KR101772118B1 - Measurement equipment of solar cell and measurement method - Google Patents

Abstract

The present invention relates to a solar cell measuring apparatus and a measuring method.
An example of a solar cell measuring apparatus according to the present invention includes a probe for a front electrode which contacts a plurality of finger electrodes formed on an incident surface of a solar cell in a direction crossing the probe electrodes; A probe for a rear electrode contacting a rear electrode formed on a rear surface opposite to an incident surface of the solar cell; And a measuring unit that receives an electrical signal from the probe unit for the front electrode and the probe unit for the rear electrode and measures at least one of an open-circuit voltage and a short-circuit current of the solar cell, wherein the probe unit for the front electrode includes a plurality of finger electrodes, And a pin electrode electrically connected to the conductive electrode.

Description

TECHNICAL FIELD [0001] The present invention relates to a solar cell,

The present invention relates to a solar cell measuring apparatus and a measuring method.

In recent years, as energy resources such as oil and coal are expected to be exhausted, interest in renewable energy to replace them has increased, and solar cell cells that produce electric energy from solar energy are attracting attention.

In order to obtain a desired output, a plurality of solar cells are connected in series or in parallel, and then used as a solar cell module in a form of a waterproof type in the form of a panel.

Generally, a solar cell module having solar cells includes a plurality of solar cells arranged at regular intervals, a shield for maintaining a gap between adjacent solar cells, and a plurality of electrodes for electrically connecting electrodes of adjacent solar cells An upper and a lower protective film for protecting the solar cells, a transparent member disposed on the protective film toward the light receiving surface of the solar cell, and a back sheet disposed on the lower side of the lower protective film opposite to the light receiving surface.

In such a solar cell module, the efficiency of the solar cell module can be maximized by including solar cells having the same efficiency. For this purpose, a sorting process for separating the solar cells by efficiency during the solar cell module process is separately provided.

An object of the present invention is to provide a solar cell measurement device and a measurement method used in a classification process for separating solar cell cells by efficiency.

An example of a solar cell measuring apparatus according to the present invention includes a probe for a front electrode which contacts a plurality of finger electrodes formed on an incident surface of a solar cell in a direction crossing the probe electrodes; A probe for a rear electrode contacting a rear electrode formed on a rear surface opposite to an incident surface of the solar cell; And a measuring unit that receives an electrical signal from the probe unit for the front electrode and the probe unit for the rear electrode and measures at least one of an open-circuit voltage and a short-circuit current of the solar cell, wherein the probe unit for the front electrode includes a plurality of finger electrodes, And a pin electrode electrically connected to the conductive electrode.

Here, the solar cell may not have a bus bar electrode crossing the plurality of finger electrodes on the incident surface.

In addition, the width of the conductive electrode may be smaller than or equal to the width of the interconnection electrically connecting the plurality of solar cells to each other.

The lower surface of the conductive electrode which is in contact with the finger electrode may have irregularities.

Further, the pin electrode can be brought into contact with the conductive electrode when measuring the solar cell.

Further, the conductive electrode and the pin electrode may be integrally formed so as to be always electrically connected.

In addition, the conductive electrode and the pin electrode can be separated from each other so as not to be electrically connected to each other during a period except for measuring the solar cell.

In addition, the number of the pin electrodes electrically connected to the conductive electrode may be at least one.

In addition, the number of the finger electrodes contacting the conductive electrode may be at least two.

Further, the measuring unit can further measure the fill factor and the resistance of the solar cell.

According to another aspect of the present invention, there is provided a method for measuring a solar cell comprising: contacting a probe for a front electrode in a direction crossing a plurality of finger electrodes formed on an incident surface of a solar cell; Contacting a probe for a rear electrode to a rear electrode formed on a rear surface which is an opposite surface of the incident surface of the solar cell; A probe for a front electrode and a probe for a rear electrode, the method comprising: receiving electrical signals from a plurality of finger electrodes and a rear electrode; And measuring at least one of an open-circuit voltage and a short-circuit current of the solar cell using an electrical signal, wherein the probe unit for the front electrode is electrically connected to the conductive electrode formed long in a direction crossing the plurality of finger electrodes, And the conductive electrode is in contact with the plurality of finger electrodes in a direction crossing the step of contacting the probe for the front electrode.

Here, in the step of contacting the probe for a front electrode, the pin electrode may be electrically connected to the conductive electrode.

In addition, the solar cell may not have a bus bar electrode crossing the plurality of finger electrodes on the incident surface.

