatings or the like characterised by shock absorbing elements, e.g. retainers or cushions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1914Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by locking systems
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1916Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by sealing arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1921Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by substrate supports
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1924Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1924Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
    • H10P72/1926Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrier
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3406Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door or cover
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/36Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations using air tracks
    • H10P72/3604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations using air tracks the workpieces being stored in a carrier, involving loading and unloading
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/139Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
CN201310692043.6A 2004-08-19 2005-08-19 容量减小的运载器和使用方法 Expired - Lifetime CN103771034B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US60336104P 2004-08-19 2004-08-19
US60/603361 2004-08-19
US11/207231 2005-08-19
US11/207,231 US8888433B2 (en) 2004-08-19 2005-08-19 Reduced capacity carrier and method of use

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN200580035790.6A Division CN101044074B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Publications (2)

Publication Number Publication Date
CN103771034A CN103771034A (zh) 2014-05-07
CN103771034B true CN103771034B (zh) 2016-06-29

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
CN201310692043.6A Expired - Lifetime CN103771034B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法
CN200580035790.6A Expired - Lifetime CN101044074B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN200580035790.6A Expired - Lifetime CN101044074B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Country Status (6)

Country Link
US (2) US8888433B2 (https=)
EP (1) EP1786710A4 (https=)
JP (2) JP5386082B2 (https=)
KR (1) KR101233101B1 (https=)
CN (2) CN103771034B (https=)
WO (1) WO2006023838A2 (https=)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1786710A4 (en) 2004-08-19 2011-10-12 Brooks Automation Inc CARRIER WITH REDUCED CAPACITY AND USE METHOD
US20080107507A1 (en) * 2005-11-07 2008-05-08 Bufano Michael L Reduced capacity carrier, transport, load port, buffer system
US8267634B2 (en) * 2005-11-07 2012-09-18 Brooks Automation, Inc. Reduced capacity carrier, transport, load port, buffer system
US8272827B2 (en) * 2005-11-07 2012-09-25 Bufano Michael L Reduced capacity carrier, transport, load port, buffer system
US7798758B2 (en) * 2005-11-07 2010-09-21 Brooks Automation, Inc. Reduced capacity carrier, transport, load port, buffer system
US20070140822A1 (en) * 2005-12-16 2007-06-21 Applied Materials, Inc. Methods and apparatus for opening and closing substrate carriers
JP5461760B2 (ja) * 2006-07-26 2014-04-02 株式会社カネカ 半導体製造装置及び半導体製造方法
KR20090053915A (ko) * 2006-08-18 2009-05-28 브룩스 오토메이션 인코퍼레이티드 용량이 축소된 캐리어, 이송, 로드 포트, 버퍼 시스템
JP2008060513A (ja) * 2006-09-04 2008-03-13 Tokyo Electron Ltd 処理装置及び処理方法
TWI475627B (zh) 2007-05-17 2015-03-01 布魯克斯自動機械公司 基板運送機、基板處理裝置和系統、於基板處理期間降低基板之微粒污染的方法,及使運送機與處理機結合之方法
JP6027303B2 (ja) * 2007-05-17 2016-11-16 ブルックス オートメーション インコーポレイテッド 側部開口部基板キャリアおよびロードポート
DE102007025339A1 (de) * 2007-05-31 2008-12-04 Advanced Micro Devices, Inc., Sunnyvale Verfahren und System zum Entfernen leerer Trägerbehälter von Prozessanlagen durch Steuern einer Zuordnung zwischen Steuerungsaufgaben und Trägerbehälter
DE102007035839B4 (de) * 2007-07-31 2017-06-22 Globalfoundries Dresden Module One Limited Liability Company & Co. Kg Verfahren und System zum lokalen Aufbewahren von Substratbehältern in einem Deckentransportsystem zum Verbessern der Aufnahme/Abgabe-Kapazitäten von Prozessanlagen
DE202010017181U1 (de) * 2010-08-04 2011-03-24 Centrotherm Thermal Solutions Gmbh + Co. Kg Vorrichtung zum Schließen und Öffnen einer Be-/Entladeöffnung einer Prozesskammer
JP2013143425A (ja) * 2012-01-10 2013-07-22 Tokyo Electron Ltd 基板処理システム及び基板位置矯正方法
JP6180954B2 (ja) * 2014-02-05 2017-08-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
WO2015170972A1 (en) * 2014-05-07 2015-11-12 Mapper Lithography Ip B.V. Enclosure for a target processing machine
JP2016178133A (ja) * 2015-03-19 2016-10-06 シンフォニアテクノロジー株式会社 ドア開閉装置、搬送装置、ソータ装置、収納容器のドッキング方法
JP6451453B2 (ja) * 2015-03-31 2019-01-16 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
JP6554872B2 (ja) * 2015-03-31 2019-08-07 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
US11569138B2 (en) * 2015-06-16 2023-01-31 Kla Corporation System and method for monitoring parameters of a semiconductor factory automation system
TWI727562B (zh) * 2015-08-04 2021-05-11 日商昕芙旎雅股份有限公司 裝載埠
TWI878060B (zh) 2015-08-04 2025-03-21 日商昕芙旎雅股份有限公司 門開閉系統及具備門開閉系統之載入埠
JP6544128B2 (ja) * 2015-08-07 2019-07-17 シンフォニアテクノロジー株式会社 収納容器の蓋体及び収納容器
DE102015219564A1 (de) * 2015-10-09 2017-04-13 Robert Bosch Gmbh Werkzeuganalyseeinrichtung und verfahren zur analyse einer bearbeitung eines werkstücks mit einem werkzeug
US10153282B1 (en) 2017-08-11 2018-12-11 Lam Research Corporation Ultra-high vacuum transport and storage
JP6969936B2 (ja) * 2017-08-29 2021-11-24 株式会社ディスコ ウエーハ収容カセット
JP7009194B2 (ja) * 2017-12-12 2022-01-25 株式会社ディスコ ウエーハ生成装置および搬送トレー
JP7164396B2 (ja) * 2018-10-29 2022-11-01 株式会社ディスコ ウエーハ生成装置
US11348817B2 (en) * 2018-11-29 2022-05-31 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer transport system and method for transporting wafers
KR102015485B1 (ko) * 2019-02-18 2019-08-28 주식회사 윈텍 오엘이디 제조 챔버 장비용 오토 리드 장치
JP6721852B2 (ja) * 2019-07-16 2020-07-15 シンフォニアテクノロジー株式会社 ロードポート
KR102278078B1 (ko) * 2019-10-17 2021-07-19 세메스 주식회사 기판 반송 장치 및 기판 처리 장치
JP7564475B2 (ja) * 2022-02-08 2024-10-09 シンフォニアテクノロジー株式会社 ロードポート及びロードポートの駆動方法
JP7820191B2 (ja) * 2022-03-03 2026-02-25 株式会社ディスコ 搬送治具

