CN217134319U

CN217134319U - Main-grid-free solar cell IV testing device

Info

Publication number: CN217134319U
Application number: CN202220771416.3U
Authority: CN
Inventors: 夏冰强; 何峻伟
Original assignee: Wuxi Shengxia Xingkong Technology Co ltd
Current assignee: Wuxi Shengxia Xingkong Technology Co ltd
Priority date: 2022-04-06
Filing date: 2022-04-06
Publication date: 2022-08-05
Anticipated expiration: 2032-04-06

Abstract

The utility model discloses a solar cell IV testing device without a main grid, which comprises a plurality of probe rows and copper bar cutters which are respectively contacted with the front surface and the back surface of a cell and are in one-to-one correspondence, wherein each probe row is provided with a plurality of probe holes, a voltage needle and a current needle are crossly arranged in each probe hole, the current needles are conducted with the probe rows, the voltage needles are insulated with the current needles, and the voltage needles are contacted with the current needles to form a thin grid of the cell; and insulating isolation belts are symmetrically arranged on the copper bar cutter. The utility model discloses rational in infrastructure, design benefit, the atress is on the battery back copper bar sword that corresponds when ensureing that the probe is arranged to push down with copper bar sword one-to-one to make the atress even, can not lead to the uneven and damaged of battery atress, compare current copper wire simultaneously and press the survey scheme, long service life satisfies battery volume production demand, and has improved test data stability and degree of accuracy, and conventional crystal silicon of test can be compromise to this device in addition has the test of main bars solar cell.

Description

Main-grid-free solar cell IV testing device

Technical Field

The utility model relates to a photovoltaic equipment technical field, concretely relates to no main grid solar cell IV testing arrangement.

Background

At present, the front surface of a conventional crystalline silicon solar cell is provided with a main grid line, silver paste is generally adopted, but the price is high, and the cost of the cell is influenced. Meanwhile, the main grid lines tend to shield the front side of the battery, so that the absorption of the battery piece to light is influenced, and the photoelectric conversion efficiency of the battery piece is influenced. With the improvement of solar cell technology, no main grid solar cells are available, and the main grid solar cells are in ohmic contact with the cells through thin grid lines arranged in a lattice mode. The crystalline silicon batteries reduce light absorption loss caused by main grid covering, reduce series resistance loss and reduce dark saturation current and open-circuit voltage loss through the design without the main grid, thereby improving the efficiency of the batteries.

In the conventional test method, the number of test rows is determined according to the number of main grid lines, and each test row has the same number of current pins and voltage pins and needs to be insulated; the back surface of the battery is an aluminum back surface field, current and voltage parameters of a battery piece on the back surface are collected through a copper bottom plate, and the current and the voltage are insulated regionally on the copper bottom plate; the battery piece with the main grid lines on the back needs to be vertically tested and aligned with the main grid lines respectively, and current and voltage parameters of the front side and the back side are collected. The conventional scheme has high alignment requirement on the probe row and the main grid lines of the battery, the number of the upper and lower measuring probe rows needs to be adjusted in time according to different numbers of the main grid lines, time and labor are wasted, the replacement is extremely inconvenient, and the productivity is influenced.

Based on a solar cell without a main grid, a copper wire pressure testing device is provided, wherein a certain amount of copper wires are adopted on the front surface of the testing cell to contact with a fine grid; and the back surface adopts a copper bottom plate with certain thickness and radian as a current and voltage parameter for collecting the back surface. However, the device also has the problems that the tension of the copper wire is difficult to recover in time along with the increase of the test times in the use process of the front copper wire in the battery sorting beat, so that the test accuracy cannot be guaranteed, the maintenance cost of the device is high, and the device is difficult to popularize and use.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcomings existing in the prior art and providing a solar cell IV testing device without a main grid.

In order to achieve the above object, the utility model provides a following technical scheme:

a solar cell IV testing device without a main grid comprises a plurality of probe rows and copper bar cutters which are respectively contacted with the front surface and the back surface of a cell and correspond to each other one by one, wherein each probe row is provided with a plurality of probe holes, voltage needles and current needles are crossly arranged in the probe holes, the current needles are conducted with the probe rows, the voltage needles are insulated from the current needles, and the voltage needles and the current needles are contacted with the cell thin grid; and insulating isolation belts are symmetrically arranged on the copper bar cutter.

As the utility model discloses a preferred setting, the probe row with the copper bar sword is equidistant range and perpendicular to the thin grid line of battery piece.

As the utility model discloses an optimal setting, the probe row with the copper bar sword is the brass material, and gets rid of the surface oxide layer.

As the utility model discloses an optimal setting, the probe row with copper bar sword quantity is the same, is 5 ~ 11.

As the utility model discloses an optimized setting, probe row length is 240 ~ 300mm, and the width is 3 ~ 5mm, highly is 8 ~ 12 mm.

As the utility model discloses an optimized setting, copper bar sword length is 210 ~ 300mm, and the width is 3 ~ 5mm, highly is 10 ~ 20 mm.

