CN103490724A - Full-back contact solar cell test bench - Google Patents
Full-back contact solar cell test bench Download PDFInfo
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- CN103490724A CN103490724A CN201310399941.2A CN201310399941A CN103490724A CN 103490724 A CN103490724 A CN 103490724A CN 201310399941 A CN201310399941 A CN 201310399941A CN 103490724 A CN103490724 A CN 103490724A
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- testboard
- solar cell
- back contact
- test probe
- cell
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention provides a full-back contact solar cell test bench. The full-back contact solar cell test bench comprises a test bench body, test probes and an adsorption assembly, wherein the test probes are arranged on the upper surface and the lower surface of the test bench body in a penetrating mode, extrude the back face of a solar panel and measure the electrical characteristics of the solar panel from the back face of the solar panel; the adsorption assembly is embedded into the test bench body, makes contact with the solar panel and adsorbs the back face of the solar panel; the adsorption force of the adsorption assembly on the back face of the solar panel is larger than the extrusion force of the test probes on the solar panel. The test bench body is provided with rubber vacuum suckers in an embedded mode and an insulating bench board is adopted, and therefore a back contact cell piece can be flat adsorbed on the test bench body, and the test bench body can transmit heat of the cell piece to a temperature control unit below the test bench body.
Description
Technical field
the present invention relates to entirely carry on the back area of solar cell, particularly a kind of full back contact solar cell testboard.
Background technology
Solar cell is a kind of semiconductor device/structure, is light energy conversion electric energy; The polycrystalline solar cell that monolithic is 6 cun can produce the electric current of about 8 to 9 amperes, the operating voltage of 0.5V, the power of 4W.Between the probe of measured voltage/current and cell piece, contact resistance is arranged.When the electric current of 8 to 9 amperes is flowed through probe, will produce touch voltage.The size of this touch voltage and stability all can affect the certainty of measurement of cell piece conversion efficiency.
Be illustrated in figure 1 the testboard that prior art provides, it comprises spring probe bar 11, conventional batteries sheet 12, gold-plated test companion 13 and temperature control unit 14.The solar panel testboard that prior art provides is being measured positive and negative electrode all during full back contact solar cell overleaf, must all probes with spring be placed on cell piece below.Usually with glass, cell piece is pressed on probe, sunlight, from through glass, then impinges upon the upper surface of cell piece.The shortcoming of doing like this is: glass can be reflected away a part of light, and the actual light intensity that arrives the cell piece surface does not reach the numerical value that anticipation is set, and this has just affected the accuracy of measuring.
Another technical problem is: the test probe head size of back of the body contact battery is generally 1mm, and the top power of spring has 50g-150g; So cell piece is stressed very large the probe contact point, the probe contact point is easy to the damage of tested probe jack-up like this; So must be adsorbed on cell piece firmly on testing stand, make cell panel there is no at all up prominent distortion.
The 3rd technical problem is: because the positive and negative grid line of battery all overleaf, when it is placed on the gold-plated copper coin of traditional temperature control, positive and negative grid line can be by gold-plated copper coin short circuit.If testboard adopts the material of electric insulation to make, its heat conductivility is just poor.
Summary of the invention
The invention provides a kind of full back contact solar cell testboard, it comprises testboard body, test probe and absorbent module, wherein
Described test probe: be arranged in the upper and lower surface of described testboard body, described test probe pushes the described cell panel back side and measures the electrical characteristics of described cell panel from the described cell panel back side;
Absorbent module: be embedded in described testboard body, contact with described solar panel and adsorb the described cell panel back side;
Described absorbent module is greater than the extruding force of described test probe to described cell panel to the absorption affinity at the described cell panel back side.
Preferably, described testboard body is heat-conducting, and the table top of described testboard body is covered with electrical insulating material.
Preferably, described testboard body adopts aluminum alloy material, and described table top forms insulating oxide after oxidation processes.
Preferably, described test probe has a stroke moved up and down.Preferably, described test probe initial position is lower than the table top of described testboard, and described test probe is moved by pneumatic or machine power.
Preferably, described test probe position immobilizes.
Preferably, described test probe is spring probe, and it is for completing the measurement to cell panel electric current and voltage from the cell panel back.
Preferably, described test probe is coaxial kelvin spring probe or conventional spring probe.
Preferably, described absorbent module comprises vacuum cup and vacuum tracheae, and the air in described vacuum tracheae extracting vacuum tracheae and vacuum cup forms negative pressure and completes the absorption to described Solar panel backside.
Preferably, also comprise temperature control unit, described temperature control unit is connected with described testboard body and described testboard body is carried out to adjustment.
Preferably, described temperature control unit comprises Peltier semiconductor temperature-control device.
