KR102005210B1 - 현미 장치 및 현미 관찰 방법 - Google Patents

현미 장치 및 현미 관찰 방법 Download PDF

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Publication number
KR102005210B1
KR102005210B1 KR1020187031620A KR20187031620A KR102005210B1 KR 102005210 B1 KR102005210 B1 KR 102005210B1 KR 1020187031620 A KR1020187031620 A KR 1020187031620A KR 20187031620 A KR20187031620 A KR 20187031620A KR 102005210 B1 KR102005210 B1 KR 102005210B1
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South Korea
Prior art keywords
optical system
optical
light
stop
opening
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KR1020187031620A
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English (en)
Korean (ko)
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KR20180122739A (ko
Inventor
도모노리 나카무라
이쿠오 아라타
요시히로 이토
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하마마츠 포토닉스 가부시키가이샤
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G02B13/24—Optical objectives specially designed for the purposes specified below for reproducing or copying at short object distances
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G02B21/04—Objectives involving mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/248—Base structure objective (or ocular) turrets
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/368—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements details of associated display arrangements, e.g. mounting of LCD monitor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0018—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for preventing ghost images
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/005—Diaphragms
    • G02B5/006—Diaphragms cooled
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/023—Mountings, adjusting means, or light-tight connections, for optical elements for lenses permitting adjustment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
  • Lens Barrels (AREA)
  • Studio Devices (AREA)
  • Overhead Projectors And Projection Screens (AREA)
KR1020187031620A 2011-06-30 2012-05-17 현미 장치 및 현미 관찰 방법 Active KR102005210B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2011145488 2011-06-30
JPJP-P-2011-145488 2011-06-30
JPJP-P-2011-286218 2011-12-27
JP2011286218A JP6000546B2 (ja) 2011-06-30 2011-12-27 顕微観察用光学装置
PCT/JP2012/062668 WO2013001932A1 (ja) 2011-06-30 2012-05-17 顕微観察用光学装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020137031539A Division KR101916494B1 (ko) 2011-06-30 2012-05-17 현미 관찰용 광학 장치

Publications (2)

Publication Number Publication Date
KR20180122739A KR20180122739A (ko) 2018-11-13
KR102005210B1 true KR102005210B1 (ko) 2019-07-29

Family

ID=47423835

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020137031539A Active KR101916494B1 (ko) 2011-06-30 2012-05-17 현미 관찰용 광학 장치
KR1020187031620A Active KR102005210B1 (ko) 2011-06-30 2012-05-17 현미 장치 및 현미 관찰 방법

Family Applications Before (1)

Application Number Title Priority Date Filing Date
KR1020137031539A Active KR101916494B1 (ko) 2011-06-30 2012-05-17 현미 관찰용 광학 장치

Country Status (7)

Country Link
US (4) US9411143B2 (enExample)
EP (1) EP2728391B1 (enExample)
JP (1) JP6000546B2 (enExample)
KR (2) KR101916494B1 (enExample)
CN (2) CN105842836B (enExample)
TW (2) TWI516749B (enExample)
WO (1) WO2013001932A1 (enExample)

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* Cited by examiner, † Cited by third party
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JP6307130B2 (ja) * 2011-06-30 2018-04-04 浜松ホトニクス株式会社 顕微装置及び顕微観察方法
JP6000546B2 (ja) 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置
WO2016094928A1 (en) 2014-12-18 2016-06-23 Halgo Pty Limited Replicating effects of optical lenses
CN106370308B (zh) * 2016-10-13 2023-07-04 中国科学院上海技术物理研究所 一种基于倾斜异形冷屏的长线阵推扫红外热成像系统
US10190907B1 (en) * 2017-09-29 2019-01-29 Raytheon Company Convex warm shield for thermal imaging device
JP6384939B1 (ja) * 2017-10-19 2018-09-05 エーエーシー テクノロジーズ ピーティーイー リミテッドAac Technologies Pte.Ltd. 撮像光学レンズ

Citations (1)

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KR100966931B1 (ko) * 2002-04-04 2010-06-30 디씨지 시스템스 인코포레이티드 실온 광학을 갖는 방출 현미경에서 고 감도 열 방사 감지

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US4783593A (en) * 1985-12-26 1988-11-08 General Electric Company Optical system for wide angle IR imager
US4820923A (en) * 1986-06-19 1989-04-11 Santa Barbara Research Center Uncooled reflective shield for cryogenically-cooled radiation detectors
JP2615913B2 (ja) * 1988-09-26 1997-06-04 富士通株式会社 赤外線光学装置
JP2691226B2 (ja) 1989-07-10 1997-12-17 株式会社ニコン 赤外線撮像光学装置
JPH05312638A (ja) * 1992-05-15 1993-11-22 Nikon Corp 赤外線光学装置
JPH06160696A (ja) * 1992-11-24 1994-06-07 Nikon Corp 像検出光学装置
US5444250A (en) 1994-08-15 1995-08-22 Hughes Aircraft Company Optical warm stop with fresnel type reflective surface
US6323995B1 (en) * 1998-03-17 2001-11-27 Olympus Optical Co., Ltd. Optical element switching device and optical microscope loaded with the device
JP4642178B2 (ja) * 2000-01-18 2011-03-02 オリンパス株式会社 赤外顕微鏡及びそれに用いる観察鏡筒
DE60044580D1 (de) * 2000-08-29 2010-08-05 Perkinelmer Singapore Pte Ltd Mikroskop für Infrarotabbildung
GB2382153B (en) 2001-11-16 2005-09-28 Thales Optics Ltd Optical imaging apparatus for negatively distorting an intermediate image
CN1233985C (zh) * 2003-03-27 2005-12-28 北京大学 对准键合精度检测系统
US7002154B2 (en) * 2003-04-25 2006-02-21 Raytheon Company Optical system for a wide field of view staring infrared sensor having improved optical symmetry
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JP6000546B2 (ja) * 2011-06-30 2016-09-28 浜松ホトニクス株式会社 顕微観察用光学装置

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Also Published As

Publication number Publication date
US10663709B2 (en) 2020-05-26
TWI585457B (zh) 2017-06-01
CN103649814A (zh) 2014-03-19
US10048483B2 (en) 2018-08-14
US20140111848A1 (en) 2014-04-24
EP2728391A4 (en) 2015-05-06
US20180307030A1 (en) 2018-10-25
JP2013033198A (ja) 2013-02-14
EP2728391B1 (en) 2019-09-18
CN105842836A (zh) 2016-08-10
WO2013001932A1 (ja) 2013-01-03
CN105842836B (zh) 2018-08-31
CN103649814B (zh) 2016-06-29
TW201606346A (zh) 2016-02-16
TW201307813A (zh) 2013-02-16
US20200241275A1 (en) 2020-07-30
KR101916494B1 (ko) 2018-11-07
KR20140043358A (ko) 2014-04-09
EP2728391A1 (en) 2014-05-07
JP6000546B2 (ja) 2016-09-28
TWI516749B (zh) 2016-01-11
US9411143B2 (en) 2016-08-09
KR20180122739A (ko) 2018-11-13
US20160313547A1 (en) 2016-10-27

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