CN108206671B - MBB solar cell testboard - Google Patents
MBB solar cell testboard Download PDFInfo
- Publication number
- CN108206671B CN108206671B CN201810138611.0A CN201810138611A CN108206671B CN 108206671 B CN108206671 B CN 108206671B CN 201810138611 A CN201810138611 A CN 201810138611A CN 108206671 B CN108206671 B CN 108206671B
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- China
- Prior art keywords
- copper
- copper table
- voltage
- mbb
- solar cell
- Prior art date
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 92
- 229910052802 copper Inorganic materials 0.000 claims abstract description 80
- 239000010949 copper Substances 0.000 claims abstract description 80
- 238000012360 testing method Methods 0.000 claims abstract description 39
- 230000007246 mechanism Effects 0.000 claims abstract description 22
- 239000000523 sample Substances 0.000 claims abstract description 16
- 238000003825 pressing Methods 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
Abstract
The invention discloses an MBB solar cell test bench, which comprises a lead fixing mechanism for testing front current and voltage data of a cell, a copper table board and a copper table board base for testing back current and voltage data of the cell; the wire fixing mechanism comprises a wire, springs, insulating brackets and a supporting frame, wherein the two insulating brackets are respectively arranged on two sides of the supporting frame, and a plurality of springs are arranged on the inner sides of the two insulating brackets; the wires are arranged in parallel, and two ends of the wires are fixed on the insulating bracket through springs; the copper table top for placing the battery piece is arranged on the copper table top base, and the copper table top and the lead fixing mechanism are oppositely arranged; the upper surface of the copper table top is provided with a vacuum hole and a voltage probe, the lower surface of the copper table top is provided with a current measuring contact point and a voltage measuring contact point, and the voltage probe is connected with the voltage measuring contact point; the supporting frame is arranged above the copper table base through the driving mechanism. The invention can truly and effectively test the electrical performance parameters of the MBB solar cell.
Description
Technical Field
The invention relates to the technical field of solar cell testing, in particular to an MBB solar cell testing table.
Background
The solar cell can convert clean, green and renewable solar energy into electric energy to serve people due to the photovoltaic effect, and the solar cell becomes a research hot spot for people. However, the conversion efficiency of the solar cell is low, and the utilization rate of solar energy is low, so that the use cost of the solar cell is higher than that of the common electricity price.
In order to prepare a high-efficiency solar cell, people continuously improve the photoelectric conversion efficiency of the solar cell by various methods, and an MBB multi-main-grid solar cell is developed, wherein the measurement of electrical performance parameters is an important link for measuring the performance of the solar cell. However, the existing solar cell test method basically uses probe contact type.
Disclosure of Invention
In order to solve the technical problems, the invention provides the MBB solar cell test bench which can well solve the problem of the electrical performance of the MBB solar cell and can truly and effectively test the electrical performance parameters of the MBB solar cell.
The technical scheme of the invention is as follows:
the MBB solar cell test bench comprises a lead fixing mechanism for testing front current and voltage data of a cell, a copper table board for testing back current and voltage data of the cell and a copper table board base;
the wire fixing mechanism comprises a wire, an insulating bracket and a supporting frame, wherein the two insulating brackets are respectively arranged on two sides of the supporting frame, and a plurality of springs are arranged on the inner sides of the two insulating brackets; the wires are arranged in parallel, and two ends of the wires are fixed on the insulating bracket through springs;
the copper table top for placing the battery piece is arranged on the copper table top base, and the copper table top and the lead fixing mechanism are arranged oppositely; the upper surface of the copper table top is provided with a vacuum hole and a voltage probe, the lower surface of the copper table top is provided with a current measuring contact point and a voltage measuring contact point, and the voltage probe is connected with the voltage measuring contact point;
the supporting frame is arranged above the copper table base through the driving mechanism.
The wire passes through the spring and is fixed in the center of the spring.
The four corners of the copper table top base are respectively provided with a driving mechanism; the driving mechanism comprises an air cylinder, a linear bearing and a guide shaft, wherein the air cylinder is arranged in the copper table surface base, the output end of the air cylinder is connected with the guide shaft through the linear bearing, and the guide shaft is connected with the bottom of the supporting frame.