Preferably, described solar panel is IBC back contact silicon solar cell, EWT back contact silicon solar cell or MWT back contact silicon solar cell.
Testboard body provided by the invention has been inlayed the rubber vacuum sucker, adopts the table top of insulation simultaneously, and above can entirely being adsorbed on back of the body contact battery, it also can be delivered to the temperature control unit below it to the heat of cell piece simultaneously.
Certainly, implement arbitrary product of the present invention and might not need to reach above-described all advantages simultaneously.
The accompanying drawing explanation
The solar cell test platform structural representation that Fig. 1 provides for prior art;
The solar cell test platform structural representation that Fig. 2 provides for the embodiment of the present invention two;
The coaxial kelvin spring probe structural representation that Fig. 3 provides for the embodiment of the present invention two;
The conventional spring probe structural representation that Fig. 4 provides for the embodiment of the present invention two;
The vacuum cup distribution schematic diagram that Fig. 5 provides for the embodiment of the present invention two;
Another vacuum cup distribution schematic diagram that Fig. 6 provides for the embodiment of the present invention two.
Specific embodiment
Embodiment mono-
The embodiment of the present invention provides a kind of full back contact solar cell testboard, and it comprises testboard body, test probe and absorbent module, wherein
Described test probe: it is arranged in the upper and lower surface of described testboard body, and described test probe pushes the described cell panel back side and measures the electrical characteristics of described cell panel from the described cell panel back side;
Absorbent module: it is embedded in described testboard body, contacts with described solar panel and adsorbs the described cell panel back side;
Described absorbent module is greater than the extruding force of described test probe to described cell panel to the absorption affinity at the described cell panel back side.
The present embodiment can be for full back contact solar cell, and full back contact solar cell comprises IBC back of the body contact battery, EWT back of the body contact battery and MWT back of the body contact battery here.Certainly the present invention also can be for the solar cell of other form, and the present invention only illustrates, and the present embodiment does not limit the scope of application of the present invention;
Full back contact solar cell in this example: refer to the surperficial gate-shaped electrode of conventional solar cell is moved on to the back side, thereby enlarge lighting area.So the measurement point of electric current and voltage is all at the back side of cell piece.According to the difference of the technology of employing, full back contact solar cell can be divided into again:
IBC back of the body contact battery: the abbreviation that is Interdigitated Back Contact silicon solar cell.It is the high performance solar batteries of being developed the earliest by Sunpower company, is characterized in positive without gate-shaped electrode, and the both positive and negative polarity cross arrangement rearward.The measurement point of electric current and voltage is all at the back side of cell piece;
EWT back of the body contact battery: the abbreviation that is Emitter Wrap Through silicon solar cell.Also can be referred to as emitter electrode around logical solar cell.The back side of battery transferred to the metal electrode grid line fully by this battery, makes the main grid of positive and negative electrode be distributed in the both sides of cell backside;
MWT back of the body contact battery: the abbreviation that is Metalization Wrap Through silicon solar cell.Also can be referred to as metal electrode around logical solar cell.The electronics that the MWT battery is collected battery front side by the metal transfer in hole to cell backside.It no longer need to make gate-shaped electrode at battery front side, so battery surface just has more large tracts of land to collect photon and be translated into electric energy.
Embodiment bis-
As shown in Figure 2, in the present embodiment, what solar battery sheet adopted is full back contact silicon cell piece 1, what test probe adopted is coaxial kelvin spring probe 2, absorbent module comprises rubber vacuum sucker 3 and vacuum tracheae 4, testboard body 5 is for table top insulation but have the testboard of excellent heat-conducting function, and temperature control unit 6 is for regulating the temperature of testboard body 5.
The coaxial Kelvin spring probe that the present embodiment adopts, its probe 31 is measuring voltages, peripheral probe 32 is used for measuring electric current.The present embodiment also can adopt conventional spring probe, and this routine spring probe adopts two probes together, and one is used for measuring voltage, and another root is measured electric current.The present invention is not limited spring probe, and the spring probe that can simultaneously measure electric current and voltage all can be used in the present invention.
The coaxial kelvin spring probe 2 that the present embodiment provides has a stroke moved up and down, in the present embodiment, the scope that coaxial kelvin spring probe 2 highly surpasses the table top of testboard body is 1mm-3mm, certainly this scope can be regulated according to specific needs, and the present embodiment only illustrates.By this altitude range being regulated to the extruding force that changes 2 pairs of full back contact silicon cell pieces 1 of coaxial kelvin spring probe, so that coaxial kelvin spring probe 2 reaches minimum contact resistance.