Further, the measuring step can further measure the fill factor and resistance of the solar cell.

The solar cell measuring device and the measuring method according to an example of the present invention can easily measure the solar cell even when there is no bus bar electrode on the incident surface of the solar cell.

1 and 2 are views for explaining an example of a solar cell to be measured by the solar cell measuring apparatus according to the present invention.
3 and 4 are views for explaining an example of a solar cell measuring apparatus according to the present invention.
5 is a view for explaining two examples of the electrical connection relationship between the conductive electrode and the pin electrode in the solar cell measuring apparatus according to the present invention.
6 is a view for explaining the lower surface of the conductive electrode of the present invention.
7 is a view for explaining various examples according to the length of the conductive electrode according to the present invention.
8 is a view for explaining an example of the number of pin electrodes connected to one conductive electrode.
9 is a view for explaining an example of measuring a solar cell including a bus bar electrode according to the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily carry out the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention in the drawings, portions not related to the description are omitted, and like reference numerals are given to similar portions throughout the specification.

In the drawings, the thickness is enlarged to clearly represent the layers and regions. When a layer, film, region, plate, or the like is referred to as being "on" another portion, it includes not only the case directly above another portion but also the case where there is another portion in between. Conversely, when a part is "directly over" another part, it means that there is no other part in the middle.

Before describing the solar cell measuring apparatus according to the present invention, an example of a solar cell to be measured by the solar cell measuring apparatus will be described first.

1 and 2 are views for explaining an example of a solar cell to be measured by the solar cell measuring apparatus according to the present invention.

1, an example of a solar cell 10 to be measured by a solar cell measuring apparatus includes a substrate 11, an emitter section 12, a finger electrode 13, an antireflection film 15, Electrode 16 may be included. As shown in the figure, the interconnectors 20 and 20 'are connected to the front or rear surface of the solar cell 10.

Here, the substrate 11 has a function of converting light energy incident from the outside into electric energy, and may be a semiconductor substrate made of silicon of the first conductivity type, for example, p-type conductive type. The silicon may be monocrystalline silicon, polycrystalline silicon or amorphous silicon. When the substrate 11 has a p-type conductivity type, it contains an impurity of a trivalent element such as boron (B), gallium (Ga), indium (In) or the like.

The emitter 12 may be of a second conductivity type, which is located on the light receiving surface of the substrate 11 on which the light is incident and is opposite to the conductive type of the substrate 11. For example, the emitter section 12 is a region doped with an impurity having an n-type conductivity type and forms a p-n junction with the semiconductor substrate 11. When the emitter section 12 has the n-type conductivity type, the emitter section 12 dopes the impurity of the pentavalent element such as phosphorus (P), arsenic (As), antimony (Sb) .

Accordingly, when electrons in the semiconductor are energized by the light incident on the substrate 11, the electrons move toward the n-type semiconductor and the holes move toward the p-type semiconductor. Accordingly, when the substrate 11 is p-type and the emitter 12 is n-type, the separated holes move toward the substrate 11 and the separated electrons move toward the emitter 12.

Conversely, the substrate 11 may be of the n-type conductivity type and may be made of a semiconductor material other than silicon. When the substrate 11 has an n-type conductivity type, the substrate 11 may contain impurities of pentavalent elements such as phosphorus (P), arsenic (As), antimony (Sb)

Since the emitter 12 forms a p-n junction with the substrate 11, when the substrate 11 has an n-type conductivity type, the emitter 12 has a p-type conductivity type. In this case, the separated electrons move toward the substrate 11, and the separated holes migrate toward the emitter 12.

When the emitter section 12 has a p-type conductivity type, the emitter section 12 is formed by doping an impurity of a trivalent element such as boron (B), gallium (Ga), indium (In) .

The antireflection film 15 is located on the emitter 12 where the finger electrodes 13 are not located and functions to make the amount of light incident from the outside more incident on the inside of the substrate 11.

The plurality of finger electrodes 13 are formed on the emitter section 12 and are electrically connected to the emitter section 12 and are formed in one direction with the finger electrodes 13 spaced apart from each other. Each of the finger electrodes 13 functions to collect charge, for example, electrons, which have migrated toward the emitter section 12, and transfer it to the inter connecter 20 which contacts the finger electrode 13.

