CN103649814B - 显微观察用光学装置 - Google Patents

显微观察用光学装置 Download PDF

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Publication number
CN103649814B
CN103649814B CN201280032676.8A CN201280032676A CN103649814B CN 103649814 B CN103649814 B CN 103649814B CN 201280032676 A CN201280032676 A CN 201280032676A CN 103649814 B CN103649814 B CN 103649814B
Authority
CN
China
Prior art keywords
optical device
reflective surface
microscopic observation
heat shield
observation according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201280032676.8A
Other languages
English (en)
Chinese (zh)
Other versions
CN103649814A (zh
Inventor
中村共则
荒田育男
伊藤能弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to CN201610322172.XA priority Critical patent/CN105842836B/zh
Publication of CN103649814A publication Critical patent/CN103649814A/zh
Application granted granted Critical
Publication of CN103649814B publication Critical patent/CN103649814B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G02B13/24—Optical objectives specially designed for the purposes specified below for reproducing or copying at short object distances
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G02B21/04—Objectives involving mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/248—Base structure objective (or ocular) turrets
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/368—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements details of associated display arrangements, e.g. mounting of LCD monitor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0018—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for preventing ghost images
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/005—Diaphragms
    • G02B5/006—Diaphragms cooled
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/023—Mountings, adjusting means, or light-tight connections, for optical elements for lenses permitting adjustment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
  • Lens Barrels (AREA)
  • Studio Devices (AREA)
  • Overhead Projectors And Projection Screens (AREA)
CN201280032676.8A 2011-06-30 2012-05-17 显微观察用光学装置 Active CN103649814B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610322172.XA CN105842836B (zh) 2011-06-30 2012-05-17 显微观察用光学装置

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2011-145488 2011-06-30
JP2011145488 2011-06-30
JP2011-286218 2011-12-27
JP2011286218A JP6000546B2 (ja) 2011-06-30 2011-12-27 顕微観察用光学装置
PCT/JP2012/062668 WO2013001932A1 (ja) 2011-06-30 2012-05-17 顕微観察用光学装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201610322172.XA Division CN105842836B (zh) 2011-06-30 2012-05-17 显微观察用光学装置

Publications (2)

Publication Number Publication Date
CN103649814A CN103649814A (zh) 2014-03-19
CN103649814B true CN103649814B (zh) 2016-06-29

Family

ID=47423835

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201280032676.8A Active CN103649814B (zh) 2011-06-30 2012-05-17 显微观察用光学装置
CN201610322172.XA Active CN105842836B (zh) 2011-06-30 2012-05-17 显微观察用光学装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201610322172.XA Active CN105842836B (zh) 2011-06-30 2012-05-17 显微观察用光学装置

Country Status (7)

Country Link
US (4) US9411143B2 (enExample)
EP (1) EP2728391B1 (enExample)
JP (1) JP6000546B2 (enExample)
KR (2) KR102005210B1 (enExample)
CN (2) CN103649814B (enExample)
TW (2) TWI516749B (enExample)
WO (1) WO2013001932A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6307130B2 (ja) * 2011-06-30 2018-04-04 浜松ホトニクス株式会社 顕微装置及び顕微観察方法
JP6000546B2 (ja) 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置
WO2016094928A1 (en) 2014-12-18 2016-06-23 Halgo Pty Limited Replicating effects of optical lenses
CN106370308B (zh) * 2016-10-13 2023-07-04 中国科学院上海技术物理研究所 一种基于倾斜异形冷屏的长线阵推扫红外热成像系统
US10190907B1 (en) * 2017-09-29 2019-01-29 Raytheon Company Convex warm shield for thermal imaging device
JP6384939B1 (ja) * 2017-10-19 2018-09-05 エーエーシー テクノロジーズ ピーティーイー リミテッドAac Technologies Pte.Ltd. 撮像光学レンズ