The initial position of the coaxial kelvin spring probe 2 that the present embodiment provides is lower than the table top of testboard body 5, coaxial kelvin spring probe 2 is moved by pneumatic, manpower or other machine power, makes coaxial kelvin spring probe 2 exceed table top and withstands the test point of full back contact silicon cell piece 1; Certainly the position of coaxial kelvin spring probe 2 provided by the invention also can immobilize.The present invention is not limited the position of test probe, and the present embodiment only illustrates.In the present embodiment, the upper surface that the table top of testboard body is testboard body in figure, the i.e. surface relative with cell piece.
The present embodiment adopts coaxial Kelvin spring probe, and its current probe and cell piece contact-making surface are the garden circles, and contact resistance is little; The pin at the contact-making surface Shi Yuanquan center of voltage probe, contact area is little.It is adapted to the back contact solar cell that pad is little.Also can improve the contact reliability of back of the body contact battery.
As shown in Figure 5, the distribution of the rubber vacuum sucker 3 that the present embodiment provides is the peripheries that are trapped among coaxial kelvin spring probe 2, particularly at the probe periphery at cell piece edge.The position of rubber vacuum sucker also must be near the cell piece edge;
As shown in Figure 6, be the distribution schematic diagram of another kind of rubber vacuum sucker, the contact point of full back contact silicon cell piece 1 is more, and what probe adopted is conventional spring probe;
The present embodiment is according to the quantity of coaxial kelvin spring probe used, and up the power on top can be up to 2Kg; The spring probe of varying number can be set according to the size of cell piece certainly, and the dynamics on the upper top reached also can be different, and the present embodiment is only a better embodiment of the present invention.
The absorbent module that the present embodiment provides comprises vacuum cup 3 and vacuum tracheae 4, by vacuum tracheae 3 extracting vacuum tracheaes 3 and the air formation negative pressure in vacuum cup 4, completes the absorption to described Solar panel backside.The vacuum cup 3 that the present embodiment adopts is the rubber vacuum sucker, and the rubber vacuum sucker specification that the present embodiment provides is: specially designed rubber suction cups size: 6mm to 12mm, sucker lip thickness 0.5mm-1mm.The material of rubber vacuum suction nozzle comprises acrylonitrile-butadiene rubber, or fluorosioloxane rubber, and hardness is at Shore A 45 – A65.The serviceability temperature scope (℃) :-20 ° of C are to+110 ° of C.
The present embodiment also comprises temperature control unit 6, temperature control unit 6 is connected with testboard body 5 and testboard body 5 is carried out to adjustment, the temperature control unit 6 that the present embodiment adopts is Peltier semiconductor temperature-control device, it can regulate the temperature of testboard rapidly, thereby the temperature that is adsorbed on the cell piece above it is regulated.Certainly, temperature control unit 6 provided by the invention also can adopt the attemperating unit of other type, and the present embodiment is the better embodiment of tool one temperature control unit 6 only, and the present embodiment does not limit temperature control unit 6 of the present invention.
The insulation that the present embodiment provides but having the material commonly used that the testboard body 5 of excellent heat-conducting function can adopt is aluminium alloy, its surface, through oxidation processes, forms electric insulation layer, the table top of testboard body 5 carries out oxidation processes and forms electric insulation layer.Certain testboard body 5 provided by the invention also can adopt other Heat Conduction Materials to make, and the present invention does not simultaneously do restriction to the generation type of the insulating barrier of its table top yet.The present embodiment is only a better embodiment of the present invention.
The solar cell platform that the present embodiment provides is when measuring the back contact solar cell sheet, simulated solar irradiation is from impinging upon its upper surface directly over cell piece, probe with spring contacts from the back side of battery, complete voltage and current and measure, the power of each spring probe contact must between in 50g to 150g;
The present embodiment, in the situation that the front of cell piece does not have thing to push down, is realized withstanding battery with the probe of spring from the back side of battery, carries out the voltage and current measurement, can realize the control to the cell piece temperature simultaneously.
Testboard body provided by the invention has been inlayed the rubber vacuum sucker, adopts the table top of insulation simultaneously, and above can entirely being adsorbed on back of the body contact battery, it also can be delivered to the temperature control unit below it to the heat of cell piece simultaneously.
The above disclosed preferred embodiment of the present invention is just for helping to set forth the present invention.Preferred embodiment does not have all details of detailed descriptionthe, and also not limiting this invention is only described embodiment.Obviously, according to the content of this specification, can make many modifications and variations.These embodiment are chosen and specifically described to this specification, is in order to explain better principle of the present invention and practical application, thereby under making, the technical field technical staff can understand and utilize the present invention well.The present invention only is subject to the restriction of claims and four corner and equivalent.