Here, the interconnector 20 may be connected to a plurality of finger electrodes 13 by a conductive film or a conductive paste without a bus bar electrode. A conductive film is a structure in which a plurality of conductive particles of a metal material (for example, nickel (Ni)) is contained in an epoxy resin, and the size of the conductive particles may be 3 to 10 μm.

The rear electrode 16 is formed on the opposite surface of the substrate 11, that is, on the rear surface of the substrate 11, and collects charge, for example, holes,

The back electrode 16 is made of at least one conductive material. The conductive material may be at least one selected from the group consisting of Ni, Cu, Ag, Al, Sn, Zn, In, Ti, Au, And combinations thereof, but may be made of other conductive materials.

The operation of the solar cell 10 having such a structure is as follows.

When light is incident on the solar cell 10 and is incident on the substrate 11 through the antireflection film 15 and the emitter section 12, free electrons are generated due to the photoelectric effect, and pn The electrons move toward the emitter section 12 having the n-type conductivity type and the holes move toward the substrate 11 having the p-type conductivity type according to the principle of the junction. The electrons moved toward the emitter section 12 are collected by the finger electrode 13 and moved to the inter connecter 20 which is in contact with the finger electrode 13 to be electrically connected, Are moved to the interconnectors 20 and 20 'that are collected by the backside electrode 16 and contact the backside electrode 16 to be electrically connected.

The solar cells 10A, 10B, and 10C having the same structure as shown in FIG. 2 may be connected to the solar cell 10 using the interconnector 20 And connected in series to form a solar cell module.

The solar cell 10 shown in FIG. 1 may not include a bus bar electrode which intersects with the finger electrode 13 and is parallel to the interconnector 20 on the incident surface of the substrate.

The bus bar electrode typically uses an electrode paste made of a high-priced material such as silver. In the case where the bus bar electrode is omitted as described above, the amount of electrode paste forming the bus bar electrode can be reduced, It is possible to omit the step of forming the bus bar electrode, thereby remarkably reducing the manufacturing cost.

However, since the width of the finger electrode is so small that it is difficult to measure the efficiency of the solar cell, it is not easy to classify the solar cell according to efficiency. However, When the measuring apparatus is used, a process of sorting solar cells by efficiency can be easily performed.

Hereinafter, a solar cell measuring apparatus according to the present invention will be described.

3 and 4 are views for explaining an example of a solar cell measuring apparatus according to the present invention.

FIG. 3 is a schematic diagram of a solar cell measuring apparatus according to the present invention, and FIG. 4 is a schematic diagram of a solar cell measuring apparatus excluding the measuring unit 300 and a solar cell measuring apparatus Fig. 3 is a schematic view showing a cross-sectional view.

As shown in FIG. 3, an example of a solar cell measuring apparatus according to the present invention includes a probe 100 for a front electrode, a probe 200 for a rear electrode, and a measuring unit 300.

Here, the probe unit 100 for the front electrode is formed in a direction crossing the plurality of finger electrodes 13 formed on the incident surface of the solar cell 10.

The probe 200 for the rear electrode is formed to contact the rear electrode 16 formed on the rear surface opposite to the incident surface of the solar cell 10. Here, the shape of the probe unit 200 for the rear electrode may be formed in a planar shape so as to be in contact with the surface of the rear electrode 16.

The measuring unit 300 is electrically connected to the probe unit 100 for the front electrode and the probe unit 200 for the back electrode to generate an electrical signal from the probe unit 100 for the front electrode and the probe unit 200 for the rear electrode And measures at least one of an open-circuit voltage (Voc) and a short-circuit current (Isc) of the solar cell (10). The fill factor F.F and the resistance R per unit area of the solar cell 10 can also be measured using the open-circuit voltage Voc and the short-circuit current Isc of the solar cell 10. Here, the electric signal may be a current or a voltage generated from the solar cell 10.

The probe 100 for a front electrode includes a conductive electrode 110 and a pin electrode 120. The conductive electrode 110 is formed in a direction crossing the plurality of finger electrodes 13, The electrode 120 is formed to be electrically connected to the conductive electrode 110. 3, the conductive electrode 110 and the pin electrode 120 are integrally formed so that the conductive electrode 110 and the fin electrode 120 of the front electrode probe 100 are always electrically connected to each other. However, The pin electrode 120 may be connected to the conductive electrode 110 only when the solar cell measuring apparatus according to the present invention measures the solar cell 10. This will be described more specifically in FIG. 5

The conductive electrode 110 of the front electrode probe 100 is formed in a direction crossing the plurality of the fin electrodes 120 as described above. For example, as shown in FIG. 3, the conductive electrode 110 may have a rectangular shape . Therefore, the longitudinal direction of the rectangular shape may be formed in a direction crossing the plurality of pin electrodes 120.