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US2380216A (en) * 1942-02-09 1945-07-10 Eastman Kodak Co Lens system
US4783593A (en) * 1985-12-26 1988-11-08 General Electric Company Optical system for wide angle IR imager
US4820923A (en) * 1986-06-19 1989-04-11 Santa Barbara Research Center Uncooled reflective shield for cryogenically-cooled radiation detectors
JP2615913B2 (ja) * 1988-09-26 1997-06-04 富士通株式会社 赤外線光学装置
JP2691226B2 (ja) 1989-07-10 1997-12-17 株式会社ニコン 赤外線撮像光学装置
JPH05312638A (ja) * 1992-05-15 1993-11-22 Nikon Corp 赤外線光学装置
JPH06160696A (ja) * 1992-11-24 1994-06-07 Nikon Corp 像検出光学装置
US5444250A (en) 1994-08-15 1995-08-22 Hughes Aircraft Company Optical warm stop with fresnel type reflective surface
US6323995B1 (en) * 1998-03-17 2001-11-27 Olympus Optical Co., Ltd. Optical element switching device and optical microscope loaded with the device
JP4642178B2 (ja) * 2000-01-18 2011-03-02 オリンパス株式会社 赤外顕微鏡及びそれに用いる観察鏡筒
DE60044580D1 (de) * 2000-08-29 2010-08-05 Perkinelmer Singapore Pte Ltd Mikroskop für Infrarotabbildung
GB2382153B (en) 2001-11-16 2005-09-28 Thales Optics Ltd Optical imaging apparatus for negatively distorting an intermediate image
US6825978B2 (en) * 2002-04-04 2004-11-30 Hypervision, Inc. High sensitivity thermal radiation detection with an emission microscope with room temperature optics
CN1233985C (zh) * 2003-03-27 2005-12-28 北京大学 对准键合精度检测系统
US7002154B2 (en) * 2003-04-25 2006-02-21 Raytheon Company Optical system for a wide field of view staring infrared sensor having improved optical symmetry
US7427758B2 (en) * 2003-05-28 2008-09-23 Opto-Knowledge Systems, Inc. Cryogenically cooled adjustable apertures for infra-red cameras
JP2005128443A (ja) * 2003-10-27 2005-05-19 Nikon Corp 顕微鏡
TWI302756B (en) * 2004-04-19 2008-11-01 Phoseon Technology Inc Imaging semiconductor structures using solid state illumination
US7457052B2 (en) * 2004-08-09 2008-11-25 Hitachi Maxwell, Ltd. Light shield sheet, optical apparatus, and method of manufacturing light shield sheet
US7180067B2 (en) * 2005-02-15 2007-02-20 Raytheon Company Infrared imaging system with ellipsoid reflective warm baffle and method
JP2007163738A (ja) * 2005-12-13 2007-06-28 Nikon Corp 自動焦点調節機構を備えた光学装置
US7586674B2 (en) * 2006-10-17 2009-09-08 Hnu-Photonics Compuscope
US7855844B2 (en) * 2007-05-17 2010-12-21 Mitutoyo Corporation Objective lens and optical measuring device
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JP5282391B2 (ja) * 2007-10-31 2013-09-04 富士通株式会社 赤外線撮像装置
JP5091716B2 (ja) * 2008-02-21 2012-12-05 株式会社ミツトヨ テレセントリックレンズ光学系および画像測定装置
JP2009204423A (ja) * 2008-02-27 2009-09-10 Fujitsu Ltd 赤外線撮像装置
JP4939574B2 (ja) * 2008-08-28 2012-05-30 日東電工株式会社 熱硬化型ダイボンドフィルム
JP5616611B2 (ja) * 2009-11-24 2014-10-29 オリンパス株式会社 微弱光標本撮像装置
JP6000546B2 (ja) * 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置

Also Published As

Publication number Publication date
JP2013033198A (ja) 2013-02-14
KR101916494B1 (ko) 2018-11-07
KR20140043358A (ko) 2014-04-09
TWI516749B (zh) 2016-01-11
US20200241275A1 (en) 2020-07-30
TWI585457B (zh) 2017-06-01
US10048483B2 (en) 2018-08-14
US10663709B2 (en) 2020-05-26
KR20180122739A (ko) 2018-11-13
CN105842836B (zh) 2018-08-31
US20160313547A1 (en) 2016-10-27
WO2013001932A1 (ja) 2013-01-03
TW201307813A (zh) 2013-02-16
EP2728391B1 (en) 2019-09-18
US9411143B2 (en) 2016-08-09
CN103649814A (zh) 2014-03-19
KR102005210B1 (ko) 2019-07-29
US20180307030A1 (en) 2018-10-25
US20140111848A1 (en) 2014-04-24
EP2728391A1 (en) 2014-05-07
CN105842836A (zh) 2016-08-10
EP2728391A4 (en) 2015-05-06
JP6000546B2 (ja) 2016-09-28
TW201606346A (zh) 2016-02-16

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