The support frame is provided with a screw micrometer for controlling the pressing depth of the lead.
The lead is silver-plated copper wire and comprises four voltage test wires and eight current test wires.
The periphery of the upper surface of the copper table top is provided with an insulating surface, and the voltage probe is connected with the copper table top in an insulating way; the four corners of the copper table surface are respectively provided with a current measuring contact point, and the current measuring contact points are led out through current leads; the voltage measurement contact is led out through a voltage lead.
One side of the copper table top is provided with a silicon wafer positioning strip higher than the upper surface of the copper table top.
The upper surface of the copper table top is an arc surface along the length direction of the lead.
The degree of the cambered surface of the copper table top is 1-2 degrees.
Compared with the prior art, the invention has the following technical effects:
according to the MBB solar cell test bench, the two ends of the copper wire of the upper copper net of the clamp are fixed by the springs, and when the clamp is pressed down for testing, the copper wire can be in close contact with the cell; the spring is adopted to fix the wires, so that the pressure of each wire contacting the battery piece is the same, and each wire can be better ensured to fully contact the contact point of the battery piece. The voltage and current on the front side of the MBB battery are drained through the contact of the upper wire-pressing copper wire and the MBB battery, and the voltage and current on the back side of the MBB battery are drained through the contact of the lower bottom copper table top and the MBB battery. The invention can well solve the problem of the electrical performance of the MBB solar cell, and can truly and effectively test the electrical performance parameters of the MBB solar cell.
Furthermore, the copper table top at the bottom adopts an arc surface, so that the table top can be in close contact with the battery piece.
Further, the screw micrometer controls the pressing depth of the upper copper net, thereby controlling the contact tightness degree of the whole upper copper net and the battery piece.
Drawings
FIG. 1 is an overall schematic of a clamp;
FIG. 2 is a schematic diagram of a copper mesh structure with an upper portion;
FIG. 3 is a schematic view of the upper spring of the test fixture;
FIG. 4 is a schematic view of a copper mesa of the test fixture;
FIG. 5 is a side view of a voltage and current lead of a copper mesa of the test fixture;
wherein: the device comprises a 1-wire fixing mechanism, a 2-linear bearing, a 3-guide shaft, a 4-copper table top base, an 11-insulating support, a 12-wire, a 13-spring, a 14-support frame, a 21-silicon wafer positioning strip, a 22-vacuum hole, a 23-voltage probe, a 24-insulating surface, a 25-current lead, a 26-voltage lead and a 27-copper table top.
Detailed Description
The invention is illustrated by the following examples. It should be noted that the following examples are only for further illustrating the present invention and do not represent the protection scope of the present invention, and other people make immaterial modifications and adjustments according to the prompts of the present invention still belong to the protection scope of the present invention.
In order to solve the problem of measuring the electrical performance parameters of the MBB solar cell, the invention mainly adopts a contact mode of copper table top and copper wire with the cell to solve the problem of electrical performance test.
As shown in fig. 1, the fixture mainly comprises two large blocks, namely a wire fixing mechanism 1 at the upper part of the fixture, a copper table base 4 at the lower part of the fixture, and the wire fixing mechanism 1 and the copper table base 4 of the MBB test fixture are respectively described below.
As shown in fig. 2, the upper jig wire fixing mechanism 1 is mainly composed of a wire (copper wire) 12, a spring 13, an insulating bracket 11 for fixing the spring, and an upper jig integral support frame 14. Insulating bracket 11 fixing mechanisms are manufactured on two sides of the wire fixing mechanism 1 and used for fixing springs; two ends of a lead (copper wire) 12 are fixed on an insulating bracket 11 through springs 13; the wires (copper wires) 12 are silver plated in a wire arrangement: 4 voltage test lines and 8 current test lines; the test wires will be soldered in parallel to the bus wires.