In order to measure the solar cell 10, the finger electrode 13 of the solar cell 10 is disposed so as to intersect the conductive electrode 110 so that the solar cell 10 The rear surface electrode 16 formed on the rear surface of the probe 200 contacts the probe 200 for the rear surface electrode. Then, the front electrode probe 100 is lowered in the direction of the arrow so as to be in contact with the plurality of finger electrodes 13 of the solar cell 10 as shown in Fig.

Thereafter, light is irradiated to the incident surface of the solar cell 10 so that the front electrode probe 100 and the rear electrode probe 200 receive electrical signals from the plurality of finger electrodes 13. [

The measuring unit 300 can measure at least one of the open-circuit voltage Voc and the short-circuit current Isc of the solar cell 10 using the input electrical signal, R) can be measured.

3, the conductive electrode 110 is disposed in a direction crossing the finger electrode 13, because the region D where the light is shielded by the conductive electrode 110 is formed by the solar cells 10, So as to be substantially equal to the area covered by the light by the interconnection connector used for connection.

The reason why the area D where the light is shielded by the conductive electrode 110 and the area where the light is shielded by the interconnector are made the same as the classification of the solar cell 10 according to the photoelectric conversion efficiency of the solar cell 10 This is to make the process more accurate.

The classification process is important because the overall efficiency of the solar cell module depends on the efficiency of each of the solar cells 10.

More specifically, for example, when one solar cell module is composed of 60 solar cells 10, each solar cell 10 may be connected in series with each other.

At this time, when 59 of the solar cells 10 produce a current of 10 mA and one produces a current of 5 mA, the current produced by one solar cell module is the current of the solar cell 10 producing the lowest current, 5 mA. As a result, the photovoltaic conversion efficiency of the solar cell module is lowered. To prevent this, all of the 60 solar cells 10 should be classified to have the same efficiency.

Accordingly, since the classification process for classifying the solar cells 10 having the same efficiency greatly affects the efficiency of the solar cell module, in order to more accurately measure the solar cell 10 in such a classification process, It is necessary to make the area of the battery 10 equal to the area where the light is actually incident. Therefore, the conductive electrodes 110 are arranged in the direction crossing the finger electrodes 13. [

In order to more accurately measure the photovoltaic efficiency of the solar cell 10, the width of the conductive electrode 110 may be less than or equal to the width of the interconnector electrically connecting the plurality of solar cells 10 to each other.

Thus, when the interconnector is connected to the solar cell 10, the area where the light is blocked and the area where the light is shielded when the solar cell 10 is measured can be made almost the same, The photoelectric efficiency can be measured more accurately.

5 is a view for explaining two examples of the electrical connection relationship between the conductive electrode and the pin electrode in the solar cell measuring apparatus according to the present invention.

In the solar cell measuring apparatus according to the present invention, the pin electrode 120 can be electrically contacted with the conductive electrode 110 at least when measuring the solar cell 10.

For example, in the solar cell measurement apparatus according to the present invention, the conductive electrode 110 and the pin electrode 120 are not electrically connected to each other during the period except for measuring the solar cell 10, 5 (a), the conductive electrode 110 is arranged to cross the finger electrode 13 only when the solar cell 10 is measured. Then, the pin electrode 120 is lowered to form the conductive electrode 110, So that the solar cell 10 can be measured. In this case, the solar cell 10 without the bus bar electrode can be easily measured by using only the conductive electrode 110 while using the existing solar cell measuring device intact. This makes it unnecessary to provide a separate device for measuring the solar cell 10 having no bus bar electrode, thereby reducing the cost.

5 (b), the solar cell measuring apparatus according to the present invention is integrally formed so that the conductive electrode 110 and the pin electrode 120 are electrically connected to each other at all times, and when the solar cell 10 is measured , The solar cell 10 may be measured by lowering the integrally formed probe unit 100 for a front electrode. In this case, the electrical connection of the probe unit 100 for the front electrode is robust, the contact resistance can be minimized, and the solar cell 10 can be measured more accurately.

As described above, in the solar cell measuring apparatus according to the present invention, only when the pin electrode 120 and the conductive electrode 110 measure at least the solar cell 10, they can be electrically connected to each other, and the conductive electrode 110 and the pin electrode 120 may be separated from each other or integrally formed.