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09232407A (ja) * 1996-02-21 1997-09-05 Hitachi Ltd ワーク搬送装置およびそれを用いた半導体製造装置
CN1439913A (zh) * 2002-02-22 2003-09-03 Lg.菲利浦Lcd株式会社 制造液晶显示器的设备和方法,使用该设备的方法,用该方法生产的器件
CN1444355A (zh) * 2002-03-08 2003-09-24 村田机械株式会社 输送系统
US6633050B1 (en) * 2000-08-15 2003-10-14 Asml Holding Nv. Virtual gauging system for use in lithographic processing

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5097421A (en) * 1984-12-24 1992-03-17 Asyst Technologies, Inc. Intelligent waxer carrier
JPS61228647A (ja) 1985-04-02 1986-10-11 Mitsubishi Electric Corp ウエハ並べ換え装置
US4724874A (en) * 1986-05-01 1988-02-16 Asyst Technologies Sealable transportable container having a particle filtering system
US4995430A (en) * 1989-05-19 1991-02-26 Asyst Technologies, Inc. Sealable transportable container having improved latch mechanism
DE4024973C2 (de) * 1990-08-07 1994-11-03 Ibm Anordnung zum Lagern, Transportieren und Einschleusen von Substraten
US5169272A (en) * 1990-11-01 1992-12-08 Asyst Technologies, Inc. Method and apparatus for transferring articles between two controlled environments
US5256204A (en) * 1991-12-13 1993-10-26 United Microelectronics Corporation Single semiconductor water transfer method and manufacturing system
US5469963A (en) * 1992-04-08 1995-11-28 Asyst Technologies, Inc. Sealable transportable container having improved liner
US5486080A (en) * 1994-06-30 1996-01-23 Diamond Semiconductor Group, Inc. High speed movement of workpieces in vacuum processing
FR2747111B1 (fr) * 1996-04-03 1998-04-30 Commissariat Energie Atomique Systeme d'accouplement pour un transfert confine d'un objet plat d'une boite de confinement vers une unite de traitement de l'objet
US5980195A (en) * 1996-04-24 1999-11-09 Tokyo Electron, Ltd. Positioning apparatus for substrates to be processed
JPH10270526A (ja) 1997-03-24 1998-10-09 Canon Inc 基板収納容器および基板搬送装置
US6390754B2 (en) * 1997-05-21 2002-05-21 Tokyo Electron Limited Wafer processing apparatus, method of operating the same and wafer detecting system
JP4253365B2 (ja) * 1997-10-17 2009-04-08 オリンパス株式会社 ウェハ搬送装置
JP3772011B2 (ja) * 1997-12-24 2006-05-10 大日本スクリーン製造株式会社 基板処理装置
US5988233A (en) * 1998-03-27 1999-11-23 Asyst Technologies, Inc. Evacuation-driven SMIF pod purge system
FR2779421B1 (fr) * 1998-06-08 2000-08-18 Incam Solutions Dispositif adaptateur pour des boites de confinement d'au moins un objet plat sous atmosphere ultrapropre
US6271917B1 (en) 1998-06-26 2001-08-07 Thomas W. Hagler Method and apparatus for spectrum analysis and encoder
US6244812B1 (en) * 1998-07-10 2001-06-12 H-Square Corporation Low profile automated pod door removal system
JP4305988B2 (ja) 1999-01-27 2009-07-29 シンフォニアテクノロジー株式会社 ウエーハキャリア
JP2000286319A (ja) * 1999-03-31 2000-10-13 Canon Inc 基板搬送方法および半導体製造装置