The spring 13 is adopted to fix the leads 12, so that the pressure of each lead 12 contacting the battery piece is the same, and the full contact of each lead with the battery piece can be better ensured. The upper part of the clamp adopts a screw micrometer to control the pressing depth of the copper net, and the pressing depth can be adjusted by the screw micrometer.
FIG. 3 is a schematic view of the upper spring of the test fixture; the wire 12 passes through the spring and is fixed at one end of the center of the spring 13, as shown in the black dots, and the lead current is not conducted through the spring 13 and is conducted by the wire 12.
As shown in fig. 4, a schematic view of a copper mesa 27 on the copper mesa base 4 at the lower part of the test fixture is shown, the copper mesa 27 is provided with a vacuum hole 22 (the diameter of the vacuum hole is determined according to the actual vacuum size), and the vacuum hole 22 is covered on the front surface for adsorbing the battery piece to be tested.
The black parts around the copper table-board 27 are insulation surfaces 24, the height of the plane of the copper table-board 27 is consistent with that of the copper surface, and the plane of the copper table-board 27 and the lead 12 form opposite parallel surfaces; a silicon wafer positioning strip 21 is arranged on one side of the copper table surface 27, and the silicon wafer positioning strip 21 is 0.5mm higher than the surface of the copper table surface 27 and is used for positioning the silicon wafer; the upper surface of the whole copper table-board 27 is arc-shaped, the difference between the arc-shaped high point and the low points at the two sides is 1mm, and the surface of the copper table-board 27 adopts a 1-degree cambered surface.
As shown in fig. 5, a schematic diagram of a voltage and current measuring lead of a copper table of the test fixture is shown, wherein 4 current measuring contact points and 1 voltage measuring contact point are arranged at the bottom of the copper table 27; the 4 current measuring contact points are directly connected to the copper table top and led out through a current lead 25; the voltage measuring contact is isolated from the copper mesa by means of a single voltage probe 23 and is led out via a voltage lead 26.
The bottom is provided with 5 lead points; the middle voltage probe 23 is connected (the voltage probe is insulated with the copper table board), and the copper table board 27 is provided with four current contacts (four corner wiring modes, a counter bore mode is adopted, and an M3 socket head cap screw locks the wiring terminal).
The test method of the MBB solar cell test bench provided by the invention comprises the following steps: the voltage and current on the front side of the MBB battery are drained through the contact of the upper wire-pressing copper wire and the MBB battery, and the voltage and current on the back side of the MBB battery are drained through the contact of the lower bottom copper table top and the MBB battery.
According to the structure, the two ends of the copper wire of the copper net at the upper part of the clamp are fixed by the springs, and the copper wire can be in close contact with the battery piece when the clamp is pressed down for testing; the surface of the copper table 27 adopts a cambered surface of 1 DEG, so that the table can be tightly contacted with the battery piece; the screw micrometer controls the pressing depth of the upper copper net, thereby controlling the contact tightness degree of the whole upper copper net and the battery piece. From the cost perspective, the probe is not provided in the scheme, the manufacturing cost is lower than that of the probe type test fixture, the fixture maintenance and use cost is lower, the copper wire is replaced after the service life of the copper wire, and the copper wire is cheaper than the copper wire with the probe.
The protective scope of the invention is not limited to the embodiments described above, but it is intended that the invention cover modifications and variations of this invention, provided they come within the scope of the appended claims and their equivalents, for those skilled in the art.