6 is a view for explaining the lower surface of the conductive electrode of the present invention.

6 (a), the lower surface of the conductive electrode 110 according to the present invention may be formed without irregularities. However, as shown in FIG. 6 (b) The concaves and convexes may be formed on the lower surface of the conductive electrode 110.

In this case, the surface where the conductive electrode 110 is in contact with the finger electrodes 13 can be further increased as compared with the case (a), so that the contact resistance between the finger electrode 13 and the conductive electrode 110 can be further increased . Therefore, the efficiency of the solar cell 10 can be more accurately measured.

6B, when the probe 100 for a front electrode is lowered to be brought into contact with the finger electrode 13, a lowering force of the probe 100 for a front electrode causes a conductive The irregularities of the electrode 110 slightly penetrate the finger electrode 13. Therefore, the contact area between the finger electrode 13 and the conductive electrode 110 can be further reduced by the irregular shape of the conductive electrode 110, so that the solar cell 10 can be measured more accurately.

6 (b), when the irregularities are formed on the lower surface of the conductive electrode 110, even if the height of the finger electrode 13 is not completely uniform, the finger electrode 13 The contact with the conductive electrode 110 is easy and the solar cell 10 can be measured more accurately.

7 is a view for explaining various examples according to the length of the conductive electrode according to the present invention.

7A to 7D, the length of the conductive electrode 110 according to the present invention is set such that the number of the finger electrodes 13 contacting the conductive electrode 110 is at least two or more Can be variously formed.

For example, the length of the conductive electrode 110 may be such that the number of the finger electrodes 13 contacting the conductive electrode 110 is two as shown in FIG. 7 (a) The number of the finger electrodes 13 contacting the conductive electrode 110 may be four or all the finger electrodes 13 formed on the conductive electrode 110 and the upper portion of the solar cell 10 as shown in FIG. May be formed in contact with each other.

In order to reduce the contact resistance between the finger electrode 13 and the conductive electrode 110, the number of the finger electrodes 13 contacting the conductive electrode 110 is preferably at least two.

More specifically, when the number of the finger electrodes 13 contacting the conductive electrode 110 is one, when the conductive electrode 110 contacts the finger electrode 13, the lower surface of the conductive electrode 110 So that the lower surface of the conductive electrode 110 may be less likely to contact the entire upper surface of the finger electrode 13.

However, when the number of the finger electrodes 13 contacting the conductive electrode 110 is at least two or more as in the present invention, the finger electrode 13 itself serves to support the contact surface of the conductive electrode 110 in a horizontal direction do. Thus, the entire upper surface of the finger electrode 13 and the lower surface of the conductive electrode 110 can be brought into close contact with each other.

8 is a view for explaining an example of the number of pin electrodes connected to one conductive electrode.

As shown in FIGS. 8A to 8C, the number of the pin electrodes 120 electrically connected to the conductive electrode 110 may be at least one or more.

8 (a), one pin electrode 120 may be formed on one conductive electrode 110, and one pin electrode 120 may be formed on one conductive electrode 110, as shown in FIG. 8 (b) Two pin electrodes 120 may be formed on the electrode 110 and three pin electrodes 120 may be formed on one conductive electrode 110 as shown in FIG. .

As described above, one or more pin electrodes 120 may be formed on one conductive electrode 110. When a plurality of pin electrodes 120 are formed on one conductive electrode 110, the conductive electrode 110 is applied to the finger electrode 13 with more uniform pressure and force due to the plurality of pin electrodes 120 The contact resistance between the finger electrode 13 and the conductive electrode 110 can be further reduced.

More specifically, as shown in FIG. 7A, when the number of the finger electrodes 13 contacting the conductive electrode 110 is two, one pin electrode (not shown) is formed on the conductive electrode 110 as shown in FIG. The two finger electrodes 13 may be formed on the conductive electrode 110 and the finger electrode 13 may be formed on the conductive electrode 110 as shown in FIG. The two pin electrodes 120 may be formed on the conductive electrode 110 as shown in FIG. 8 (b) so that the force and the pressure applied to the four finger electrodes 13 are uniformly dispersed.

By doing so, when the conductive electrode 110 contacts the finger electrode 13, the respective pin electrodes 120 appropriately distribute the pressure and the force, so that the contact between the conductive electrode 110 and the finger electrode 13 It has the effect of reducing the resistance.