The beneficial effects of the utility model are that:

the utility model adopts a plurality of probe rows which are arranged at equal intervals and are vertical to the thin grid lines of the battery on the front surface of the battery, the probe rows adopt a porous form and are used for installing current and voltage needles, and each current and voltage needle is arranged in a crossed way, so that the accuracy of collecting the current and the voltage is improved; the copper bar knife is used for collecting battery back current, and insulating isolation belts which are in insulating treatment with the copper bar knife are arranged on two sides of the copper bar knife and used for collecting battery back voltage parameters. The utility model discloses rational in infrastructure, design benefit, the atress is on the battery back copper bar sword that corresponds when ensureing that the probe is arranged to push down with copper bar sword one-to-one to make the atress even, can not lead to the uneven and damaged of battery atress, compare current copper wire simultaneously and press the survey scheme, long service life satisfies battery volume production demand, and has improved test data stability and degree of accuracy, and conventional crystal silicon of test can be compromise to this device in addition has the test of main bars solar cell.

Drawings

Fig. 1 is a top view of the probe row provided by the present invention.

Fig. 2 is a structure view of the copper bar cutter provided by the utility model.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in detail with reference to specific embodiments. In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "connected," and the like are to be construed broadly, and for example, "connected" may be either fixedly connected or detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1-2, a device for testing a solar cell IV without a main grid comprises a plurality of probe banks 1 and copper bar cutters 2 which are respectively contacted with the front and back of a cell and are in one-to-one correspondence, wherein each probe bank 1 is provided with a plurality of probe holes 3, voltage pins and current pins are arranged in the probe holes 3 in a crossed manner, the current pins are conducted with the probe banks, the voltage pins are insulated from the current pins, and the voltage pins and the current pins are contacted with the cell thin grid; and the copper bar cutter 2 is symmetrically provided with insulating isolation belts 4.

As a preferable scheme of this embodiment, the probe row 1 and the copper bar cutter 2 are both arranged at equal intervals and perpendicular to the thin grid lines of the battery piece.

As a preferable scheme of this embodiment, the probe bank 1 and the copper bar cutter 2 are both made of brass, and the surface oxide layer is removed.

As a preferable scheme of this embodiment, the number of the probe rows 1 is the same as that of the copper bar cutters 2, and is 5 to 11.

As a preferable scheme of the embodiment, the length of the probe bank 1 is 240-300 mm, the width is 3-5 mm, and the height is 8-12 mm.

As a preferable scheme of the embodiment, the length of the copper bar cutter 2 is 210-300 mm, the width is 3-5 mm, and the height is 10-20 mm.

Specifically, the testing device uses a plurality of probe rows 1 which are arranged at equal intervals to press the front face of the battery, current and voltage pins are arranged in a crossed mode in each probe row, the current pins are conducted with the probe rows 1, the voltage pins are insulated from the current pins, and the number of the current and voltage pins is determined according to the length of the battery. The battery back device adopts a copper bar cutter 2 structure, the copper bar cutter 2 is contacted with the back of the battery to collect back current, and two insulating isolation belts 4 insulated from the copper bar cutter are arranged at the upper part of the copper bar cutter and used for collecting the back voltage of the battery.

When a battery without a main grid is tested, the number of the front probe row 1 and the number of the back copper bar cutters 2 are the same, the number of the front probe row and the number of the back copper bar cutters 2 are 5-11, the front probe row and the back copper bar cutters are adjusted according to the size of an actual battery piece, and the front probe row 1 and the back copper bar cutters 2 are in one-to-one correspondence in the longitudinal positions, so that the battery is uniformly stressed when being pressed by the front probe row. The pressing mode can be realized by adopting an air cylinder or an electric cylinder;

to sum up, the utility model discloses rational in infrastructure, design benefit, the atress is on the battery back copper bar sword that corresponds when ensureing that the probe is arranged to push down with copper bar sword one-to-one to make the atress even, can not lead to the uneven and damaged of battery atress, compare current copper wire simultaneously and press the survey scheme, long service life satisfies battery volume production demand, and has improved test data stability and degree of accuracy, and this device can compromise the conventional crystal silicon of test in addition and has the test of main grid solar cell.

Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims above, any of the claimed embodiments may be used in any combination. The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information constitutes prior art already known to a person skilled in the art.

Claims

1. A solar cell IV testing device without a main grid is characterized by comprising a plurality of probe rows and copper bar cutters which are respectively contacted with the front surface and the back surface of a cell piece and correspond one to one, wherein a plurality of probe holes are formed in each probe row, voltage pins and current pins are arranged in the probe holes in a crossed manner, the current pins are conducted with the probe rows, the voltage pins are insulated from the current pins, and the voltage pins and the current pins are contacted with the cell piece fine grids; and insulating isolation belts are symmetrically arranged on the copper bar cutter.

2. The tandem-free solar cell IV testing apparatus of claim 1, wherein the probe rows and the copper bar cutters are all fine grid lines arranged at equal intervals and perpendicular to the cell pieces.

3. The IV testing apparatus for solar cells without main grid of claim 1, wherein the probe row and the copper bar cutter are made of brass and have surface oxide layers removed.

4. The device for testing the solar cell IV without the main grid according to claim 1, wherein the number of the probe rows is the same as that of the copper bar cutters, and the number of the probe rows is 5-11.

5. The maingrid-free solar cell IV test set forth in claim 1, wherein the probe bank has a length of 240-300 mm, a width of 3-5 mm, and a height of 8-12 mm.

6. The device for testing the solar cell IV without the main grid according to claim 1, wherein the copper bar cutter has a length of 210-300 mm, a width of 3-5 mm and a height of 10-20 mm.