Claims (12)
1. a full back contact solar cell testboard, is characterized in that, comprises testboard body, test probe and absorbent module, wherein
Described test probe: be arranged in the upper and lower surface of described testboard body, described test probe pushes the described cell panel back side and measures the electrical characteristics of described cell panel from the described cell panel back side;
Absorbent module: be embedded in described testboard body, contact with described solar panel and adsorb the described cell panel back side;
Described absorbent module is greater than the extruding force of described test probe to described cell panel to the absorption affinity at the described cell panel back side.
2. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described testboard body is heat-conducting, and the table top of described testboard body is covered with electrical insulating material.
3. full back contact solar cell testboard as claimed in claim 2, is characterized in that, described testboard body adopts aluminum alloy material, and described table top forms insulating oxide after oxidation processes.
4. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described test probe has a stroke moved up and down.
5. full back contact solar cell testboard as claimed in claim 4, is characterized in that, described test probe initial position is lower than the table top of described testboard, and described test probe is moved by pneumatic or machine power.
6. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described test probe position immobilizes.
7. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described test probe is spring probe, and it is for completing the measurement to cell panel electric current and voltage from the cell panel back.
8. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described test probe is coaxial kelvin spring probe or conventional spring probe.
9. full back contact solar cell testboard as claimed in claim 1, it is characterized in that, described absorbent module comprises vacuum cup and vacuum tracheae, and the air in described vacuum tracheae extracting vacuum tracheae and vacuum cup forms negative pressure and completes the absorption to described Solar panel backside.
10. full back contact solar cell testboard as described as claim 1-9 any one, is characterized in that, also comprises temperature control unit, and described temperature control unit is connected with described testboard body and described testboard body is carried out to adjustment.
11. full back contact solar cell testboard as claimed in claim 10 is characterized in that described temperature control unit comprises Peltier semiconductor temperature-control device.
12. full back contact solar cell testboard as claimed in claim 1, is characterized in that, described solar panel is IBC back contact silicon solar cell, EWT back contact silicon solar cell or MWT back contact silicon solar cell
.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201310399941.2A CN103490724A (en) | 2013-09-05 | 2013-09-05 | Full-back contact solar cell test bench |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310399941.2A CN103490724A (en) | 2013-09-05 | 2013-09-05 | Full-back contact solar cell test bench |
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| CN103490724A true CN103490724A (en) | 2014-01-01 |
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| CN201310399941.2A Pending CN103490724A (en) | 2013-09-05 | 2013-09-05 | Full-back contact solar cell test bench |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105375880A (en) * | 2015-11-27 | 2016-03-02 | 中国电子科技集团公司第四十八研究所 | Back contact solar cell sheet test platform |
| CN105827201A (en) * | 2016-04-08 | 2016-08-03 | 浙江晶科能源有限公司 | Crystalline silicon solar main-grid-free battery sheet IV test apparatus |
| CN106803743A (en) * | 2015-11-25 | 2017-06-06 | 波音公司 | For keeping, detecting and testing the temperature control platform of solar cell, system and method |
| CN107911080A (en) * | 2017-12-19 | 2018-04-13 | 泰州隆基乐叶光伏科技有限公司 | The test device of solar cell electrical property |
| CN108133898A (en) * | 2017-12-19 | 2018-06-08 | 泰州隆基乐叶光伏科技有限公司 | A kind of solar cell electric performance testing device |
| CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106803743A (en) * | 2015-11-25 | 2017-06-06 | 波音公司 | For keeping, detecting and testing the temperature control platform of solar cell, system and method |
| CN106803743B (en) * | 2015-11-25 | 2020-04-17 | 波音公司 | Temperature control platform, system and method for holding, probing and testing solar cells |
| TWI703811B (en) * | 2015-11-25 | 2020-09-01 | 美商波音公司 | Temperature controlled system and method for holding, probing, and testing solar cells |
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| CN105375880A (en) * | 2015-11-27 | 2016-03-02 | 中国电子科技集团公司第四十八研究所 | Back contact solar cell sheet test platform |
| CN105827201A (en) * | 2016-04-08 | 2016-08-03 | 浙江晶科能源有限公司 | Crystalline silicon solar main-grid-free battery sheet IV test apparatus |
| CN107911080A (en) * | 2017-12-19 | 2018-04-13 | 泰州隆基乐叶光伏科技有限公司 | The test device of solar cell electrical property |
| CN108133898A (en) * | 2017-12-19 | 2018-06-08 | 泰州隆基乐叶光伏科技有限公司 | A kind of solar cell electric performance testing device |
| CN107911080B (en) * | 2017-12-19 | 2024-04-09 | 泰州隆基乐叶光伏科技有限公司 | Testing device for electrical performance of solar cell |
| CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
| CN108206671B (en) * | 2018-02-10 | 2024-04-09 | 泰州隆基乐叶光伏科技有限公司 | MBB solar cell testboard |
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Application publication date: 20140101 |