CN106301218A - A kind of test device for many main grids cell piece - Google Patents
A kind of test device for many main grids cell piece Download PDFInfo
- Publication number
- CN106301218A CN106301218A CN201610933842.1A CN201610933842A CN106301218A CN 106301218 A CN106301218 A CN 106301218A CN 201610933842 A CN201610933842 A CN 201610933842A CN 106301218 A CN106301218 A CN 106301218A
- Authority
- CN
- China
- Prior art keywords
- testing stand
- cell piece
- test
- gold
- test device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 105
- 239000000523 sample Substances 0.000 claims abstract description 25
- 238000009413 insulation Methods 0.000 claims abstract description 20
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 241000218202 Coptis Species 0.000 claims 1
- 235000002991 Coptis groenlandica Nutrition 0.000 claims 1
- 238000007747 plating Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 2
- 230000007547 defect Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Relating To Insulation (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610933842.1A CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610933842.1A CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Publications (1)
Publication Number | Publication Date |
---|---|
CN106301218A true CN106301218A (en) | 2017-01-04 |
Family
ID=57719674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610933842.1A Pending CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106301218A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1356727A (en) * | 2000-11-30 | 2002-07-03 | 三菱电机株式会社 | Semiconductor device including bipolar transistor elements |
US20070068567A1 (en) * | 2005-09-23 | 2007-03-29 | Rubin Leonid B | Testing apparatus and method for solar cells |
CN102445668A (en) * | 2010-10-11 | 2012-05-09 | 财团法人工业技术研究院 | Wafer-level light-emitting diode chip detection method, detection device and transparent probe card |
CN104769838A (en) * | 2012-09-05 | 2015-07-08 | 康斯坦茨大学 | Device for non-permanent electrical contacting of solar cells in order to measure electrical properties |
CN206412987U (en) * | 2016-11-01 | 2017-08-15 | 常州天合光能有限公司 | A kind of test device for many main grid cell pieces |
-
2016
- 2016-11-01 CN CN201610933842.1A patent/CN106301218A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1356727A (en) * | 2000-11-30 | 2002-07-03 | 三菱电机株式会社 | Semiconductor device including bipolar transistor elements |
US20070068567A1 (en) * | 2005-09-23 | 2007-03-29 | Rubin Leonid B | Testing apparatus and method for solar cells |
CN102445668A (en) * | 2010-10-11 | 2012-05-09 | 财团法人工业技术研究院 | Wafer-level light-emitting diode chip detection method, detection device and transparent probe card |
CN104769838A (en) * | 2012-09-05 | 2015-07-08 | 康斯坦茨大学 | Device for non-permanent electrical contacting of solar cells in order to measure electrical properties |
CN206412987U (en) * | 2016-11-01 | 2017-08-15 | 常州天合光能有限公司 | A kind of test device for many main grid cell pieces |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
CN108206671B (en) * | 2018-02-10 | 2024-04-09 | 泰州隆基乐叶光伏科技有限公司 | MBB solar cell testboard |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information |
Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: trina solar Ltd. Applicant after: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: CHANGZHOU TRINA SOLAR ENERGY Co.,Ltd. Applicant before: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: TRINASOLAR Co.,Ltd. Applicant after: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: trina solar Ltd. Applicant before: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. |
|
CB02 | Change of applicant information | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170104 |
|
RJ01 | Rejection of invention patent application after publication |