Claims (6)
1. The MBB solar cell test bench is characterized by comprising a lead fixing mechanism (1) for testing front current and voltage data of a cell, a copper table board (27) for testing back current and voltage data of the cell and a copper table board base (4);
the wire fixing mechanism (1) comprises a wire (12), insulating brackets (11) and a supporting frame (14), wherein the two insulating brackets (11) are respectively arranged on two sides of the supporting frame (14), and a plurality of springs (13) are arranged on the inner sides of the two insulating brackets (11); the plurality of wires (12) are arranged in parallel, and two ends of the wires (12) are fixed on the insulating bracket (11) through springs (13); the lead (12) passes through the spring (13) and is fixed in the center of the spring (13);
the copper table top (27) for placing the battery piece is arranged on the copper table top base (4), and the copper table top (27) is arranged opposite to the lead fixing mechanism (1); the upper surface of the copper table-board (27) is provided with a vacuum hole (22) and a voltage probe (23), the lower surface of the copper table-board (27) is provided with a current measuring contact point and a voltage measuring contact point, and the voltage probe (23) is connected with the voltage measuring contact point; the four corners of the copper table top base (4) are respectively provided with a driving mechanism; the driving mechanism comprises an air cylinder, a linear bearing (2) and a guide shaft (3), wherein the air cylinder is arranged in a copper table base (4), the output end of the air cylinder is connected with the guide shaft (3) through the linear bearing (2), and the guide shaft (3) is connected with the bottom of the supporting frame (14);
the supporting frame (14) is arranged above the copper table base (4) through a driving mechanism;
the support frame (14) is provided with a screw micrometer for controlling the pressing depth of the lead (12).
2. The MBB solar cell test bench according to claim 1, wherein the wires (12) are silver-plated copper wires, comprising four voltage test wires and eight current test wires.
3. The MBB solar cell test bench according to claim 1, wherein an insulating surface (24) is arranged around the upper surface of the copper table top (27), and the voltage probe (23) is connected with the copper table top (27) in an insulating manner; the four corners of the copper table surface (27) are respectively provided with a current measuring contact point, and the current measuring contact points are led out through a current lead (25); the voltage measurement contact is led out via a voltage lead (26).
4. The MBB solar cell test bench according to claim 1, wherein a silicon wafer positioning strip (21) higher than the upper surface of the copper table surface (27) is arranged on one side of the copper table surface (27).
5. The MBB solar cell test bench according to claim 1, wherein the upper surface of the copper mesa (27) is a cambered surface along the length direction of the lead (12).
6. An MBB solar cell test bench according to claim 1, characterized in that the degree of camber of the copper mesa (27) is 1-2 °.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810138611.0A CN108206671B (en) | 2018-02-10 | 2018-02-10 | MBB solar cell testboard |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810138611.0A CN108206671B (en) | 2018-02-10 | 2018-02-10 | MBB solar cell testboard |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108206671A CN108206671A (en) | 2018-06-26 |
| CN108206671B true CN108206671B (en) | 2024-04-09 |
Family
ID=62606451
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810138611.0A Active CN108206671B (en) | 2018-02-10 | 2018-02-10 | MBB solar cell testboard |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108206671B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013115046A1 (en) * | 2012-02-03 | 2013-08-08 | 山下電装株式会社 | Probe for measuring characteristics of solar cell |
| CN103490724A (en) * | 2013-09-05 | 2014-01-01 | 上海伟信新能源科技有限公司 | Full-back contact solar cell test bench |
| CN105375880A (en) * | 2015-11-27 | 2016-03-02 | 中国电子科技集团公司第四十八研究所 | Back contact solar cell sheet test platform |
| CN106301218A (en) * | 2016-11-01 | 2017-01-04 | 常州天合光能有限公司 | A kind of test device for many main grids cell piece |
| CN207782755U (en) * | 2018-02-10 | 2018-08-28 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
-
2018
- 2018-02-10 CN CN201810138611.0A patent/CN108206671B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013115046A1 (en) * | 2012-02-03 | 2013-08-08 | 山下電装株式会社 | Probe for measuring characteristics of solar cell |
| CN103490724A (en) * | 2013-09-05 | 2014-01-01 | 上海伟信新能源科技有限公司 | Full-back contact solar cell test bench |
| CN105375880A (en) * | 2015-11-27 | 2016-03-02 | 中国电子科技集团公司第四十八研究所 | Back contact solar cell sheet test platform |
| CN106301218A (en) * | 2016-11-01 | 2017-01-04 | 常州天合光能有限公司 | A kind of test device for many main grids cell piece |
| CN207782755U (en) * | 2018-02-10 | 2018-08-28 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108206671A (en) | 2018-06-26 |
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