CN103620375B - 高通量准直照射器和均匀场照射的方法 - Google Patents
高通量准直照射器和均匀场照射的方法 Download PDFInfo
- Publication number
- CN103620375B CN103620375B CN201280031845.6A CN201280031845A CN103620375B CN 103620375 B CN103620375 B CN 103620375B CN 201280031845 A CN201280031845 A CN 201280031845A CN 103620375 B CN103620375 B CN 103620375B
- Authority
- CN
- China
- Prior art keywords
- light source
- surface point
- distance
- secondary light
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8483—Investigating reagent band
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Signal Processing (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161480426P | 2011-04-29 | 2011-04-29 | |
| US61/480426 | 2011-04-29 | ||
| PCT/US2012/035346 WO2012149243A1 (en) | 2011-04-29 | 2012-04-27 | High flux collimated illuminator and method of uniform field illumination |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103620375A CN103620375A (zh) | 2014-03-05 |
| CN103620375B true CN103620375B (zh) | 2016-06-29 |
Family
ID=47072763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280031845.6A Active CN103620375B (zh) | 2011-04-29 | 2012-04-27 | 高通量准直照射器和均匀场照射的方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20140028857A1 (enExample) |
| EP (1) | EP2691759B1 (enExample) |
| JP (1) | JP6096173B2 (enExample) |
| CN (1) | CN103620375B (enExample) |
| HU (1) | HUE063638T2 (enExample) |
| WO (1) | WO2012149243A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6599721B2 (ja) * | 2015-10-09 | 2019-10-30 | 栄研化学株式会社 | 試験片分析装置及び試験片分析方法 |
| US11585804B2 (en) | 2018-10-19 | 2023-02-21 | Youcount Inc. | Urinalysis device and test strip for home and point of care use |
| CA3049972A1 (en) | 2019-07-15 | 2021-01-15 | Youcount Inc. | Urinalysis test strip for over-the-counter use |
| JP7465963B2 (ja) * | 2019-10-31 | 2024-04-11 | シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレイテッド | 試料および/または試料容器の特性評価のための背景照明の較正を提供する方法および装置 |
| EP4196720A4 (en) * | 2020-08-12 | 2024-01-24 | Siemens Healthcare Diagnostics, Inc. | CIRCUIT BOARD WITH INTEGRATED LIGHT SOURCES |
| KR102421127B1 (ko) * | 2021-12-23 | 2022-07-15 | 주식회사 뷰온 | 에어리어 카메라가 구비된 검사 장치 및 에어리어 카메라가 구비된 검사 장치를 이용한 검사 방법 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5717485A (en) * | 1995-04-24 | 1998-02-10 | Matsushita Electric Industrial Co., Ltd. | Foreign substance inspection apparatus |
| US5877863A (en) * | 1997-03-20 | 1999-03-02 | Bayer Corporation | Readhead for a photometric diagnostic instrument |
| CN101208594A (zh) * | 2005-07-08 | 2008-06-25 | 伊雷克托科学工业股份有限公司 | 光源的平面阵列所发射的收敛光线的获得 |
| US7852481B2 (en) * | 2007-04-03 | 2010-12-14 | Konica Minolta Sensing, Inc. | Apparatus and method for measuring optical property |
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| NL145946B (nl) * | 1949-04-13 | Philips Nv | Inrichting voor het verwekken van koude, in het bijzonder bij zeer lage temperaturen. | |
| DE1284830B (de) * | 1967-11-30 | 1968-12-05 | Agfa Gevaert Ag | Mikrofilm-Aufnahmegeraet |
| US3535688A (en) * | 1969-05-09 | 1970-10-20 | Du Pont | Magnetic buffer storage |
| US3830591A (en) * | 1973-05-04 | 1974-08-20 | Eastman Kodak Co | Illumination apparatus |
| JPS5685975A (en) * | 1979-12-14 | 1981-07-13 | Fujitsu Ltd | Uniform illumination method |
| US4728848A (en) * | 1981-11-09 | 1988-03-01 | Duro-Test Corporation | Energy-efficient incandescent reflector lamp |
| US4755058A (en) | 1984-06-19 | 1988-07-05 | Miles Laboratories, Inc. | Device and method for measuring light diffusely reflected from a nonuniform specimen |
| US4731854A (en) * | 1986-07-17 | 1988-03-15 | Perceptics Corporation | Optical system for producing an image for a set of characters |
| CA2009129C (en) * | 1989-02-04 | 1995-02-14 | Mitsubishi Chemical Corporation | Image pickup head for image pickup device |
| JPH03181807A (ja) * | 1989-12-12 | 1991-08-07 | Omron Corp | 視覚装置 |
| JP2529043B2 (ja) * | 1991-09-30 | 1996-08-28 | 株式会社スタビック | 照明撮像装置 |
| US5461417A (en) * | 1993-02-16 | 1995-10-24 | Northeast Robotics, Inc. | Continuous diffuse illumination method and apparatus |
| CA2175071C (en) * | 1993-10-26 | 1999-11-30 | Naoyuki Shiratori | Measuring method and apparatus of gloss irregularity and printing unevenness |
| JPH08186743A (ja) * | 1994-12-29 | 1996-07-16 | Fuji Photo Film Co Ltd | 画像入力装置用照明装置 |
| US5751910A (en) * | 1995-05-22 | 1998-05-12 | Eastman Kodak Company | Neural network solder paste inspection system |