TW461686U (en) 1999-04-06 2001-10-21 Benq Corp Housing decoration cap set
US6612797B1 (en) * 1999-05-18 2003-09-02 Asyst Technologies, Inc. Cassette buffering within a minienvironment
DE19922936B4 (de) 1999-05-19 2004-04-29 Infineon Technologies Ag Anlage zur Bearbeitung von Wafern
US8348583B2 (en) * 1999-10-19 2013-01-08 Rorze Corporation Container and loader for substrate
JP3939062B2 (ja) 2000-01-25 2007-06-27 松下電器産業株式会社 基板検出装置
US6901971B2 (en) * 2001-01-10 2005-06-07 Entegris, Inc. Transportable container including an internal environment monitor
US6530736B2 (en) * 2001-07-13 2003-03-11 Asyst Technologies, Inc. SMIF load port interface including smart port door
JP3697478B2 (ja) * 2001-08-20 2005-09-21 ソニー株式会社 基板の移送方法及びロードポート装置並びに基板移送システム
US6745901B2 (en) * 2001-10-12 2004-06-08 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer cassette equipped with piezoelectric sensors
US20030077153A1 (en) * 2001-10-19 2003-04-24 Applied Materials, Inc. Identification code reader integrated with substrate carrier robot
JP4168642B2 (ja) * 2002-02-28 2008-10-22 東京エレクトロン株式会社 被処理体収納容器体及び処理システム
US6691416B2 (en) * 2002-06-26 2004-02-17 Hsiu-Man Yu Chen Cutter for vehicle safety belts or the like
US6719142B1 (en) * 2002-07-16 2004-04-13 Ion Systems, Inc. Apparatus and method for measuring static charge on wafers, disks, substrates, masks, and flat panel displays
US6826451B2 (en) * 2002-07-29 2004-11-30 Asml Holding N.V. Lithography tool having a vacuum reticle library coupled to a vacuum chamber
US7328836B2 (en) * 2004-02-03 2008-02-12 Taiwan Semiconductor Manufacturing Co., Ltd. Smart tag holder and cover housing
EP1786710A4 (en) 2004-08-19 2011-10-12 Brooks Automation Inc CARRIER WITH REDUCED CAPACITY AND USE METHOD
KR20070054683A (ko) * 2004-08-23 2007-05-29 브룩스 오토메이션 인코퍼레이티드 승강기 기반의 도구 적재 및 버퍼링 시스템
JP2011186366A (ja) 2010-03-11 2011-09-22 Noriko Takamine 香るチラシの作成方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09232407A (ja) * 1996-02-21 1997-09-05 Hitachi Ltd ワーク搬送装置およびそれを用いた半導体製造装置
US6633050B1 (en) * 2000-08-15 2003-10-14 Asml Holding Nv. Virtual gauging system for use in lithographic processing
CN1439913A (zh) * 2002-02-22 2003-09-03 Lg.菲利浦Lcd株式会社 制造液晶显示器的设备和方法,使用该设备的方法,用该方法生产的器件
CN1444355A (zh) * 2002-03-08 2003-09-24 村田机械株式会社 输送系统

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US9881825B2 (en) 2018-01-30
KR20070045322A (ko) 2007-05-02
US20150155192A1 (en) 2015-06-04
JP2008511142A (ja) 2008-04-10
US8888433B2 (en) 2014-11-18
KR101233101B1 (ko) 2013-02-14
EP1786710A4 (en) 2011-10-12
US20060088272A1 (en) 2006-04-27
WO2006023838A3 (en) 2006-08-17
WO2006023838A2 (en) 2006-03-02
JP5386082B2 (ja) 2014-01-15
JP2012015550A (ja) 2012-01-19
CN101044074A (zh) 2007-09-26
CN103771034A (zh) 2014-05-07
CN101044074B (zh) 2014-04-02

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