9 is a view for explaining an example of measuring a solar cell including a bus bar electrode according to the present invention.

As shown in FIG. 9A, only the solar cell 10 according to the present invention does not include the bus bar electrode 14, but the present invention is not limited thereto. The solar cell 10 'in which the bus bar electrode 14 is formed in the direction crossing the finger electrode 13 on the incident surface as shown in FIG. 9 (b) can be measured.

When the solar cell 10 'on which the bus bar electrode 14 is formed is measured, the conductive electrode 110 is disposed on the bus bar electrode 14 so that the conductive electrode 110 is positioned on the upper side of the bus bar electrode 14 To measure the solar cell 10.

In this case, the width WP of the conductive electrode 110 may be smaller than or equal to the width WB of the bus bar electrode 14. Thereby, the efficiency of the solar cell 10 including the bus bar electrode 14 can be measured more accurately.

As described above, the solar cell measuring apparatus according to the present invention can measure not only the solar cell 10 'including the bus bar electrode 14 but also the solar cell 10 not including the bus bar electrode 14 It is possible to more easily classify the solar cells 10 by efficiency.

It will be apparent to those skilled in the art that various modifications, substitutions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims. will be.

Therefore, the embodiments disclosed in the present invention and the accompanying drawings are intended to illustrate and not to limit the technical spirit of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments and the accompanying drawings . The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

Claims (14)

A probe for a front electrode contacting the plurality of finger electrodes formed on the incident surface of the solar cell in a direction crossing the plurality of finger electrodes;
A probe for a back electrode contacting a rear electrode formed on a rear surface opposite to an incident surface of the solar cell; And
And a measuring unit for measuring at least one of an open-circuit voltage and a short-circuit current of the solar cell, receiving the electrical signal measured from the probe unit for the front electrode and the probe unit for the rear electrode,
The probe for a front electrode
A plurality of finger electrodes, and a plurality of finger electrodes, the plurality of finger electrodes being formed in a bar shape extending in a direction crossing the plurality of finger electrodes,
And a plurality of pin electrodes electrically connected to the measurement unit and the conductive electrode, the end electrodes being connected to an upper surface of the conductive electrode. The method according to claim 1,
Wherein the solar cell has no bus bar electrode formed on the incident surface in a direction crossing the plurality of finger electrodes. The method according to claim 1,
Wherein a width of the conductive electrode is smaller than or equal to a width of an interconnecting connector that electrically connects the plurality of solar cells to each other. The method according to claim 1,
Wherein a lower surface of the conductive electrode which is in contact with the finger electrode is formed with irregularities. The method according to claim 1,
Wherein the pin electrode is in contact with the conductive electrode when measuring the solar cell. The method according to claim 1,
Wherein the conductive electrode and the pin electrode are integrally formed so as to be electrically connected at all times. The method according to claim 1,
Wherein the conductive electrode and the pin electrode are separable so as not to be electrically connected to each other during a period except for measuring the solar cell. delete delete The method according to claim 1,
Wherein the measurement unit further measures a fill factor and a resistance of the solar cell. Contacting a probe for a front electrode in a direction crossing a plurality of finger electrodes formed on an incident surface of the solar cell;
Contacting a probe for a back electrode to a rear electrode formed on a rear surface opposite to an incident surface of the solar cell;
The probe for a front electrode and the probe for a rear electrode receiving an electrical signal from the plurality of finger electrodes; And
And measuring the at least one of the open-circuit voltage and the short-circuit current of the solar cell using the electrical signal, wherein the measurement unit connected to the probe unit for the front electrode and the probe unit for the rear electrode measures the electrical signal,
The probe for a front electrode
A plurality of finger electrodes formed on the substrate, the plurality of finger electrodes being electrically connected to the plurality of finger electrodes,
And a plurality of pin electrodes electrically connected to the measuring unit and the conductive electrode, the fin unit having an elongated shape, an end connected to an upper surface of the conductive electrode,
Wherein the conductive electrode is in contact with the plurality of finger electrodes in a direction intersecting the step of contacting the probe for a front electrode. 12. The method of claim 11,
Wherein the pin electrode is electrically connected to the conductive electrode in the step of contacting the probe for the front electrode. 12. The method of claim 11,
Wherein the solar cell has no bus bar electrode formed on the incident surface in a direction crossing the plurality of finger electrodes. 12. The method of claim 11,
Wherein the measuring step further measures a fill factor and a resistance of the solar cell.

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