| US5518689A (en) | 1995-09-05 | 1996-05-21 | Bayer Corporation | Diffused light reflectance readhead |
| JPH09259253A (ja) * | 1996-03-22 | 1997-10-03 | Nec Corp | 画像入力装置 |
| US5654803A (en) | 1996-05-09 | 1997-08-05 | Bayer Corporation | Apparatus and method for determination of non-hemolyzed levels of occult blood in urine |
| IL121279A (en) * | 1996-07-16 | 2001-05-20 | Roche Diagnostics Gmbh | An analytical system with means for testing samples with too small volumes |
| JPH10170242A (ja) * | 1996-12-12 | 1998-06-26 | Sharp Corp | シール剤塗布検査方法及びその装置 |
| TW402856B (en) * | 1996-12-26 | 2000-08-21 | Palite Corp | LED illuminator |
| US6105869A (en) * | 1997-10-31 | 2000-08-22 | Microscan Systems, Incorporated | Symbol reading device including optics for uniformly illuminating symbology |
| US20040114035A1 (en) * | 1998-03-24 | 2004-06-17 | Timothy White | Focusing panel illumination method and apparatus |
| JP2001118158A (ja) * | 1999-10-20 | 2001-04-27 | Nippon Aleph Corp | 複合型センサ |
| US7038208B2 (en) * | 2002-08-31 | 2006-05-02 | The Research Foundation of the City of New York | Systems and methods for non-destructively detecting material abnormalities beneath a coated surface |
| FR2846424B1 (fr) * | 2002-10-25 | 2006-02-03 | Bsn Glasspack | Procede et dispositif d'eclairage pour detecter des defaut et/ou de manque de matiere sur la bague d'un recipient transparent ou translucide |
| WO2004044565A1 (ja) * | 2002-11-14 | 2004-05-27 | Ccs Inc. | 光量調整システム |
| KR100966544B1 (ko) * | 2002-12-24 | 2010-06-29 | 주식회사 포스코 | 코일 표면의 선형 요철성 결함 검출 장치 |
| JP2005028100A (ja) * | 2003-06-18 | 2005-02-03 | Seiko Epson Corp | 遊技機 |
| US7092094B2 (en) * | 2003-09-29 | 2006-08-15 | General Electric Company | Coordinated polarization for shiny surface measurement |
| US7070293B2 (en) * | 2004-07-22 | 2006-07-04 | Herbert E. Seymour | Lighting array for wall hangings |
| JP2006115288A (ja) * | 2004-10-15 | 2006-04-27 | Canon Inc | 画像形成装置 |
| AU2005327078A1 (en) * | 2004-12-28 | 2006-08-17 | Hypermed Imaging, Inc. | Hyperspectral/multispectral imaging in determination, assessment and monitoring of systemic physiology and shock |
| WO2007129326A2 (en) * | 2006-05-09 | 2007-11-15 | Technion Research & Development Foundation Ltd | Imaging systems and methods for recovering object visibility |
| US7852564B2 (en) * | 2006-09-27 | 2010-12-14 | Microscan Systems, Inc. | Devices and/or systems for illuminating a component |
| US20080267446A1 (en) * | 2007-04-18 | 2008-10-30 | Dale Capewell | Chemistry strip reader and method |
| WO2009048833A1 (en) * | 2007-10-09 | 2009-04-16 | Siemens Healthcare Diagnostics Inc. | Two dimensional imaging of reacted areas on a reagent |
| WO2010059537A1 (en) * | 2008-11-19 | 2010-05-27 | Siemens Healthcare Diagnostics Inc. | Polarized optics for optical diagnostic device |
| KR100928159B1 (ko) * | 2008-12-24 | 2009-11-23 | 한성엘컴텍 주식회사 | 광원모듈과 이를 이용한 조명장치 |
| TWI398745B (zh) * | 2009-03-06 | 2013-06-11 | Ind Tech Res Inst | 基於光線強度的定位方法及系統 |
| JP2011075534A (ja) * | 2009-10-01 | 2011-04-14 | Hikichi Seiko Kk | 曲面外観検査装置 |
-
2012
- 2012-04-27 WO PCT/US2012/035346 patent/WO2012149243A1/en not_active Ceased
- 2012-04-27 EP EP12776025.4A patent/EP2691759B1/en active Active
- 2012-04-27 US US14/112,573 patent/US20140028857A1/en not_active Abandoned
- 2012-04-27 CN CN201280031845.6A patent/CN103620375B/zh active Active
- 2012-04-27 HU HUE12776025A patent/HUE063638T2/hu unknown
- 2012-04-27 JP JP2014508575A patent/JP6096173B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5717485A (en) * | 1995-04-24 | 1998-02-10 | Matsushita Electric Industrial Co., Ltd. | Foreign substance inspection apparatus |
| US5877863A (en) * | 1997-03-20 | 1999-03-02 | Bayer Corporation | Readhead for a photometric diagnostic instrument |
| CN101208594A (zh) * | 2005-07-08 | 2008-06-25 | 伊雷克托科学工业股份有限公司 | 光源的平面阵列所发射的收敛光线的获得 |
| US7852481B2 (en) * | 2007-04-03 | 2010-12-14 | Konica Minolta Sensing, Inc. | Apparatus and method for measuring optical property |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2691759A4 (en) | 2015-07-29 |
| WO2012149243A1 (en) | 2012-11-01 |
| EP2691759B1 (en) | 2023-05-31 |
| JP2014517271A (ja) | 2014-07-17 |
| US20140028857A1 (en) | 2014-01-30 |
| EP2691759A1 (en) | 2014-02-05 |
| JP6096173B2 (ja) | 2017-03-15 |
| HUE063638T2 (hu) | 2024-01-28 |
| CN103620375A (zh) | 2014-03-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |